The document discusses updates and challenges associated with the next-generation physical layer specifications for MIPI C-Phy, D-Phy, and M-Phy in 2017, including changes to eye diagram test methodologies. Key updates include enhancements in transmission rates, voltage levels, and calibration improvements across the different MIPI standards. Additionally, it highlights the importance of direct connections for testing accuracy and the implementation of spread spectrum clocking to reduce signal interference.
Related topics: