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Proposals for Memristor Crossbar 
Design and Applications 
Memristors and Memristive Systems Symposium 
UC Berkeley November 21, 2008 
Blaise Mouttet 
George Mason University
Desirable Manufacturing Goals to Ease 
Adoption of Memristor Crossbars 
• Design should be compatible with standard manufacturing 
techniques to facilitate wide use and experimentation by 
many participants (i.e. universities, research labs, existing 
fabs, etc.) without a significant investment in new equipment. 
• Design should be easy to integrate with standard electronics 
components and materials. 
• Design should incorporate materials capable of RHIGH>>RLOW. 
• Design should be robust to both temporal and spatial 
variation of memristance. 
• Design should avoid internal feedback current paths in 
crossbar which can limit speed and ability to read resistance 
states reliably. 
• Design should allow ease of reconfiguration of resistance 
states.
Nanowire vs. Microscale Wire Crossbars 
• Some applications may not require nanowires 
to provide competitive solutions in a variety 
of areas (e.g. signal processing, pattern 
recognition) 
• Near‐term implementation is likely to be 
easier and more readily adopted using 
microscale wires which can avoid the 
problems of nanowire defects, addressing, 
etc.
Ideally, the detected resistance state of a selected crossbar 
junction should be independent of other resistance states in the 
crossbar. 
1 0 0 0 
Vread 
1 
0 
0 
Low resistance 
junction 
(i.e. logic 1) 
High resistance 
junction 
(i.e. logic 0)
However, this is not the case for simple crossbar designs due to 
internal currents. 
1 0 0 0 
Vread 
1 
0 
0
A simple solution compatible with microfabrication 
techniques is the incorporation of pn junctions in the 
crossbar (taught by Ovshinsky for phase change crossbar 
memory in US Patent 4,597,162). One variation of this 
solution adapted to bilayer oxide memristive films is as 
follows: 
A) Film deposition of metal layer and silicon layers 
n‐doped polysilicon 
p‐doped polysilicon 
metal layer (e.g. Al) 
SiO2 
Silicon wafer
B) Etch metal and semiconductor layers to form crossbar columns. 
SiO2 
Silicon wafer 
N 
P 
N 
P 
N 
P 
N 
P 
Al Al Al Al
C) Deposit SiO2 in gaps to provide isolation and planarize surface 
D) Deposit memristor oxide bilayer (e.g. TiO2/TiO2‐x) 
E) Deposit and pattern top metal layer to form crossbar row wires 
Pt 
SiO2 SiO2 SiO2 
SiO2 
Silicon wafer 
N 
P 
N 
P 
N 
P 
N 
P 
Al Al Al Al 
TiO2/TiO2‐x
Desirable Goals for Memristor 
Crossbar Array Applications 
• Complement (not conflicting with) existing 
technologies and markets to achieve ease of 
acceptance 
• Identify uses compatible with smaller emerging 
markets with potential for high growth (e.g. 
FPAAs , commercial robotics, neural interfaces) 
• Solve problems for which conventional electronic 
hardware and software do not provide efficient 
solutions but which memristors can (e.g. pattern 
recognition, traveling salesman problem)
Op‐amps are well known to be 
implemented as summing amplifiers 
R1 
_ 
+ 
RF 
Vout = - [V1(RF/R1)+V2(RF/R2)+ 
V3(RF/R3)+V4(RF/R4)] 
R2 
R3 
R4 
V1 
V2 
V3 
V4
Integrating Memristor Crossbar Array with Op‐ 
Amp Circuitry = Matrix Summing Amplifier 
M11 M12 M13 M14 
M21 M22 M23 M24 
M31 M32 M33 M34 
M41 M42 M43 M44 
R1 R2 R3 R4 
V1 V2 V3 V4 
_ 
+ 
RF 
Vout
For an ideal op‐amp: 
=−Σ 
F ij I I 
ij 
V V 
( − 
) 
Σ + 
= − 
i loss 
ij ij i 
V 
out 
F 
M R 
R 
( ) 
V R − = − − 
= −Σ Σ 
out V V T M V V 
( ) ( )( ) 
F 
( ) i loss 
ij 
ij 
ij 
i loss 
M + 
R 
ij i
To achieve behavior similar to binary logic requires 
T(Mij=RHIGH)=0 and T(Mij=RLOW)=1 
By setting the fixed column resistors Ri = RF‐RLOW then T(RLOW)=1 
is achievable. However, T(RHIGH) is not able to be zero since this 
would require RF = 0. Thus a low bit error (LBE) exists and a 
tolerable LBE should satisfy: 
T(RHIGH)= LBE ≥ 1/[1+(RHIGH‐RLOW)/RF] 
Solving for RF produces: 
RF ≤ [LBE/(1‐LBE)] (RHIGH‐RLOW) 
This inequality sets an upper limit to RF based on a maximum 
allowable low bit error and the high and low resistance values of 
the memristor.
