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(Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley
COLIN MAUNDER
Elscironlc Engineering/Testing
Are you looking to reduce the cost of testing your board design?
Reading this book you will realize that design-for-test has many benefits and need not
be difficult. By following a few essential steps you will significantly reduce the cost of
testing your finish eel board design.
Matching the way a board is designed, this comprehensive book considers
design-for-test requirements in a step-by-step fashion with explanations of why a
feature is needed and what the consequences of ignoring it might be.
The hook:
3 presents design-for-test principles In a manner that matches the way a
board is designed
3 provides checklists to assess the testability of each completed design
3 includes a chapter on the important IEEE standard on boundary-scan
(IEEE Std 1149.1)
3 discusses how a development project should be managed so that a testable
design is achieved
This book will be very valuable for engineers and managers involved wish electronic
board design. It will also be suitable for students in electrical and electronic
engineering and related disciplines to support courses in test development and
design-for-test.
Colin Maunder is a consultant in computer-aided testing at BT Laboratories, UK. He is
well known internationally for his courses on design-for-test and his work on IEEE
Std 1149.1. He received a major IEEE Computer Society award for leading the
development of this important new standard for design-for-test and is currently
Emeritus Chair of the international working group that is enhancing and maintaining
the standard.
9 0 0 0 0 >
ELECTRONIC SYSTEMS ENGINEERING SERIES
Consulting editors E L Dagless
University of Bristol
J O'Reilly
University College of Wales
OTHER TITLES IN THE SERIES
Advanced Microprocessor Architectures L Ciminiera and A Valenzano
Optical Pattern Recognition Using Holographic Techniques JV Collings
Modern Logic Design D Green
Data Communications, Computer Networks and OSI (2nd Edn) FHalsall
Multivariate Feedback Design J M Maciejowski
Microwave Components and Systems K F Sander
Tolerance Design of Electronic Circuits R Spence and R Soin
Computer Architecture and Design A J van de Goor
Digital Systems Design with Programmable Logic M Bolton
Introduction to Robotics P J McKerrow
MAP and TOP Communications: Standards and Applications A Valenzano,
C Demartini and L Ciminiera
Integrated Broadband Networks R Handel and M N Huber
Addison-Wesley Publishing Company
Wokingham, England • Reading, Massachusetts • Menlo Park, California • New York
Don Mills, Ontario • Amsterdam • Bonn • Sydney • Singapore • Tokyo • Madrid
San Juan • Milan • Paris • Mexico City • Seoul • Taipei
(£) 1992 Addison-Wesley Publishers Ltd.
© 1992 Addison-Wesley Publishing Company Inc.
AH rights reserved. No part of this publication may be reproduced, stored in a
retrieval system, or transmitted in any form or by any means, electronic, mechanical,
photocopying, recording or otherwise, without prior written permission of the
publisher.
The programs in this book have been included for their instructional value. They
have been tested with care but are not guaranteed for any particular purpose. The
publisher does not offer any warranties or representations, nor does it accept any
liabilities with respect to the programs.
Many of the designations used by manufacturers and sellers to distinguish their
products are claimed as trademarks. Addison-Wesley has made every attempt to
supply trademark information about manufacturers and their products mentioned in
this book.
Cover designed by Designers & Partners of Oxford
and printed by The Riverside Printing Co. (Reading) Ltd.
Printed in Great Britain at the University Press, Cambridge.
First printed 1991.
British Library Cataloguing in Publication Data
Maunder, Colin
The board users guide to testable logic circuits.
I. Title
621.38153
ISBN 0-201-56513-7
Library of Congress Cataloging-in-Publication Data
Maunder, Colin M.
The board designers guide to testable logic circuits / by Colin Maunder.
p. cm. — (Electronic systems engineering series)
Includes bibliographical references and index.
ISBN 0-201-56513-7
1. Logic circuits—Testing. I. Title. II. Series.
TK7868.L6M376 1992
621.39'5—dc20 91-29663
CIP
Preface
When I first got involved in test engineering in the 1970s, boards were, by
today's standards, simple. They contained, on average, a few thousand logic
gates in the form of small- and medium-scale integration components.
Testing was done by applying signals at the board's functional connector and
by examining the board's response.
Of course, board complexities increased. Soon, it was recognized that
functional (from the edge) testing was too costly — it was expensive to
develop test programs and these were relatively inefficient at locating
common manufacturing faults, such as open and short circuits. The in-circuit
tester was introduced as a solution to these problems. It allowed test
generation costs to be significantly reduced and, by virtue of its connection
to every chip-to-chip interconnection on the board, allowed rapid diagnosis
of the most common manufacturing-induced faults.
During the 1980s, the in-circuit tester became the principal type of
test system used for testing loaded boards. Initially, some were concerned
that the backdriving technique used by these testers might cause damage or
reliability degradation to components on the boards. In response, techniques
were developed to control the way that in-circuit tests were applied —
ensuring that the chance of damage was minimized. In essence, these
techniques required careful sequencing of the tests applied to the board,
allowing a recovery period following backdriving of a particular IC, and
imposition of a maximum time. limit for each test, calculated according to
the characteristics of the components adjacent to that under test.
v
VI rtikPAUK
Unfortunately, technology doesn't stand still. Board complexities
continued to increase during the 1980s, fuelled by advancing integrated
circuit technology and by the move towards the use of smaller surface-
mount packages. This caused three problems for the in-circuit tester:
O First, test times for individual components increased and began to
exceed the time limit imposed to avoid the possibility of damage
during backdriving. Tests had to be shortened, with the result that
they were less comprehensive than before.
