The document discusses modeling the impact of ground plated through hole (GND-PTH) stitches in memory controller packages using the method of moments (MoM). MoM is used to simulate GND-PTH stitches in DDR3/GDDR3/GDDR5 memory controller packages and study their impact on data eye opening and radiated emission. Simulation results provide design guidelines for memory controller packages by determining the minimum number and placement of GND-PTH stitches required.