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Intro Routing Crosstalk ECO DFM
Routing
How to Route your own chip
Ahmed Abdelazeem
Faculty of Engineering
Zagazig University
RTL2GDSII Flow, March 2022
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM
Table of Contents
1 Introduction
2 Routing Operations
3 Crosstalk
4 Engineering change order (ECO)
5 Chip Finishing and DFM
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Routing Route
Table of Contents
1 Introduction
2 Routing Operations
3 Crosstalk
4 Engineering change order (ECO)
5 Chip Finishing and DFM
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Routing Route
Design Status, Start of Routing Phase
Placement - completed
CTS – completed
Power and ground nets – prerouted
Estimated congestion - acceptable
Estimated timing - acceptable ( 0ns slack)
Estimated max cap/transition – no violations
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Routing Route
Routing Fundamentals: Goal
Routing creates physical connections to all clock and signal
pins through metal interconnects
Routed paths must meet setup and hold timing, max
cap/trans, and clock skew requirements
Metal traces must meet physical DRC requirements
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Routing Route
Grid-Based Routing System
Metal traces (routes) are built
along and centered upon
routing tracks based on a grid.
Each metal layer has its own
grid and preferred routing
direction:
M1: Horizontal
M2: Vertical, etc. . .
The tracks and preferred
routing directions are defined in
a ”unitTile” cell in the standard
cell library
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Routing Route
Peculiarities of Grid-Based Routing System in IC Compiler
The ”unitTile” shown as a screen shot is used to define and
store routing tracks and preferred directions information.
unitTile cell is part of the standard cell library.
The unitTile is similar to a site. It defines several things:
The minimum height and width a cell can occupy
The pitches in the preferred direction
Power and ground rail locations for standard cells
The height of the unitTile is based on the metal 1 pitch
(vertical) and must be a multiple of it.
The width is based on the metal 2 pitch (horizontal) and
must be a multiple of it.
The metal 2 routing track defined in it must either be along
the left side boundary or centered in the unitTile.
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Table of Contents
1 Introduction
2 Routing Operations
3 Crosstalk
4 Engineering change order (ECO)
5 Chip Finishing and DFM
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Routing Operations
PnR Compiler performs:
1 Global Routing
2 Track Assignment
3 Detail Routing
4 Search and Repair
After global routing, track assignment and detail routing
all clock/signal nets will be completely routed and
should meet all timing, and most all DRC, requirements
Any remaining DRC violations can be fixed by Search &
Repair
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Route Operations: Global Route
Global Route (GR) is the first step in routing
GR gives more accurate parasitic and delay estimates
compared to VR.
The Global Route that is performed during routing will
be used by the subsequent Track Assign operation
Determining overall path of all routes
Seeking to reduce delay, channel widths
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Route Operations: Global Route
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Route Operations: Global Route Summary
Answer: False!
GR does not lay
down any metal
traces.
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Route Operations: Track Assignment
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Route Operations: Detail Routing
Detail route attempts to clear DRC violations using a
fixed size Sbox
Due to the fixed Sbox size, detail route may not be able
to clear all DRC violations
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Route Operations: Search&Repair
Search&Repair fixes remaining DRC violations through
multiple loops using progressively larger SBox sizes
Note: Even if the design is DRC clean after S&R, you
must still run a sign-off DRC checker (Caliber).
Routing DRC rules are a subset of the complete technology
DRC rules
IC Compiler works on the FRAM view, not the detailed
transistor-level (CEL) view
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R
Routing over Macros
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Crosstalk
Table of Contents
1 Introduction
2 Routing Operations
3 Crosstalk
4 Engineering change order (ECO)
5 Chip Finishing and DFM
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Crosstalk
What is Crosstalk?
