Example-BB Electronic
- 1. Sponsor Peter Zhou Coach Peter Zhou Champion XXXXX Leader XXXX Team Member XXXX, XXXX XXXX ABCD Product AOI First Time Yield Improvement Oct 13, 2008 1
- 2. Continental/Tianjin - Chrysler ALCOA AM I CD 2
- 3. CTQ & CTP Chart CTQ CCR Customer Issues VOC Pin Position return ppm No Positioning defects during AOI test (Meet Spec: +/- 0.4mm) Pin positioning problem will cause ALCOA assembly line problem TIPM board not reliable enough VOB Business Issues CBR CTP High scrap rate (14%FYI) Low output rate with high cost Improve FTY% by 10% at least from current 86% Reduce Misalignment defect rate Remark 1. Voice of customer and voice of business to be prioritized to those which are related to project objective 2. Use VOB or VOC or both depending on the project objectives AM I CD 3
- 4. F/E Process AOI and Packing process ICT PC Board Loading Screen Print Component Placement Solder Reflow UMG Machine Loading 2nd UMG Machine Coating Machine Function test AOI Tester for Complaint pins AOI Tester for Tuning fork pins Finished Good Packing Shipping to customer Process Flow AM I CD 4
- 5. Yield Current Performance – Pin Misalignment Y = Scrap Rate TIPM Product AOI First Time Yield Performance Trend 75.00% 80.00% 85.00% 90.00% 95.00% 100.00% 28-Oct-07 29-Oct-07 30-Oct-07 31-Oct-07 1-Nov-07 2-Nov-07 3-Nov-07 4-Nov-07 5-Nov-07 6-Nov-07 7-Nov-07 8-Nov-07 9-Nov-07 10-Nov-07 % Average 86% y = Pins Position Defect Rate AM I CD 5
- 7. Team Charter Project Selection ID CCR Team Charter Build Team Map Process Financial Estimation Goal Statement Indicator Baseline Target Target Date Process Output 86% 96% Aug 1st 2008 Finance …… Saving 200k Aug 1st 2008 Subsequent Team Selection Sponsor/Champion: Scott Stryker/Chrysler, Angie Liu/Continental Team leader.: XXX 35% - Con% Team member: Michael Quality engineer 35% Wang Test engineer 10% Cao line leader 5% Han Quality engineer 5% Zhang Process engineer 5% White Production super. 5% Project Schedule Phase Start End Remark Define 11/30/2007 12/15/2007 Measure 12/15/2007 01/15/2008 Analyze 01/15/2008 04/28/2008 Improve 04/28/2008 05/30/2008 Control 05/30/2008 07/30/2008 Business Case Chrysler is the biggest customer for XXX factory. TIPM for Chrysler has been launched since end 2006. It is brand-new design product for Continental/Tianjin, which has two sides pin on the top and bottom PCB slide. As the pin straightness (perpendicular to the board) is very important to customer assembly process, therefore Tianjin factory install AOI test for inspection, but the first time yield FTY% can’t meet the target which is above 96%. Opportunity Statement If we can meet FTY target 96%, we can achieve saving at least 200k and meet customer requirement accordingly. On time delivery will also be assured. Project Scope Process Front End Process Start Point UMG Station End Point Packing process Scope Focus on Tianjin facility for TIPM product 7
- 8. TIPM Product AOI First Time Yield Daily Performance Trend 65.00% 70.00% 75.00% 80.00% 85.00% 90.00% 95.00% 28-Oct-07 29-Oct-07 30-Oct-07 31-Oct-07 1-Nov-07 2-Nov-07 3-Nov-07 4-Nov-07 5-Nov-07 6-Nov-07 7-Nov-07 8-Nov-07 9-Nov-07 10-Nov-07 11-Nov-07 12-Nov-07 13-Nov-07 14-Nov-07 15-Nov-07 16-Nov-07 17-Nov-07 18-Nov-07 19-Nov-07 20-Nov-07 21-Nov-07 22-Nov-07 23-Nov-07 24-Nov-07 % 86% 88% Quick Win Opportunity Yield Improved to 88% by Implement three Opportunities from Quick Win AM I CD 8
