SlideShare a Scribd company logo
2
Most read
6
Most read
12
Most read
BOUNDARY SCAN
JTAG
WHAT IS JTAG??..
 Joint Test Action Group (JTAG) is the
common name used for a debugging, programming, and testing interface typically
found on microcontrollers, ASICs, and FPGAs. It enables all components with this
interface to be tested, programmed, and/or debugged using a single connector on
a PC board which can daisy chain them together.
JTAG is the name of the group that defined the IEEE 1149.1 standard. This standard
defines the Test Access Port (TAP) controller logic used in processors with JTAG
interfaces.
Required below pins -
TMS -Test Mode Select
TCK - Test Clock Input
TDI - Test Data Input
TDO - Test Data Output
TRST - Test Reset (optional)
WHY JTAG???
 This interface enables you to debug the hardware easily in real time (i.e.
emulate). It can control directly the clock cycles provided to the micro controller
through software
This unique interface enables you to debug the hardware easily in real time (i.e.
emulate). It can control directly the clock cycles provided to the micro controller
through software. Therefore you can put hardware breakpoints in your code
execution. You can start, pause, stop the execution of the code in the hardware as
you want.
 For simplicity, one may assume the
following hardware
Whenever JTAG control is set to '1', oscillator clock will be
connected to CPU, else CPU will not receive clock and
cannot execute any instruction. This way, you can control
the execution of instructions in hardware.
HOW JTAG??...
 JTAG PORT TYPICALLY CONTAINS FIVE SIGNALS LIKE TDI TDO TMS TCK TRST
 THE DATA SHIFTED FROM THE TEST DATA IN PUT CAN BE SHIFTED TO SEVERAL DATA
DESTINATIONS ONE SUCH DESTINATION IS BOUNDARY SCAN REGISTER THIS ARE THE
CELLS WHICH CONNECTS THE BOUNDARY IO PINS OF THE DEVICE
 TEST VECTOR IS SHIFTED INTO THE BOUNDARY SCAN REGISTER DATA IS ALSO
SHIFTED OUT FROM THE PREVIOUS TEST VECTOR SO THAT IT CAN BE COMPAED
TAP CONTROLLER
TAP is the abbreviation for the test access port it is the part of IEEE 1149.1
Standard for JTAG
THE ORIGINAL MOTIVATION FOR JTAG IS BOUNDARY SCAN TEST
BOUNDARY SCAN IS THE METHOD FOR GAINING CONTROL FOR THE IO PINS
The TAP controller is a finite state machine with a state diagram containing 16 states
IT CONSISTS OF THREE BLOCKS
1) RESET AND RUN TEST BLOCK
2) INSTRUCTION REGISTER BLOCK
3) DATA REGISTER BLOCK
Test logic
FINATE STATE MACHINE

Jtagppt
Jtagppt
Boundary scan cell
EXTEST
VARIOUS OPERATION
MODE
INTEST

More Related Content

PDF
Jtag presentation
PPTX
Spyglass dft
PPT
The IEEE 1149.1 Boundary-scan test standard
PDF
ATPG Methods and Algorithms
PPTX
DRCs.pptx
PDF
Design-for-Test (Testing of VLSI Design)
PDF
Sta by usha_mehta
PPTX
Scan insertion
Jtag presentation
Spyglass dft
The IEEE 1149.1 Boundary-scan test standard
ATPG Methods and Algorithms
DRCs.pptx
Design-for-Test (Testing of VLSI Design)
Sta by usha_mehta
Scan insertion

What's hot (20)