G Second, the pin-to-pin spacing for surface-mount packages is less
than the 0.1" of dual-in-line ICs. The spacing between in-circuit test
probes had to be reduced to allow connections into and out of these
ICs to be accessed. Unfortunately, however, probes become less
robust and less reliable as their size reduces.
Towards the end of the 1980s, these problems were becoming acute in
certain sectors of the electronics industry. An industry pressure group (the
Joint Test Action Group — JTAG) was formed to develop and promulgate a
change of approach — from in-circuit testing to a technique more suited to
highly-complex, miniaturized loaded board designs, JTAG and,
subsequently, the IEEE drafted a standard for the design of integrated
circuits that would ensure that chips would be able to assist in the task of
testing the loaded board. This standard — ANSI/IEEE Std 1149.1, Standard
Test Access Port and Boundary-Scan Architecture — is now supported by
several leading IC vendors and test equipment companies and is set to
provide the basis of board testing through the 1990s.
While these changes have helped to control the cost of testing (which
would otherwise have risen much more rapidly as board complexity
increased), it is clear that testing has become an expensive part of the total
cost of developing, manufacturing, and (in particular) supporting electronic
systems. As a result, design-for-test has become an essential aspect of the
designer's task — those who ignore it do so at their peril.
The objective of this book is to present design-for-test in a manner
that matches the way that a board is designed — starting with top-level
block design and progressing through component selection and circuit design
to board layout. The design-for-test requirements that should be considered
at each stage are, wherever possible, grouped into a single chapter. An
explanation is provided for each requirement so that the designer can
understand why the feature is needed and what the consequences of ignoring
the requirement might be. Finally, a set of checklists is provided to help
assess the testability of each completed design — again, stage by stage.
As you will see, design-for-test is not difficult. The various
requirements are easy to understand and to implement. If implemented, the
various design-for-test features will significantly reduce the cost of testing
the finished board design. So why not give it a try?
PREFACE vii
Acknowledgements
Many people have contributed to this book. Particular acknowledgement
should be given to the following:
O my employer, BT, for providing the time to develop the internal
design-for-test 'manual' that was the basis of this book and for giving
permission for its publication;
• Ben Bennetts, of Bennetts Associates, who introduced me to test
engineering and with whom I have lectured on test generation and
design-for-test over many years;
3 the students on courses presented in Amsterdam and elsewhere, who
unwittingly acted as the test-bed for the material in this book and, in
some cases, contributed items that have been included in it;
O Ken Totton and other colleagues at BT Laboratories, who provided
comments on early drafts; and, lastly,
H my wife and children, who were starved of attention at evenings and
weekends as the draft was converted into this book.
Finally, Chapter 3 contains material from two previously-published papers:
O Maunder CM. and Tulloss R.E. (1991). An introduction to the
boundary-scan standard: ANSI/IEEE Std 1149.1. Journal of
Electronics Test, Theory, and Applications, 2(1), 27-42.
• . Maunder CM. (1991). The impact of testability standards on design
and EDA. In Proc. Concurrent Engineering and Electronic Design
Automation Conference. Bournemouth, UK, March.
Acknowledgement is made to Kluwer Academic Publishers and
Bournemouth Polytechnic, respectively, for permission to reuse this
material.
; Colin Maunder
BT Laboratories
Martlesham Heath
Ipswich, IP5 7RE, UK
November 11, 1991
(Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley
Contents
Preface v
Glossary xiii
Part 1 l
1 Introduction to testing and testability 3
1.1 • Introduction 3
1.2 Basics 4
1.3 Test generation 8
1.4 Test application 14
1.5 Fault diagnosis 18
1.6 Design-for-test 21
References 23
2 Design-for-test techniques 24
2.1 Introduction 24
2.2 Do nothing 26
2.3 Design-for-test guidelines 27
2.4 Scan design 30
2.5 Self-test 42
References 51
IX
x CONTENTS
3 Boundary-scan 52
3.1 Introduction 52
3.2 A chip-level view 53
3.3 The test logic architecture 54
3.4 The TAP 56
3.5 The TAP controller 57
3.6 The instruction register 59
3.7 The test data registers 60
3.8 The BYPASS instruction 62
3.9 The IDCODE and USERCODE instructions 63
3.10 Boundary-scan register instructions 65
3.11 Machine-readable descriptions of ANSI/IEEE Std
1149.1-compatible ICS 75
3.12 Using boundary-scan 76
3.13 Conclusion 81
References 82
4 Planning for design-for-test 83
4.1 Introduction 83
4.2 Planning for a testable design 83
4.3 Testability checklists and design reviews 86
4.4 The test strategy 90
4.5 Choosing a design-for-test strategy 91
4.6 Setting a design-for-test budget 94
References 95
Part 2 97
Test access techniques
5.1 Introduction
5.2 Connector 'U' links
5.3 3-state devices
5.4 Multiplexors and shift-registers
5.5 Use of simple logic gates
5.6 Test support chips
5.7 Bed-of-nails
Designing self-testing products
6.1 Introduction
6.2 Start small
6.3 Triggering self-test
6.4 Pass/fail indications
6.5 Control of external interfaces during self-test
6.6 Component-specific self-test requirements
6.7 Some useful techniques
99
99
100
102
102
104
104
105
106
106
107
109
109
110
110
112
CONTENTS
7 Component selection and design 113
7.1 Introduction 113
7.2 Component selection 114
7.3 Programmable device design 115
7.4 ASIC design 117
8 Circuit design 122
8.1 Introduction 122
8.2 Initialization 123
8.3 Architectural issues 128
8.4 Function-oriented requirements 132
8.5 Connection-oriented requirements 138
8.6 Controllability and observability improvement 143
9 Supplying power to the product 144
9.1 Introduction 144
9.2 Safety during testing 144
9.3 Power inputs 145
9.4 Decoupling 146
9.5 Conversion and validation 146
9.6 Power-on resets 146
10 Connector selection and layout 147
10.1 Introduction 147
10.2 Connector selection 148
10.3 Signal-to-pin mapping 148
11 Printed circuit layout 151
151
152
155
155
157
157
159
162
166
168
171
172
12 Documentation 173
12.1 Introduction 173
12.2 Documentation required for test 173
11.1
11.2
11.3
11.4
11.5
11.6
11.7
11.8
11.9
11.10
11.11
Introduction
Using this chapter
Terminology
Overall layout
Interconnect, vias, etc.
