This document summarizes a study on using X-ray diffraction (XRD) to analyze crystallite size and microstrain in materials. XRD works by passing X-rays through a material and analyzing the diffraction patterns. This can provide information about the material's crystal structure, orientation, density, and residual stress and strain. The study examines how factors like temperature and pressure affect mineral crystal structure and properties. It also discusses how the Scherrer equation can be used to calculate crystallite size from XRD peak broadening measurements and how microstrain within crystals can be analyzed. The conclusions summarize that XRD allows characterization of properties like crystallite size, residual stress, and identification of crystal structures and phases present.