ODP
APB protocol v1.0
PPTX
Advance Peripheral Bus
PDF
IMPLEMENTATION AND VALIDATION OF MEMORY BUILT IN SELF TEST (MBIST) - SURVEY
PPTX
PDF
What is JTAG?
PDF
14 static timing_analysis_5_clock_domain_crossing
PDF
Dual port ram
PDF
Deterministic Test Pattern Generation ( D-Algorithm of ATPG) (Testing of VLSI...
PPTX
Design for testability and automatic test pattern generation
PDF
Automatic Test Pattern Generation (Testing of VLSI Design)
PDF
Pcie basic
PDF
Design for Testability
PPTX
Introduction to System verilog
DOCX
Timing analysis
PPT
Pass Transistor Logic
PPSX
VLSI Testing Techniques
PPT
Placement and routing in full custom physical design
PPTX
Vlsi physical design automation on partitioning
PDF
Design for Testability
APB protocol v1.0
Advance Peripheral Bus
IMPLEMENTATION AND VALIDATION OF MEMORY BUILT IN SELF TEST (MBIST) - SURVEY
What is JTAG?
14 static timing_analysis_5_clock_domain_crossing
Dual port ram
Deterministic Test Pattern Generation ( D-Algorithm of ATPG) (Testing of VLSI...
Design for testability and automatic test pattern generation
Automatic Test Pattern Generation (Testing of VLSI Design)
Pcie basic
Design for Testability
Introduction to System verilog
Timing analysis
Pass Transistor Logic
VLSI Testing Techniques
Placement and routing in full custom physical design
Vlsi physical design automation on partitioning
Design for Testability
Ad

Similar to Jtagppt (20)

PDF
DESIGN OF IEEE 1149.1 TAP CONTROLLER IP CORE
PDF
Design of IEEE 1149.1 Tap Controller IP Core
PDF
JTAG-Technical-Primer.pdf
PDF
IRJET- PCB Test, Debug & Programming Made Easy with Universal Test Jig
PDF
PDF
What is JTAG..pdf
PDF
JTAG
PPTX
Prezentare tcs2011
PDF
JTAG Interface (Intro)
PPTX
Timing n interrupt.pptx
PPT
Level sensitive scan design(LSSD) and Boundry scan(BS)
PDF
How Many Ways Can I Manage Oracle GoldenGate?
PPTX
-basic concept and history-of-plc-ppt.pptx
PDF
1-AVR Introduction to Atmega32 good .pdf
PPTX
Review journal CA pRNG with global loop non-uniform rule control
PDF
LE1201-XJLink2
PDF
One integrated platform for all activities,from engineering to production
PDF
Lorenzo 1210 features
PPT
Overview of LPC213x MCUs
PPT
Output compare
DESIGN OF IEEE 1149.1 TAP CONTROLLER IP CORE
Design of IEEE 1149.1 Tap Controller IP Core
JTAG-Technical-Primer.pdf
IRJET- PCB Test, Debug & Programming Made Easy with Universal Test Jig
What is JTAG..pdf
JTAG
Prezentare tcs2011
JTAG Interface (Intro)
Timing n interrupt.pptx
Level sensitive scan design(LSSD) and Boundry scan(BS)
How Many Ways Can I Manage Oracle GoldenGate?
-basic concept and history-of-plc-ppt.pptx
1-AVR Introduction to Atmega32 good .pdf
Review journal CA pRNG with global loop non-uniform rule control
LE1201-XJLink2
One integrated platform for all activities,from engineering to production
Lorenzo 1210 features
Overview of LPC213x MCUs
Output compare
Ad

Recently uploaded (20)

