Moisture content investigation in the soil samples using microwave dielectric constant measurement method

International Journal of Electrical and Computer Engineering (IJECE)
Vol. 10, No. 1, February 2020, pp. 704~710
ISSN: 2088-8708, DOI: 10.11591/ijece.v10i1.pp704-710  704
Journal homepage: http://ijece.iaescore.com/index.php/IJECE
Moisture content investigation in the soil samples using
microwave dielectric constant measurement method
Shashi K. Dargar, Viranjay M. Srivastava
Department of Electronic Engineering, University of KwaZulu-Natal, South Africa
Article Info ABSTRACT
Article history:
Received Jul 10, 2018
Revised Sep 30, 2019
Accepted Oct 7, 2019
The microwaves of typical frequency ranges of 3 GHz to 30 GHz have been
in use for remote sensing applications which are progressing rapidly.
The microwaves can sense existing moisture in any material that absorbs
moisture such as soil or vegetation. In case of soils which may be comprised
of variable mix proportionate of solids, liquids or gases and distinct textures
subjected to the associated size and the arrangements of soil particles. Hence,
the moisture absorption by a specific type of soil used to be different.
The inherent physical and electrical properties such as color, texture, grains,
dielectric constant, conductivity or permeability, etc. differentiate various
soils. In this work, authors present soil moisture measurement by simple
estimation of emissivity i.e. the ratio of energy radiated by an object to
absorbing the body of same physical temperature. A strategic method of
measuring dielectric constant using a microwave signal is used in this
research work. The measurement of the dielectric constant of the soils
collected from the specific regions and analysis of results has been reported.
The proposed method is less complex and can further be used for
the identification of soil moisture and agricultural applications.
Keywords:
Dielectric constant
Emissivity
Microwave
Soil moisture
Waveguide
Copyright © 2020 Institute of Advanced Engineering and Science.
All rights reserved.
Corresponding Author:
Shashi K. Dargar,
Department of Electronic Engineering, Howard College,
University of KwaZulu-Natal,
Durban, 4041, South Africa.
Email: drshashikant.dargar@ieee.org
1. INTRODUCTION
The soil is composed of soil particles, air, and bounded or free watering contents [1]. Microwave
techniques for the measurement of soil moisture content are based on the fact that the dielectric properties of
water and the soil particles are dissimilar. This emissivity is a function of physical and electrical parameters of
the soiled object and related to dielectric property. The dielectric constant, which is a complex number
representing the response of any material to an electric field, is the measure of dielectric properties [2, 3].
The property is about the free space (=or) and involves real and imaginary components as  = ' + i".
The real part of dielectric constant (') is in phase and signifies the propagation characteristics of the EM
signal in the material related to the wave velocity, whereas the complex component (") is out of phase and
determines the energy losses as the electromagnetic wave passes through the material [4-7]. The energy
losses and absorption are referred to as dielectric loss factor [8]. The energy losses cause vibration or spin of
the water molecules in soil [9].
Conceptually, the divergence in dielectric properties of water and dry soil, and the relation between
Fresnel reflection coefficient and dielectric constant are the fundamentals of sensing soil moisture. For dry
soil particles, the real part of the relative dielectric constant (r') ranges between 2 to 5, with an imaginary
part (r") typically less than 0.05 [10]. In contrary, for free water, the relative dielectric constant at room
temperature the real component is nearly 80 and the imaginary part is 4 [11]. As this much significant