Analysis for memristor (Mij) variation 
For an allowable bit sensitivity σ(Mij), 
R dM 
F ij 
ij M 
d T M <σ 
| ( ) | 2 ij 
( ) 
M R 
( + 
) 
ij i 
= 
The maximum allowable value of d|T(Mij)| is at Mij = RLOW 
and for Ri = RF‐RLOW 
dM 
R dM 
F ij M 
( ) 
( )2 ij 
F 
ij 
LOW F LOW 
R 
R R R 
= <σ 
+ −
Analysis for memristor (Mij) variation 
Combining the previous conditions the optimum range for RF can 
be determined based on the memristance sensitivity and low bit 
error as: 
R LBE 
dM 
ij R R 
( ) 
( ) 1 F HIGH LOW 
ij 
LBE 
M 
− 
− 
< < 
σ
Analysis for memristor (Mij) variation 
A possible rule of thumb is to set the allowable low bit error and bit 
sensitivity in terms of the number of columns of the crossbar (=N). 
For example, if all of the crosspoints have a low bit error and sensitivity 
of 1/N a total of 1 bit error is produced at the output. The range of RF 
may then be expressed as: 
NdM R N − 
ij F HIGH LOW R R 
( ) 
1/ 
1 1/ 
N 
− 
< <
Analysis for memristor (Mij) variation 
For large N the above inequality can be approximated to find the 
maximum allowable variation in Mij as: 
dM RHIGH RLOW 
( ) 
2 
N 
ij 
− 
< 
In case of relaxing the maximum bit error and sensitivity constraints 
to allow for n total bit errors for N columns the above equation 
becomes: 
2 ( ) 
dM n RHIGH RLOW 
2 
N 
ij 
− 
<
Potential Application #1 
Programmable Drive Waveforms
Problems with Conventional Drive 
Waveform Circuits 
• In many electronics applications variation of circuit 
parameters due to temperature change, aging, etc. require 
adjustment of drive waveforms (e.g. LEDs may require a 
higher amplitude voltage drive over time to produce a 
consistent light output). 
• Waveform adjustment is also desirable for mode adjustment 
in various applications (e.g. inkjet printheads changing 
resolution or drop size often involves timing or amplitude 
adjustment of drive signal for heater or piezo.) 
• Timing modulation and amplitude modulation circuits 
implemented in hardware can require complex circuitry and 
have limitations in adaptability and the range of possible 
waveforms. 
• Software based solutions require a microprocessor which can 
be difficult/expensive to miniaturize for several portable 
electronics applications
Memristor Crossbar Drive Waveform Circuit 
Assuming RLOW of memristors << RF, R 
1 0 0 0 
_ 
+ 
RF 
|Vout/Vin|≈ 
RF/R 
R 
2R 
4R 
8R 
Voltage Level Converter 
Shift Register
Memristor Crossbar Drive Waveform Circuit 
Assuming RLOW of memristors << RF, R 
0 1 0 0 
_ 
+ 
RF 
|Vout/Vin|≈ 
RF/2R 
R 
2R 
4R 
8R 
Voltage Level Converter 
Shift Register
Memristor Crossbar Drive Waveform Circuit 
Assuming RLOW of memristors << RF, R 
0 0 1 0 
_ 
+ 
RF 
|Vout/Vin|≈ 
RF/4R 
R 
2R 
4R 
8R 
Voltage Level Converter 
Shift Register
Memristor Crossbar Drive Waveform Circuit 
Assuming RLOW of memristors << RF, R 
0 0 0 1 
_ 
+ 
RF 
|Vout/Vin|≈ 
RF/8R 
R 
2R 
4R 
8R 
Voltage Level Converter 
Shift Register
Advantages 
• Both timing and amplitude of output waveform 
can be adjusted by binary switching of the 
memristance states in the crossbar. 