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Crosstalk
Crosstalk-Induced Noise (aka Glitches)
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Crosstalk
Crosstalk-Induced Delay
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM ECO Functional
Table of Contents
1 Introduction
2 Routing Operations
3 Crosstalk
4 Engineering change order (ECO)
5 Chip Finishing and DFM
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM ECO Functional
Engineering change order
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM ECO Functional
Two Types of ECO Flows
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM ECO Functional
Functional ECO Flows
Non-Freeze silicon ECO
Pre-tapeout, no restriction on placement or routing
Minimal disturbances to the existing layout
ECO cells are placed close to their optimal locations
Freeze silicon ECO
Post-tapeout, metal masks change only using previously
inserted spare cells
Cell placement remains unchanged
ECO cells are mapped to spare cells that are closest to the
optimal location
Deleted cells become spare cells
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Table of Contents
1 Introduction
2 Routing Operations
3 Crosstalk
4 Engineering change order (ECO)
5 Chip Finishing and DFM
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Chip Finishing Flow
PnR Compiler can address several issues to increase
manufacturing yield:
Gate Oxide integrity → antenna fixing
Via resistance and reliability → extra contacts
Random Particle defect → Wire spreading
Metal erosion → metal slotting
Metal liftoff → metal slotting
Metal Over-Etching → metal fill
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Manufacturability Issues
In deep submicron VLSI, some manufacturing steps, like
photo-resist exposure, development and etch and Chemical
Mechanical Polishing (CMP) have detrimental effects on
interconnect structures. These effects can vary based on local
characteristics of the layout.
To make these effects predictable, the layouts must be made
“uniform” with respect to certain density standards across
very small localized areas of the die. In the past, foundries
performed the post processing needed to provide this
uniformity. The techniques they used were filling (selective
insertion of shapes) or slotting (selective reduction of shapes).
In today’s processes, the design tools doing RC extraction,
delay calculation, IR drop analysis, timing/noise/crosstalk
analysis must be aware of these slotting/filling activities or
suffer significant inaccuracy.
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Manufacturability Issues
PnR Compiler attempts to move all these into the design
stage and out of the Fab post processing regime.
To minimize the impact of the manufacturing process on
device yields, foundries impose various density rules to make
the layouts more uniform. For instance, the foundry may
impose a density rule on an interconnect layer such that in
any 10 um x 10 um window, there must be at least 35 um2 of
metal features, but no greater than 70 um2 of metal.
Spare areas must be filled, but wide metal stripes must be
slotted to meet the density rules.
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Problem: Gate Oxide Integrity
Metal wires (antennae) placed in an EM field generate
voltage gradients
During the metal etch stage, strong EM fields are used
to stimulate the plasma etchant
Resultant voltage gradients at MOSFET gates can
damage the thin oxide
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Antenna Rules
As length of wire increases during processing, the
voltage stressing the gate oxide increases
Antenna rules define acceptable length of wires
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Fixing Antenna Problems
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Voids in Vias During Manufacturing
Voids in vias is a serious issue in manufacturing
Two solutions are available:
Reduce via count: via optimization techniques are employed in
routing stage
Add backup vias: known as redundant vias
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Via Resistance and Reliability
Replacing one via with multiple vias can improve yield &
timing (series R reduction)
Inserts multiple vias without rerouting
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Wire Spreading: Random Particle Defects
Random missing or extra material causes opens or shorts
during the fabrication process
Wires at minimum spacing are most susceptible to shorts
Minimum-width wires are most susceptible to opens
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Filler Cell Insertion
Metal fill insertion helps
To fill layers of choice including poly
To insert floating vias
To do area based metal fill
To specify required width (timing driven metal fill doesn’t fill
wire tracks around critical nets)
For better yield, density of the chip needs to be uniform
Some placement sites remain empty on some rows
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Problem: Metal Over-Etching
A narrow metal wire separated from other metal receives
a higher density of etchant than closely spaced wires
The narrow metal can get over-etched
Minimum metal density rules are used to control this
Too much etchant in contact with too little metal →
over-etched metal
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Solution: Metal Fill
Fills empty tracks with metal shapes to meet the
minimum metal density rules
Uses up most of the remaining routing resource:
No further routing or antenna fixes can be done
Metal filling is done to improve process planarization,
which is important for processes with a large number of
metal layers.
