1
Atomic Layer Deposition
(ALD)
Presentation Overview
Presentation Overview
• Definition of ALD
Definition of ALD
• Brief history of ALD
Brief history of ALD
• ALD process and equipments
ALD process and equipments
• ALD applications
ALD applications
• Summary
Summary
Definition of ALD
Definition of ALD
• ALD is a method of applying thin
ALD is a method of applying thin
films to various substrates with
films to various substrates with
atomic scale precision.
atomic scale precision.
• Similar in chemistry to chemical vapor deposition (CVD),
Similar in chemistry to chemical vapor deposition (CVD),
except that the ALD reaction breaks the CVD reaction into
except that the ALD reaction breaks the CVD reaction into
two half-reactions, keeping the precursor materials separate
two half-reactions, keeping the precursor materials separate
during the reaction.
during the reaction.
• ALD film growth is self-limited and based on surface
ALD film growth is self-limited and based on surface
reactions, which makes achieving atomic scale deposition
reactions, which makes achieving atomic scale deposition
control possible.
control possible.
• By keeping the precursors separate throughout the coating
By keeping the precursors separate throughout the coating
process, atomic layer thickness control of film grown can be
process, atomic layer thickness control of film grown can be
obtained as fine as atomic/molecular scale per monolayer.
obtained as fine as atomic/molecular scale per monolayer.
Ref:
Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <
"Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki
/Atomic_Layer_Deposition>.
>.
Definition of ALD
Definition of ALD
• ALD is a method of applying thin films to various substrates
ALD is a method of applying thin films to various substrates
with atomic scale precision.
with atomic scale precision.
• Similar in chemistry to CVD, except
Similar in chemistry to CVD, except
that the ALD reaction breaks the CVD
that the ALD reaction breaks the CVD
reaction into two half-reactions,
reaction into two half-reactions,
keeping the precursor materials
keeping the precursor materials
separate during the reaction.
separate during the reaction.
• ALD film growth is self-limited and based on surface
ALD film growth is self-limited and based on surface
reactions, which makes achieving atomic scale deposition
reactions, which makes achieving atomic scale deposition
control possible.
control possible.
• By keeping the precursors separate throughout the coating
By keeping the precursors separate throughout the coating
process, atomic layer thickness control of film grown can be
process, atomic layer thickness control of film grown can be
obtained as fine as atomic/molecular scale per monolayer.
obtained as fine as atomic/molecular scale per monolayer.
Ref:
Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <
"Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki
/Atomic_Layer_Deposition>.
>.
• ALD is a method of applying thin films to various substrates
ALD is a method of applying thin films to various substrates
with atomic scale precision.
with atomic scale precision.
• Similar in chemistry to chemical vapor deposition (CVD),
Similar in chemistry to chemical vapor deposition (CVD),
except that the ALD reaction breaks the CVD reaction into
except that the ALD reaction breaks the CVD reaction into
two half-reactions, keeping the precursor materials separate
two half-reactions, keeping the precursor materials separate
during the reaction.
during the reaction.
• ALD film growth is
ALD film growth is self-limited and
based on surface reactions, which
which
makes achieving atomic scale
makes achieving atomic scale
deposition control possible.
deposition control possible.
• By keeping the precursors separate throughout the coating
By keeping the precursors separate throughout the coating
process, atomic layer thickness control of film grown can be
process, atomic layer thickness control of film grown can be
obtained as fine as atomic/molecular scale per monolayer.
obtained as fine as atomic/molecular scale per monolayer.
Definition of ALD
Definition of ALD
Ref:
Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <
"Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki
/Atomic_Layer_Deposition>.
>.
Definition of ALD
Definition of ALD
• ALD is a method of applying thin films to various substrates
ALD is a method of applying thin films to various substrates
with atomic scale precision.
with atomic scale precision.
• Similar in chemistry to chemical vapor deposition (CVD),
Similar in chemistry to chemical vapor deposition (CVD),
except that the ALD reaction breaks the CVD reaction into
except that the ALD reaction breaks the CVD reaction into
two half-reactions, keeping the precursor materials separate
two half-reactions, keeping the precursor materials separate
during the reaction.
during the reaction.
