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Prof. L. Satish
HV Lab, Dept. of Electrical Engineering
Indian Institute of Science, Bangalore
homepage: hve.iisc.ernet.in/~satish
Credits: Dr. Pritam Mukherjee
Localization of Incipient Mechanical Damage
– Frequency Response Analysis
Transformer Technology Symposium, 9th - 10th Aug 2016, BANGALORE
My Research Interests
 Signal processing of HV impulse test data
 Testing ADCs in waveform digitizers
 Basic study on transformer windings
 Indirect measurement of Series Capacitance
 FRA for diagnostics and interpretation
 Localization, severity assessment of radial &
axial displacements
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Outline
 Introduction
 FRA: State-of-the-art
 Longstanding issues in FRA
 Objectives
 Generalized Analytical Formulation
 Localization and Severity assessment
 Radial Displacement
 Axial Displacement
 Summary
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Introduction
• Diagnostic Testing and Condition Monitoring
• Triggered by structural change in energy sector
• Power/Energy is now a marketable quantity
• DTCM is a necessity for power utilities to
 Optimise existing assets, Lower operating costs
 Prevent unscheduled outages
 Detect incipient fault, Track fault evolution
 Invaluable feedback to designer
Thereby, use HV power equipment efficiently
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Monitoring and Diagnostics
 Monitoring
 Desirable qualities: On-line, On-site, Non-
destructive, Non-invasive
 Data acquisition and Noise suppression
 Includes sensor development
 Diagnostics
 Interpretation of monitored data
 Provide corrective/preventive action
 Strong mathematical basis
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Insulation system Winding and Core
 Dissolved gas analysis
 Partial Discharge
 Top oil temperature
 Degree of polymerization
 Furan analysis
 Recovery voltage
 Insulation resistance
 Capacitance and tan
 IR Imaging, FO sensors
 Reactance
 Low voltage
impulse test
 HV dielectric test
and Transfer
function
 FRA/SFRA
DTCM methods for Transformers
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Why Measure FRA?
 Functionally relates input and output
 Thus, allowing mathematical modeling
 FRA is very sensitive to changes in
the winding geometry
 Whenever L&C distribution is altered,
it leads to a deviation in FRA
 FRA mismatch IMPLIES winding damage
 FRA data contains hidden info about
fault, its location, etc….
 Cumulative effect of exposure to
abnormal conditions creates weak-
spots, incipient faults,…
 Weak-spot eventually leads to failure
 But, weak-spots are not immediately
found or perceivable
 Goal: Find such weak-spots by FRA
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
FRA: Longstanding Issues
 In existence for more than 25 years
 Is still a Monitoring Tool ONLY!!
 WHY?
 Lack of rigorous analysis
 Underlying phenomenon is intricate
 Capturing complex correlations between
FRA deviation and damage remains elusive
 A Cause-and-Effect rule for different faults,
based on indices, is difficult to generalize
HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
 An engineer expects FRA to provide
info on fault location, severity, etc.,
so that corrective action, if needed,
can be determined and initiated.
 On this count, sadly, FRA has failed
as a diagnostic
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
FRA: Longstanding Issues
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
FR Analysis Zones
Core and Magnetic Circuit (Low Freq)
•Freq < 10 kHz
Winding Geometry (Mid Freq)
•10 kHz < Freq < 600-800 kHz
Inter - Connections and Test System (High Freq)
•Freq > 1MHz
FRA Interpretation- Current Practice
International Standards and Status
 Stds recognize its inherent potential
 So, FRA is treated as an additional
source of valuable information
 But, NOT yet an Acceptance Test
 Guides/Stds issued by-
 IEC 60076-18 Ed. 1.0, 2012
 IEEE Std. C57.149™, 2012
 CIGRE Tech Brochure No. 342, 2008
HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
Summary of Literature
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
F
R
A
1. Estd. in 1979, detect mechanical damage and establish
achievable level of sensitivity
2. Use of mathematical and statistical indices to connect
winding damage & frequency deviation. Is Not Universal!
