An application specific reconfigurable architecture for fault testing and diagnosis

IJRET: International Journal of Research in Engineering and Technology eISSN: 2319-1163 | pISSN: 2321-7308
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Volume: 03 Issue: 02 | Feb-2014, Available @ http://www.ijret.org 645
AN APPLICATION SPECIFIC RECONFIGURABLE ARCHITECTURE
FOR FAULT TESTING AND DIAGNOSIS: A SURVEY
A.R Kasetwar1
, Gaurav Kumar2
, S. M. Gulhane3
1
Research Scholar,Dept. of Electronics & Tele communication, BDCE, Sewagram, Maharashtra, India
2
P.G student Dept. of Electronics & Tele communication, DBNCOET,Yavatmal, Maharashtra,India
3
Professor and Head of Dept. of Elect.& Telecomm.Engg, JDIET, Yavatmal, Maharashtra, India
Abstract
Now a day’s many VLSI designers are implementing different applications on real time with the use of FPGAs. Although they are
working efficiently, they are not achieving their expected goals. This is only because of the faults which are occurring in the
FPGA at the runtime of the application. Those faults are remaining in the circuitry as there is no provision for removal of those
faults at application level. So there is a great need of detection & removal of faults. Mainly Interconnect faults, Logical Faults
and Delay are the faults which reduces the performance of FPGA. Although the manufacturers are trying to decrease the fault
present in the FPGA, it is very necessary to remove those faults at run time of the particular application. This paper includes the
brief discussion about the occurrence of different faults and various methods to remove those faults.
Key Words: Fault diagnosis, field-programmable gate array (FPGA), testing.
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1. INTRODUCTION
A Field Programmable Gate Array (FPGA) is a logic device
that is used to implement a number of digital circuits. FPGA
is widely used in many applications due to their reprogram
ability, flexibility characteristic. It has also the advantage of
short design & implementation cycles with low non-
recurring engineering cost. As compare to Application
specific integrated circuits (ASIC) FPGA results in faster
design and debug cycle due to its reprogram ability. Though
the density capability and speed of FPGA is increased, it
becomes more vulnerable to various types of faults, but the
FPGA test can be substantially more complex than
application –Specific integrated circuit test. The basic
architecture of FPGA consists of three major components:
programmable logic blocks which implements the logic
functions, programmable routing (interconnects) to
implement these functions and IO blocks to make off-chip
connections. We can Program FPGA for combination and
sequential functions. All Programmable logic blocks (PLB)
are Identical before programming. An illustration of typical
FPGA architecture is shown in figure
FIG.1Basic Architecture of FPGA
FIG.2Typical Plb Structure
Above diagram shows the typical structure of programmable
logic blocks (PLB) ; it consist of a memory block that can
function as look – up table(LUT) or RAM, number of flip-
flop(FFs); and multiplying output logic. The LUT/RAM
block may also contain special-purpose logic for arithmetic
functions (counters, adders, multipliers, etc.). The RAM
may be configured in various modes of operation like
synchronous, asynchronous, single-port, dual-port, etc. The
FFs can also be configured as latches, and may have
programmable clock-enable, preset/clear, and data selector
functions [2].
The manufacturer of FPGA is constantly trying to decrease
the number of faults, which are present in their designed
FPGA. Detection of faults and the type of faults, which is
present in the circuit, is known as fault detection. Fault
diagnosis, process locate the fault in the circuit and replace
or remove the faulty circuit with a good one.
In general, FPGA testing is of two types
1) Application Independent.
2) Application dependent.
Application independent tests are performed at the
manufacturer level. In this test, entire FPGA resources are
tested for the presence of faults. The faults usually focused

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in this testing are logical faults and interconnection faults
[21].