- 9. Pin Misalignment Position Complaint Bent pin TIPM Medium The complaint pin use the mechanical connective design, The tail of complain pin directly contact PCB through hole without any soldering. So they are more easily bent during normal production process. X Direction Y Direction Bent Pins AM I CD 9
- 10. Pin Misalignment Position J4-37 J4-11 J2- 17 Bent Pin Most Happened Position Is On Then Edge of PCB Board AM I CD 10
- 11. Pin Misalignment Position Position Pareto chart for Real bent pin The Pareto chart show the major bent pin issue are from the compliant pin and occurred more frequently at position J4-37 & J2-17. AM I CD 11
- 12. MachineManpower Drop to The Ground Transportation Shock Material Tilted Pin Wrong Handling Mounting Machine Temperature Chamber ICT Machine Operator Touch Up Separation Machine Coating Machine Function Fixture Method Unsafe Package In Process Process Flow Pin Handing Temp Test Time Oven Temp, Time PCB Hole Tilt Pin Roller Defect Fishbone Diagram Pin Snap Slot Defect (Top Layer pin may be touched accidentally) Unsafe Package after AOI AM I CD Different Pin Position 12
- 14. MachineManpower Drop to The Ground Transportation Shock Material Tilted Pin Wrong Handling UMG Mounting Machine Temperature Test ICT Machine Operator Touch Up Separation Machine Routing Machine Function Fixture Method Unsafe Package In Process Process Flow Pin Handing Temp Test Time Oven Temp, Time PCB Hole Tilt Pin Roller Defect Fishbone Diagram Pin Snap Slot Defect (Top Layer pin may be touched accidentally) Unsafe Package after AOI AM I CD Different Pin Position 14
- 15. UMG Mounting Machine Temperature Test ICT Machine Operator Touch Up Routing Machine Unsafe Package In Process Pin Snap Slot Defect AM I CDScreening Function Fixture 15
- 16. Data Collection Plan ID IPO Indicators Collect Data MSA Process Capability Remarks: Other data refers to additional information from stratification perspective. Performance measure (Y) Operational definition Data source and location Sample size Who will collect the data When will data be collected How will data be collected Other data that should be collected at the same time PIN Misalignment Rate Pin Straightness Requirement (+/- 0.4mm) AOI Tester 100% QA Nov 07 AOI Tester Process / Input (X) Operational definition Data source and location Sample size Who will collect the data When will data be collected How will data be collected Other data that should be collected at the same time Pin Position Measure Pin Position Jasper System 100% Jasper System Every Shift Jasper System - 16
- 17. MSA Results MSA study on these test items To ensure the data are reasonable, we will do MSA study for AOI 1 tester These AOI Tester GR&R% are all less than 10% , acceptable! See the MSA_Demo.PPT for the GR&R% study demonstration. AM I CD 17
- 18. Pin Misalignment distribution Check the TOP defect data distribution, The P-value is more than 0.05. It is normal distribution. But the mean value deviation to spec center, which need further analysis. 