3. Correlating a mechanical damage to an equivalent change
in ladder network
4. Rational function approximation of the measured FRA gain
and phase data
5. Synthesis of ladder-network corresponding to healthy and
faulty FRA, search/optimization and evolutionary algorithms
Ground Truth
1. No closed-form expression to
link damage location and its
severity to observed deviation
in FRA data
2. No generic method to locate
true mechanical damage in an
actual transformer winding
based on measured FRA data
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Bottom-line
It appears that unless this
fundamental bottleneck is
overcome, it will be difficult to
foresee FRA attaining the status
of a true diagnostic tool.
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Typical Failures: EXTREME EXAMPLES
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Typical Failures: EXTREME EXAMPLES
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Typical Failures: EXTREME EXAMPLES
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Typical Failures: EXTREME EXAMPLES
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Typical Failures: EXTREME EXAMPLES
Nominal Winding
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Incipient Radial Displacement
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
FRA comparison: Healthy vs Faulty
The BIG QUESTION???
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Given Healthy & Faulty FRA
data, is it POSSIBLE to work
BACKWARDS to Locate a
minor winding damage and
assess its severity??
 Derive expression to link change in
FRA data to change in winding L & C
 Employ this to
 Locate actual RD & AD in an actual winding
 Estimate its severity
 Given-
 Measurable inputs at terminals
 Winding data in its nominal state
HV Lab, Dept. of Electrical Engineering, IISc
Terms of Reference
August 30, 2016
Why Analytical Approach?
 Solutions are generic and applicable
to all types of uniform winding
 Removes empiricism that existed in
previous methods
 Establishes a theoretical basis for
FRA data interpretation
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
s
s
s
g
g
g
g
Origin of Equivalent Circuit
Core, winding and tank assembly of a transformer can be
visualized as a distributed parameter inductively coupled
ladder network of capacitances, inductances and resistors
HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
Ladder Network Model Used
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
DPI
or
Z(s)
Each circuit element is DISTINCT
 For an LTI system,
DPI Peaks are the OCNFs, Troughs are the SCNFs
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Choice of Network Function
 DPI was preferred to TF, as it
affords many advantages
Derivation: State Space Formulation
 Eigen values of system matrix A are
the natural frequencies of a system
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 SCNFs/Zeros of DPI are eigenvalues of system matrix A,
and can be determined for a 3-section ladder network
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Derivation: State Space Formulation
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Derivation: State Space Formulation
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Derivation: State Space Formulation
 Substituting, system matrix A can be rewritten as
 Neglecting resistances leads to block anti-diagonal form of A
Difficulties
 Eigenvalues of A can be easily computed
when its entirely numeric
 But, when there are symbols, it is difficult,
especially, when N is large
 L, C are simple, have a systematic pattern
 Inversion destroys this, and leads to
higher-order and cross-terms
 Using A with symbols in its present form is
not suitable for an ANALYTICAL expression
 Hence, alternatives are needed….!!
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Alternative- Use 1/ω2 instead of ω
 Avoid: Finding eigenvalues of A, in
its current form
 Avoid: Inversion of L and C
 Intuition: Resonance: series LC ckt
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 Find: Matrix with 1/ω2 as its eigen
value, and expressible as product of
L and C matrices
 If jωsci is an eigenvalue of A, by def.
 Let,
 So, are the eigenvalues of Λ
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
New idea: Inverse square of SCNFs
 Matrix A is 2Nx2N, Λ is NxN
 Eigenvalues of A: ±jωsci (complex)
 Eigenvalues of Λ: -ω2
sci (real)
 But, still inversion of L and C exists
 This has to be avoided….
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
New idea: Inverse square of SCNFs
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
New idea: Inverse square of SCNFs
 It is well-known from linear algebra:
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Compactly expressed as
Conjectured earlier, now proved !!!
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 Eigenvalues of are
 Inversion of symbolic L, C avoided
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Trace is sum of diagonal elements of
Computing it, and rearranging yields
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Significance of M0i
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Salient Features of Expression
 Monotonicity of M0i w.r.t index i
 M0i vs i needed for localization
 M0i can be computed for an actual
winding or estimated via FEM-based
 Generalized expression for N-sections
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Analytical Expression
Therefore, for the first time, a
generalized expression
connecting SCNFs and the
parameters of a completely
inhomogeneous ladder network
having an arbitrary number of
sections has been derived.
