A generic randomization framework architecture is proposed for automated testing of system on chips (SoCs). The framework generates random test configurations to improve coverage and prevent bias. It captures the device under test's state at different parameter settings. The framework consists of a random number generator, parameter constraints, and interfaces to configure the test and get results. It was validated using a test that generates single edge nibble transmission frames with randomized frequencies and data. The framework successfully selected random parameters and passed them to the test, demonstrating its ability to automate testing and improve coverage of SoCs.