This document discusses techniques for improving fault tolerance in VLSI circuits through micro inversion. It begins with an introduction to increasing reliability concerns with technology scaling. It then discusses micro inversion, where operations on erroneous data are "undone" through hardware rollback of a few cycles. It describes implementing micro inversion in a register file and handling the potential domino effect in multi-module systems through common bus transactions acting as a clock. The document concludes that micro inversion combined with parallel error checking can help achieve fault tolerance in complex multi-module VLSI systems.