Compared to application- independent test and diagnosis,
application –dependent test and diagnosis is faster with
higher diagnosis resolution over more compressive faults
[12].This is because application –dependent test focuses
only on a specific part of FPGA used for a particular design
instead of diagnoses complete FPGA. The faults of interest
in this type of testing are only those that can affect the
operation of a specific part of FPGA. It includes diagnosis
of faults related to logic blocks, interconnection & delay
faults which can strongly affect the timing characteristics of
the circuitry. In this paper, we are focusing on the detailed
study of various application dependent fault diagnosis
methods. An application dependent fault diagnosis includes
faults in the Logical blocks, Interconnect faults and fault due
to the presence of delay.
Faults in the logic blocks are those faults which are related
to Look-Up-Table (LUT), multiplexers and with the flip-
flops. For an LUT, a fault can occur in any of the memory
matrix, decoder, and input output lines. A faulty memory
matrix makes some memory cells incapable of storing the
correct logic values. If the fault is related with the decoder,
then a wrong address may lead to reading of wrong cell
contents. The next possible fault is related to input output
lines that led to generation of the stack at fault. The
multiplexer faults are functional faults because the internal
connection of multiplexers in FPGAs is different for
different application. Faulty multiplexer may have the
problem in selecting correct inputs applied to it. The faults
in flip-flop are also a functional fault any fault can cause a
flip-flop to receive no data, to be unable to be triggered by
the correct clock edge, or to be unable to be set or reset.
The interconnect faults are the faults which are generated
due to the fault in connecting wires [22]. It may be an open
fault, short fault or stack-at-faults. The other type of fault is
a delay fault which may severely affect the timing
characteristics of the output. It is an important task to test
whether an operation is completed within the specified clock
cycle or not. Though a circuit is free from logical and
interconnection fault, the output characteristics may get
badly affected.
2 PREVIOUS WORK
2.1 LOGICAL FAULTS
TomooInque et.al proposed a universal fault diagnosis
method for unprogrammed FPGAs, based on a test
procedure for Configurable logic blocks (CLBs) developed
by Michinishi. Author’s method is used to diagnose one
CLB i.e. method is used to locate the fault in only on CLB.
Their assumption is that there is at least one CLB which
includes faults like Stuck-at, interconnect, multiple-access
faults of look-up-table. They had performed their procedure
repeatedly by implementing a configuration and alternately
applying input sequence to the configuration. TPCLB is
represented by a sequence of pairs consisting of a
configuration and input sequence applied to the
configuration as follows:
TPCLB= [(C1, S1), (C2, S2)....................., (C2k+1, S2k+1)]
This test procedure detects any faults in faulty block.
However this method requires repetitive computations,
which lead to consume much time for testing.
A hybrid fault model for FPGA testing was introduced in
2001, which permits the detection of all single faults (i.e.
stuck –at faults, functional) with some multiple faults [2].
Repeated FPGA reprogramming is used. They had assumed
that interconnects and IOB’s had already tested. The main
objectives of their proposed method is
a) 100% fault coverage with neither delay nor area
overhead.
b) Ease of test pattern generation because test patterns
generated for CLBs, not for complete FPGA.
c) Efficient implementation of the testing process.
d) Number of programming phase must be as small as
possible.
Author had generated test pattern into two phases according
to the CLB partitioning. The LUT memory matrix can be
tested by reading all the memory bits in two phases; second
phase is complement of the first. For testing stuck-at faults,
the scenario is different. The contents of LUT must be
arranged such that Boolean difference is one for input to be
tested for which multiple patterns are required. For
multiplexers, each data inputs must be activated at least for
one phase because multiplexers selects single output from
all inputs i.e., at least niphases are required to test a
multiplexers with niinput. Advantage of using this method is
that the time required to test all the CLBs is the same as to
test a single CLB with perfect controllability/observability.
All the CLBs can be under test simultaneously, which is not
possible with other method like neither BIST approach nor
naive approach.