• Even with only binary memristance switching, a 
very large number of possible drive waveforms 
are available (2NxM) (e.g. 10x10Æ1030 states). 
• Combined with techniques such as hill climbing 
and genetic algorithms has potential for self‐optimizing 
drive waveforms and real‐time 
adaption of circuitry to effects of aging and 
temperature variation.
Potential Application #2 
Pattern Recognition
Problems with Conventional Pattern 
Recognition Solutions 
• Software‐based solutions require time for data 
transfer between memory and processor circuits 
which causes a lag in responsiveness. 
• Hardware solutions can be faster but have limits 
in adaptability and limits in the range of patterns 
that can be classified. 
• Memristors offer a route to a “morphware” 
pattern recognition solution combining both 
memory storage and data processing in a 
common circuit.
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (write mode) 
_ 
+ 
-Vref 
1 0 1 0 
1 
0 
0 
0 
Voltage Level Converter (V>Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (write mode) 
_ 
+ 
-Vref 
0 1 1 1 
0 
1 
0 
0 
Voltage Level Converter (V>Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (write mode) 
_ 
+ 
-Vref 
1 1 0 0 
0 
0 
1 
0 
Voltage Level Converter (V>Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (write mode) 
_ 
+ 
-Vref 
0 0 1 0 
0 
0 
0 
1 
Voltage Level Converter (V>Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (detect mode) 
_ 
+ 
-Vref 
0 1 1 1 
1 
I 
0 
0 
0 
Voltage Level Converter (V<Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (detect mode) 
_ 
+ 
-Vref 
0 1 1 1 
0 
4I 
1 
0 
0 
Voltage Level Converter (V<Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (detect mode) 
_ 
+ 
-Vref 
0 1 1 1 
0 
I 
0 
1 
0 
Voltage Level Converter (V<Vthreshold)
V1 V2 V3 V4 V5 V6 V7 V8 
_ 
+ 
RF 
Memristor Crossbar Pattern Comparison Circuit (detect mode) 
_ 
+ 
-Vref 
0 1 1 1 
0 
2I 
0 
0 
1 
Voltage Level Converter (V<Vthreshold)
Advantages 
• Output voltage from 1st op‐amp is analogous to 
XNOR (bit comparator) function 
out ij V = A ΣT M V −V +ΣT M V −V −V 
2 ([ ( )( i loss ) ( ij 
)( i loss )] ref 
) i 
i 
• Tuning Vref can adjust sensitivity of pattern 
comparison and adjust allowable bit error 
between resistance states and voltage states. 
• Allowing for bit error could potentially be very 
useful to applications such as facial recognition 
which can require robustness to a large 
percentage of bit errors.
Potential Application #3 
FPAAs
Problems with Conventional FPAAs 
• FPAAs (Field Programmable Analog Arrays) 
provide reconfigurability of filter designs useful in 
communications and control systems but are 
limited in the range of configurable states. 
• Lacks ability to electrically tune the resistance 
such as provided by memristors to achieve 
intermediate frequency states (for 
communication apps.) or pole/zero adjustment 
(for control apps.)
By including memristor crossbar junctions in the input and feedback path of 
an op‐amp capacitor array, a transfer function can be tuned to adjust the 
gain, pole, and/or zero of a filter. 
Memristance programming circuitry 
M21 M22 M23 M24 M25 
M11 M12 M13 M14 M15 Vout(t) 
C 
R1 C/2 C/4 C/8 
Vin(t) 
R2 C C/2 C/4 C/8 
Vout(s)/Vin(s) = K(Mij) [1+s/a(Mij)]/[(1+s/b(Mij)] 
a(Mij)<<b(Mij) Æ high pass filter 
a(Mij>>b(Mij) Æ low pass filter
Advantages 
• Conversion between low pass and high pass 
filter by appropriate selection of on/off states 
of Mij. 
• Tuning of f‐3dB or pole/zero by adjustment of 
memristance state. 
• Cascading multiple stages can provide for 
tunable bandpass adjustment 
• Dynamic PID controllers can be implemented 
by connecting multiple stages in parallel.
Potential Application #4 
Arithmetic Optimization Problems
Problems with Conventional Arithmetic 
Processor Designs 
• Segmentation between memory and 
processor circuitry may produce a bottleneck 
in speed. New clock independent designs are 
desirable. 