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Salient Features of the Expression
 Connects SCNFs & ladder network elements
 Valid for uniform, nonuniform & damaged wdg
 Contributions of Cg and Cs are decoupled
 Ψscnf proportional to amount of change, so is a
indicator of severity (qualitatively)
 Ψscnf contribution of lower frequency SCNFs are
more compared to the higher frequency
 Cg element contribution depends on its position
 This property is crucial in localization
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Radial Displacement in Actual wdg
 RD causes significant change in Cg
alone
 The rest of distributions remain
more or less unaffected
 Minor/incipient RD can be modeled
as a change in Cg alone, viz.,
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 Let,
 Then,
 Hence,
 Thus, for a M0m, knowing M0i vs i,
the location/position can be found
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Experiments on an Actual Winding
 Requirements-
 Measure SCNFs before and after RD
 Measure Cg before and after RD
 Variation of M0x vs x
 Procedure-
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 One healthy phase of a
discarded trfr taken
 Trfr rating-
 3-ph, 70 kVA, 2200/220 V,
25 Hz
 23 disk-pairs
 Cut out all disk-pairs
 13 identical disks pairs
selected and stacked
horizintally as shown
 FRA measurement
 Inner Dia = 240 mm
 Outer Dia = 290 mm
Experimental setup
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
M0x versus x
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Nominal Winding
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Radial Displacement: 11th disk-pair
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
FRA before Radial Displacement
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
FRA after Radial Displacement
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Sample calculations
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
CASE-A: RD of 1 disk-pair at
different positions
Nominal Winding
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
CASE B: RD involving 2 disk-pairs
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
CASE C: Assessment of Severity
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
3mm
HV Lab, Dept. of Electrical Engineering, IISc
4mm
5mm
6mm
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Axial Displacement
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 Here, both Lii and Cg will change
 Philosophy of localization algorithm
1. Estimate changed Lii & Cg for an AD
2. Repeat step-1, for all positions of AD
3. Use equation and measurement to
locate AD and estimate its severity
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Axial Displacement
Estimation of new L
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Disk-1
Disk-2
Disk-3
Disk-4
Disk-5
Disk-6
Estimation of new L
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Disk-1
Disk-2
Disk-3
Disk-4
Disk-5
Disk-6
Estimation of new L
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Disk-1
Disk-2
Disk-3
Disk-4
Disk-5
Disk-6
Inductance change for Disk-1
D1 D2 D3 D4 D5 D6
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Inductance change for Disk-1
D1 D2 D3 D4 D5 D6
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Estimation of new L
 The new inductance matrix can
be estimated, for a given AD
location, if the quantum of
displacement can somehow be
worked out first.
 Three steps are involved-
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Estimation of new L and new Cg
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
1.
2.
3.
Proposed Method- Steps
Measure before & after AD
For each AD location, find new L & C,
For each, compute
Plot versus ‘x’
Find ‘x’ corresponding to
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
1.
2.
3.
4.
5.
6.
Sample results: AD @ D-7 and D-8
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
8 7 6 5 4 3 2 1
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Assessment of Severity of AD
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
Summary …
 Analytical expression derived to connect
radial/axial displacement and change in
natural frequencies
 Localization of actual radial and axial
displacement successfully demonstrated!!
 Assessment of severity is ALSO possible!!
HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
 Takeaway- Innovative methods needed to
harness hidden information in FRA data, as
demonstrated by this work
 FR analysis is a very complex and teasingly
challenging task,
 But, solutions do exist and can be found!!
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
 Thanks for your kind attention
 Questions Please… ?