Faults related to CLBs are solved correctly in the method
proposed [2], but the problem of testing faulty multiplexers
was solved incorrectly. A new built-in-self –test approach
which is able to detect and accurately diagnose all single
and practically all multiple faulty PLBs in FPGA with
maximum diagnosis resolution was proposed by
M.Abramovici and C.Stroud.[5]
The logic and interconnect faults are tested separately; it is
an offline testing method. The problem related to
conventional BIST approach is the problem area overhead
and delay penalties; which later results in speed degradation,
which is unacceptable in high performance system. The
BIST methods are first proposed for testing PLBs and then
extended for testing interconnects faults.
To configure groups of PLBs as Test Pattern Generators
(TPG), Out Response Analyzer (ORA) and other group as
Block Under Test(BLT) as shown in fig 3 (a). The BUT is
reconfigured repeatedly to test it in all modes of operation.
Once the BUT is tested, the role of PLBs is reversed so that

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in the next test session the previous BUTs become TPG or
ORAs and vice versa. Fig 3(b) & 3 (c) gives the floor plan
for two test session. Authors had used Pseudo exhaustive
testing method.
FIG.3. BIST Architecture TPG, BUT and ORA Connection.
FIG.4. A) Floor Plan for First Test Session B) Floor Plan
for Second Test Session.
Following claim had been made: Any single faulty PLB is
guaranteed to be detected, with the group of faulty PLBs in
the same row is guaranteed to be detected also group of
faulty PLBs in the middle rows of the same column that has
at least two adjacent faults free PLBs is guaranteed to be
detected.
Most of the authors had focused on application independent
diagnosis of FPGAs. Application dependent diagnosis of
FPGAs techniques for logic and interconnect resources was
introduced by M.B.Tahoori [17]. For logic diagnosis, the
configurations of used logic blocks remain unchanged while
the configurations of theInterconnect resources and unused
logic blocks are modified. Any single functional fault,
inclusive of all stuck-at faults, in logic blocks are accurately
diagnosed in only one test configuration.
The problem with previous testing is that it diagnose only
those blocks which are used in some particular application
where as other blocks, which are not used for that operation
may introduce new faults. This affects the reliability of the
system. A new technique for online testing and diagnosis of
nontransient faults in PLBs with the help of roving self-
testing-area (STARs) is introduced [6]. The STAR is a
temporarily off line section of the FPGA in which self-
testing continues without affecting the actual operation of
FPGA. BIST approach detects any combination faulty
PLBs. During the testing process, BIST approach is used to
test all PLBs in the BISTER tile. The main advantage of
this testing is that if a particular fault is not obtained, the
suspected faulty PLBs are divided into subset and retested.
The diagnosis time is very fast.
Further J. Emert et.al had introduced new Fault Tolerating
(FT) techniques for PLBs. In previous FT techniques, faults
are detected within the working part of the system, and then
they are located or bypassed as quickly as possible so that
working of the FPGAs does not get affected. In STAR
technique, the FPGA is divided into two parts. The STARs
where the BIST and diagnosis take place and the working
area where operation is carried out. When the test of one
part is completed, STAR exchanges its part so that it can
cover complete FPGA. The main advantage of this
technique is that the fault is detected in an STAR due to
which they do not affect the working of the system. This
technique is used only for the logical faults. Authors had
determined whether the system can continue it works under
the presence of the located faults or not. Because in many
situations this is possible due to which no reconfiguration is
needed, but if fault affects the system function, alternative
configurations was determined that avoid the faulty
resources. This method allows more time for accurate
diagnosis and for computing any required fault by passing
configuration. This method determines the faulty LUTs or
the faulty FFs inside a PLB.M.B.Tahoori had focused on
logic and interconnect faults. For the logic faults, Built – in
–self-Diagnosis (BISD) method is used in which the
configuration of used blocks remain unchanged while the
configuration of the interconnect resources and unused logic
blocks are modified. In this method, any functional fault is
accurately diagnosed. [11]
In this scheme, all used logic blocks were tested
exhaustively. In which global interconnect is reprogrammed
such that test signals are routed to each logic blocks. A
Linear feedback shift register (LFSR) is used for generating
test vectors, which are connected to all logic blocks. The
output of logic blocks is connected to internal response
compactor. The number of the test session in this technique
required is less as compare to others. While in other cases,
the time requirement is also more and even then those
methods focus only on single faults.