• Logic based arithmetic is inefficient for some 
network optimization problems such as the 
traveling salesman problem involving 
repeated recalculation of sums
Memristor Crossbar Arithmetic Circuit 
Assuming RLOW of memristors << R/8 
0 1 0 1 
_ 
+ 
R 
Vout 
R 
R/2 
R/4 
R/8 
Voltage Level Converter 
20 
21 
22 
23 
Analog output representative of 2+4
Memristor Crossbar Arithmetic Circuit 
Assuming RLOW of memristors << R/8 
1 0 1 0 
_ 
+ 
R 
Vout 
R 
R/2 
R/4 
R/8 
Voltage Level Converter 
20 
21 
22 
23 
Analog output representative of 1+3
Advantages 
• Although op‐amps are slower than logic circuits the 
combination of memory and processing in a single 
circuit reduces the reliance on a clock. 
• May be scalable to provide real time solutions to 
network optimization. For example, in a traveling 
salesman problem with 100 nodes including 5050 
inter‐relational distances, each distance metric can be 
stored in a different crossbar column. Comparisons 
between different paths between the nodes only 
requires changing the bit pattern input to the crossbar 
rows and detecting the analog level of voltage output.
Potential Application #5 
Signal Mixing
Problems with Conventional Modulation 
Systems 
• Increase in portable wireless electronics 
requires more efficient uses of spectrum with 
techniques such as frequency hopping. 
• Simpler but more secure signal encryption 
methods are desirable.
Back‐to‐back diode memristor crossbar 
Silicon wafer 
SiO2 
Al 
N 
P 
Pt 
TiO2/TiO2‐x Pt Pt Pt Pt 
SiO2 SiO2 SiO2 
SiO2 
Silicon wafer 
P 
N 
P 
N 
P 
N 
P 
N 
Al Al Al Al
Equivalent circuit at each crossbar junction 
VeqB = VinB [(Ri+Mij)/(Ri+Rj+Mij)]+ 
VinA[Rj/(Ri+Rj+Mij)] 
For VinB less than the diode 
threshold voltage, the 
resistance state of Mij and 
voltage state of VinA can be 
used to modulate signal 
transmission. 
VoutA 
VinB 
VoutB (ZB=∞) 
VinA 
Ri 
Rj 
RL 
Mij 
VeqB
Input Wiring 
Vsig1 
Vsig2 
Vsig3 
Vsig4 
Vmod1 Vmod2 Vmod3 Vmod4
Input Wiring 
Vsig1 
Vsig2 
Vsig3 
Vsig4 
Vmod1 Vmod2 Vmod3 Vmod4
Input Wiring 
Vsig1 
Vsig2 
Vsig3 
Vsig4 
Vmod1 Vmod2 Vmod3 Vmod4
Input Wiring 
Vsig1 
Vsig2 
Vsig3 
Vsig4 
Vmod1 Vmod2 Vmod3 Vmod4
Advantages 
• Switching of carrier frequencies allow more 
efficient use of spectrum and compensation 
for crowded channels. 
• Potential exist for improved signal encryption 
by sharing a randomized memristance 
switching pattern between sender and 
receiver.
Potential Application #6 
Artificial Intelligence
Potential Routes to Strong A.I. with 
Memristor Crossbars 
• Neural Networks (feedforward of nonlinear 
weighted sums of memristance states) 
• Genetic Algorithms (selection, crossover, and 
mutation of memristance states) 
• Emergent Complexity from Memory‐ 
Prediction Framework (Hawkins approach)
Memristor Crossbar Circuit Design for 
Sensor Stimulated Emergent Behavior 
1st crossbar array 
Differential 
Amplifiers 
Summing 
Amplifiers 
V11 V12 V13 V14 V21 V22 V23 V24 
Vsen1 Vsen2 Vsen3 Vsen4 
Vact1 
Vact2 
Vact3 
Vact4 
M11 M12 M13 M14 
M21 M22 M23 M24 
M31 M32 M33 M34 
M41 M42 M43 M44 
Analog Sensor Voltages 
Analog 
Actuator 
Voltages
Memristor Crossbar Circuit Design for 
Sensor Stimulated Emergent Behavior 
2nd crossbar array 
Differential 
Amplifiers 
Summing 
Amplifiers 
V21 V22 V23 V24 V11 V12 V13 V14 
Vsen5 Vsen6 Vsen7 Vsen8 
Vact5 
Vact6 
Vact7 
Vact8 
M11 M12 M13 M14 
M21 M22 M23 M24 
M31 M32 M33 M34 
M41 M42 M43 M44 
Analog Sensor Voltages 
Analog 
Actuator 
Voltages 
Recursive feedback 
between 1st and 2nd 
crossbar can potentially 
set up a dynamic 
memory‐prediction 
framework for 
intelligence
Potential Applications #7 and 8 
Neural Interfaces (spike counting and 
classification) and Robotics (enhanced 
responsiveness for actuator control) 
‐To be continued at 
NSTI Nanotech Conference and Expo 
May 3‐7, 2009 
Houston, TX
Conclusion 
• Thank you to organizers and participants. 
