The document outlines a dual-target test-driven development (TDD) approach for embedded systems called 'metal-in' TDD, aimed at improving the efficiency and safety of creating and evolving embedded code. It emphasizes the importance of faster feedback, treating embedded code as independent subsystems, and using software test-doubles to streamline the development process. Practical examples and methodologies are presented to demonstrate how to implement this approach effectively in the context of embedded software design and testing.