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FIG.5Application –Dependent Self-Test Architecture For
Logic Blocks A) Original Configuration B) Bist
Configuration.
2.2 INTERCONNECTION FAULTS
Detection of interconnection faults in FPGAs circuit is a
difficult problem. In year 2002, M.B.Tahoori proposed a
new method to diagnosis open defects present in the circuit.
An open defect is a discontinuity in the connection between
two circuit’s nodes that should be completely connected
[13]. Author had proposed a two-step diagnosis processes to
identify the faulty interconnects blocks. In which the first
step is Coarse –grain step which localizes the fault to a small
portion of the FPGA. In the second step i.e. fine grain step,
it precisely locates the faults inside that portion of the
FPGA.
FIG.6. A Test Configuration For Interconnect
In the above figure test configuration consist of the number
of wires under test (WUT). A WUT consist of the routing
paths which connect the output of one logic blocks with the
input of other logic blocks. During the diagnosis process, the
logic value of WUT is captured, and the values are stored in
the flip- flop connected to it in the next cycle. The value
stored in the flip- flop is verified by applying it to the test
vector, and the faulty WUT is obtained. Input to the fine
grain diagnosis is a defective WUT, which is the output
ofCoarse –grain. In this step, the goal is to identify faulty
recourses. The basic idea, which is used here, is a portion of
WUT is removed and using some other WUT connection is
made. If the new WUT still fails which means those
removed WUT are faults free, i.e., the fault is located in the
non-removed recourses. Otherwise, the opposite conclusion
is made. The time required for diagnosis of interconnect is
large because the complete process is performed in two parts
and 100% fault removal is also not guaranteed.
Further G.Hriss et.al had suggested a new method to
diagnose faults in Cluster based FPGAs [14]. The fault
detection in cluster based FPGAs are very difficult because
of its high densities. Author had used BIST method they had
focused on two possible faults present in the FPGAs an open
fault in which a single line is broken, or a connectable cable
is unconnected and short defect which causes two lines to be
crossed. However, the diagnostic resolution was limited to a
given set of WUT, and far from the diagnostic resolution
required for efficient fault tolerant application.
According to M.B.Tahoori interconnects diagnosis for the
configurations of used logic blocks are modified and
interconnect configuration remain unchanged [11]. Any
single fault (open, stuck-at, or bridging fault) in interconnect
can be uniquely identified in a small number of test
configurations. Author had categorized the diagnosis
procedure into two parts (a) Adaptive (b) Non adaptive
approach. In adaptive approach, the selection of the next
step is depending on the result of the previous step. Whereas
in non-adaptive process all the steps are performed first and
then the result is calculated from falling pattern. The non-
adaptive approach is preferred over adaptive approach
because the time requirement is less
2.3. DELAY FAULT
Delay fault diagnosis is more difficult as compared to
interconnect faults as delay fault model depends on the size
of a delay defect due to which it is harder to define. Path
delay testing of FPGAs is very important because FPGAs
which is fault free will, still not work properly due to delay.
The basic idea is to test a set of interconnects, or paths,
between two logic blocks for delay faults by creating a race
condition between the signals propagating on those paths.
