Project Report for Materials Informatics
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This document discusses using small angle and wide angle X-ray scattering at synchrotron sources to perform time-resolved measurements of the microstructure of semicrystalline polymers during deformation. It aims to analyze SAXS patterns to obtain real space structural models, validate the models using 2D fast Fourier transforms, and develop a phase recovery algorithm to generate eigenstructures from single time steps in order to establish a low-dimensional representation of the process-structure linkage and potentially capture orientation information.
Project Report for Materials Informatics
- 1. In-situ X Ray Characterization of Semicrystalline Polymer Microstructure during Deformation 1 ~1nm ~100nm Time Resolved Measurements at Synchrotron Sources
- 2. Small Angle X Ray Scattering (SAXS) 훆
- 3. SAXS Analysis Convert to Real Space dac dc da 0.046 A-1 Qy Qx Image Analysis SAXS Pattern Structural Model Image Analysis WAXS Pattern Structural Model
- 4. β° 4 Model Validation for SAXS via 2D FFT
- 5. Project Outline • Spatial Correlations For Single Time Step • Phase Recovery Algorithm To Generate Eigen Microstructure • Establish And Visualize Low Dimensional Representation Of Process-Structure Linkage • Attempt To Utilize Work Flow To Capture Orientation Information 5
- 6. Thanks! ! ! David Brough Abhiram Kannan 6