Packaging of logic elements
Component placement
Test access provision
Test access point design
Labelling
Construction
References
xii CONTENTS
Appendix Testability checklists 175
A. 1 Introduction 175
Self-testing products 176
Component selection 177
Programmable device design 178
ASIC design 179
Circuit design 180
Power supply and distribution 183
Connectors 185
Printed circuit layout 186
Documentation 188
Index 189
Glossary
AC
ACL
ALU
AOT
ASIC
ATE
ATPG
BILBO
BIST
BOM
BSDL
CCITT
CMOS
DC
DIL
DIP
DTL
DUT
ECL
EDA
EMC
FBT
Alternating current
Approved component list
Arithmetic logic unit
Adjust on test
Application-specific IC
Automatic test equipment
Automatic test program generation
Built-in logic block observer
Built-in self-test
Bill of materials
Boundary-scan description language
International Telephone and Telegraph Consultative
Committee
Complementary metal oxide semiconductor
Direct current
Dual-in-line
Dual-in-line package
Diode transistor logic
Device-under-test
Emitter-coupled logic
Electronic design automation
Electromagnetic compatibility
Functional board tester: a type of ATE
Xltl
FDDI
IC
ICT
ISDN
JEDEC
JTAG
LED
LFSR
LSSD
MISR
MOS
Overdrive
PBX
PCB
PLD
PTH
PWB
RAM
ROM
RTL
S-a-0
S-a-1
SIP
SMT
SOT
Stuck-at fault
TAP
Test fixture
Test Land
TTL
VHDL
VHSIC
Via
VLSI
UUT
ZIF
Fibre distributed data interface
Integrated circuit
In-circuit tester: a type of ATE
Integrated services digital network
Joint Electron Device Engineering Council
Joint Test Action Group
Light-emitting diode
Linear-feedback shift register
Level-sensitive scan design
Multiple-input signature register
Metal oxide semiconductor
Force the logic state of a connection by supplying more
current than the circuit that would normally drive it
Private branch exchange: a telephone and/or data exchange
installed on a company's premises, etc.
Printed circuit board
Programmable logic device
Plated through hole
Printed wiring board
Random-access memory
Read-only memory
Resistor transistor logic
Stuck-at-0: a fault in which a connection becomes
permanently fixed at logic 0
Stuck-at-1: a fault in which a connection becomes
permanently fixed at logic 1
Single-in-line package
Surface-mount technology
Select on test
A fault that causes a signal to take on a fixed logic value
regardless of the output of preceeding logic
The ANSI/IEEE Std 1149.1 test access port
Hardware used to connect the printed circuit board being
tested to the ATE.
Contact area on a printed circuit board used by bed-of-nails
test probes
Transistor transistor logic
VHSIC hardware description language
Very high speed integrated circuit
A plated-through hole on a printed circuit board used solely
to convey a connection from one layer to another
Very large scale integration
Unit under test
Zero insertion force
This part provides an introduction to testing
and design-for-testability. It provides an
overview of the principal design-for-test
techniques, for both chips and loaded boards,
and discusses the formulation of plans to
ensure that products are designed to be
testable.
Part 1
(Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley
CHAPTER 1.
Introduction to
Testing and
Testability
1.1 Introduction 1.4 Test application
1.2 Basics 1-5 Fault diagnosis
1.3 Test generation 1.6 Design-for-test
References
1.1. Introduction
A combination of two factors — greater competition and the wider use of
'information technology' — is bringing about a rapid growth in the variety of
electronic products available to the consumer. Also evident is the increasing
complexity of these products, made possible through the combination of
low-cost state of the art integrated circuit technology and advanced
manufacturing techniques.
To compete successfully in such an environment, companies need to
bring new products from the drawing board to the marketplace as quickly
(and as cheaply) as possible, and to encourage their suppliers to do the same.