• Thank you to Dr. Wei Wang of the College of 
Nanoscale Science and Engineering for 
information and feedback on FPAAs and 
suggestion for error analysis. 
• Thank you to Jeff Hawkins for insights on 
memory‐prediction framework for intelligence 
as documented in On Intelligence

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Proposals for Memristor Crossbar Design and Applications

  • 1. Proposals for Memristor Crossbar Design and Applications Memristors and Memristive Systems Symposium UC Berkeley November 21, 2008 Blaise Mouttet George Mason University
  • 2. Desirable Manufacturing Goals to Ease Adoption of Memristor Crossbars • Design should be compatible with standard manufacturing techniques to facilitate wide use and experimentation by many participants (i.e. universities, research labs, existing fabs, etc.) without a significant investment in new equipment. • Design should be easy to integrate with standard electronics components and materials. • Design should incorporate materials capable of RHIGH>>RLOW. • Design should be robust to both temporal and spatial variation of memristance. • Design should avoid internal feedback current paths in crossbar which can limit speed and ability to read resistance states reliably. • Design should allow ease of reconfiguration of resistance states.
  • 3. Nanowire vs. Microscale Wire Crossbars • Some applications may not require nanowires to provide competitive solutions in a variety of areas (e.g. signal processing, pattern recognition) • Near‐term implementation is likely to be easier and more readily adopted using microscale wires which can avoid the problems of nanowire defects, addressing, etc.
  • 4. Ideally, the detected resistance state of a selected crossbar junction should be independent of other resistance states in the crossbar. 1 0 0 0 Vread 1 0 0 Low resistance junction (i.e. logic 1) High resistance junction (i.e. logic 0)
  • 5. However, this is not the case for simple crossbar designs due to internal currents. 1 0 0 0 Vread 1 0 0
  • 6. A simple solution compatible with microfabrication techniques is the incorporation of pn junctions in the crossbar (taught by Ovshinsky for phase change crossbar memory in US Patent 4,597,162). One variation of this solution adapted to bilayer oxide memristive films is as follows: A) Film deposition of metal layer and silicon layers n‐doped polysilicon p‐doped polysilicon metal layer (e.g. Al) SiO2 Silicon wafer
  • 7. B) Etch metal and semiconductor layers to form crossbar columns. SiO2 Silicon wafer N P N P N P N P Al Al Al Al
  • 8. C) Deposit SiO2 in gaps to provide isolation and planarize surface D) Deposit memristor oxide bilayer (e.g. TiO2/TiO2‐x) E) Deposit and pattern top metal layer to form crossbar row wires Pt SiO2 SiO2 SiO2 SiO2 Silicon wafer N P N P N P N P Al Al Al Al TiO2/TiO2‐x
  • 9. Desirable Goals for Memristor Crossbar Array Applications • Complement (not conflicting with) existing technologies and markets to achieve ease of acceptance • Identify uses compatible with smaller emerging markets with potential for high growth (e.g. FPAAs , commercial robotics, neural interfaces) • Solve problems for which conventional electronic hardware and software do not provide efficient solutions but which memristors can (e.g. pattern recognition, traveling salesman problem)
  • 10. Op‐amps are well known to be implemented as summing amplifiers R1 _ + RF Vout = - [V1(RF/R1)+V2(RF/R2)+ V3(RF/R3)+V4(RF/R4)] R2 R3 R4 V1 V2 V3 V4
  • 11. Integrating Memristor Crossbar Array with Op‐ Amp Circuitry = Matrix Summing Amplifier M11 M12 M13 M14 M21 M22 M23 M24 M31 M32 M33 M34 M41 M42 M43 M44 R1 R2 R3 R4 V1 V2 V3 V4 _ + RF Vout
  • 12. For an ideal op‐amp: =−Σ F ij I I ij V V ( − ) Σ + = − i loss ij ij i V out F M R R ( ) V R − = − − = −Σ Σ out V V T M V V ( ) ( )( ) F ( ) i loss ij ij ij i loss M + R ij i
  • 13. To achieve behavior similar to binary logic requires T(Mij=RHIGH)=0 and T(Mij=RLOW)=1 By setting the fixed column resistors Ri = RF‐RLOW then T(RLOW)=1 is achievable. However, T(RHIGH) is not able to be zero since this would require RF = 0. Thus a low bit error (LBE) exists and a tolerable LBE should satisfy: T(RHIGH)= LBE ≥ 1/[1+(RHIGH‐RLOW)/RF] Solving for RF produces: RF ≤ [LBE/(1‐LBE)] (RHIGH‐RLOW) This inequality sets an upper limit to RF based on a maximum allowable low bit error and the high and low resistance values of the memristor.
