Property Description
Principle
X-rays interact with the crystal lattice of a material, causing
diffraction.
Applications
Phase identification, crystal structure determination, lattice
parameter determination, strain and stress analysis, particle size and
microstructure analysis, texture analysis.
Types Powder XRD, single crystal XRD, thin film XRD.
Advantages Non-destructive, versatile, quantitative analysis, rapid analysis.
Limitations
Sensitive to sample preparation, limited sensitivity for amorphous
materials.
X-Ray diffraction
UV spectroscopy
Property Description
Principle Measures the absorption of ultraviolet and visible light by molecules.
Applications
Determination of concentration, identification of compounds, study
of electronic transitions.
Advantages
Sensitive, non-destructive, can be used for quantitative and
qualitative analysis.
Limitations Requires a pure sample, may be affected by interferences.
Raman spectroscopy
Property Description
Principle Measures the inelastic scattering of light by molecules.
Applications
Identification of functional groups, study of molecular structure and
vibrations, analysis of crystalline materials.
Advantages
Non-destructive, can be used for both solids and liquids, can provide
information about molecular symmetry.
Limitations
May be affected by fluorescence, requires a relatively high
concentration of the sample.
Photoluminescence
Property Description
Principle
Measures the emission of light from a material after it has been
excited by light.
Applications
Study of electronic transitions, analysis of semiconductor materials,
development of optical devices.
Advantages
Can be used for both solids and liquids, can provide information
about the electronic structure of materials.
Limitations May be affected by impurities and defects in the material.
Thermo Gravimetric Analysis (TGA)
Property Description
Principle Measures the weight loss or gain of a sample as it is heated.
Applications
Determination of moisture content, thermal decomposition, and
phase transitions.
Advantages
Can be used for a wide range of materials, can provide quantitative
information about weight loss or gain.
Limitations May be affected by the heating rate and atmosphere.
Scanning probe microscopy
Property Description
Principle
Uses a probe to scan the surface of a material and measure
interactions between the probe and the surface.
Applications
Imaging of surfaces with atomic resolution, measurement of surface
properties (e.g., roughness, stiffness).
Advantages
High spatial resolution, can be used for imaging both conductive and
non-conductive materials.
Limitations
Can be time-consuming, may be affected by vibrations and
environmental factors.
Scanning electron microscopy(SEM)
Property Description
Principle
Scans the surface of a material with a focused beam of electrons,
generating secondary electrons that are collected to form an image.
Applications
Imaging of surface morphology and topography, analysis of particle
size and distribution.
Advantages
High resolution, can be used for both conductive and non-conductive
materials.
Limitations
Requires a vacuum environment, may be affected by charging
effects.
Transmission electron microscopy(TEM)
Property Description
Principle
Transmits a beam of electrons through a thin sample, creating an
image of the internal structure.
Applications Imaging of crystal structure, defects, and nanostructures.
Advantages
High resolution, can provide information about the internal structure
of materials.
Limitations Requires thin samples, may be affected by electron beam damage.
X Ray photoelectron spectroscopy
Property Description
Principle
Measures the kinetic energy of electrons ejected from a material by
X-rays.
Applications
Determination of elemental composition, chemical state analysis,
surface analysis.
Advantages
Can provide information about the surface composition and chemical
state of elements.
Limitations
Requires a high vacuum environment, may be affected by surface
contamination.

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characterisation techniques in material science.pdf

  • 1. Property Description Principle X-rays interact with the crystal lattice of a material, causing diffraction. Applications Phase identification, crystal structure determination, lattice parameter determination, strain and stress analysis, particle size and microstructure analysis, texture analysis. Types Powder XRD, single crystal XRD, thin film XRD. Advantages Non-destructive, versatile, quantitative analysis, rapid analysis. Limitations Sensitive to sample preparation, limited sensitivity for amorphous materials. X-Ray diffraction
  • 2. UV spectroscopy Property Description Principle Measures the absorption of ultraviolet and visible light by molecules. Applications Determination of concentration, identification of compounds, study of electronic transitions. Advantages Sensitive, non-destructive, can be used for quantitative and qualitative analysis. Limitations Requires a pure sample, may be affected by interferences.
  • 3. Raman spectroscopy Property Description Principle Measures the inelastic scattering of light by molecules. Applications Identification of functional groups, study of molecular structure and vibrations, analysis of crystalline materials. Advantages Non-destructive, can be used for both solids and liquids, can provide information about molecular symmetry. Limitations May be affected by fluorescence, requires a relatively high concentration of the sample.
  • 4. Photoluminescence Property Description Principle Measures the emission of light from a material after it has been excited by light. Applications Study of electronic transitions, analysis of semiconductor materials, development of optical devices. Advantages Can be used for both solids and liquids, can provide information about the electronic structure of materials. Limitations May be affected by impurities and defects in the material.
  • 5. Thermo Gravimetric Analysis (TGA) Property Description Principle Measures the weight loss or gain of a sample as it is heated. Applications Determination of moisture content, thermal decomposition, and phase transitions. Advantages Can be used for a wide range of materials, can provide quantitative information about weight loss or gain. Limitations May be affected by the heating rate and atmosphere.
  • 6. Scanning probe microscopy Property Description Principle Uses a probe to scan the surface of a material and measure interactions between the probe and the surface. Applications Imaging of surfaces with atomic resolution, measurement of surface properties (e.g., roughness, stiffness). Advantages High spatial resolution, can be used for imaging both conductive and non-conductive materials. Limitations Can be time-consuming, may be affected by vibrations and environmental factors.
  • 7. Scanning electron microscopy(SEM) Property Description Principle Scans the surface of a material with a focused beam of electrons, generating secondary electrons that are collected to form an image. Applications Imaging of surface morphology and topography, analysis of particle size and distribution. Advantages High resolution, can be used for both conductive and non-conductive materials. Limitations Requires a vacuum environment, may be affected by charging effects.
  • 8. Transmission electron microscopy(TEM) Property Description Principle Transmits a beam of electrons through a thin sample, creating an image of the internal structure. Applications Imaging of crystal structure, defects, and nanostructures. Advantages High resolution, can provide information about the internal structure of materials. Limitations Requires thin samples, may be affected by electron beam damage.
  • 9. X Ray photoelectron spectroscopy Property Description Principle Measures the kinetic energy of electrons ejected from a material by X-rays. Applications Determination of elemental composition, chemical state analysis, surface analysis. Advantages Can provide information about the surface composition and chemical state of elements. Limitations Requires a high vacuum environment, may be affected by surface contamination.