Int J Elec & Comp Eng ISSN: 2088-8708 
Moisture content investigation in the soil samples using microwave dielectric constant … (Shashi K. Dargar)
705
difference in dielectric constant lies in soil and water, it makes possible to measure soil moisture using
microwaves. But as reported in the past [12, 13], because of water molecules absorbed into the surfaces of
particles and restrained dipoles, the bounded water has a lower dielectric constant than free water confined to
the aperture spaces. Besides this, the r of moist soil is proportional to the number of water dipoles per unit
volume, volumetric models are preferred over gravimetric [14, 15]. Several other passive methods have also
been proposed in the past which does not make use of the microwave techniques but it clear in
the literature that for the near-surface soil moisture content measurement, utilizing microwave method has
the high efficacy due to all-weather competencies. In this research work, authors present the dielectric
constant analysis of different soils using the microwave method and propose the soil moisture detection from
the obtained results.
2. METHODOLOGY
This section describes the procedure followed to perform the soil dielectric constant measurement.
Table 1 shows the list of soil samples specified with their PH and EC values [16-18] with their collect
locations in Udaipur district. These samples were filled in the slot section of a structure called waveguide cell
which is an essential part of this measurement utilized to expose the signal on the soil under test.
Table 1. Soil samples for dielectric constant measurement
S.N. Soil Sample Location PH EC
1 RCA, Farm 8.0 2.5
2 RCA, Farm 7.55 2.7
3 Badgaon 9.83 0.10
4 Badgaon 9.68 0.47
5 Badgaon 8.21 0.09
6 Fatehnagar 9.69 0.21
7 Khumanpura 9.74 0.30
10 Shivam 9.48 0.87
11 Shivam 9.35 1.94
12 Pabusar 9.85 0.21
13 Padar 9.90 0.15
The measurement started with creating the waveguide cell using the mechanical tools on a metallic
piece. The waveguide cell is a termination structure for x-band rectangular waveguide. The soil sample
under test has been placed into the designed slot. Figure 1 shows the designed structure of the waveguide cell
with dimensions as length, width, and depth of the slot is 2.65 cm, 1.60 cm, and 0.50 cm, respectively.
These dimensions are chosen in accordance with the bench component size specifications and radiation
exposure [19].
Figure 1. Designed structure for soil sample and dimensions

 ISSN: 2088-8708
Int J Elec & Comp Eng, Vol. 10, No. 1, February 2020 : 704 - 710
706
2.1. Experimental setup
The equipment comprised of microwave bench components. This include regulated power supply to
input to the microwave source, reflex klystron tube, and mount, bench isolator, microwave components,
i.e. attenuator, Probe detector, short, E-H and magic tee junctions Frequency Meter, and slotted line carriage
section along with measuring devices such as Voltage Standing Wave Ratio (VSWR) meter, microammeter
ranges up to 500 μA, and oscilloscopes. The reflex klystron tube is a microwave generator with built-in
feedback mechanism which functions using the single reentrant cavity for bunching and produces the output.
When in operation, the initial RF fringing field of cavity modulates the velocity beam when passes through
the cavity to the drift space.
The deceleration of velocity and reversal by the considerable reflector potential set up the beam to
pass the cavity again in the opposite direction. Therefore, the proper choice of the reflector voltage (Vr) is to
be made in such a way that the phase angle adds up in the second pass of the electron beam for establishing
positive feedback and to initiate the tube oscillation. The device set up is shown in Figure 2, and
the alignment has been set up by connecting components and equipment as shown in the setup diagram.
The variable attenuator is set to the maximum position for micrometer to indicate zero.
Figure 2. Experimental setup using X-band microwave bench
The mod-switch of Klystron power supply is kept to Continuous Wave (CW) position with beam
voltage control knob to fully anti-clockwise and reflector voltage control knob to fully clockwise at meter
switch to OFF position. Then the knob of frequency meter rotated fully at one side. Also the multimeter in
DC microampere range of up to 250 μA. After that, once the Klystron Power Supply (KPS), VSWR meter
and assisted cooling fan of the tube is switched ON, the meter is to be switched at beam voltage position and
rotated the beam voltage knob clockwise to slowly up to 300 volts. As specified for the instrument, the beam
current is not being exceeded than 30 milliamps. Further, the reflector voltage Vr is to be slightly varied to
look for the fluctuation in the micrometer scales and set to the voltage point at maximum deflection in
the meter. If no deflection is obtained change the multimeter switch position to 50 μA. and tune the plunger
of Klystron mount for the maximum output. Then after the knob of frequency meter slowly revolved and
stopped to a position where the output is minimum.
The direct reading of the frequency meter between two horizontal lines and the vertical marker has
been marked. If micrometer type frequency meter is used, by control meter reading in the calibration chart
can also give frequency at the point. For bench characteristics, the reflector voltages and read the current and
frequency for each reflector voltage can be noted using an oscilloscope.
For dominant TE10 mode of a rectangular waveguide, λ0, λg, and λc are related as [19, 20]:
2 2 2
1 1 1
( ) ( ) ( )o g c  
 