August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc

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Frequency Response Analysis by Prof Satish IISc

  • 1. Prof. L. Satish HV Lab, Dept. of Electrical Engineering Indian Institute of Science, Bangalore homepage: hve.iisc.ernet.in/~satish Credits: Dr. Pritam Mukherjee Localization of Incipient Mechanical Damage – Frequency Response Analysis Transformer Technology Symposium, 9th - 10th Aug 2016, BANGALORE
  • 2. My Research Interests  Signal processing of HV impulse test data  Testing ADCs in waveform digitizers  Basic study on transformer windings  Indirect measurement of Series Capacitance  FRA for diagnostics and interpretation  Localization, severity assessment of radial & axial displacements August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 3. Outline  Introduction  FRA: State-of-the-art  Longstanding issues in FRA  Objectives  Generalized Analytical Formulation  Localization and Severity assessment  Radial Displacement  Axial Displacement  Summary August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 4. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Introduction • Diagnostic Testing and Condition Monitoring • Triggered by structural change in energy sector • Power/Energy is now a marketable quantity • DTCM is a necessity for power utilities to  Optimise existing assets, Lower operating costs  Prevent unscheduled outages  Detect incipient fault, Track fault evolution  Invaluable feedback to designer Thereby, use HV power equipment efficiently
  • 5. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Monitoring and Diagnostics  Monitoring  Desirable qualities: On-line, On-site, Non- destructive, Non-invasive  Data acquisition and Noise suppression  Includes sensor development  Diagnostics  Interpretation of monitored data  Provide corrective/preventive action  Strong mathematical basis
  • 6. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Insulation system Winding and Core  Dissolved gas analysis  Partial Discharge  Top oil temperature  Degree of polymerization  Furan analysis  Recovery voltage  Insulation resistance  Capacitance and tan  IR Imaging, FO sensors  Reactance  Low voltage impulse test  HV dielectric test and Transfer function  FRA/SFRA DTCM methods for Transformers
  • 7. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Why Measure FRA?  Functionally relates input and output  Thus, allowing mathematical modeling  FRA is very sensitive to changes in the winding geometry  Whenever L&C distribution is altered, it leads to a deviation in FRA  FRA mismatch IMPLIES winding damage  FRA data contains hidden info about fault, its location, etc….
  • 8.  Cumulative effect of exposure to abnormal conditions creates weak- spots, incipient faults,…  Weak-spot eventually leads to failure  But, weak-spots are not immediately found or perceivable  Goal: Find such weak-spots by FRA August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 9. FRA: Longstanding Issues  In existence for more than 25 years  Is still a Monitoring Tool ONLY!!  WHY?  Lack of rigorous analysis  Underlying phenomenon is intricate  Capturing complex correlations between FRA deviation and damage remains elusive  A Cause-and-Effect rule for different faults, based on indices, is difficult to generalize HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
  • 10.  An engineer expects FRA to provide info on fault location, severity, etc., so that corrective action, if needed, can be determined and initiated.  On this count, sadly, FRA has failed as a diagnostic August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc FRA: Longstanding Issues
  • 11. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc FR Analysis Zones Core and Magnetic Circuit (Low Freq) •Freq < 10 kHz Winding Geometry (Mid Freq) •10 kHz < Freq < 600-800 kHz Inter - Connections and Test System (High Freq) •Freq > 1MHz FRA Interpretation- Current Practice
  • 12. International Standards and Status  Stds recognize its inherent potential  So, FRA is treated as an additional source of valuable information  But, NOT yet an Acceptance Test  Guides/Stds issued by-  IEC 60076-18 Ed. 1.0, 2012  IEEE Std. C57.149™, 2012  CIGRE Tech Brochure No. 342, 2008 HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
  • 13. Summary of Literature August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc F R A 1. Estd. in 1979, detect mechanical damage and establish achievable level of sensitivity 2. Use of mathematical and statistical indices to connect winding damage & frequency deviation. Is Not Universal! 3. Correlating a mechanical damage to an equivalent change in ladder network 4. Rational function approximation of the measured FRA gain and phase data 5. Synthesis of ladder-network corresponding to healthy and faulty FRA, search/optimization and evolutionary algorithms
  • 14. Ground Truth 1. No closed-form expression to link damage location and its severity to observed deviation in FRA data 2. No generic method to locate true mechanical damage in an actual transformer winding based on measured FRA data August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 15. Bottom-line It appears that unless this fundamental bottleneck is overcome, it will be difficult to foresee FRA attaining the status of a true diagnostic tool. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 16. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Typical Failures: EXTREME EXAMPLES
  • 17. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Typical Failures: EXTREME EXAMPLES
  • 18. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Typical Failures: EXTREME EXAMPLES
  • 19. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Typical Failures: EXTREME EXAMPLES
  • 20. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Typical Failures: EXTREME EXAMPLES
  • 21. Nominal Winding August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 22. Incipient Radial Displacement August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 23. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc FRA comparison: Healthy vs Faulty
  • 24. The BIG QUESTION??? August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Given Healthy & Faulty FRA data, is it POSSIBLE to work BACKWARDS to Locate a minor winding damage and assess its severity??
