1. The document describes experiments measuring noise in a preamplifier and transistor in the frequency domain as the cutoff frequency and temperature are varied.
2. Observations show that the thermal noise from the preamplifier is constant but thermal noise from the input varies with cutoff frequency. The plateaus need adjustment to analyze noise sources.
3. Measurements at different temperatures from 73F to 93F show that noise depends strongly on temperature at low frequencies and is independent at high frequencies, suggesting the noise comes from the channel at low frequencies and the resistor at high frequencies.