  • 14. Analysis for memristor (Mij) variation For an allowable bit sensitivity σ(Mij), R dM F ij ij M d T M <σ | ( ) | 2 ij ( ) M R ( + ) ij i = The maximum allowable value of d|T(Mij)| is at Mij = RLOW and for Ri = RF‐RLOW dM R dM F ij M ( ) ( )2 ij F ij LOW F LOW R R R R = <σ + −
  • 15. Analysis for memristor (Mij) variation Combining the previous conditions the optimum range for RF can be determined based on the memristance sensitivity and low bit error as: R LBE dM ij R R ( ) ( ) 1 F HIGH LOW ij LBE M − − < < σ
  • 16. Analysis for memristor (Mij) variation A possible rule of thumb is to set the allowable low bit error and bit sensitivity in terms of the number of columns of the crossbar (=N). For example, if all of the crosspoints have a low bit error and sensitivity of 1/N a total of 1 bit error is produced at the output. The range of RF may then be expressed as: NdM R N − ij F HIGH LOW R R ( ) 1/ 1 1/ N − < <
  • 17. Analysis for memristor (Mij) variation For large N the above inequality can be approximated to find the maximum allowable variation in Mij as: dM RHIGH RLOW ( ) 2 N ij − < In case of relaxing the maximum bit error and sensitivity constraints to allow for n total bit errors for N columns the above equation becomes: 2 ( ) dM n RHIGH RLOW 2 N ij − <
  • 18. Potential Application #1 Programmable Drive Waveforms
  • 19. Problems with Conventional Drive Waveform Circuits • In many electronics applications variation of circuit parameters due to temperature change, aging, etc. require adjustment of drive waveforms (e.g. LEDs may require a higher amplitude voltage drive over time to produce a consistent light output). • Waveform adjustment is also desirable for mode adjustment in various applications (e.g. inkjet printheads changing resolution or drop size often involves timing or amplitude adjustment of drive signal for heater or piezo.) • Timing modulation and amplitude modulation circuits implemented in hardware can require complex circuitry and have limitations in adaptability and the range of possible waveforms. • Software based solutions require a microprocessor which can be difficult/expensive to miniaturize for several portable electronics applications
  • 20. Memristor Crossbar Drive Waveform Circuit Assuming RLOW of memristors << RF, R 1 0 0 0 _ + RF |Vout/Vin|≈ RF/R R 2R 4R 8R Voltage Level Converter Shift Register
  • 21. Memristor Crossbar Drive Waveform Circuit Assuming RLOW of memristors << RF, R 0 1 0 0 _ + RF |Vout/Vin|≈ RF/2R R 2R 4R 8R Voltage Level Converter Shift Register
  • 22. Memristor Crossbar Drive Waveform Circuit Assuming RLOW of memristors << RF, R 0 0 1 0 _ + RF |Vout/Vin|≈ RF/4R R 2R 4R 8R Voltage Level Converter Shift Register
  • 23. Memristor Crossbar Drive Waveform Circuit Assuming RLOW of memristors << RF, R 0 0 0 1 _ + RF |Vout/Vin|≈ RF/8R R 2R 4R 8R Voltage Level Converter Shift Register
  • 24. Advantages • Both timing and amplitude of output waveform can be adjusted by binary switching of the memristance states in the crossbar. • Even with only binary memristance switching, a very large number of possible drive waveforms are available (2NxM) (e.g. 10x10Æ1030 states). • Combined with techniques such as hill climbing and genetic algorithms has potential for self‐optimizing drive waveforms and real‐time adaption of circuitry to effects of aging and temperature variation.