• ALD film growth is self-limited and based on surface
ALD film growth is self-limited and based on surface
reactions, which makes achieving atomic scale deposition
reactions, which makes achieving atomic scale deposition
control possible.
control possible.
• By keeping the precursors separate
By keeping the precursors separate
throughout the coating process, atomic
throughout the coating process, atomic
layer thickness control of film grown
layer thickness control of film grown
can be obtained as fine as
can be obtained as fine as
atomic/molecular scale per monolayer.
atomic/molecular scale per monolayer.
Ref:
Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <
"Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki
/Atomic_Layer_Deposition>.
>.
Brief History of ALD
Brief History of ALD
• Introduced in 1974 by Dr. Tuomo
Introduced in 1974 by Dr. Tuomo
Suntola and co-workers in Finland to
Suntola and co-workers in Finland to
improve the quality of ZnS films used
improve the quality of ZnS films used
in electroluminescent displays.
in electroluminescent displays.
• Recently, it turned out that ALD also produces outstanding
Recently, it turned out that ALD also produces outstanding
dielectric layers and attracts semiconductor industries for
dielectric layers and attracts semiconductor industries for
making High-K dielectric materials.
making High-K dielectric materials.
Ref:
Ref: "History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. <
"History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. <http://www.fmnt.fi
/index.pl?id=2913&isa=Category&op=show>.
>.
Brief History of ALD
Brief History of ALD
• Introduced in 1974 by Dr. Tuomo Suntola and co-workers in
Introduced in 1974 by Dr. Tuomo Suntola and co-workers in
Finland to improve the quality of ZnS films used in
Finland to improve the quality of ZnS films used in
electroluminescent displays.
electroluminescent displays.
• Recently, it turned out that ALD
Recently, it turned out that ALD
method also produces outstanding
method also produces outstanding
dielectric layers and attracted
dielectric layers and attracted
semiconductor industries for making
semiconductor industries for making
High-K dielectric materials.
High-K dielectric materials.
Ref:
Ref: "History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. <
"History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. <http://www.fmnt.fi
/index.pl?id=2913&isa=Category&op=show>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Releases sequential precursor gas
Releases sequential precursor gas
pulses to deposit a film one layer at a
pulses to deposit a film one layer at a
time on the substrate.
time on the substrate.
• The precursor gas is introduced into the process chamber and
The precursor gas is introduced into the process chamber and
produces a monolayer of gas on the wafer surface. A second
produces a monolayer of gas on the wafer surface. A second
precursor of gas is then introduced into the chamber reacting with the
precursor of gas is then introduced into the chamber reacting with the
first precursor to produce a monolayer of film on the wafer surface.
first precursor to produce a monolayer of film on the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition
deposition
• Since each pair of gas pulses (one cycle) produces exactly one
Since each pair of gas pulses (one cycle) produces exactly one
monolayer of film, the thickness of the resulting film may be precisely
monolayer of film, the thickness of the resulting film may be precisely
controlled by the number of deposition cycles.
controlled by the number of deposition cycles.
Ref:
Ref: A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous
A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous
Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06.
Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06.
<
<http://w3.rz-berlin.mpg.de/%7Ejentoft/lehre/catalysis0405.html>.
>.
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the
A first precursor gas is introduced into the
process chamber and produces a monolayer of
process chamber and produces a monolayer of
gas on the wafer surface. Then a second
gas on the wafer surface. Then a second
precursor of gas is introduced into the chamber
precursor of gas is introduced into the chamber
reacting with the first precursor to produce a
reacting with the first precursor to produce a
monolayer of film on the wafer surface.
monolayer of film on the wafer surface.
Two fundamental mechanisms:
 Chemisorption saturation process
 Sequential surface chemical reaction process
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition
deposition
• Since each pair of gas pulses (one cycle) produces exactly one monolayer of film,
Since each pair of gas pulses (one cycle) produces exactly one monolayer of film,
the thickness of the resulting film may be precisely controlled by the number of
the thickness of the resulting film may be precisely controlled by the number of
deposition cycles.
deposition cycles.
