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Engineering Skills
- 1. Isaac E. Chao B.S. Materials Science and Engineering [email_address]
- 2. Outline Education Skills Relevant Course Work Work Experience (Reverse Chronological Order) Rutgers University Specialty Fibers Department OFS Optics University of South Carolina LAMSS Overview
- 3. Education Rutgers University August 2002 – May 2006 B.S. Materials Science and Engineering Cumulative GPA 3.1/4.0 South Carolina Governors School for the Arts and Humanities August 2001 – May 2002 Concentration in piano performance Graduated in top 5% of class Integrated humanities and science curriculum
- 4. Education: Rutgers Keramos Ceramic Engineering Honors Fraternity Engineering Governing Council Kappa Sigma Fraternity
- 5. Skills: Processing Sieve Analysis Stokes Law and Sedimentation
- 6. Skills: Processing Compaction and dry-pressing Slip Casting Extrusion Materials Selection
- 7. Skills Furnace Operation Sintering Wet Chemistry Deposition Techniques
- 8. Skills: Characterization SEM, AFM, Light Microscopy XRD Indentation Hardness Testing Electrical Properties: Impedance Analzyers, Optical Spectrum Analyzers FTIR Spectroscopy, Cutback Attenuation Testing Thermocouples
- 9. Skills: Design AutoCAD – one semester coursework (received grade of A) as well as prior experience Strong interest in Solidworks and ProEngineer LABVIEW virtual instrumentation interface
- 10. Relevant Course Work Ceramic Processing (3 Semesters) Characterization of Materials Ceramic Compositions Strength of Materials Physics of Materials Thermodynamics of Materials
- 11. Skills: Non-technical Adobe Photoshop Microsoft Word Microsoft Excel Microsoft Powerpoint Microsoft Outlook Microsoft Windows XP Maintenance
- 12. Work Experience: Outline Rutgers University Materials Science and Engineering January 2004 – June 2006, Piscataway, NJ Undergraduate Research OFS Optics July 2004 – June 2005, Somerset, NJ Laboratory Technician LAMSS (Laboratory for Active Materials and Smart Structures) at University of South Carolina Dept. of Mechanical Engineering May 2003 – August 2003, Columbia, SC Undergraduate Research
- 13. Rutgers University Materials Science and Engineering: Undergraduate Research Senior Research Project: Hollow Waveguides for the Delivery of Terahertz Radiation 15 hours / week Undergraduate Assistant sophomore and junior years 10 hours / week Assisted with fiber drawing process and preform fabrication
- 14. Senior Project Overview: Terahertz Technology Current technology allows creation and detection of sub-millimeter wavelengths, but an effective waveguide has yet to be invented. Our objective was to create such a waveguide. http://departments.colgate.edu/physics/research/condensedm/conden1.jpg
- 15. Why Terahertz? Terahertz spectroscopy can be used for imaging and chemical sensing Can see through clothing, luggage, fog, and haze Image of Neoprene on mm scale http://www.jhuapl.edu/programs/rtdc/SensorTechnology/TerahertzImaging.html
- 16. Direction of Project Deposit Silver layer (metal) using wet chemistry Deposit Polymer film (dielectric) Silver is the reflector and the polymer thin film decreases the loss of the waveguide
- 17. Silver Deposition Setup reducing solution pump clamp pipette tip pipette tip waveguide Tygon tubing silvering solution waste
- 18. Polymer Deposition Method Solution pumped into top of vertically oriented waveguide. No tubing is attached to bottom of waveguide. PS solution pumped at 5 ml/min for 5 minutes
- 19. Changes in direction COP -> High wt % PS -> low wt% PS High wt% PS resulted in non-uniform films with low adhesion Switched from 20 wt% to 5wt%, 2 wt%, 1 wt%, and .5wt%
- 20. Lower wt% vs. high Property Lower wt% Higher wt% Adhesion √ Smoothness/ Uniformity √ Transmittance √ Thickness √
- 21. Absorption Spectrum for PS coated sample (2 wt%) Polystyrene absorption peak 6th 5th 4th 3 rd order interference peak
- 22. What this means Presence of interference peaks indicates that the film is being deposited uniformly.
- 23. Film thickness Film Thickness can be determined from Absorption Data: Lambda: primary absorption wavelength n: refractive index of material n= 1.57 for polystyrene The thickness of our film was determined to be 1.53 micrometers
- 24. Problems to be addressed Inconsistent results – interference peaks not observed every time (unable to determine correlation between pump speed, time, and uniformity) Periodic flow rate of peristaltic pump results in non-uniform layers. Ideal setup would involve continuous flow rate. (ie vacuum system)
- 25. Goals With one-layer PS samples, cutback attenuation testing should demonstrate equal or less loss than silver-only waveguides. Once this is demonstrated, we will proceed to deposit multiple layers to achieve samples with thicker layers and lower loss.
- 26. OFS Optics: Laboratory Technician Characterized fibers used in the telecommunications industry Cutback attenuation, wavelength, reliability, aging, mechanical properties Experience with fusion splicers and cleavers Proficiency with Photon Kinetics, Ericsson, and Fujikura fiber handling equipment
- 27. LAMSS: University of South Carolina Characterization of Piezoelectric wafers (used for structural integrity tests) through the use of impedance analyzers and software-based LABVIEW interface.
- 28. LabVIEW LabVIEW, or Laboratory Virtual Instrument Engineering Workbench, is a graphical programming language that has been widely adopted throughout industry, academia, and research labs as the standard for data acquisition and instrument control.
- 29. The Virtual Instrument LabVIEW is based on the concept of the VI, or Virtual Instrument. A virtual instrument is a computer program that does the functions of one or more hardware instruments, and essentially replaces them.
- 30. Characterization of PZT thin films PZT thin film was sputtered onto a glass microscope slide using RF sputtering RF sputtering can be used for non-conductive materials, unlike DC sputtering
- 31. Sample Preparation Aluminum and Silver were sputtered on using DC sputtering, because they are conductive
- 32. PZT Sensor Sample Diagram
- 33. Optical Microscopy of Sample The optical microscopy images produced no blemishes of significance. The ones seen on this slide are attributed to dust on the sample (and/or lens).
- 34. Scanning Electron Microscopy (SEM) The SEM produced an image which shows small blemishes on the surface of the PZT thin-film. These could be attributed to damage to the PZT during handling, but could possibly represent imperfections on the sputtered surface on a scale of 10^(-6) meters.
- 35. X-Ray Diffraction (XRD) X-Ray Diffraction only detected the presence of Aluminum and Silver, not PZT, as our particular sample was amorphous. Note the peaks which correspond to Ag and Al.
- 36. Atomic Force Microscopy of the Sample
- 37. Atomic Force Microscopy of the Sample AFM shows that surface deflection remains at the nano scale (10^-9), which is insignificant compared to the thickness of the layer (10^-6).
- 38. Conclusion of LAMSS work From the data collected, we can conclude that through the use of RF sputtering, PZT thin film layers can be successfully deposited on a substrate surface for the purpose of using it as an integrated sensor.
- 39. Overview: Isaac E. Chao B.S. Materials Science and Engineering, Rutgers University, GPA 3.1/4.0 , May 2006 Work Experience Rutgers University MSE, 2004-2006 OFS Optics, 2004-2005 University of South Carolina: Laboratory for Active Materials and Smart Structures; Summer 2001, 2002, 2003