scanning electron microscope for analysis
- 2. Presented by: Muhammad Ali Mohsin 2023-MS-MME-1 Presented To: Prof. Muhammad Asif Rafiq Sb.
- 3. INTRODUCTION OF SEM • Electron Microscopes are scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale. • This examination can yield information about the topography , morphology, composition and crystallographic information. Mainly 2 types: • Transmission Electron Microscope (TEM) - allows one the study of the inner structures. • Scanning Electron Microscope (SEM) - used to visualize the surface of objects.
- 4. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector. The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. SEM can achieve resolution better than 1 nanometer.
- 5. RESOLVING POWER Close to the eye – resolvable At larger distance -not resolvable . Rayleigh's criterion: Angular resolution = 1.22λ / D • Smaller value of angular resolution - instrument can resolve finer details & has a higher resolving power. • Electrons have very small wavelength. • Hence according to Rayleigh's criterion, electron wave can be used to resolve very small angular separations. : Resolving power is the ability of an imaging device to see objects distinctly, that are located at a small angular distances.
- 6. Topography Texture/surface of a sample Morphology Size, shape, order of particles Composition Elemental composition of sample Crystalline Structure Arrangement present within sample What can you see with an SEM?
- 7. SEM Micrographs Crystalline Latex Particles Polymer Hydrogel Surface
- 8. Scanning Electron Microscopy (SEM) Instrumentation: Essential components of all SEMs include the following: •Electron Source ("Gun") •Electron Lenses •Sample Stage •Detectors for all signals of interest •Display / Data output devices •Infrastructure Requirements: •Power Supply •Vacuum System •Cooling system •Vibration-free floor •Room free of ambient magnetic and electric fields SEMs always have at least one detector (usually a secondary electron detector), and most have additional detectors.
- 10. SEM SAMPLE PREPARATION Aspider coated in gold 13mm radius aluminium stubs •Sample coated with a thin layer of conductive material. •Done using a device called a "sputter coater.” • Sample placed in a small chamber that is at a vacuum . •Gold foil is placed in the instrument. •Argon gas and an electric field cause an electron to be removed from the argon, making the atoms positively charged. •The argon ions then become attracted to a negatively charged gold foil. •The argon ions knock gold atoms from the surface of the gold foil. •These gold atoms fall and settle onto the surface of the sample producing a thin gold coating. Sputtercoater
- 11. SEM WORKING • The electron gun produces an electron beam when tungsten wire is heated by current. • This beam is accelerated by the anode. • The beam travels through electromagnetic fields and lenses, which focus the beam down toward the sample. • A mechanism of deflection coils enables to guide the beam so that it scans the surface of the sample in a rectangular frame. • When the beam touches the surface of the sample, it produces: – Secondary electrons (SE) – Back scattered electrons (BSE) – X - Rays... • The emitted SE is collected by SED and convert it into signal that is sent to a screen which produces final image. • Additional detectors collect these X-rays, BSE and produce corresponding images.
- 12. • A secondary electron detector attracts the scattered electrons and, depending on the number of electrons that reach the detector, registers different levels of brightness on a monitor. • By reducing the size of the area scanned by the scan coils, the SEM changes the magnification of the image.
- 13. PRINCIPLE OF WORKING OFSEM • Incoming (primary) electrons – can be “reflected” (backscattered) from a bulk specimen. – can release secondary electrons. • Primary electrons are focused into a small- diameter electron probe that is scanned across the specimen. • Electrostatic or magnetic fields, applied at right angles to the beam, can be used to change its direction of travel. • By scanning simultaneously in two perpendicular directions, a square or rectangular area of specimen (known as a raster) can be covered. • Image of this area can be formed by collecting secondary electrons from each point on the specimen.
- 15. • Electron gun consisting of cathode and anode. • The condenser lens controls the amount of electrons travelling down the column • The objective lens focuses the beam into a spot on the sample. • Deflection coil helps to deflect the electron beam. • SED attracts the secondary electrons. • Additional sensors detect backscattered electrons and X-rays.
- 17. Advantages • It gives detailed 3D and topographical imaging and the versatile information garnered from different detectors. • This instrument works very fast. • Modern SEMs allow for the generation of data in digital form. • Most SEM samples require minimal preparation actions. Disadvantages • SEMs are expensive and large. • Special training is required to operate an SEM. • The preparation of samples can result in artifacts. • SEMs are limited to solid samples. • SEMs carry a small risk of radiation exposure associated with the electrons that scatter from beneath the sample surface. ADVANTAGES & DISADVANTAGES OF SEM
- 18. RECENT DEVELOPMENTS • Three famous physicists, Harald H. Rose , Knut W. Urban and Maximillian Haider have received the Wolf-prize in physics 2011 for the realization of aberration-corrected electron microscopy. • Aberrations are intrinsic imperfections of electron lenses. • Those aberrations are reduced by installing in a microscope a set of specially designed auxiliary "lenses" which are called aberration correctors. • They designed a novel aberration corrector thereby improving resolution of transmission electron microscope.
- 19. CONCLUSION • Since its invention, electron microscope has been a valuable tool in the development of scientific theory • It has contributed greatly to biology, medicine and material sciences. • This wide spread use because they permit the observation of materials on a nanometer (nm) to micrometer (μm) scale. • Although SEMs and TEMs are large, expensive pieces of equipments, they remain popular among researchers due to the high- resolution and detailed images they produce.