This document describes how a semiconductor manufacturer used the open source Jumbune flow analyzer to debug errors in their Hadoop MapReduce data partitioning process. The QA team found inconsistencies between wafer test data and packaging test data that were traced back to issues in how pass/fail thresholds were interpreted during MapReduce partitioning. Using Jumbune's debugger to validate data flows, custom classes were created to correlate test results with actual outputs, revealing that a critical test threshold was misinterpreted during partitioning, incorrectly flagging valid wafers as faulty. This helped resolve the production issues.