300225150750-75 Median Mean 11010510095908580 1st Q uartile 23.500 Median 99.500 3rd Q uartile 168.750 Maximum 308.000 84.558 107.163 82.113 113.000 88.722 104.768 A -Squared 0.72 P-V alue 0.061 Mean 95.861 StDev 96.076 V ariance 9230.529 Skewness -0.082150 Kurtosis -0.688619 N 280 Minimum -130.000 A nderson-Darling Normality Test 95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev 95% Confidence Intervals Summary for Y_j2-17 -60-120-180-240-300-360 Median Mean -160-165-170-175-180-185-190 1st Q uartile -214.75 Median -169.50 3rd Q uartile -134.25 Maximum -21.00 -186.81 -170.63 -187.00 -163.00 61.01 72.50 A -Squared 0.70 P-V alue 0.066 Mean -178.72 StDev 66.26 V ariance 4389.96 Skewness -0.295591 Kurtosis -0.063028 N 260 Minimum -352.00 A nderson-Darling Normality Test 95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev 95% Confidence Intervals Summary for X_j2-17 3002001000-100-200-300 Median Mean 1051009590858075 1st Q uartile 25.500 Median 84.000 3rd Q uartile 154.500 Maximum 369.000 76.747 100.411 75.485 104.545 93.773 110.569 A -Squared 0.72 P-V alue 0.058 Mean 88.579 StDev 101.477 V ariance 10297.505 Skewness -0.240282 Kurtosis 0.998535 N 285 Minimum -319.000 A nderson-Darling Normality Test 95% C onfidence Interv al for Mean 95% C onfidence Interv al for Median 95% C onfidence Interv al for StDev 95% Confidence Intervals Summary for X_j4-37 AM I CD 18
- 19. IndividualValue 272421181512963 0 -200 -400 _ X=-181.7 UCL=2.6 LCL=-366.0 MovingRange 272421181512963 200 100 0 __ MR=69.3 UCL=226.4 LCL=0 Observation Values 252015105 0 -150 -300 -50-100-150-200-250-300-350 0-200-400 Within Overall Specs Within StDev 61.43289 C p 2.17 C pk 1.18 C C pk 2.17 O v erall StDev 67.56258 Pp 1.97 Ppk 1.08 C pm * Process Capability Sixpack of Before I Chart Moving Range Chart Last 25 Observations Capability Histogram Normal Prob Plot A D: 0.234, P: 0.775 Capability Plot Bent pin Analysis Cp/Cpk study for “Bent pin ”: CPK: 1.18 AM I CDCapability Analysis 19
- 20. Key Process Characteristics Identified During Measurement Phase Shows That Four Stations Need To Be Focus On… AM I CDInitial Analysis UMG Mounting Machine Temperature Test/Chamber ICT Machine Operator Touch Up Routing Machine Unsafe Package In Process Pin Snap Slot Defect Function Fixture 20
- 21. UMG Machine ICT Machine Routing Chamber & 3-temp. Testing Same Lot PCB Board Go Through Four Processes, Pin Position Data Were Taken To Analysis & Identify The Key Process AM I CDANOVA 21
- 22. Bent Pin Analysis – Independent and Normality Test 300250200150100500-50 99 95 90 80 70 60 50 40 30 20 10 5 1 Measure UMG Percent Mean 119.8 StDev 66.91 N 30 AD 0.435 P-Value 0.281 Probability Plot of Measure UMG Normal p-values > 0.05, normal distribution! 30282624222018161412108642 250 200 150 100 50 0 Observation MeasureUMG Number of runs about median: 13 Expected number of runs: 16.0 Longest run about median: 8 Approx P-Value for Clustering: 0.132 Approx P-Value for Mixtures: 0.868 Number of runs up or down: 20 Expected number of runs: 19.7 Longest run up or down: 3 Approx P-Value for Trends: 0.559 Approx P-Value for Oscillation: 0.441 Run Chart of Measure UMG 30282624222018161412108642 300 200 100 0 -100 Observation MeasureICT Number of runs about median: 17 Expected number of runs: 16.0 Longest run about median: 4 Approx P-Value for Clustering: 0.645 Approx P-Value for Mixtures: 0.355 Number of runs up or down: 21 Expected number of runs: 19.7 Longest run up or down: 3 Approx P-Value for Trends: 0.724 Approx P-Value for Oscillation: 0.276 Run Chart of Measure ICT 30282624222018161412108642 250 200 150 100 50 0 Observation MeasureRouter Number of runs about median: 13 Expected number of runs: 16.0 Longest run about median: 6 Approx P-Value for Clustering: 0.132 Approx P-Value for Mixtures: 0.868 Number of runs up or down: 22 Expected number of runs: 19.7 Longest run up or down: 2 Approx P-Value for Trends: 0.851 Approx P-Value for Oscillation: 0.149 Run Chart of Measure Router 3002001000-100 99 95 90 80 70 60 50 40 30 20 10 5 1 Measure ICT Percent Mean 125 StDev 66.76 N 30 AD 0.378 P-Value 0.385 Probability Plot of Measure ICT Normal p-values > 0.05, normal distribution! 