  • 25. Potential Application #2 Pattern Recognition
  • 26. Problems with Conventional Pattern Recognition Solutions • Software‐based solutions require time for data transfer between memory and processor circuits which causes a lag in responsiveness. • Hardware solutions can be faster but have limits in adaptability and limits in the range of patterns that can be classified. • Memristors offer a route to a “morphware” pattern recognition solution combining both memory storage and data processing in a common circuit.
  • 27. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (write mode) _ + -Vref 1 0 1 0 1 0 0 0 Voltage Level Converter (V>Vthreshold)
  • 28. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (write mode) _ + -Vref 0 1 1 1 0 1 0 0 Voltage Level Converter (V>Vthreshold)
  • 29. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (write mode) _ + -Vref 1 1 0 0 0 0 1 0 Voltage Level Converter (V>Vthreshold)
  • 30. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (write mode) _ + -Vref 0 0 1 0 0 0 0 1 Voltage Level Converter (V>Vthreshold)
  • 31. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (detect mode) _ + -Vref 0 1 1 1 1 I 0 0 0 Voltage Level Converter (V<Vthreshold)
  • 32. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (detect mode) _ + -Vref 0 1 1 1 0 4I 1 0 0 Voltage Level Converter (V<Vthreshold)
  • 33. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (detect mode) _ + -Vref 0 1 1 1 0 I 0 1 0 Voltage Level Converter (V<Vthreshold)
  • 34. V1 V2 V3 V4 V5 V6 V7 V8 _ + RF Memristor Crossbar Pattern Comparison Circuit (detect mode) _ + -Vref 0 1 1 1 0 2I 0 0 1 Voltage Level Converter (V<Vthreshold)
  • 35. Advantages • Output voltage from 1st op‐amp is analogous to XNOR (bit comparator) function out ij V = A ΣT M V −V +ΣT M V −V −V 2 ([ ( )( i loss ) ( ij )( i loss )] ref ) i i • Tuning Vref can adjust sensitivity of pattern comparison and adjust allowable bit error between resistance states and voltage states. • Allowing for bit error could potentially be very useful to applications such as facial recognition which can require robustness to a large percentage of bit errors.
  • 37. Problems with Conventional FPAAs • FPAAs (Field Programmable Analog Arrays) provide reconfigurability of filter designs useful in communications and control systems but are limited in the range of configurable states. • Lacks ability to electrically tune the resistance such as provided by memristors to achieve intermediate frequency states (for communication apps.) or pole/zero adjustment (for control apps.)
  • 38. By including memristor crossbar junctions in the input and feedback path of an op‐amp capacitor array, a transfer function can be tuned to adjust the gain, pole, and/or zero of a filter. Memristance programming circuitry M21 M22 M23 M24 M25 M11 M12 M13 M14 M15 Vout(t) C R1 C/2 C/4 C/8 Vin(t) R2 C C/2 C/4 C/8 Vout(s)/Vin(s) = K(Mij) [1+s/a(Mij)]/[(1+s/b(Mij)] a(Mij)<<b(Mij) Æ high pass filter a(Mij>>b(Mij) Æ low pass filter
  • 39. Advantages • Conversion between low pass and high pass filter by appropriate selection of on/off states of Mij. • Tuning of f‐3dB or pole/zero by adjustment of memristance state. • Cascading multiple stages can provide for tunable bandpass adjustment • Dynamic PID controllers can be implemented by connecting multiple stages in parallel.
  • 40. Potential Application #4 Arithmetic Optimization Problems
  • 41. Problems with Conventional Arithmetic Processor Designs • Segmentation between memory and processor circuitry may produce a bottleneck in speed. New clock independent designs are desirable. • Logic based arithmetic is inefficient for some network optimization problems such as the traveling salesman problem involving repeated recalculation of sums
  • 42. Memristor Crossbar Arithmetic Circuit Assuming RLOW of memristors << R/8 0 1 0 1 _ + R Vout R R/2 R/4 R/8 Voltage Level Converter 20 21 22 23 Analog output representative of 2+4
  • 43. Memristor Crossbar Arithmetic Circuit Assuming RLOW of memristors << R/8 1 0 1 0 _ + R Vout R R/2 R/4 R/8 Voltage Level Converter 20 21 22 23 Analog output representative of 1+3
  • 44. Advantages • Although op‐amps are slower than logic circuits the combination of memory and processing in a single circuit reduces the reliance on a clock. • May be scalable to provide real time solutions to network optimization. For example, in a traveling salesman problem with 100 nodes including 5050 inter‐relational distances, each distance metric can be stored in a different crossbar column. Comparisons between different paths between the nodes only requires changing the bit pattern input to the crossbar rows and detecting the analog level of voltage output.