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Problem: Metal Erosion
The wafer is made flat (planarized) by a process called
Chemical Mechanical Polishing (CMP)
Metals are mechanically softer than dielectrics:
CMP leaves metal tops with a concave shape - dishing
The wider the metal the more pronounced the dishing
Wide traces with little intervening dielectric and can become
quite thin – dishing this severe is called erosion
Process rules specify maximum metal density per layer
to minimize erosion
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Problem: Metal Liftoff
Conductors and Dielectrics have different coefficients of
thermal expansion:
Stress builds up with temperature cycling
Metals can delaminate (lift off) with time
Wide metal traces are more vulnerable than narrow ones
Maximum metal density rules also address this issue
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Solution: Metal Slotting
Slotting wide wires reduces the metal density
Slots minimize stress buildup, reducing liftoff tendency
Primarily used on Power and Ground traces:
Can apply to any other net if wide enough
Slotting parameters can be set layer by layer
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
Final Validation
Ahmed Abdelazeem ASIC Physical Design
Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation
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Ahmed Abdelazeem ASIC Physical Design

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Routing.pdf

  • 1. Intro Routing Crosstalk ECO DFM Routing How to Route your own chip Ahmed Abdelazeem Faculty of Engineering Zagazig University RTL2GDSII Flow, March 2022 Ahmed Abdelazeem ASIC Physical Design
  • 2. Intro Routing Crosstalk ECO DFM Table of Contents 1 Introduction 2 Routing Operations 3 Crosstalk 4 Engineering change order (ECO) 5 Chip Finishing and DFM Ahmed Abdelazeem ASIC Physical Design
  • 3. Intro Routing Crosstalk ECO DFM Routing Route Table of Contents 1 Introduction 2 Routing Operations 3 Crosstalk 4 Engineering change order (ECO) 5 Chip Finishing and DFM Ahmed Abdelazeem ASIC Physical Design
  • 4. Intro Routing Crosstalk ECO DFM Routing Route Design Status, Start of Routing Phase Placement - completed CTS – completed Power and ground nets – prerouted Estimated congestion - acceptable Estimated timing - acceptable ( 0ns slack) Estimated max cap/transition – no violations Ahmed Abdelazeem ASIC Physical Design
  • 5. Intro Routing Crosstalk ECO DFM Routing Route Routing Fundamentals: Goal Routing creates physical connections to all clock and signal pins through metal interconnects Routed paths must meet setup and hold timing, max cap/trans, and clock skew requirements Metal traces must meet physical DRC requirements Ahmed Abdelazeem ASIC Physical Design
  • 6. Intro Routing Crosstalk ECO DFM Routing Route Grid-Based Routing System Metal traces (routes) are built along and centered upon routing tracks based on a grid. Each metal layer has its own grid and preferred routing direction: M1: Horizontal M2: Vertical, etc. . . The tracks and preferred routing directions are defined in a ”unitTile” cell in the standard cell library Ahmed Abdelazeem ASIC Physical Design
  • 7. Intro Routing Crosstalk ECO DFM Routing Route Peculiarities of Grid-Based Routing System in IC Compiler The ”unitTile” shown as a screen shot is used to define and store routing tracks and preferred directions information. unitTile cell is part of the standard cell library. The unitTile is similar to a site. It defines several things: The minimum height and width a cell can occupy The pitches in the preferred direction Power and ground rail locations for standard cells The height of the unitTile is based on the metal 1 pitch (vertical) and must be a multiple of it. The width is based on the metal 2 pitch (horizontal) and must be a multiple of it. The metal 2 routing track defined in it must either be along the left side boundary or centered in the unitTile. Ahmed Abdelazeem ASIC Physical Design
  • 8. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Table of Contents 1 Introduction 2 Routing Operations 3 Crosstalk 4 Engineering change order (ECO) 5 Chip Finishing and DFM Ahmed Abdelazeem ASIC Physical Design
  • 9. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Routing Operations PnR Compiler performs: 1 Global Routing 2 Track Assignment 3 Detail Routing 4 Search and Repair After global routing, track assignment and detail routing all clock/signal nets will be completely routed and should meet all timing, and most all DRC, requirements Any remaining DRC violations can be fixed by Search & Repair Ahmed Abdelazeem ASIC Physical Design
  • 10. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Route Operations: Global Route Global Route (GR) is the first step in routing GR gives more accurate parasitic and delay estimates compared to VR. The Global Route that is performed during routing will be used by the subsequent Track Assign operation Determining overall path of all routes Seeking to reduce delay, channel widths Ahmed Abdelazeem ASIC Physical Design