The costly and time-consuming 'production engineering' phases that have
traditionally followed initial design must now be avoided, with the
consequence that the responsibility for production engineering tasks is
increasingly placed on the designer. The areas of design covered by these
3
4 INTRODUCTION TO TESTING AND TESTABILITY
tasks do, however, contribute significantly to the product's commercial
viability and it is therefore important that they continue to be considered
carefully.
One such design area is 'design-for-testability' which stems from the
need to make the process of testing the product, both following production
and during repair, as cost-effective as possible. The purpose of this chapter
is to explain why design-for-testability (and hence this book) is needed
through a discussion of test technology and the problems of test generation,
test application and fault diagnosis.
1.2. Basics
1.2.1. Types of testing
Testing is performed at a number of stages in the development of a product
and for a variety of purposes. Perhaps the most important of these types of
testing are:
(1) Design Verification Testing. Carried out to ensure that the design
adequately performs the function which is expected of it. This stage
of testing is most often performed using bench-top instrumentation
(oscilloscopes, logic analysers, etc.), although in the case of more
complex designs programmable test systems may be used.
(2) Production Testing. Performed to locate any defects which might
exist in each copy of a design once it has been manufactured.
Typically, this stage of testing will be done using a programmable
automated test equipment (ATE), which for assembled printed
circuit boards may cost $1,000,000 or more. The principal types of
ATE are described in Section 1.4.1.
(3) Repair Testing. Performed when a product fails during use. The aim
is to isolate the cause of failure sufficiently to allow it to be repaired.
Once again, this may be accomplished using ATE.
(4) Self-testing. An example of self-test is the routining of telephone
exchanges, computers, or military equipment during idle periods,
performed to locate faults before they cause failure in use. Self-test
procedures are also provided for other reasons, for example to reduce
the costs of performing on-site repair. They are particularly suitable
for use in equipment that is to be installed in a customer's premises
(for example, office equipment or telephone switches) since they
allow the customer to check which piece of equipment is at fault
before asking for repair.
BASICS 5
This book is directed at all stages of testing a product during its life and at
ways in which products can be designed to make test tasks easier.
1.2.2. Test activities
There are three stages of activity involved in the testing of a product.
(1) Test Development. Firstly, a test for the product must be developed,
and demonstrated to be sufficiently good at detecting and locating
faults. We will look at one typical method for achieving this in
Section 1.3.
(2) Test Application. Secondly, once the test has been developed, it will
be applied to units as they leave the production line, or as they arrive
for repair, using the available ATE. After this stage units will have
been marked faulty or fault-free. Types of ATE, and other aspects of
test application, are considered in Section 1.4.
(3) Diagnosis. Finally, if a unit is found faulty, the ATE will be used to
produce a diagnosis of the cause of failure, for example a failed
component. In this way, a repair can be effected, the success of
which will be determined by re-testing the unit. Ways in which
automated diagnosis is accomplished are discussed in Section 1.5.
1.2.3. What is testability?
Since cost is an important factor in any commercial environment, it should
not be surprising that the overall cost of performing testing activities
discussed in Section 1.2.2 is one measure of the product's testability. The
higher the cost of each activity, the lower the product's testability.
Cost is, however, not the only factor which determines testability,
and for the purpose of this discussion two other factors will be considered.
Firstly, the time taken to perform the various test tasks is important,
and cannot always be measured through the costs of labour, etc. In some
cases, for example when deadlines have to be met, time may actually be
more important than cost. In these cases, the most significant impact of
reduced testability may be lengthened test development timescales. Figure
1.1 (Reinerstein, 1983) shows the importance of time-to-market in high-
growth markets where product life cycles are relatively short. It can be seen
that a loss of up to 33% of profits may occur if a product is six months late
on to the market.
Secondly, there is the adverse effect that reduced testability can have
on the quality of the product. Ideally, a test program should be able to detect
lOOfo of the faults that might occur in the product; if this were the case, then
the quality of the product could be guaranteed. Inevitably, the test will be
less than perfect (as will be discussed later) and so some faults will escape
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And I thought, as I saw him then, merrily recalling the scenes and
escapades of student life, "How well the distinguished man of the
world had succeeded in keeping the heart of a boy!"
A passage in Mr. Low's book, "A Chronicle of Friendships," that
recalls that day most vividly, is this: "Stevenson never once excused
himself from our company on the plea of having work to do." For so
it was with us; he seemed to have no cares or preoccupations, but
to be content to be there, enjoying the conversation and the
pleasantness of the passing hour.
I had a cosy quarter of an hour with his mother after my walk, and
off by ourselves, in a corner, away from interruption, she spoke of
her son's childhood. In her eyes, he was still the "bonnie wee laddie"
who scouted about in his make-believe worlds among the chairs and
tables in the drawing-room while she entertained her friends, and
we repeated bits from "A Child's Garden of Verses."
I think that if there is any clue to the character of a great man we
must look to his mother. Mrs. Stevenson embodied the idea of her
son's peculiar charm; there was the same triumphal youthfulness,
and her cheeks were round and rosy like a ripe apple.
I think of the mother now, after so many years, as the crowning
influence of the day, quiet and reticent, but always felt, and honored
by all as became the mother of our welcome guest.
In her letters, written in the Marquesas to her sister in Scotland, she
carries out this impression of habitual freshness of spirit, and her
humor is subtle and optimistic: "Nothing gives me more pleasure or
a better appetite than an obstacle overcome." She shows herself the
life of "The Silver Ship," as the people of Fakarava dubbed the
Casco, and never a word of criticism or complaint is penned at any
inconvenience or annoyance endured by the way. Indeed, one
marvels at her tranquillity in the midst of so many complications—
just as one wondered at the simplicity of Queen Victoria in her diary.