The particular set of paths under test (PUTs) between two
logic blocks are configured such that their fault-free
propagation delays are nearly identical, and a signal
transition simultaneously occurring at the start of the PUTs
should also simultaneously occur the end of the PUTs. [15]
In the above method, an iterative logic array model is used
which test number of similar sections of interconnects
simultaneously [16]. Author had suggested a new approach
which partitions target paths into subset which are used in
the same test configuration. They had tested all the paths
with all combinations of signal inversions. As there are
numbers of paths present in the circuit only a limited sets of
the path is tested, with the guarantee that the maximum
delays along the tested path will not exceeds the clock
period during the normal operation. They had proposed two
methods in the first method, which is known as single –
phase method; paths are selected so that all paths in each
configuration can be tested in parallel. Whereas the second
method is the multi-phase method; attempts to test the paths
in a configuration with a sequence of test phases, each of
which test a set of paths in parallel.
All the previous authors had delayed fault testing for general
integrated circuit. Nur A.Touba et.al had proposed a new
method to delay diagnose [26]. The method is simple and

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easy to apply. CLBs are reprogrammed, and then the
modified circuit is tested by using the same test pattern
which caused the circuit to fail. As the same test pattern is
re-used, it eliminates the time that is required for generating
additional diagnostic vectors. This technique targeted
towards the common case of single point delay defect that
increases the delay through a CLB or an interconnect
causing it to exceed its timing specification.
3. SUMMARY AND CONCLUSION
Fault diagnosis has particular importance in the context of
field programmable gate arrays (FPGAs) because faults can
be avoided by reconfiguration at almost no real cost. The
main faults in the FPGAs are interconnects, logic blocks and
faults related to delay of an arbitrary design. As FPGAs
works properly, all three faults should be removed. FPGA
testing is of two types an application dependent and
application independent. The testing process for both is
different. The time required to test an application dependent
testing is less as it focuses only on some specific part
whereas the application independent testing tests complete
FPGAs.Faults related to logical block, interconnected faults
and delay faults are the problems for the FPGAs user.
Numbers of faults diagnosis method are present.
In this paper, we have made a detail survey of number of
methods for fault diagnosis from this survey we come to
know that for interconnect diagnosis, the method explained
by M.B.Tahorri [11] is better as compared to other method
because all the single faults and multiple faults (open, stuck-
at –faults, or bridging faults) are uniquely identified and
removed. For logic blocks diagnosis, BISD approach is
selected because in it multiple faults are uniquely identified
in a single test configuration with a fixed test time. All other
methods are limited only for faulty CLBs and single faults
[11].For delay fault the method proposed by JayabrataGhosh
is preferred. It is used for both manufacturing as well as
user configuration test with the guarantee that the maximum
delays along the tested path will not exceeds the clock
period during the normal operation.
TABLE- 1: Comparison of Different Methods
References Logic
Blocks
Intercon
nection
Delay
faults
Conclusion
[1] Yes NO No Only one fault
considered
[2] Yes NO No Only one fault
considered
[5] Yes NO No Two test session
for all CLBs
[6] Yes NO No Accurate only for
single faulty PLB
and for some
multiple PLBs
[9] Yes NO No Used for online
operation
[11] Yes Yes No For logic block
only one test
configuration and
for interconnect it
logarithmic
depends on the
FPGAs size
[25] No No Yes Used by
Manufacturer
[26] No No Yes Time required is
small & used by
manufacturer and
user
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BIOGRAPHIES
A.R. Kasetwar is a research
scholar from BapuroDeshmukh
College of Engineering, Wardha
working in the field of D.S.P-
VLSI (phone: 9766813382;
E-mail:
abhaykasetwar@gmail.com).
Gaurav Kumar is pursuing his M.E
from Dr.BhausahebNandurkar
College of Engineering and
Technology, Yavatmal India
(phone: 9860402620;
E-
mail:singhgauravsep@gmail.com)
.
Dr.S. M. Gulhane working as a
Professor and Head of Dept. of
Elect. & Telecomm. Engg. and
holding a charge of Dean (Admin.)
at Jawaharlal Darda Inst. Of Engg.
& Tech., Yavatmal,(phone
9881832100;
E-mail :
smgulhane67@rediffmail.com)

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