  • 45. Potential Application #5 Signal Mixing
  • 46. Problems with Conventional Modulation Systems • Increase in portable wireless electronics requires more efficient uses of spectrum with techniques such as frequency hopping. • Simpler but more secure signal encryption methods are desirable.
  • 47. Back‐to‐back diode memristor crossbar Silicon wafer SiO2 Al N P Pt TiO2/TiO2‐x Pt Pt Pt Pt SiO2 SiO2 SiO2 SiO2 Silicon wafer P N P N P N P N Al Al Al Al
  • 48. Equivalent circuit at each crossbar junction VeqB = VinB [(Ri+Mij)/(Ri+Rj+Mij)]+ VinA[Rj/(Ri+Rj+Mij)] For VinB less than the diode threshold voltage, the resistance state of Mij and voltage state of VinA can be used to modulate signal transmission. VoutA VinB VoutB (ZB=∞) VinA Ri Rj RL Mij VeqB
  • 49. Input Wiring Vsig1 Vsig2 Vsig3 Vsig4 Vmod1 Vmod2 Vmod3 Vmod4
  • 50. Input Wiring Vsig1 Vsig2 Vsig3 Vsig4 Vmod1 Vmod2 Vmod3 Vmod4
  • 51. Input Wiring Vsig1 Vsig2 Vsig3 Vsig4 Vmod1 Vmod2 Vmod3 Vmod4
  • 52. Input Wiring Vsig1 Vsig2 Vsig3 Vsig4 Vmod1 Vmod2 Vmod3 Vmod4
  • 53. Advantages • Switching of carrier frequencies allow more efficient use of spectrum and compensation for crowded channels. • Potential exist for improved signal encryption by sharing a randomized memristance switching pattern between sender and receiver.
  • 54. Potential Application #6 Artificial Intelligence
  • 55. Potential Routes to Strong A.I. with Memristor Crossbars • Neural Networks (feedforward of nonlinear weighted sums of memristance states) • Genetic Algorithms (selection, crossover, and mutation of memristance states) • Emergent Complexity from Memory‐ Prediction Framework (Hawkins approach)
  • 56. Memristor Crossbar Circuit Design for Sensor Stimulated Emergent Behavior 1st crossbar array Differential Amplifiers Summing Amplifiers V11 V12 V13 V14 V21 V22 V23 V24 Vsen1 Vsen2 Vsen3 Vsen4 Vact1 Vact2 Vact3 Vact4 M11 M12 M13 M14 M21 M22 M23 M24 M31 M32 M33 M34 M41 M42 M43 M44 Analog Sensor Voltages Analog Actuator Voltages
  • 57. Memristor Crossbar Circuit Design for Sensor Stimulated Emergent Behavior 2nd crossbar array Differential Amplifiers Summing Amplifiers V21 V22 V23 V24 V11 V12 V13 V14 Vsen5 Vsen6 Vsen7 Vsen8 Vact5 Vact6 Vact7 Vact8 M11 M12 M13 M14 M21 M22 M23 M24 M31 M32 M33 M34 M41 M42 M43 M44 Analog Sensor Voltages Analog Actuator Voltages Recursive feedback between 1st and 2nd crossbar can potentially set up a dynamic memory‐prediction framework for intelligence
  • 58. Potential Applications #7 and 8 Neural Interfaces (spike counting and classification) and Robotics (enhanced responsiveness for actuator control) ‐To be continued at NSTI Nanotech Conference and Expo May 3‐7, 2009 Houston, TX
  • 59. Conclusion • Thank you to organizers and participants. • Thank you to Dr. Wei Wang of the College of Nanoscale Science and Engineering for information and feedback on FPAAs and suggestion for error analysis. • Thank you to Jeff Hawkins for insights on memory‐prediction framework for intelligence as documented in On Intelligence