One of the chief delights in the perusal of these letters is the
questions they project into the mind of the reader. Is it a style, a
native virtue, a mannerism, a fad, or what?
For example, she never suspects that the French man-o'-war in one
of the bays may account for some of the good behavior of the
natives, or that their bounty in cocoanuts and bread-fruit may be
tendered with an eye to the novelties to be had in exchange, but
accepts all in good faith, as part of their native generosity.
And what a joy it is to see her taking holy communion with these
people, so lately reclaimed from cannabalism, and taking the
ceremony "au grand serieux"! Thus, a missionary within, a warship
without, the amenities of religion and society are enjoyed to the full.
One lays down these letters and laughs, many a time, where no
laughter was intended. Certainly, she was a good mixer as well as
the born mother of a genius.
Stevenson's death is an anomaly no less pathetic than his life, for in
eluding extinction by consumption, he probably achieved a still
earlier end by apoplexy. I had the account from Mrs. Low, who
received it directly from "Fanny" by letter. Mrs. Stevenson was
mixing a salad of native ingredients of which Stevenson was very
fond, when he joined her in the kitchen, complaining that he was
not very well, and sitting down, laid his head on her shoulder, where
in about twenty minutes he expired.
I said at the beginning that I was not disappointed in the personality
of Stevenson, but it would be nearer the mark to say that my
anticipations fell far short of the reality.
It is often the case in meeting literary celebrities that one has the
feeling that they are first authors, and after that men. Rodin, the
French sculptor, focuses this idea by saying that "many are artists at
the expense of some qualities of manhood." With Stevenson one
was clearly in the presence of a man, and after that the scholar and
the gentleman.
Was it not this fine distinction that, in spite of woolen shirt and a
third-class transportation, awoke the suspicions of his companions of
the steerage, that prompted the already quoted remark, "You are
not one of us?"
And on that memorable journey across the plains, seeking the
woman of his choice, resolved, though penniless and unknown, to
make her his wife in spite of every obstacle, the truth that the frailty
of the body is no criterion for the strength of the spirit is well
brought out. It was, in fact, this quality of initiative that constituted
his chief charm—the quality that, above all others, made us so
spontaneous in his presence and so proud of his achievement.
We knew that we were seeing him at his best, surrounded by his old
friends, and with the light of the memory of his youthful ambitions
on his face. We knew, too, that the parting would be a life-long one,
and that we would never look upon his like again. This regret each
knew to be uppermost in the mind of the others, but when the
good-byes began, we made no sign that it was to be more than the
absence of a day.
Nevertheless, the tensity of the last moments of parting was keenly
felt. Stevenson had planned to spend his last night at Wainwright's,
and Lloyd Osbourne was to row him across the river. Mr. Eaton and I
went down to the river-bank to see them off and to wave our last
adieux.
The rumble of carriage-wheels in the distance, and the
reverberations of footsteps and voices on the old wooden bridge
grew fainter and died away, before the little boat was pushed off;
and then, these two friends, Robert Louis Stevenson and Wyatt
Eaton, both at the zenith of their life and powers, and both hovering
so closely on the brink of eternity, sent their last messages to each
other, across the distance, until the little boat had glided away, on
the ebb-tide, a mere speck in the gray transparency of the twilight.
(Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley
FATE OF THE CASCO
There are ships that, like certain people, seem created for an
unusual and distinguishing destiny, and are unable long to survive
the destruction of those peculiar conditions that have given them
their dominating qualities, animation and color. Mr. Francis Dickie of
Vancouver, B. C., has described with a vivid pen the later adventures
and slow foundering of the Casco.
This gentleman has kindly given me permission to reprint it here.
Our sympathy goes out to the beautiful yacht in her lonely buffetings
and chill decay, but though stricken and vanished, we know that she
will live long in romance and in song as "The Silver Ship."
FATE OF THE CASCO
by
Francis Dickie
Forty miles from Nome, Alaska, breaking under the Arctic winter on
the shores of bleak King Island, lies the skeleton of a wrecked top-
mast schooner.
Early in June, 1919, a small crew of adventurous spirits had turned
her nose out through the Behring Sea, headed for the Lena River
and Anadyn—and gold. She was small and old, this yacht, but what
are thirty-three years when a craft has the proper tradition for
daring, hazardous adventure?
September storms swept upon the Casco, pounding her teak sides
with unfamiliar Northern blasts. Fog, cold, night—and she lay
shuddering on the rocks, snow-beaten, ice-broken, abandoned by
her crew.
So ships pass and become smooth driftwood on scattered beaches.
But sometimes the magic of long adventure will gather around an
abandoned hull, and form a rich memory to tempt the eternal
wanderlust of man. What is an old ship but a floating castle built
upon the memories of the men who have helmed her? Sometimes
she plies the same dull course throughout her existence. Sometimes
she changes trade with surprising chances. So it was with the Casco
—now a glittering pleasure yacht, whim of an old millionaire, now
stripped of gaudy trappings and bent to the grim will of seal hunter
and opium trader.