  • 25.  Derive expression to link change in FRA data to change in winding L & C  Employ this to  Locate actual RD & AD in an actual winding  Estimate its severity  Given-  Measurable inputs at terminals  Winding data in its nominal state HV Lab, Dept. of Electrical Engineering, IISc Terms of Reference August 30, 2016
  • 26. Why Analytical Approach?  Solutions are generic and applicable to all types of uniform winding  Removes empiricism that existed in previous methods  Establishes a theoretical basis for FRA data interpretation August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 27. s s s g g g g Origin of Equivalent Circuit Core, winding and tank assembly of a transformer can be visualized as a distributed parameter inductively coupled ladder network of capacitances, inductances and resistors HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
  • 28. Ladder Network Model Used August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc DPI or Z(s) Each circuit element is DISTINCT
  • 29.  For an LTI system, DPI Peaks are the OCNFs, Troughs are the SCNFs August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Choice of Network Function  DPI was preferred to TF, as it affords many advantages
  • 30. Derivation: State Space Formulation  Eigen values of system matrix A are the natural frequencies of a system August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 31.  SCNFs/Zeros of DPI are eigenvalues of system matrix A, and can be determined for a 3-section ladder network August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Derivation: State Space Formulation
  • 32. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Derivation: State Space Formulation
  • 33. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Derivation: State Space Formulation  Substituting, system matrix A can be rewritten as  Neglecting resistances leads to block anti-diagonal form of A
  • 34. Difficulties  Eigenvalues of A can be easily computed when its entirely numeric  But, when there are symbols, it is difficult, especially, when N is large  L, C are simple, have a systematic pattern  Inversion destroys this, and leads to higher-order and cross-terms  Using A with symbols in its present form is not suitable for an ANALYTICAL expression  Hence, alternatives are needed….!! August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 35. Alternative- Use 1/ω2 instead of ω  Avoid: Finding eigenvalues of A, in its current form  Avoid: Inversion of L and C  Intuition: Resonance: series LC ckt August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc  Find: Matrix with 1/ω2 as its eigen value, and expressible as product of L and C matrices
  • 36.  If jωsci is an eigenvalue of A, by def.  Let,  So, are the eigenvalues of Λ August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc New idea: Inverse square of SCNFs
  • 37.  Matrix A is 2Nx2N, Λ is NxN  Eigenvalues of A: ±jωsci (complex)  Eigenvalues of Λ: -ω2 sci (real)  But, still inversion of L and C exists  This has to be avoided…. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc New idea: Inverse square of SCNFs
  • 38. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc New idea: Inverse square of SCNFs  It is well-known from linear algebra:
  • 39. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Compactly expressed as
  • 40. Conjectured earlier, now proved !!! August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc  Eigenvalues of are  Inversion of symbolic L, C avoided
  • 41. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Trace is sum of diagonal elements of Computing it, and rearranging yields
  • 42. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 43. Significance of M0i August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 44. Salient Features of Expression  Monotonicity of M0i w.r.t index i  M0i vs i needed for localization  M0i can be computed for an actual winding or estimated via FEM-based  Generalized expression for N-sections August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 45. Analytical Expression Therefore, for the first time, a generalized expression connecting SCNFs and the parameters of a completely inhomogeneous ladder network having an arbitrary number of sections has been derived. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 46. Salient Features of the Expression  Connects SCNFs & ladder network elements  Valid for uniform, nonuniform & damaged wdg  Contributions of Cg and Cs are decoupled  Ψscnf proportional to amount of change, so is a indicator of severity (qualitatively)  Ψscnf contribution of lower frequency SCNFs are more compared to the higher frequency  Cg element contribution depends on its position  This property is crucial in localization August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 47. Radial Displacement in Actual wdg  RD causes significant change in Cg alone  The rest of distributions remain more or less unaffected  Minor/incipient RD can be modeled as a change in Cg alone, viz., August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 48.  