The document provides step-by-step instructions for loading and preparing a sample in a JEOL JSM-7600F scanning electron microscope (SEM), obtaining images of the sample, and removing the sample at the end of the session. Key steps include switching on monitors, loading the sample onto a holder, pumping and venting the specimen chamber, optimizing focus and brightness, capturing images, removing detectors, venting the chamber again to remove the sample, and switching off monitors. Safety cautions are provided at the beginning regarding gloves, clearance, and maintaining a cold trap to reduce contamination.