250200150100500 99 95 90 80 70 60 50 40 30 20 10 5 1 Measure Router Percent Mean 116.5 StDev 54.66 N 30 AD 0.405 P-Value 0.332 Probability Plot of Measure Router Normal p-values > 0.05, normal distribution! All 4 p-values > 0.05, data are independent! AM I CDData Analysis 22
- 23. ANOVA For All Related Process Data Measure 3-tempMeasure ICTMeasure RouterMeasure UMG 300 200 100 0 -100 Boxplot of Measure UMG, Measure Router, Measure ICT, Measure 3-temp Process 95% Bonferroni Confidence Intervals for StDevs Measure Router Measure ICT Measure 3-temp Measure UMG 10090807060504030 Bartlett's Test 0.394 Test Statistic 7.43 P-Value 0.059 Levene's Test Test Statistic 1.00 P-Value Test for Equal Variances for Measure Measure 3 –Temp caused the most difference (Mean Shift a lot as compared with the other 3 process). Equal Variance showed at the test. AM I CD 23
- 24. Why the 3-temp test process contribute the most Put unit into the trays Put into cold chamber Cold temperature function test Put unit into the trays Put into hot chamber Room temperature function test AOI test equipment Input From Front Line To packing station ? 3 – Temp Test Steps Breakdown AM I CDTemperature Inspection 24
- 25. MachineManpower Transportation Shock Material Tilted Pin Wrong Handling High Temp Chamber +85 Degree C Function Test Fixture Low Temp Chamber -40 Degree C Operator Touch Up Conveyor Method Unsafe Package In Process Process Flow Temperature PCB Hole Tilt Pin Roller Defect Fishbone Diagram Pin Snap Slot Defect AM I CD 25
- 26. SOV Chamber Measure 8540 -50 -100 -150 -200 -250 Fixture 1 2 Multi-Vari Chart for Measure by Fixture - Chamber Chamber 1 -40 Degree C 1 Chamber Fixture Chamber 2 +85 Degree C 2 1 2 Conduct Source Of Variation Studies (SOV) AM I CD 26
- 27. UMG Mounting Machine Temperature Test/Chamber ICT Machine Operator Touch Up Routing Machine Unsafe Package In Process Pin Snap Slot Defect Screening Chamber Temperature Function Fixture AM I CD Function Fixture Chamber Measure 8540 -50 -100 -150 -200 -250 Fixture 1 2 Multi-Vari Chart for Measure by Fixture - Chamber 27
- 28. Fixture 1 Fixture 2 Comparison Mfg Date Same Same Maintenance Schedule Same Same Open Angle 85 degree 70 degree Operation Force 16 Ib 20 Ib Close Angle 6 degree 2 degree Operator A B Usage Rate Same Same AM I CDSetting Comparison 28
- 29. Objective of DOE Condition I: -45 Degree C Condition II: 85 Degree C Level 1 Level 2 Level 1 Level 2 Open Angle 85 degree 70 degree 85 degree 70 degree Open Force 16 Ib 20 Ib 16 Ib 20 Ib Close Angle 6 degree 2 degree 6 degree 2 degree In order to minimize the pin bent possibility, plan to design an experiment to optimize all the factors… AM I CD 29
- 30. DOE at -40 Degree C AM I CD 30
- 31. Step 1. View Data >> Data Is Normal ------ P Value > 0.05 >> No Outlier Point >> No Apparent Upward or Downward Trend -60-80-100-120-140-160-180 Median Mean -100-110-120-130-140-150 A nderson-Darling Normality Test V ariance 1161.42 Skewness 0.311887 Kurtosis -0.532572 N 18 Minimum -179.91 A -Squared 1st Q uartile -151.12 Median -130.44 3rd Q uartile -96.99 Maximum -61.44 95% C onfidence Interv al for Mean -144.65 0.21 -110.75 95% C onfidence Interv al for Median -149.42 -104.81 95% C onfidence Interv al for StDev 25.57 51.09 P-V alue 0.825 Mean -127.70 StDev 34.08 95% Confidence Intervals Summary for Measure -40 RunOrder Measure-40 20151050 -50 -75 -100 -125 -150 -175 CenterPt 0 1 Scatterplot of Measure -40 vs RunOrder AM I CDDOE at -40 Degree C 31
