Device Modeling Report




COMPONENTS : PHOTOCOUPLER
PART NUMBER : TLP521-2
MANUFACTURER : TOSHIBA
REMARK : SAMPLE A




               Bee Technologies Inc.


All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
DIODE MODEL
  Pspice model
                                         Model description
   Parameter
        IS         Saturation Current
        N          Emission Coefficient
       RS          Series Resistance
       IKF         High-injection Knee Current
      CJO          Zero-bias Junction Capacitance
        M          Junction Grading Coefficient
        VJ         Junction Potential
      ISR          Recombination Current Saturation Value
       BV          Reverse Breakdown Voltage(a positive value)
      IBV          Reverse Breakdown Current(a positive value)
        TT         Transit Time

BIPOLAR JUNCTION TRANSISTOR MODEL
  Pspice model
                                Model description
   parameter
       NR      Reverse Emission Coefficient
       RB      Base Resistance
       RC      Series Collector Resistance
      CJE      Zero-bias Emitter-Base Junction Capacitance
      CJC      Zero-bias Collector-Base Junction Capacitance
       TF      Forward Transit Time
       TR      Reverse Transit Time

VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS)


E<Name><(+)Node><(-)Node>VALUE={Expression}

E<Name><(+)Node><(-)Node>TABLE={Expression}




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS)


E<Name><(+)Node><(-)Node>VALUE={Expression}


CURRENT CONTROLLED MODEL(W)
 Pspice model
                                Model description
  parameter
     IOFF     Controlling current to Off state
      ION     Controlling current to On state
    ROFF      Off Resistance
     RON      On Resistance




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Input Device Forward Current Characteristics




                                                       Measurement
                                                       Simulation




Input Device Junction Capacitance Characteristics




                                                      Measurement
                                                      Simulation




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Input Device Reverse Recovery Characteristics




                                                   Measurement




trj=120n(s)
trb=288n(s)
Conditions:Ifwd=Irev=0.04(A),Rl=50



                                                        Example




                             Relation between trj and trb



              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
LED IV Curve Characteristics

Evaluation Circuit



                                         U1
                                         1          8


                                         2          7


                                         3          6


                                         4          5

                                         TLP521_2                             V1
                         I1
                                                                     1.6Vdc
            0mAdc




                     0                                                        0




Simulation result




                                                        Simulation




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Comparison Table

                                     Vfwd(V)
     Ifwd(A)                                                          % Error
                      Measurement             Simulation

     0.0001                  0.92              0.927116                0.773

     0.0002                  0.96              0.961572                0.164

     0.0005                  1.01                1.0076                -0.238

      0.001                  1.05                1.0427                -0.695

      0.002                  1.09                1.0785                -1.055

      0.005                 1.125                1.1283                0.293

      0.01                  1.165                1.1697                0.403

      0.02                   1.21                1.2182                0.678

      0.05                   1.31                1.3060                -0.305




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Transistor Saturation Characteristics

Evaluation Circuit

                                            U1
                                            1          8


                                            2          7


                                            3          6


                                            4          5

                                            TLP521_2
                         I1
                                                                            I2
            8mAdc
                                                                        2.4mAdc




                     0                                                  0



Simulation result




                               Simulation




Comparison Table

                              Measurement                  Simulation       % Error
       Vce (sat)                  0.4 V                0.398485 V                -0.379
               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
CTR(Current Transfer Ratio) Characteristics

Evaluation Circuit



                       V2                U1                  V3

                                         1          8
                            0Vdc                                  0Vdc
                                         2          7


                                         3          6


                                         4          5
                                                                           V1
                                         TLP521_2
                  I1                                                5Vdc

               5mAdc




              0                                                            0




Simulation result




                            Simulation




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Rise Curve     Table

                                      CTR(%)
      If(mA)                                                           % Error
                       Measurement             Simulation

        0.5                    95                 95.875                0.921

         1                    160                154.340                -3.538

         3                    250                246.570                -1.372

         5                    300                289.174                -3.609

         8                    330                328.211                -0.542

        10                    350                350.044                0.013




Fall Curve Table

                                      CTR(%)
      If(mA)                                                           % Error
                       Measurement             Simulation

        10                    350                350.044                0.013

        20                    280                268.431                -4.132

        30                    230                220.757                -4.019

        40                    190                186.974                -1.593

        50                    160                160.801                0.501

        60                    140                139.438                -0.401



              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Switching Time Characteristics

