Electron microscopy is a technique that uses beams of electrons instead of light to view objects. There are two main types: transmission electron microscopy (TEM) and scanning electron microscopy (SEM). TEM uses electrons transmitted through an ultra-thin sample to form magnified images, allowing visualization of structures as small as single atoms. SEM scans a focused beam of electrons across a sample to produce high-resolution 3D images of surface topology and composition. Newer techniques like scanning tunneling microscopy can achieve even higher resolution down to fractions of a nanometer. Electron microscopy has enabled significant advances in fields like materials science, biology, and nanotechnology.