The document provides an overview of X-ray diffraction (XRD) techniques. It discusses how XRD works by exploiting the diffraction of X-rays by crystal lattice planes. Bragg's law relates the diffraction angle to the atomic spacing within crystals. XRD can be used to determine crystal structures, identify phases, and measure properties like particle size, stress, and thin film thickness. The document outlines sample preparation and experimental methods like transmission, powder, and rotating crystal diffraction. It also covers applications in fields like materials characterization and quality analysis.