Evaluation Circuit

                                  V2            U1
                                                1          8
                                       0Vdc
                                                2          7


                                                3          6                       R1
                                                                                    1.9k
                                                4          5
            I1 = 0
                                                TLP521_2
            I2 = 16m         I1
            TD = 10u
            TR = 10n
            TF = 10n                                                           V1
            PW = 20u                                                    5Vdc
            PER = 500u




                         0                                                     0




Simulation result




                                                                    Simulation




Comparison Table
VCC=5V,IF=16mA,RL=1.9k                   Measurement          Simulation               % Error
          Ts (us)                             15                 14.966                 -0.227
         Toff (us)                            25                 24.920                 -0.320

                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

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SPICE MODEL of TLP521-2 SAMPLE A in SPICE PARK

  • 1. Device Modeling Report COMPONENTS : PHOTOCOUPLER PART NUMBER : TLP521-2 MANUFACTURER : TOSHIBA REMARK : SAMPLE A Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time BIPOLAR JUNCTION TRANSISTOR MODEL Pspice model Model description parameter NR Reverse Emission Coefficient RB Base Resistance RC Series Collector Resistance CJE Zero-bias Emitter-Base Junction Capacitance CJC Zero-bias Collector-Base Junction Capacitance TF Forward Transit Time TR Reverse Transit Time VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS) E<Name><(+)Node><(-)Node>VALUE={Expression} E<Name><(+)Node><(-)Node>TABLE={Expression} All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 3. VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS) E<Name><(+)Node><(-)Node>VALUE={Expression} CURRENT CONTROLLED MODEL(W) Pspice model Model description parameter IOFF Controlling current to Off state ION Controlling current to On state ROFF Off Resistance RON On Resistance All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 4. Input Device Forward Current Characteristics Measurement Simulation Input Device Junction Capacitance Characteristics Measurement Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 5. Input Device Reverse Recovery Characteristics Measurement trj=120n(s) trb=288n(s) Conditions:Ifwd=Irev=0.04(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 6. LED IV Curve Characteristics Evaluation Circuit U1 1 8 2 7 3 6 4 5 TLP521_2 V1 I1 1.6Vdc 0mAdc 0 0 Simulation result Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 7. Comparison Table Vfwd(V) Ifwd(A) % Error Measurement Simulation 0.0001 0.92 0.927116 0.773 0.0002 0.96 0.961572 0.164 0.0005 1.01 1.0076 -0.238 0.001 1.05 1.0427 -0.695 0.002 1.09 1.0785 -1.055 0.005 1.125 1.1283 0.293 0.01 1.165 1.1697 0.403 0.02 1.21 1.2182 0.678 0.05 1.31 1.3060 -0.305 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 8. Transistor Saturation Characteristics Evaluation Circuit U1 1 8 2 7 3 6 4 5 TLP521_2 I1 I2 8mAdc 2.4mAdc 0 0 Simulation result Simulation Comparison Table Measurement Simulation % Error Vce (sat) 0.4 V 0.398485 V -0.379 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 9. CTR(Current Transfer Ratio) Characteristics Evaluation Circuit V2 U1 V3 1 8 0Vdc 0Vdc 2 7 3 6 4 5 V1 TLP521_2 I1 5Vdc 5mAdc 0 0 Simulation result Simulation All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 10. Rise Curve Table CTR(%) If(mA) % Error Measurement Simulation 0.5 95 95.875 0.921 1 160 154.340 -3.538 3 250 246.570 -1.372 5 300 289.174 -3.609 8 330 328.211 -0.542 10 350 350.044 0.013 Fall Curve Table CTR(%) If(mA) % Error Measurement Simulation 10 350 350.044 0.013 20 280 268.431 -4.132 30 230 220.757 -4.019 40 190 186.974 -1.593 50 160 160.801 0.501 60 140 139.438 -0.401 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 11. Switching Time Characteristics Evaluation Circuit V2 U1 1 8 0Vdc 2 7 3 6 R1 1.9k 4 5 I1 = 0 TLP521_2 I2 = 16m I1 TD = 10u TR = 10n TF = 10n V1 PW = 20u 5Vdc PER = 500u 0 0 Simulation result Simulation Comparison Table VCC=5V,IF=16mA,RL=1.9k Measurement Simulation % Error Ts (us) 15 14.966 -0.227 Toff (us) 25 24.920 -0.320 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005