- 32. Step 2 and 3. Create and Fit Model Term Standardized Effect ABC BC AB AC B C A 121086420 2.23 Factor Name A O pen A ngle B C lose A ngle C O peration Force Pareto Chart of the Standardized Effects (-40 Degree) (response is Measure -40, Alpha = .05) Factor Open Angle, Close Angle, Operation Force and interaction between Open Angle and Operation Force are signification a = 0.05 AM I CDDOE at -40 Degree C 32
- 33. Standardized Effect Percent 151050-5-10 99 95 90 80 70 60 50 40 30 20 10 5 1 Factor Name A O pen A ngle B C lose A ngle C O peration Force Effect Type Not Significant Significant AC C B A Normal Probability Plot of the Standardized Effects (response is Measure -40, Alpha = .05) Normal probability plot of effects also shows the same effects to be significant. AM I CDDOE at -40 Degree C 33
- 34. Open A ngle 642 201816 -100 -150 -200 Close A ngle -100 -150 -200 Operation Force Open 77.5 Center 85.0 Corner Angle Point Type 70.0 Corner Close 4 Center 6 Corner Angle Point Type 2 Corner Interaction Plot (data means) for Measure -40 MeanofMeasure-40 85.077.570.0 -100 -120 -140 -160 642 201816 -100 -120 -140 -160 Open Angle Close Angle Operation Force Point Type Corner Center Main Effects Plot (data means) for Measure -40 These plots are consistent with our previous conclusions about the effects. AM I CDDOE at -40 Degree C 34
- 35. ANOVA indicates that at least one main effect is significant at a = 0.05. It also indicates that curvature is NOT significant. AM I CDDOE at -40 Degree C 35
- 36. Estimated effects and coefficients indicate that Open Angle, Close Angle, Operation Force and interaction Open Angle*Operation Force are significant at a = 0.05. The results agreed with the earlier graphs R-Sq = 96.38% R-Sq(adj) = 93.85% AM I CDDOE at -40 Degree C 36
- 37. Step 4. Perform Residual Diagnostics The residual vs fitted (predicted) value and residual vs run order plots do not show any patterns or trends, and do not indicate any violations of the assumptions. The normal probability plot indicates residuals are normally distributed Residual Percent 20100-10-20 99 90 50 10 1 Fitted ValueResidual -50-100-150-200 10 0 -10 Residual Frequency 151050-5-10-15 4.8 3.6 2.4 1.2 0.0 Observation Order Residual 18161412108642 10 0 -10 Normal Probability Plot of the Residuals Residuals Versus the Fitted Values Histogram of the Residuals Residuals Versus the Order of the Data Residual Plots for Measure -40 AM I CDDOE at -40 Degree C 37
- 38. Open Angle Residual 868482807876747270 15 10 5 0 -5 -10 Residuals Versus Open Angle (response is Measure -40) Close Angle Residual 65432 15 10 5 0 -5 -10 Residuals Versus Close Angle (response is Measure -40) The residual vs each X do not show any pattern Operation Force Residual 2019181716 15 10 5 0 -5 -10 Residuals Versus Operation Force (response is Measure -40) AM I CDDOE at -40 Degree C 38
- 39. Step 6. Remove non-significant terms / Refit reduced model Remove the non-significant terms ANOVA indicates at least one main effect and at least one two-factor interactions are significant at a = 0.05 Also, curvature is not significant. Step 5. Check for possible transformations. AM I CDDOE at -40 Degree C 39