ALD Process and
ALD Process and
Equipments
Equipments
Ref:
Ref: A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous
A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous
Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06.
Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06.
<
<http://w3.rz-berlin.mpg.de/%7Ejentoft/lehre/catalysis0405.html>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (Step 1a)
deposition (Step 1a)
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech Inc.,
"Atomic Layer Deposition," Cambridge NanoTech Inc.,
24 April 06. <
24 April 06. <http://www.cambridgenanotech.com/>.
>.
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (Step 1b)
deposition (Step 1b)
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech
"Atomic Layer Deposition," Cambridge NanoTech
Inc., 24 April 06. <
Inc., 24 April 06. <http://www.cambridgenanotech.com/
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (Step 1c)
deposition (Step 1c)
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech
"Atomic Layer Deposition," Cambridge NanoTech
Inc., 24 April 06. <
Inc., 24 April 06. <http://www.cambridgenanotech.com/
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (Step 2a)
deposition (Step 2a)
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech
"Atomic Layer Deposition," Cambridge NanoTech
Inc., 24 April 06. <
Inc., 24 April 06. <http://www.cambridgenanotech.com/
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (Step 2b)
deposition (Step 2b)
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech
"Atomic Layer Deposition," Cambridge NanoTech
Inc., 24 April 06. <
Inc., 24 April 06. <http://www.cambridgenanotech.com/
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (Step 2c)
deposition (Step 2c)
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech
"Atomic Layer Deposition," Cambridge NanoTech
Inc., 24 April 06. <
Inc., 24 April 06. <http://www.cambridgenanotech.com/
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition (after 3 cycles)
deposition (after 3 cycles)
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a
A first precursor gas is introduced into the process chamber and produces a
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
monolayer of gas on the wafer surface. Then a second precursor of gas is introduced
into the chamber reacting with the first precursor to produce a monolayer of film on
into the chamber reacting with the first precursor to produce a monolayer of film on
the wafer surface.
the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
Ref:
Ref: "Atomic Layer Deposition," Cambridge NanoTech
"Atomic Layer Deposition," Cambridge NanoTech
Inc., 24 April 06. <
Inc., 24 April 06. <http://www.cambridgenanotech.com/
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
• Releases sequential precursor gas pulses to deposit a film one layer at a time.
Releases sequential precursor gas pulses to deposit a film one layer at a time.
• A first precursor gas is introduced into the process chamber and produces a monolayer of
A first precursor gas is introduced into the process chamber and produces a monolayer of
gas on the wafer surface. Then a second precursor of gas is introduced into the chamber
gas on the wafer surface. Then a second precursor of gas is introduced into the chamber
reacting with the first precursor to produce a monolayer of film on the wafer surface.
reacting with the first precursor to produce a monolayer of film on the wafer surface.
Two fundamental mechanisms:
Two fundamental mechanisms:
 Chemisorption saturation process
Chemisorption saturation process
 Sequential surface chemical reaction process
Sequential surface chemical reaction process
• Example: ALD cycle for Al
Example: ALD cycle for Al2
2O
O3
3 deposition
deposition
• Since each pair of gas
Since each pair of gas
pulses (one cycle) produces
pulses (one cycle) produces
exactly one monolayer of
exactly one monolayer of
film, the thickness of the
film, the thickness of the
resulting film may be
resulting film may be
precisely controlled by the
precisely controlled by the
number of deposition
number of deposition
cycles.
cycles.
Ref:
Ref: "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <www.
icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf>.
>.
Step coverage and deposition rate Vs.
Step coverage and deposition rate Vs.
deposition technique.
deposition technique.