707
where λo is free space wavelength,
λg is guided wavelength, and
λc is cut-off wavelength
For the dominant mode TE10, λc = 2a, where ‘a’ is the broader dimension of waveguide.
2.2. Measuring frequency and guided wavelength
The control knobs of klystron power supply are adjusted for alignment, as explained in Section 2.1
and then KPS, VSWR meter, and cooling fan were switched ON. The deflection with Amplitude Modulation
(AM) amplitude and frequency were maximized from the control knob of power supply. The maximum
deflection tuning is done for the plunger of Klystron tube and frequency meter, whereas reflector knob is kept
such that few moving deflections are obtained VSWR meter. Following steps are taken to measure
the frequency and guided wavelength after alignment:
a. The tunable probe is varied to get a dip on the VSWR scale and noted the frequency which is directly
indicated from frequency meter.
b. The tunable probe has been shifted along the cut line in the slotted section and the deflection in VSWR
meter is obtained. Now, the probe is moved to minimum deflection positions.
c. For accuracy, the VSWR meter range in dB has been increased to higher decibel values.
d. By rehearsing step 2, the next minimum value at the probe movement is noted.
e. Calculate the guide wavelength as twice the distance between two successive minimum positions
obtained as above, as the subsequent minimums are 0.5 λg distant. The waveguide inner broad
dimension ‘a’ which will be around 22.86 mm for X-band. Hence, the frequency can be calculated using
the following equation [21]:
1/2
2 2
1 1
( ) ( )g c
f c
 
 
  
 
where c = 3 × 108
msec-1
i.e. velocity of light
2.3. Measurement of dielectric constant of soil samples
Once the frequency and guided wavelength from the set are calculated, the dielectric contact of
the soil under test can be measured. This section describes the dielectric constant measurement and uses
the waveguide cell placed with various soil samples in the following steps:
a. The circuit is to be set up according to the block diagram as mentioned in Figure 2. The power is
applied to the source and set for warming up.
b. The frequency, RF level, and modulation of the signal source are appropriately adjusted to get
the stability and maximum power output. Preferably at minimum gain (20 dB or 30 dB).
c. The λga can be calculated as below:
2 2
2
1 1 1
;
2a( )
a
aga
c
f


   
       
where λa, λga, and, a are the free space wavelength, guided wavelength, and larger dimension of
the waveguide in the set up with unfilled waveguide cell.
d. At this setup frequency, three successive minima positions Xa, Xa' and Xa" were measured using
Vernier scale of the slotted section keeping attenuation to a minimum in the microwave bench.
e. The dielectric sample soil is then introduced in the shorted waveguide cell at the same frequency and
three successive minima positions X, X' and X" were obtained.
f. The displacement or the shift ‘d’ in minima’s of step 4 and 5 are calculated as:
d = Xa – X = Xa
'
– X
'
= Xa
"
– X
"
g. The tangential relation for the same unfilled and filled soil sample setup would be equal. Therefore,
if the LHS term of the following equation is first calculated for (tan x)/x and then computation using
the table of x versus (tanx)/x, λg can be determined [22].

 ISSN: 2088-8708
708
2 (d L) 2 L
tan tan
2 L 2 L
ga g
ga g
 
 
 
 


       
      
      
   
   
   
Where d is the shift in minima’s of unfilled and filled waveguide cell and L is the length of waveguide slot.
h. r can be determined by substituting the value of λg in the equation given as [22]:
 
2
2
2
a a
r
g
a
 
 
 
   
 
3. EXPERIMENTAL RESULTS
The guide wavelength has been calculated, i.e., twice of the distance between two successive
minimum positions for fixed short as shown in the scales below:
Later, the dielectric sample (soil) is introduced in the shorted waveguide cell at the same frequency and four
successive minima position X, X
'
, X
"
, and X
"'
have been obtained from the measuring scale.
The difference in subsequent minima in the above two processes are calculated, which ideally
should be the same but to obtain precision and to circumvent the observational errors, the average of
the obtained difference ‘d’ is considered.
d = Xa – X = Xa
'
– X
'
= Xa
"
– X
"
The calculated values of dielectric constant measurement for the different soil samples are shown
in Table 2.
Table 2. Calculation results of soil dielectric constants measurement
Soil Sample
F
(GHz)
λa
(cm)
λga
(cm)
Xa
X
Xa
'
X
'
Xa
"
X
"
d=Xa
-X
L
(cm)
2 (d L)
tan
2 L
ga
ga




   
  
  
 
 
 