PDF
A GUIDE TO GENETICS FOR UNDERGRADUATE MEDICAL STUDENTS
PDF
Empowerment Technology for Senior High School Guide
PDF
Paper A Mock Exam 9_ Attempt review.pdf.
PDF
ChatGPT for Dummies - Pam Baker Ccesa007.pdf
PDF
RTP_AR_KS1_Tutor's Guide_English [FOR REPRODUCTION].pdf
PPTX
History, Philosophy and sociology of education (1).pptx
PDF
Computing-Curriculum for Schools in Ghana
PDF
Indian roads congress 037 - 2012 Flexible pavement
PPTX
B.Sc. DS Unit 2 Software Engineering.pptx
PDF
Black Hat USA 2025 - Micro ICS Summit - ICS/OT Threat Landscape
PPTX
Virtual and Augmented Reality in Current Scenario
PPTX
Chinmaya Tiranga Azadi Quiz (Class 7-8 )
PDF
What if we spent less time fighting change, and more time building what’s rig...
PDF
1.3 FINAL REVISED K-10 PE and Health CG 2023 Grades 4-10 (1).pdf
PDF
Trump Administration's workforce development strategy
PPTX
CHAPTER IV. MAN AND BIOSPHERE AND ITS TOTALITY.pptx
PPTX
Introduction to pro and eukaryotes and differences.pptx
PDF
Chinmaya Tiranga quiz Grand Finale.pdf
PDF
AI-driven educational solutions for real-life interventions in the Philippine...
PDF
Τίμαιος είναι φιλοσοφικός διάλογος του Πλάτωνα
A GUIDE TO GENETICS FOR UNDERGRADUATE MEDICAL STUDENTS
Empowerment Technology for Senior High School Guide
Paper A Mock Exam 9_ Attempt review.pdf.
ChatGPT for Dummies - Pam Baker Ccesa007.pdf
RTP_AR_KS1_Tutor's Guide_English [FOR REPRODUCTION].pdf
History, Philosophy and sociology of education (1).pptx
Computing-Curriculum for Schools in Ghana
Indian roads congress 037 - 2012 Flexible pavement
B.Sc. DS Unit 2 Software Engineering.pptx
Black Hat USA 2025 - Micro ICS Summit - ICS/OT Threat Landscape
Virtual and Augmented Reality in Current Scenario
Chinmaya Tiranga Azadi Quiz (Class 7-8 )
What if we spent less time fighting change, and more time building what’s rig...
1.3 FINAL REVISED K-10 PE and Health CG 2023 Grades 4-10 (1).pdf
Trump Administration's workforce development strategy
CHAPTER IV. MAN AND BIOSPHERE AND ITS TOTALITY.pptx
Introduction to pro and eukaryotes and differences.pptx
Chinmaya Tiranga quiz Grand Finale.pdf
AI-driven educational solutions for real-life interventions in the Philippine...
Τίμαιος είναι φιλοσοφικός διάλογος του Πλάτωνα

Jtagppt

  • 2. WHAT IS JTAG??..  Joint Test Action Group (JTAG) is the common name used for a debugging, programming, and testing interface typically found on microcontrollers, ASICs, and FPGAs. It enables all components with this interface to be tested, programmed, and/or debugged using a single connector on a PC board which can daisy chain them together. JTAG is the name of the group that defined the IEEE 1149.1 standard. This standard defines the Test Access Port (TAP) controller logic used in processors with JTAG interfaces. Required below pins - TMS -Test Mode Select TCK - Test Clock Input TDI - Test Data Input TDO - Test Data Output TRST - Test Reset (optional)
  • 3. WHY JTAG???  This interface enables you to debug the hardware easily in real time (i.e. emulate). It can control directly the clock cycles provided to the micro controller through software This unique interface enables you to debug the hardware easily in real time (i.e. emulate). It can control directly the clock cycles provided to the micro controller through software. Therefore you can put hardware breakpoints in your code execution. You can start, pause, stop the execution of the code in the hardware as you want.
  • 4.  For simplicity, one may assume the following hardware Whenever JTAG control is set to '1', oscillator clock will be connected to CPU, else CPU will not receive clock and cannot execute any instruction. This way, you can control the execution of instructions in hardware.
  • 5. HOW JTAG??...  JTAG PORT TYPICALLY CONTAINS FIVE SIGNALS LIKE TDI TDO TMS TCK TRST  THE DATA SHIFTED FROM THE TEST DATA IN PUT CAN BE SHIFTED TO SEVERAL DATA DESTINATIONS ONE SUCH DESTINATION IS BOUNDARY SCAN REGISTER THIS ARE THE CELLS WHICH CONNECTS THE BOUNDARY IO PINS OF THE DEVICE  TEST VECTOR IS SHIFTED INTO THE BOUNDARY SCAN REGISTER DATA IS ALSO SHIFTED OUT FROM THE PREVIOUS TEST VECTOR SO THAT IT CAN BE COMPAED
  • 6. TAP CONTROLLER TAP is the abbreviation for the test access port it is the part of IEEE 1149.1 Standard for JTAG THE ORIGINAL MOTIVATION FOR JTAG IS BOUNDARY SCAN TEST BOUNDARY SCAN IS THE METHOD FOR GAINING CONTROL FOR THE IO PINS The TAP controller is a finite state machine with a state diagram containing 16 states IT CONSISTS OF THREE BLOCKS 1) RESET AND RUN TEST BLOCK 2) INSTRUCTION REGISTER BLOCK 3) DATA REGISTER BLOCK