ALD Process and
ALD Process and
Equipments
Equipments
Four main types of ALD reactors
Four main types of ALD reactors
• Closed system chambers
Closed system chambers
• Open system chambers
Open system chambers
• Semi-closed system chambers
Semi-closed system chambers
• Semi-open system chambers
Semi-open system chambers
ALD Process and
ALD Process and
Equipments
Equipments
Four main types of ALD reactors
Four main types of ALD reactors
• Closed system chambers (most common)
Closed system chambers (most common)
• Open system chambers
Open system chambers
• Semi-closed system chambers
Semi-closed system chambers
• Semi-open system chambers
Semi-open system chambers


ALD Process and
ALD Process and
Equipments
Equipments
Four main types of ALD reactors
Four main types of ALD reactors
• Closed system chambers
Closed system chambers (most common)
(most common)
 The reaction chamber walls are designed to effect the
The reaction chamber walls are designed to effect the
transport of the precursors.
transport of the precursors.
• Open system chambers
Open system chambers
• Semi-closed system chambers
Semi-closed system chambers
• Semi-open system chambers
Semi-open system chambers
Schematic of
a closed ALD
system
Ref:
Ref: "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April
06. <
06. <
www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf
>.
>.
ALD Process and
ALD Process and
Equipments
Equipments
The Verano 5500™
A 300-mm ALD system by
Aviza Technology, Inc [2].
Process Temperature [1]
[1] [1]
1
1
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <
www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf
>
>
2
2
”Atomic Layer Deposition," Aviza Technology. 26 April 06.
”Atomic Layer Deposition," Aviza Technology. 26 April 06.
<
<http://www.avizatechnology.com/products/verano.shtml
>.
ALD Process and
ALD Process and
Equipments
Equipments
The Verano 5500™
A 300-mm ALD system by
Aviza Technology, Inc [2].
One cycle
Process Temperature [1]
Process Temperature [1]
[1] [1]
Acceptable
temperature range
for deposition.
1
1
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <
www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf>.
>.
2
2
”Atomic Layer Deposition," Aviza Technology. 26 April 06.
”Atomic Layer Deposition," Aviza Technology. 26 April 06.
<
<http://www.avizatechnology.com/products/verano.shtml
>.
ALD Applications
ALD Applications
• High-K dielectrics for CMOS
High-K dielectrics for CMOS
• Semiconductor memory (DRAM)
Semiconductor memory (DRAM)
• Cu interconnect barrier
Cu interconnect barrier
• Deposition in porous structures
Deposition in porous structures
ALD Applications
ALD Applications
• High-K dielectrics for CMOS
High-K dielectrics for CMOS
• Semiconductor memory (DRAM)
Semiconductor memory (DRAM)
• Cu interconnect barrier
Cu interconnect barrier
• Deposition in porous structures
Deposition in porous structures


Candidates for High-K dielectrics
Candidates for High-K dielectrics
Film
Film Precursors
Precursors
Al
Al2
2O
O3
3 Al(CH)
Al(CH)3
3, H
, H2
2O or O
O or O3
3
HfO
HfO2
2 HfCl
HfCl4
4 or TEMAH, H
or TEMAH, H2
2O
O
ZrO
ZrO2
2 ZrCl
ZrCl4
4, H
, H2
2O
O
ALD Applications
ALD Applications
• High-K dielectrics for CMOS
High-K dielectrics for CMOS
• Reduces leakage current
• Faster switching speed
• Cooler transistors
Ref: "Intel's High-k/Metal Gate Announcement," Intel®
Corporation. 26 April,
06. <http://www.intel.com/technology/silicon/micron.htm#high>.
ALD Applications
ALD Applications
• High-K dielectrics for CMOS
High-K dielectrics for CMOS
• Semiconductor memory (DRAM)
Semiconductor memory (DRAM)
• Cu interconnect barrier
Cu interconnect barrier
• Deposition in porous structures
Deposition in porous structures
All these applications take
advantage of uniformity,
conformal step coverage,
precise thickness control
of deposited films, which
can be achieved by ALD
deposition method.
Step coverage and deposition rate Vs.
Step coverage and deposition rate Vs.
deposition technique.
deposition technique.
Ref:
Ref: "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April
"Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April
06. <
06. <
www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf
>.
>.
Summary
Summary
• Advantages
Advantages
 Stoichiometric films with large area uniformity and 3D
Stoichiometric films with large area uniformity and 3D
conformality.
conformality.
