This document focuses on the use of electron diffraction via transmission electron microscopy (TEM) for characterizing materials, highlighting its advantages over x-ray and neutron methods, such as the ability to analyze small areas and its sensitivity to structural defects. The text reviews significant discoveries made by researchers, particularly in the field of quasicrystals, where TEM was crucial in observing new structures formed under rapid solidification conditions. Additionally, it discusses various techniques and the development of analytical microscopy capabilities that enhance the understanding of material structures at the atomic level.