This document summarizes experiments on the I-V characteristics of semiconducting diodes. It describes the forward and reverse bias characteristics of germanium and silicon diodes, and how the reverse saturation current varies with temperature, allowing determination of the band gap. Experiments are presented that measure the exponential forward I-V relationship and higher conductivity of silicon diodes compared to germanium, as well as the small reverse current of silicon that prevents its measurement with available equipment. The temperature dependence of carrier mobility and concentration are also discussed.
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