  • 11. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Route Operations: Global Route Ahmed Abdelazeem ASIC Physical Design
  • 12. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Route Operations: Global Route Summary Answer: False! GR does not lay down any metal traces. Ahmed Abdelazeem ASIC Physical Design
  • 13. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Route Operations: Track Assignment Ahmed Abdelazeem ASIC Physical Design
  • 14. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Route Operations: Detail Routing Detail route attempts to clear DRC violations using a fixed size Sbox Due to the fixed Sbox size, detail route may not be able to clear all DRC violations Ahmed Abdelazeem ASIC Physical Design
  • 15. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Route Operations: Search&Repair Search&Repair fixes remaining DRC violations through multiple loops using progressively larger SBox sizes Note: Even if the design is DRC clean after S&R, you must still run a sign-off DRC checker (Caliber). Routing DRC rules are a subset of the complete technology DRC rules IC Compiler works on the FRAM view, not the detailed transistor-level (CEL) view Ahmed Abdelazeem ASIC Physical Design
  • 16. Intro Routing Crosstalk ECO DFM Operations Global Track Detail S&R Routing over Macros Ahmed Abdelazeem ASIC Physical Design
  • 17. Intro Routing Crosstalk ECO DFM Crosstalk Table of Contents 1 Introduction 2 Routing Operations 3 Crosstalk 4 Engineering change order (ECO) 5 Chip Finishing and DFM Ahmed Abdelazeem ASIC Physical Design
  • 18. Intro Routing Crosstalk ECO DFM Crosstalk What is Crosstalk? Ahmed Abdelazeem ASIC Physical Design
  • 19. Intro Routing Crosstalk ECO DFM Crosstalk Crosstalk-Induced Noise (aka Glitches) Ahmed Abdelazeem ASIC Physical Design
  • 20. Intro Routing Crosstalk ECO DFM Crosstalk Crosstalk-Induced Delay Ahmed Abdelazeem ASIC Physical Design
  • 21. Intro Routing Crosstalk ECO DFM ECO Functional Table of Contents 1 Introduction 2 Routing Operations 3 Crosstalk 4 Engineering change order (ECO) 5 Chip Finishing and DFM Ahmed Abdelazeem ASIC Physical Design
  • 22. Intro Routing Crosstalk ECO DFM ECO Functional Engineering change order Ahmed Abdelazeem ASIC Physical Design
  • 23. Intro Routing Crosstalk ECO DFM ECO Functional Two Types of ECO Flows Ahmed Abdelazeem ASIC Physical Design
  • 24. Intro Routing Crosstalk ECO DFM ECO Functional Functional ECO Flows Non-Freeze silicon ECO Pre-tapeout, no restriction on placement or routing Minimal disturbances to the existing layout ECO cells are placed close to their optimal locations Freeze silicon ECO Post-tapeout, metal masks change only using previously inserted spare cells Cell placement remains unchanged ECO cells are mapped to spare cells that are closest to the optimal location Deleted cells become spare cells Ahmed Abdelazeem ASIC Physical Design
  • 25. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Table of Contents 1 Introduction 2 Routing Operations 3 Crosstalk 4 Engineering change order (ECO) 5 Chip Finishing and DFM Ahmed Abdelazeem ASIC Physical Design
  • 26. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Chip Finishing Flow PnR Compiler can address several issues to increase manufacturing yield: Gate Oxide integrity → antenna fixing Via resistance and reliability → extra contacts Random Particle defect → Wire spreading Metal erosion → metal slotting Metal liftoff → metal slotting Metal Over-Etching → metal fill Ahmed Abdelazeem ASIC Physical Design
  • 27. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Manufacturability Issues In deep submicron VLSI, some manufacturing steps, like photo-resist exposure, development and etch and Chemical Mechanical Polishing (CMP) have detrimental effects on interconnect structures. These effects can vary based on local characteristics of the layout. To make these effects predictable, the layouts must be made “uniform” with respect to certain density standards across very small localized areas of the die. In the past, foundries performed the post processing needed to provide this uniformity. The techniques they used were filling (selective insertion of shapes) or slotting (selective reduction of shapes). In today’s processes, the design tools doing RC extraction, delay calculation, IR drop analysis, timing/noise/crosstalk analysis must be aware of these slotting/filling activities or suffer significant inaccuracy. Ahmed Abdelazeem ASIC Physical Design