- 40. Term Standardized Effect AC B C A 121086420 2.16 Factor Name A O pen A ngle B C lose A ngle C O peration Force Pareto Chart of the Standardized Effects (response is Measure -40, Alpha = .05) P-values show that all effects in the model are significant. The value of R-Sq and R-Sq(adj) has decreased Standardized Effect Percent 1050-5-10 99 95 90 80 70 60 50 40 30 20 10 5 1 Factor Name A O pen A ngle B C lose A ngle C O peration Force Effect Type Not Significant Significant AC C B A Normal Probability Plot of the Standardized Effects (response is Measure -40, Alpha = .05) Reduced Model Full Model R Square 94.53% 96.38% R Square-Adj 92.84% 93.85% AM I CDDOE at -40 Degree C 40
- 41. Residual Diagnostics Residual Percent 20100-10-20 99 90 50 10 1 Fitted Value Residual -50-100-150-200 20 10 0 -10 -20 Residual Frequency 20151050-5-10-15 4 3 2 1 0 Observation Order Residual 18161412108642 20 10 0 -10 -20 Normal Probability Plot of the Residuals Residuals Versus the Fitted Values Histogram of the Residuals Residuals Versus the Order of the Data Residual Plots for Measure -40 The residual vs fitted (predicted) value and residual vs run order plots do not show any patterns or trends, and do not indicate any violations of the assumptions. The normal probability plot indicates residuals are normally distributed AM I CDDOE at -40 Degree C 41
- 42. Open Angle Residual 868482807876747270 20 10 0 -10 -20 Residuals Versus Open Angle (response is Measure -40) Close Angle Residual 65432 20 10 0 -10 -20 Residuals Versus Close Angle (response is Measure -40) Operation Force Residual 2019181716 20 10 0 -10 -20 Residuals Versus Operation Force (response is Measure -40) The residual vs each X do not show any pattern AM I CDDOE at -40 Degree C 42
- 43. Model is adequate, therefore we can use it for predicting future responses at specified settings of control factors. Chosen Model for the Fixture in uncoded units is: Y (Pin Position) = 597.769 – 6.96360(Open Angle) + 7.18076(Close Angle) - 60.4389(Operation Force) + 0.628457(Open Angle)*(Operation Force) Step 7. Choose Improved Model AM I CDDOE at -40 Degree C Pin Position Specification: 0 +/-0.4mm 43
- 44. Predict Pin Position at the following level of X’s Open Angle = 85 degree Close Angle = 6 degree Operation Force = 16 lb AM I CDDOE at -40 Degree C 44
- 45. MeanofMeasure-40 85.077.570.0 -100 -120 -140 -160 642 201816 -100 -120 -140 -160 Open Angle Close Angle Operation Force Point Type Corner Center Main Effects Plot (data means) for Measure -40 Open A ngle 642 201816 -100 -150 -200 Close A ngle -100 -150 -200 Operation Force Open 77.5 Center 85.0 Corner Angle Point Type 70.0 Corner Close 4 Center 6 Corner Angle Point Type 2 Corner Interaction Plot (data means) for Measure -40 Step 8. Interpret Chosen Model AM I CDDOE at -40 Degree C 45
- 46. 6 ure -40 -120 4 -90 -60 Close Angle70 75 280 85 Open Angle Hold Values Operation Force 16 Surface Plot of Measure -40 vs Close Angle, Open Angle Open Angle CloseAngle -70 -80 -90 -100 -110 -120 -130 8482807876747270 6 5 4 3 2 Hold Values Operation Force 16 Contour Plot of Measure -40 vs Close Angle, Open Angle Contour plot shows at what different settings of X’s can achieve the target Y. It also shows that the direction of meeting Y requirement. (0+/-0.4mm) AM I CDDOE at -40 Degree C Look For Maximum 46