In the opening of Robert Louis Stevenson's novel, "The Wrecker,"
with red ensign waving, sailing into the port of Tai-o-hae in the
Marquesas, the Casco takes her place in fiction. But she is far more
romantic as she has sailed in fact.
"Winged by her own impetus and the dying breeze, the Casco
skimmed under cliffs, opened out a cove, showed us a beach and
some green trees, and flitted by again, bowing to the swell ... from
close aboard arose the bleating of young lambs; a bird sang on the
hillside; the scent of the land and of a hundred fruits or flowers
flowed forth to meet us; and presently"—
Presently they sailed among the Isles of Varien, sunny and
welcoming in the South Seas.
Stevenson wrote this in the cabin of the Casco, in the summer of
'88. His always delicate health had broken completely under the San
Francisco climate. Friends had urged a cruise to the South Seas, he
had gladly acquiesced, and looked around for a ship. There was a
subtle romantic call for the author of "Treasure Island" in a voyage
on a ship of his own choosing and direction under the soft skies of
the tropics.
The Casco had been built by an eccentric California millionaire, Dr.
Merritt, for cruising along the coast, and no money had been spared
in her fittings. She was a seventy-ton fore-and-aft schooner, ninety-
five feet long, with graceful lines, high masts, white sails and decks,
shiny brasswork, and a gaudy silk-hung saloon. She was not perhaps
too staunch a cruiser. "Her cockpit was none too safe, her one pump
was inadequate in size and almost worthless; the sail plan forward
was meant for racing and not for cruising; and even if the masts
were still in good condition, they were quite unfitted for hurricane
weather."
Nevertheless, negotiations were opened with Dr. Merritt. That
gentleman had read of Stevenson. He had conceived him as an
erratic, irresponsible soul who wrote poetry and let everything else
go to the devil. He'd be blamed, he said, if he'd let any scatter-
brained writer use his precious yacht. Finally, a meeting between the
two was effected; and, speedily charmed by Stevenson's manner, he
decided to let him have the Casco. Therefore, with Capt. Otis as
skipper, four deck hands, "three Swedes and the inevitable Finn,"
and a Chinese cook, the Stevensons sailed June 28, 1888, for the
Marquesas.
Stevenson's health rapidly improved in the first weeks of the voyage.
He was charmed by the Southern islands and began making notes
and gathering data from the natives for later books. He wrote parts
of "The Master of Ballantrae" and of "The Wrong Box," and spent
much of his time studying the intricate personality of his skipper,
whose portrait afterward appeared in the pages of "The Wrecker."
After months of idle cruising, it was discovered that the Casco's
masts were dangerously rotten. Repairs were immediately necessary.
Meantime Stevenson became less and less well. When the ship was
again in commission and took them to Hawaii, he realized the
impossibility of his returning to America, and, sending the Casco
back to San Francisco, started upon the exile that was to terminate
in his death.
Thereafter, the Casco changed hands frequently, exploring the
mysteries of seal-hunting, opium-smuggling, coast-trading and gold-
adventure, among other things. In the early nineties, she was
known, because of her swiftness, quickness and ease of handling at
the wheel, to be the best of a hundred and twenty ships engaged in
the extinction of the pelagic seal. But when, in 1898, the sealers
found themselves impoverished by their own ruthlessness, the
Casco, her decks disfigured with blood and her hold rotten from the
drip of countless salty pelts, was discarded and left to rot on the
mud flats of Victoria. Too much of the spirit of adventure, however,
lurked in the tall masts of the Casco to let her waste away to such
an ugly ending. When the smuggling of Chinese and opium was at
its height, up and down the coast there were whisperings of the
daring work of the smuggler Casco. The revenue officers knew
positively that she was laden with illicit Oriental cargo, and with
Chinese immigrants; but she escaped them again and again, her old
speed and lightness returning. Once, however, the wind failed her,
and the revenue launch hauled alongside. Search for contraband
was instituted; but not a Chinaman appeared, not a trace of opium.
Fooled!—and they climbed down sheepishly into their launch. Later it
developed that while the revenue men were still far astern, the crew
had weighted the sixty Chinamen and dumped them overboard
along with the opium!
(Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley
The Casco, Just Before It was Wrecked on King Island
Kind permission of Mr. L. W. Pedrose
From the swift romance of opium running the Casco turned drudge.
She carried junk between Victoria and Vancouver; she was a training
ship for the Boy Sea Scouts of Vancouver; she was a coasting trader
in 1917 when the shipping boom gave value to even her little hulk;
and in between times she lay on mud flats.
In the spring of 1919 came the stories of gold in Northern Siberia.
With high hopes of fortunes to be made, the Northern Mining and
Trading Company sprang into existence, and the Casco was
chartered to dare the far Northern seas and icy gaps.
So she died at sea, as all good ships should, with the storm at her
back and the mists over her, with snow as a shroud, and brooding
icebergs to mourn. She lies cold and stately, with her memories of
tropical splendor, high adventure, and light romance—this little ship
whose cabin knew Stevenson.
PORTRAITS FROM STEVENSON
by
George Steele Seymour
TREASURE ISLAND
Jim Hawkins, Jim Hawkins, the treasure ship's a-sailing,
The lure of life is calling us beyond the shining sea,
The distant land of mystery her beauty is unveiling,
And shall we then be lagging when there's work for you and me?
