The document describes a study that used a crop growth model combined with remotely sensed leaf area index (LAI) data to simulate regional winter wheat yield in northern China. The study area covered 11 counties. Researchers used the EPIC crop growth model optimized with the SCE-UA algorithm. Remotely sensed MODIS LAI data were input to the model. The model was able to accurately simulate winter wheat sowing dates, plant density, fertilizer application rates, and yields compared to field investigation data, demonstrating the potential of the approach for crop monitoring and yield forecasting.