Protocol Aware Ate Semi Submitted

The document discusses the benefits of protocol aware automatic test equipment (ATE) compared to traditional ATE. Protocol aware ATE would allow testers to interact with devices under test using the same protocol level of abstraction as designers, making testing easier and reducing development cycles. It provides examples showing how protocol aware ATE could speed up silicon bring-up and debug by enabling direct register reads and writes using protocols instead of low-level vectors. This would help address issues of non-deterministic device behavior from processes like cycle slipping.