The pirate ship is on the main, Jim Hawkins, Jim Hawkins,
She flies the Jolly Roger and there's battle in her prow,
Then shall we play the craven-heart and lurk ashore, Jim Hawkins,
When fortune with a lavish turn is waiting for us now?
Jim Hawkins, Jim Hawkins, the pirate crew has landed,
With guns and knives between their teeth they're stealing on the
prey,
Then let's afoot and follow them and catch them bloody-handed—
When life and joy are calling us, shall we bide long away?
Jim Hawkins, Jim Hawkins!
ALAN BRECK
Is't you, Alan? You of the ready sword
And nimble feet, and keen, courageous eye,
Quick to affront, and yet more quick to spy
Aught that might touch your own dear absent lord!
Hero and clown! How it sets every chord
Athrill to see your feathered hat draw nigh,
And all your brave, fantastic finery!
Romance no stranger picture doth afford.
For I have met you in the House of Fear,
Have watched you cross the torrent of Glencoe
And climbed with you the rugged mountain-side.
We are old comrades, and I hold most dear
This loyal friend and yet more loyal foe
Who bore a kingly name with kingly pride.
ELLIS DUCKWORTH
Was there a rustle of the leafy bed?
Heard you no footstep in the matted grass?
Down the deep glade where fearsome shadows pass
What is it lurks so still? What secret dread
Troubles the tangled branches overhead?
An ye be foe to this good man, alas!
No art shall save you though ye walk in brass.
Swift to your heart shall the Black Death be sped.
The woods are still—for that was years ago—
And now no baleful presence haunts the glade,
No train-band rules the highway as of yore.
Romance is dead. Adventure, too, lies low.
Long in the grave is Duckworth's kingdom laid,
And the black arrow speeds its way no more.
SAINT IVES
Viscomte, your health. Confusion to the foe.
The noble lord your uncle—bless his name!
And may your wicked captors die in shame.
I kiss your hand; I kiss your forehead—so!
The castle cliff is steep, but down below
Both fortune and the lady Flora wait.
Oh, you will meet them, I anticipate,
Your hand upon your heart, and bowing low.
The stage-coach lumbers heavily tonight.
Its wheels sound loudly on the stony flag.
What's that! A chest of florins in the drag
Gone! And the rascally postboy taken flight!
Ah, well, God send him a dark night, and we ...
Your health, Saint Ives, in sparkling Burgundy.
PRINCE FLORIZEL
Try these perfectos, gentlemen. The flavour
I recommend. A smoke-royal. With white wines
You'll find them fragrantest. That spicy savour
Comes only in stock from the Isle of Pines.
Here are cigarettes, Turkish and Egyptian,
Such as no other merchant has to sell,
And Trichinopoly of the same description
I smoked when I was called Prince Florizel.
That was before I stooped to trade plebeian,
Left my exalted home and wandered far,
Emptied my plate at danger's feast Protean,
Beside the well of wisdom broke my jar.
Till Louis looked from out the empyrean
And in the dust of Mayfair found a star.
THE EBB TIDE
Green palm-tops bending low by silent seas
Like heads in prayer—
Life's turmoil nor its multiplicities
Are there.
But only calms and potencies hold sway
That will not be denied,
Come with the surge of dawn and drift away
With the ebb tide.
FOOTNOTES:
[A] Lescaris was a Greek shepherd who discovered the secret of
transmuting the baser metals to fine gold.
[B] Paua—Native name for the Tridacna Gigus, a huge clam.
When it closes on any one, his only escape is by losing the limb.
TRANSCRIBER'S NOTE:
Inconsistencies in spelling, punctuation, and hyphenation have been standardized.
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(Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley

  • 1. (Ebook) The Board Designer's Guide to Testable Logic Circuits by Colin Maunder - Addison-Wesley download https://ebooknice.com/product/the-board-designer-s-guide-to- testable-logic-circuits-55605506 Explore and download more ebooks at ebooknice.com
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  • 6. Elscironlc Engineering/Testing Are you looking to reduce the cost of testing your board design? Reading this book you will realize that design-for-test has many benefits and need not be difficult. By following a few essential steps you will significantly reduce the cost of testing your finish eel board design. Matching the way a board is designed, this comprehensive book considers design-for-test requirements in a step-by-step fashion with explanations of why a feature is needed and what the consequences of ignoring it might be. The hook: 3 presents design-for-test principles In a manner that matches the way a board is designed 3 provides checklists to assess the testability of each completed design 3 includes a chapter on the important IEEE standard on boundary-scan (IEEE Std 1149.1) 3 discusses how a development project should be managed so that a testable design is achieved This book will be very valuable for engineers and managers involved wish electronic board design. It will also be suitable for students in electrical and electronic engineering and related disciplines to support courses in test development and design-for-test. Colin Maunder is a consultant in computer-aided testing at BT Laboratories, UK. He is well known internationally for his courses on design-for-test and his work on IEEE Std 1149.1. He received a major IEEE Computer Society award for leading the development of this important new standard for design-for-test and is currently Emeritus Chair of the international working group that is enhancing and maintaining the standard. 9 0 0 0 0 >
  • 7. ELECTRONIC SYSTEMS ENGINEERING SERIES Consulting editors E L Dagless University of Bristol J O'Reilly University College of Wales OTHER TITLES IN THE SERIES Advanced Microprocessor Architectures L Ciminiera and A Valenzano Optical Pattern Recognition Using Holographic Techniques JV Collings Modern Logic Design D Green Data Communications, Computer Networks and OSI (2nd Edn) FHalsall Multivariate Feedback Design J M Maciejowski Microwave Components and Systems K F Sander Tolerance Design of Electronic Circuits R Spence and R Soin Computer Architecture and Design A J van de Goor Digital Systems Design with Programmable Logic M Bolton Introduction to Robotics P J McKerrow MAP and TOP Communications: Standards and Applications A Valenzano, C Demartini and L Ciminiera Integrated Broadband Networks R Handel and M N Huber