  • 28. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Manufacturability Issues PnR Compiler attempts to move all these into the design stage and out of the Fab post processing regime. To minimize the impact of the manufacturing process on device yields, foundries impose various density rules to make the layouts more uniform. For instance, the foundry may impose a density rule on an interconnect layer such that in any 10 um x 10 um window, there must be at least 35 um2 of metal features, but no greater than 70 um2 of metal. Spare areas must be filled, but wide metal stripes must be slotted to meet the density rules. Ahmed Abdelazeem ASIC Physical Design
  • 29. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Problem: Gate Oxide Integrity Metal wires (antennae) placed in an EM field generate voltage gradients During the metal etch stage, strong EM fields are used to stimulate the plasma etchant Resultant voltage gradients at MOSFET gates can damage the thin oxide Ahmed Abdelazeem ASIC Physical Design
  • 30. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Antenna Rules As length of wire increases during processing, the voltage stressing the gate oxide increases Antenna rules define acceptable length of wires Ahmed Abdelazeem ASIC Physical Design
  • 31. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Fixing Antenna Problems Ahmed Abdelazeem ASIC Physical Design
  • 32. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Voids in Vias During Manufacturing Voids in vias is a serious issue in manufacturing Two solutions are available: Reduce via count: via optimization techniques are employed in routing stage Add backup vias: known as redundant vias Ahmed Abdelazeem ASIC Physical Design
  • 33. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Via Resistance and Reliability Replacing one via with multiple vias can improve yield & timing (series R reduction) Inserts multiple vias without rerouting Ahmed Abdelazeem ASIC Physical Design
  • 34. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Wire Spreading: Random Particle Defects Random missing or extra material causes opens or shorts during the fabrication process Wires at minimum spacing are most susceptible to shorts Minimum-width wires are most susceptible to opens Ahmed Abdelazeem ASIC Physical Design
  • 35. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Filler Cell Insertion Metal fill insertion helps To fill layers of choice including poly To insert floating vias To do area based metal fill To specify required width (timing driven metal fill doesn’t fill wire tracks around critical nets) For better yield, density of the chip needs to be uniform Some placement sites remain empty on some rows Ahmed Abdelazeem ASIC Physical Design
  • 36. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Problem: Metal Over-Etching A narrow metal wire separated from other metal receives a higher density of etchant than closely spaced wires The narrow metal can get over-etched Minimum metal density rules are used to control this Too much etchant in contact with too little metal → over-etched metal Ahmed Abdelazeem ASIC Physical Design
  • 37. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Solution: Metal Fill Fills empty tracks with metal shapes to meet the minimum metal density rules Uses up most of the remaining routing resource: No further routing or antenna fixes can be done Metal filling is done to improve process planarization, which is important for processes with a large number of metal layers. Ahmed Abdelazeem ASIC Physical Design
  • 38. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Problem: Metal Erosion The wafer is made flat (planarized) by a process called Chemical Mechanical Polishing (CMP) Metals are mechanically softer than dielectrics: CMP leaves metal tops with a concave shape - dishing The wider the metal the more pronounced the dishing Wide traces with little intervening dielectric and can become quite thin – dishing this severe is called erosion Process rules specify maximum metal density per layer to minimize erosion Ahmed Abdelazeem ASIC Physical Design
  • 39. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Problem: Metal Liftoff Conductors and Dielectrics have different coefficients of thermal expansion: Stress builds up with temperature cycling Metals can delaminate (lift off) with time Wide metal traces are more vulnerable than narrow ones Maximum metal density rules also address this issue Ahmed Abdelazeem ASIC Physical Design
  • 40. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Solution: Metal Slotting Slotting wide wires reduces the metal density Slots minimize stress buildup, reducing liftoff tendency Primarily used on Power and Ground traces: Can apply to any other net if wide enough Slotting parameters can be set layer by layer Ahmed Abdelazeem ASIC Physical Design
  • 41. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation Final Validation Ahmed Abdelazeem ASIC Physical Design
  • 42. Intro Routing Crosstalk ECO DFM Flow Antenna Via Wire Filler Metal Slotting Validation .... ÕækQË@ áÔgQË@ éÊË@ Õæ„. C JÊ ¯ B @ Õ Îª Ë@ áÓ Õ æJKð@ AÓð Ahmed Abdelazeem ASIC Physical Design