 Precise thickness control.
Precise thickness control.
 Low temperature deposition possible.
Low temperature deposition possible.
 Gentle deposition process for sensitive substrates.
Gentle deposition process for sensitive substrates.
• Disadvantages
Disadvantages
 Deposition Rate slower than CVD.
Deposition Rate slower than CVD.
 Number of different material that can be deposited is fair
Number of different material that can be deposited is fair
compared to MBE.
compared to MBE.

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Atomic Layer Depositionnnnwerantyjsty.ppt

  • 2. Presentation Overview Presentation Overview • Definition of ALD Definition of ALD • Brief history of ALD Brief history of ALD • ALD process and equipments ALD process and equipments • ALD applications ALD applications • Summary Summary
  • 3. Definition of ALD Definition of ALD • ALD is a method of applying thin ALD is a method of applying thin films to various substrates with films to various substrates with atomic scale precision. atomic scale precision. • Similar in chemistry to chemical vapor deposition (CVD), Similar in chemistry to chemical vapor deposition (CVD), except that the ALD reaction breaks the CVD reaction into except that the ALD reaction breaks the CVD reaction into two half-reactions, keeping the precursor materials separate two half-reactions, keeping the precursor materials separate during the reaction. during the reaction. • ALD film growth is self-limited and based on surface ALD film growth is self-limited and based on surface reactions, which makes achieving atomic scale deposition reactions, which makes achieving atomic scale deposition control possible. control possible. • By keeping the precursors separate throughout the coating By keeping the precursors separate throughout the coating process, atomic layer thickness control of film grown can be process, atomic layer thickness control of film grown can be obtained as fine as atomic/molecular scale per monolayer. obtained as fine as atomic/molecular scale per monolayer. Ref: Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. < "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki /Atomic_Layer_Deposition>. >.
  • 4. Definition of ALD Definition of ALD • ALD is a method of applying thin films to various substrates ALD is a method of applying thin films to various substrates with atomic scale precision. with atomic scale precision. • Similar in chemistry to CVD, except Similar in chemistry to CVD, except that the ALD reaction breaks the CVD that the ALD reaction breaks the CVD reaction into two half-reactions, reaction into two half-reactions, keeping the precursor materials keeping the precursor materials separate during the reaction. separate during the reaction. • ALD film growth is self-limited and based on surface ALD film growth is self-limited and based on surface reactions, which makes achieving atomic scale deposition reactions, which makes achieving atomic scale deposition control possible. control possible. • By keeping the precursors separate throughout the coating By keeping the precursors separate throughout the coating process, atomic layer thickness control of film grown can be process, atomic layer thickness control of film grown can be obtained as fine as atomic/molecular scale per monolayer. obtained as fine as atomic/molecular scale per monolayer. Ref: Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. < "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki /Atomic_Layer_Deposition>. >.
  • 5. • ALD is a method of applying thin films to various substrates ALD is a method of applying thin films to various substrates with atomic scale precision. with atomic scale precision. • Similar in chemistry to chemical vapor deposition (CVD), Similar in chemistry to chemical vapor deposition (CVD), except that the ALD reaction breaks the CVD reaction into except that the ALD reaction breaks the CVD reaction into two half-reactions, keeping the precursor materials separate two half-reactions, keeping the precursor materials separate during the reaction. during the reaction. • ALD film growth is ALD film growth is self-limited and based on surface reactions, which which makes achieving atomic scale makes achieving atomic scale deposition control possible. deposition control possible. • By keeping the precursors separate throughout the coating By keeping the precursors separate throughout the coating process, atomic layer thickness control of film grown can be process, atomic layer thickness control of film grown can be obtained as fine as atomic/molecular scale per monolayer. obtained as fine as atomic/molecular scale per monolayer. Definition of ALD Definition of ALD Ref: Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. < "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki /Atomic_Layer_Deposition>. >.