- 47. Step 9. Implement New Process/Make Confirmation Runs Plan to run 10pcs confirmation runs Predict response y=-63.7694 at the optimum settings above Compute the appropriate confidence interval of prediction based on the number of confirmation test run. Conduct 10 confirmation runs. Calculated average of the confirmation runs falls within the calculated confidence interval. (Average 10 confirmation run = - 59.95) AM I CDDOE at -40 Degree C 47
- 48. Optimized Setting Key parameters Current Range Optimized Range Open Force 16 Ib~20 Ib 16 Ib Close Angle 2~6 6 Open Angle 70~85 85 AM I CD 48
- 49. Pilot Run Result Sample SampleMean 121110987654321 0 -50 -100 -150 -200 -250 -300 __ X=-64.9 UCL=7.3 LCL=-137.0 Before After Xbar Chart of Data by Status Tests performed with unequal sample sizes 3602401200-120-240-360 LSL USL LSL -400 Target * USL 400 Sample Mean -178.719 Sample N 260 StDev (Within) 65.2126 StDev (O v erall) 66.2567 Process Data C p 2.04 C PL 1.13 C PU 2.96 C pk 1.13 Pp 2.01 PPL 1.11 PPU 2.91 Ppk 1.11 C pm * O v erall C apability Potential (Within) C apability PPM < LSL 0.00 PPM > USL 0.00 PPM Total 0.00 O bserv ed Performance PPM < LSL 345.38 PPM > USL 0.00 PPM Total 345.38 Exp. Within Performance PPM < LSL 419.27 PPM > USL 0.00 PPM Total 419.27 Exp. O v erall Performance Within Overall Process Capability of X_j2-17 3752501250-125-250-375 LSL USL Process Data Sample?N 29 StDev (Within) 47.18711 StDev (O v erall) 49.35170 LSL -400.00000 Target * USL 400.00000 Sample Mean -64.88374 Potential (Within) C apability C C pk 2.83 O v erall C apability Pp 2.70 PPL 2.26 PPU 3.14 Ppk C p 2.26 C pm * 2.83 C PL 2.37 C PU 3.28 C pk 2.37 O bserv ed Performance PPM?<?LSL 0.00 PPM?>?USL 0.00 PPM?Total 0.00 Exp. Within Performance PPM?<?LSL 0.00 PPM?>?USL 0.00 PPM?Total 0.00 Exp. O v erall Performance PPM?<?LSL 0.00 PPM?>?USL 0.00 PPM?Total 0.00 Within Overall Process Capability of After CPK: 1.18 CPK 2.37 One month pilot run result shows before and after resolution implemented Pin bent position really improved ! AM I CD 49
- 50. Pilot run for FTY% tracking After improvement on the first time yield%, we got this trend chart: Pilot Run Result TIPM Product AOI First Time Yield Daily Performance Trend 75.00% 80.00% 85.00% 90.00% 95.00% 100.00% 18-Jun-08 19-Jun-08 20-Jun-08 21-Jun-08 22-Jun-08 23-Jun-08 24-Jun-08 25-Jun-08 26-Jun-08 27-Jun-08 28-Jun-08 % FTY% is higher than 96%, and the average FTY value is 97% TIPM Product AOI First Time Yield Daily Performance Trend 75.00% 80.00% 85.00% 90.00% 95.00% 100.00% 28-Oct-07 29-Oct-07 30-Oct-07 31-Oct-07 1-Nov-07 2-Nov-07 3-Nov-07 4-Nov-07 5-Nov-07 6-Nov-07 7-Nov-07 8-Nov-07 9-Nov-07 10-Nov-07 % 97% May’08 YieldPerformance 86% Nov’07 AM I CD 50
- 51. Add NP chart for test defect counts control in test bay eSPC function: Subgroup size =30 upper limit =3 Add NP chart in Control plan AM I CDControl Plan Update 51
- 52. Standardization and Documentation Replication Opportunity Replication Standardization Solution Focus Pilot Site Company-wide Similar process TIPM Product Line TIPM Product Line Continental/Tianj in SMT Line Continental/Tianjin and other Continental Electrical SMT Line SMT Line and other product line using UMG Pin Mounting Process AM I CD 52
- 53. Updated the product handle procedure based on the corrective action and train related operator and release the WI into system9000: AM I CDLesson Learned and Training 53