Spectroscopic ellipsometry is a technique for investigating the optical properties and electrodynamics of materials. It has several advantages over other optical techniques:
1) It provides an exact numerical inversion with no need for Kramers-Kronig transformations, allowing consistency checks.
2) Measurements are non-invasive and highly reproducible as they do not require reference samples.
3) It is very sensitive to thin film properties due to its ability to measure at oblique angles of incidence.
Ellipsometry has been used to study phenomena like superconductivity in cuprates and pnictides by measuring changes in spectral weight, and collective charge ordering in oxide superlattices.