  • 6. Definition of ALD Definition of ALD • ALD is a method of applying thin films to various substrates ALD is a method of applying thin films to various substrates with atomic scale precision. with atomic scale precision. • Similar in chemistry to chemical vapor deposition (CVD), Similar in chemistry to chemical vapor deposition (CVD), except that the ALD reaction breaks the CVD reaction into except that the ALD reaction breaks the CVD reaction into two half-reactions, keeping the precursor materials separate two half-reactions, keeping the precursor materials separate during the reaction. during the reaction. • ALD film growth is self-limited and based on surface ALD film growth is self-limited and based on surface reactions, which makes achieving atomic scale deposition reactions, which makes achieving atomic scale deposition control possible. control possible. • By keeping the precursors separate By keeping the precursors separate throughout the coating process, atomic throughout the coating process, atomic layer thickness control of film grown layer thickness control of film grown can be obtained as fine as can be obtained as fine as atomic/molecular scale per monolayer. atomic/molecular scale per monolayer. Ref: Ref: "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. < "Atomic Layer Deposition," Wikipedia: The Free Encyclopedia, Wikimedia Foundation, 24 April 06. <http://en.wikipedia.org/wiki /Atomic_Layer_Deposition>. >.
  • 7. Brief History of ALD Brief History of ALD • Introduced in 1974 by Dr. Tuomo Introduced in 1974 by Dr. Tuomo Suntola and co-workers in Finland to Suntola and co-workers in Finland to improve the quality of ZnS films used improve the quality of ZnS films used in electroluminescent displays. in electroluminescent displays. • Recently, it turned out that ALD also produces outstanding Recently, it turned out that ALD also produces outstanding dielectric layers and attracts semiconductor industries for dielectric layers and attracts semiconductor industries for making High-K dielectric materials. making High-K dielectric materials. Ref: Ref: "History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. < "History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. <http://www.fmnt.fi /index.pl?id=2913&isa=Category&op=show>. >.
  • 8. Brief History of ALD Brief History of ALD • Introduced in 1974 by Dr. Tuomo Suntola and co-workers in Introduced in 1974 by Dr. Tuomo Suntola and co-workers in Finland to improve the quality of ZnS films used in Finland to improve the quality of ZnS films used in electroluminescent displays. electroluminescent displays. • Recently, it turned out that ALD Recently, it turned out that ALD method also produces outstanding method also produces outstanding dielectric layers and attracted dielectric layers and attracted semiconductor industries for making semiconductor industries for making High-K dielectric materials. High-K dielectric materials. Ref: Ref: "History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. < "History of Atomic Layer Deposition (ALD)," Finnish MicroNanoTechnology Network (FMNT), 24 April 2006. <http://www.fmnt.fi /index.pl?id=2913&isa=Category&op=show>. >.
  • 9. ALD Process and ALD Process and Equipments Equipments • Releases sequential precursor gas Releases sequential precursor gas pulses to deposit a film one layer at a pulses to deposit a film one layer at a time on the substrate. time on the substrate. • The precursor gas is introduced into the process chamber and The precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. A second produces a monolayer of gas on the wafer surface. A second precursor of gas is then introduced into the chamber reacting with the precursor of gas is then introduced into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. first precursor to produce a monolayer of film on the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition deposition • Since each pair of gas pulses (one cycle) produces exactly one Since each pair of gas pulses (one cycle) produces exactly one monolayer of film, the thickness of the resulting film may be precisely monolayer of film, the thickness of the resulting film may be precisely controlled by the number of deposition cycles. controlled by the number of deposition cycles. Ref: Ref: A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06. Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06. < <http://w3.rz-berlin.mpg.de/%7Ejentoft/lehre/catalysis0405.html>. >.
  • 10. • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the A first precursor gas is introduced into the process chamber and produces a monolayer of process chamber and produces a monolayer of gas on the wafer surface. Then a second gas on the wafer surface. Then a second precursor of gas is introduced into the chamber precursor of gas is introduced into the chamber reacting with the first precursor to produce a reacting with the first precursor to produce a monolayer of film on the wafer surface. monolayer of film on the wafer surface. Two fundamental mechanisms:  Chemisorption saturation process  Sequential surface chemical reaction process • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition deposition • Since each pair of gas pulses (one cycle) produces exactly one monolayer of film, Since each pair of gas pulses (one cycle) produces exactly one monolayer of film, the thickness of the resulting film may be precisely controlled by the number of the thickness of the resulting film may be precisely controlled by the number of deposition cycles. deposition cycles. ALD Process and ALD Process and Equipments Equipments Ref: Ref: A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous A. Knop–Gericke, "Preparation of Model Systems by Physical Methods," a lecture given at Modern Methods in Heterogeneous Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06. Catalysis Research Lecture Series, Fritz Haber Institute of the Max Planck Society. 24 April 06. < <http://w3.rz-berlin.mpg.de/%7Ejentoft/lehre/catalysis0405.html>. >.
  • 11. ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (Step 1a) deposition (Step 1a) • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech Inc., "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < 24 April 06. <http://www.cambridgenanotech.com/>. >.
  • 12. • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (Step 1b) deposition (Step 1b) Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < Inc., 24 April 06. <http://www.cambridgenanotech.com/ >. >.
  • 13. ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (Step 1c) deposition (Step 1c) • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < Inc., 24 April 06. <http://www.cambridgenanotech.com/ >. >.
  • 14. ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (Step 2a) deposition (Step 2a) • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < Inc., 24 April 06. <http://www.cambridgenanotech.com/ >. >.
  • 15. ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (Step 2b) deposition (Step 2b) • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < Inc., 24 April 06. <http://www.cambridgenanotech.com/ >. >.
  • 16. ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (Step 2c) deposition (Step 2c) • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < Inc., 24 April 06. <http://www.cambridgenanotech.com/ >. >.
  • 17. ALD Process and ALD Process and Equipments Equipments • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition (after 3 cycles) deposition (after 3 cycles) • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process Ref: Ref: "Atomic Layer Deposition," Cambridge NanoTech "Atomic Layer Deposition," Cambridge NanoTech Inc., 24 April 06. < Inc., 24 April 06. <http://www.cambridgenanotech.com/ >. >.
  • 18. ALD Process and ALD Process and Equipments Equipments • Releases sequential precursor gas pulses to deposit a film one layer at a time. Releases sequential precursor gas pulses to deposit a film one layer at a time. • A first precursor gas is introduced into the process chamber and produces a monolayer of A first precursor gas is introduced into the process chamber and produces a monolayer of gas on the wafer surface. Then a second precursor of gas is introduced into the chamber gas on the wafer surface. Then a second precursor of gas is introduced into the chamber reacting with the first precursor to produce a monolayer of film on the wafer surface. reacting with the first precursor to produce a monolayer of film on the wafer surface. Two fundamental mechanisms: Two fundamental mechanisms:  Chemisorption saturation process Chemisorption saturation process  Sequential surface chemical reaction process Sequential surface chemical reaction process • Example: ALD cycle for Al Example: ALD cycle for Al2 2O O3 3 deposition deposition • Since each pair of gas Since each pair of gas pulses (one cycle) produces pulses (one cycle) produces exactly one monolayer of exactly one monolayer of film, the thickness of the film, the thickness of the resulting film may be resulting film may be precisely controlled by the precisely controlled by the number of deposition number of deposition cycles. cycles. Ref: Ref: "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. <www. icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf>. >. Step coverage and deposition rate Vs. Step coverage and deposition rate Vs. deposition technique. deposition technique.
  • 19. ALD Process and ALD Process and Equipments Equipments Four main types of ALD reactors Four main types of ALD reactors • Closed system chambers Closed system chambers • Open system chambers Open system chambers • Semi-closed system chambers Semi-closed system chambers • Semi-open system chambers Semi-open system chambers
  • 20. ALD Process and ALD Process and Equipments Equipments Four main types of ALD reactors Four main types of ALD reactors • Closed system chambers (most common) Closed system chambers (most common) • Open system chambers Open system chambers • Semi-closed system chambers Semi-closed system chambers • Semi-open system chambers Semi-open system chambers  
  • 21. ALD Process and ALD Process and Equipments Equipments Four main types of ALD reactors Four main types of ALD reactors • Closed system chambers Closed system chambers (most common) (most common)  The reaction chamber walls are designed to effect the The reaction chamber walls are designed to effect the transport of the precursors. transport of the precursors. • Open system chambers Open system chambers • Semi-closed system chambers Semi-closed system chambers • Semi-open system chambers Semi-open system chambers Schematic of a closed ALD system Ref: Ref: "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < 06. < www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf >. >.