Let,  Then,  Hence,  Thus, for a M0m, knowing M0i vs i, the location/position can be found August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 49. Experiments on an Actual Winding  Requirements-  Measure SCNFs before and after RD  Measure Cg before and after RD  Variation of M0x vs x  Procedure- August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 50. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc  One healthy phase of a discarded trfr taken  Trfr rating-  3-ph, 70 kVA, 2200/220 V, 25 Hz  23 disk-pairs  Cut out all disk-pairs  13 identical disks pairs selected and stacked horizintally as shown  FRA measurement  Inner Dia = 240 mm  Outer Dia = 290 mm
  • 51. Experimental setup August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 52. M0x versus x August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 53. Nominal Winding August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 54. Radial Displacement: 11th disk-pair August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 55. FRA before Radial Displacement August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 56. FRA after Radial Displacement August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 57. Sample calculations August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 58. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc CASE-A: RD of 1 disk-pair at different positions
  • 59. Nominal Winding August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 60. CASE B: RD involving 2 disk-pairs August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 61. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 62. CASE C: Assessment of Severity August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc 3mm
  • 63. HV Lab, Dept. of Electrical Engineering, IISc 4mm 5mm 6mm
  • 64. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 65. Axial Displacement August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 66.  Here, both Lii and Cg will change  Philosophy of localization algorithm 1. Estimate changed Lii & Cg for an AD 2. Repeat step-1, for all positions of AD 3. Use equation and measurement to locate AD and estimate its severity August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Axial Displacement
  • 67. Estimation of new L August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Disk-1 Disk-2 Disk-3 Disk-4 Disk-5 Disk-6
  • 68. Estimation of new L August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Disk-1 Disk-2 Disk-3 Disk-4 Disk-5 Disk-6
  • 69. Estimation of new L August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc Disk-1 Disk-2 Disk-3 Disk-4 Disk-5 Disk-6
  • 70. Inductance change for Disk-1 D1 D2 D3 D4 D5 D6 August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 71. Inductance change for Disk-1 D1 D2 D3 D4 D5 D6 August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 72. Estimation of new L  The new inductance matrix can be estimated, for a given AD location, if the quantum of displacement can somehow be worked out first.  Three steps are involved- August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 73. Estimation of new L and new Cg August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc 1. 2. 3.
  • 74. Proposed Method- Steps Measure before & after AD For each AD location, find new L & C, For each, compute Plot versus ‘x’ Find ‘x’ corresponding to August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc 1. 2. 3. 4. 5. 6.
  • 75. Sample results: AD @ D-7 and D-8 August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 76. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc 8 7 6 5 4 3 2 1
  • 77. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 78. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 79. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 80. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 81. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 82. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 83. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 84. Assessment of Severity of AD August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 85. August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 86. Summary …  Analytical expression derived to connect radial/axial displacement and change in natural frequencies  Localization of actual radial and axial displacement successfully demonstrated!!  Assessment of severity is ALSO possible!! HV Lab, Dept. of Electrical Engineering, IIScAugust 30, 2016
  • 87.  Takeaway- Innovative methods needed to harness hidden information in FRA data, as demonstrated by this work  FR analysis is a very complex and teasingly challenging task,  But, solutions do exist and can be found!! August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc
  • 88.  Thanks for your kind attention  Questions Please… ? August 30, 2016 HV Lab, Dept. of Electrical Engineering, IISc