This document presents a method for automatic diagnosis of abnormal tumor regions in brain CT images using wavelet-based statistical texture analysis. The proposed system involves discrete wavelet decomposition, feature extraction via co-occurrence matrices, genetic algorithm for feature selection, and classification using support vector machine (SVM) and back propagation neural network (BPN) classifiers, achieving a classification accuracy of 96%. The research emphasizes the importance of texture analysis in enhancing diagnostic processes in medical imaging.