  • 22. ALD Process and ALD Process and Equipments Equipments The Verano 5500™ A 300-mm ALD system by Aviza Technology, Inc [2]. Process Temperature [1] [1] [1] 1 1 "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf > > 2 2 ”Atomic Layer Deposition," Aviza Technology. 26 April 06. ”Atomic Layer Deposition," Aviza Technology. 26 April 06. < <http://www.avizatechnology.com/products/verano.shtml >.
  • 23. ALD Process and ALD Process and Equipments Equipments The Verano 5500™ A 300-mm ALD system by Aviza Technology, Inc [2]. One cycle Process Temperature [1] Process Temperature [1] [1] [1] Acceptable temperature range for deposition. 1 1 "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf>. >. 2 2 ”Atomic Layer Deposition," Aviza Technology. 26 April 06. ”Atomic Layer Deposition," Aviza Technology. 26 April 06. < <http://www.avizatechnology.com/products/verano.shtml >.
  • 24. ALD Applications ALD Applications • High-K dielectrics for CMOS High-K dielectrics for CMOS • Semiconductor memory (DRAM) Semiconductor memory (DRAM) • Cu interconnect barrier Cu interconnect barrier • Deposition in porous structures Deposition in porous structures
  • 25. ALD Applications ALD Applications • High-K dielectrics for CMOS High-K dielectrics for CMOS • Semiconductor memory (DRAM) Semiconductor memory (DRAM) • Cu interconnect barrier Cu interconnect barrier • Deposition in porous structures Deposition in porous structures  
  • 26. Candidates for High-K dielectrics Candidates for High-K dielectrics Film Film Precursors Precursors Al Al2 2O O3 3 Al(CH) Al(CH)3 3, H , H2 2O or O O or O3 3 HfO HfO2 2 HfCl HfCl4 4 or TEMAH, H or TEMAH, H2 2O O ZrO ZrO2 2 ZrCl ZrCl4 4, H , H2 2O O ALD Applications ALD Applications • High-K dielectrics for CMOS High-K dielectrics for CMOS • Reduces leakage current • Faster switching speed • Cooler transistors Ref: "Intel's High-k/Metal Gate Announcement," Intel® Corporation. 26 April, 06. <http://www.intel.com/technology/silicon/micron.htm#high>.
  • 27. ALD Applications ALD Applications • High-K dielectrics for CMOS High-K dielectrics for CMOS • Semiconductor memory (DRAM) Semiconductor memory (DRAM) • Cu interconnect barrier Cu interconnect barrier • Deposition in porous structures Deposition in porous structures All these applications take advantage of uniformity, conformal step coverage, precise thickness control of deposited films, which can be achieved by ALD deposition method. Step coverage and deposition rate Vs. Step coverage and deposition rate Vs. deposition technique. deposition technique. Ref: Ref: "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April "Technology Backgrounder: Atomic Layer Deposition," IC Knowledge LLC, 24 April 06. < 06. < www.icknowledge.com/misc_technology/Atomic%20Layer%20Deposition%20Briefing.pdf >. >.
  • 28. Summary Summary • Advantages Advantages  Stoichiometric films with large area uniformity and 3D Stoichiometric films with large area uniformity and 3D conformality. conformality.  Precise thickness control. Precise thickness control.  Low temperature deposition possible. Low temperature deposition possible.  Gentle deposition process for sensitive substrates. Gentle deposition process for sensitive substrates. • Disadvantages Disadvantages  Deposition Rate slower than CVD. Deposition Rate slower than CVD.  Number of different material that can be deposited is fair Number of different material that can be deposited is fair compared to MBE. compared to MBE.