X in
tanX/
X
λg r
RCA 9.48 3.1645 4.08
9.31
9.73
11.10
11.53
13.35
13.80
0.45 2.65 0.020464 37.50 0.4437 5.5494
Badgaon 9.48 3.1645 4.08
9.16
9.63
10.95
11.43
13.20
13.69
0.48 2.65 0.020708 38.70 0.4299 3.5946
Fatehnagar 9.48 3.1645 4.08
9.41
9.86
11.20
11.66
13.44
13.93
0.46 2.65 0.205757 38.12 0.4365 4.9492
Padar 9.48 3.1645 4.08
9.62
9.95
11.41
11.75
13.68
14.02
0.33 2.65 0.019711 33.50 0.4967 7.3495

709
Dielectric constant (r) is a dimensionless physical quantity that reflects the ability of a substance to
store polarization charge in the applied electric field. At present, the typical achievement of this method is
Topp’s formula [23], [24] which is an important relationship and commonly used in determining moisture
content according to the dielectric constant. The Topp’s formula is as follows:
r = 3.03 + 9.3ϴv + 146.0 ϴv
2
- 76.6ϴv
3
ϴv = -5.3 x 102
+ 292 x 10-2
r – 5.5 x 10-4
r
2
+ 4.3 x10-6
r
3
where r and ϴv are relative dielectric constant and moisture content, respectively. The radiant energy may be
reflected from the surface of the dry soil, or it penetrates the soil particles, where it may be absorbed or
scattered. The total reflectance from the dry soil is a function of specular reflectance and the internal volume
reflectance. At increasing soil moisture, every soil particle encapsulates into a thin membrane of capillary
water filling the water content in the interstitial spaces as well. That in turn results in high absorption|
of incident energy following the fact that the soild reflectance deteriorates with increasing water
amount [25-26].
4. CONCLUSION AND FUTURE SCOPE
In conclusion, the authors have presented soil moisture measurement by simple estimation of dielectric constact
measurement from microwave signal. The measurement of the dielectric constant of the soils samples collected from
the various regions have been used for the experiment evaluation. By measuring the dielectric constant,
the measurement of moisture content of the soil can be determined. This approach can be used for identifying
the need for water irrigation of a field keeping in view the availablily moisture in the soil to control
unevenness. In future, the sensors and circuits using thin-film devices can be integrated to sense, monitor,
and display the soil moisture and chemical status of soil [27-30]. Furthermore, this maethod of dielectric
constant measure would be useful for other passive remote sensing applications as the reflectance of soil can
be determined at the progression of this work.
REFERENCES
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BIOGRAPHIES OF AUTHORS
Shashi K. Dargar is presently working as a Post-Doctoral Fellow in the Department of Electronic
Engineering, Howard College, University of KwaZulu-Natal, Durban, South Africa. He received
his Ph.D. in Electronics Engineering, Master’s degree M.Tech. in Digital Communication, and
Bachelor of Engineering in Electronics and Communication Engineering. He has been contributing
in the field of academics and research from the last 14 years. His research interest includes
Microelectronics, Thin film device design, VLSI, Wireless Communication and Microwave
Engineering. He has over 25 research articles in international journals and conferences. He is a
member of IEEE, IACSIT, IAENG, and reviewer in various reputed international journals.
Prof. Viranjay M. Srivastava is a Doctorate (2012) in the field of RF Microelectronics and VLSI
Design, Master (2008) in VLSI design, and Bachelor (2002) in Electronics and Instrumentation
Engineering. He has worked for the fabrication of devices and development of circuit design.
Presently, he is currently working as an Associate Professor in the Department of Electronic
Engineering, Howard College, University of KwaZulu-Natal, Durban, South Africa. He has more
than 15 years of teaching and research experience in the area of VLSI design, RFIC design, and
Analog IC design. He has supervised various Bachelors, Masters and Doctorate theses. He is a
senior member of IEEE, and member of IEEE-HKN, IITPSA, ACEEE, and IACSIT. He has
worked as a reviewer for several Journals and Conferences both national and international. He is
author/co-author of more than 200 scientific contributions including articles in international
refereed Journals and Conferences and also author of following books, 1) VLSI Technology, 2)
Characterization of C-V curves and Analysis, Using VEE Pro Software: After Fabrication of MOS
Device, and 3) MOSFET Technologies for Double-Pole Four Throw Radio Frequency Switch,
Springer International Publishing, Switzerland, October 2013.

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