The document outlines the procedure for determining a crystal structure from diffraction data. It discusses that lattice parameters and space group must be determined simultaneously with reflection positions. Additional information like crystal system, symmetry, and density can provide insight. Intensities of many reflections need to be measured and corrected. Atom positions can be found using techniques like Patterson functions, heavy atoms, and direct methods. The structure is then refined by adjusting positional and thermal parameters to minimize differences between observed and calculated structure factors.
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