  • 8. Addison-Wesley Publishing Company Wokingham, England • Reading, Massachusetts • Menlo Park, California • New York Don Mills, Ontario • Amsterdam • Bonn • Sydney • Singapore • Tokyo • Madrid San Juan • Milan • Paris • Mexico City • Seoul • Taipei
  • 9. (£) 1992 Addison-Wesley Publishers Ltd. © 1992 Addison-Wesley Publishing Company Inc. AH rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording or otherwise, without prior written permission of the publisher. The programs in this book have been included for their instructional value. They have been tested with care but are not guaranteed for any particular purpose. The publisher does not offer any warranties or representations, nor does it accept any liabilities with respect to the programs. Many of the designations used by manufacturers and sellers to distinguish their products are claimed as trademarks. Addison-Wesley has made every attempt to supply trademark information about manufacturers and their products mentioned in this book. Cover designed by Designers & Partners of Oxford and printed by The Riverside Printing Co. (Reading) Ltd. Printed in Great Britain at the University Press, Cambridge. First printed 1991. British Library Cataloguing in Publication Data Maunder, Colin The board users guide to testable logic circuits. I. Title 621.38153 ISBN 0-201-56513-7 Library of Congress Cataloging-in-Publication Data Maunder, Colin M. The board designers guide to testable logic circuits / by Colin Maunder. p. cm. — (Electronic systems engineering series) Includes bibliographical references and index. ISBN 0-201-56513-7 1. Logic circuits—Testing. I. Title. II. Series. TK7868.L6M376 1992 621.39'5—dc20 91-29663 CIP
  • 10. Preface When I first got involved in test engineering in the 1970s, boards were, by today's standards, simple. They contained, on average, a few thousand logic gates in the form of small- and medium-scale integration components. Testing was done by applying signals at the board's functional connector and by examining the board's response. Of course, board complexities increased. Soon, it was recognized that functional (from the edge) testing was too costly — it was expensive to develop test programs and these were relatively inefficient at locating common manufacturing faults, such as open and short circuits. The in-circuit tester was introduced as a solution to these problems. It allowed test generation costs to be significantly reduced and, by virtue of its connection to every chip-to-chip interconnection on the board, allowed rapid diagnosis of the most common manufacturing-induced faults. During the 1980s, the in-circuit tester became the principal type of test system used for testing loaded boards. Initially, some were concerned that the backdriving technique used by these testers might cause damage or reliability degradation to components on the boards. In response, techniques were developed to control the way that in-circuit tests were applied — ensuring that the chance of damage was minimized. In essence, these techniques required careful sequencing of the tests applied to the board, allowing a recovery period following backdriving of a particular IC, and imposition of a maximum time. limit for each test, calculated according to the characteristics of the components adjacent to that under test. v
  • 11. VI rtikPAUK Unfortunately, technology doesn't stand still. Board complexities continued to increase during the 1980s, fuelled by advancing integrated circuit technology and by the move towards the use of smaller surface- mount packages. This caused three problems for the in-circuit tester: O First, test times for individual components increased and began to exceed the time limit imposed to avoid the possibility of damage during backdriving. Tests had to be shortened, with the result that they were less comprehensive than before. G Second, the pin-to-pin spacing for surface-mount packages is less than the 0.1" of dual-in-line ICs. The spacing between in-circuit test probes had to be reduced to allow connections into and out of these ICs to be accessed. Unfortunately, however, probes become less robust and less reliable as their size reduces. Towards the end of the 1980s, these problems were becoming acute in certain sectors of the electronics industry. An industry pressure group (the Joint Test Action Group — JTAG) was formed to develop and promulgate a change of approach — from in-circuit testing to a technique more suited to highly-complex, miniaturized loaded board designs, JTAG and, subsequently, the IEEE drafted a standard for the design of integrated circuits that would ensure that chips would be able to assist in the task of testing the loaded board. This standard — ANSI/IEEE Std 1149.1, Standard Test Access Port and Boundary-Scan Architecture — is now supported by several leading IC vendors and test equipment companies and is set to provide the basis of board testing through the 1990s. While these changes have helped to control the cost of testing (which would otherwise have risen much more rapidly as board complexity increased), it is clear that testing has become an expensive part of the total cost of developing, manufacturing, and (in particular) supporting electronic systems. As a result, design-for-test has become an essential aspect of the designer's task — those who ignore it do so at their peril. The objective of this book is to present design-for-test in a manner that matches the way that a board is designed — starting with top-level block design and progressing through component selection and circuit design to board layout. The design-for-test requirements that should be considered at each stage are, wherever possible, grouped into a single chapter. An explanation is provided for each requirement so that the designer can understand why the feature is needed and what the consequences of ignoring the requirement might be. Finally, a set of checklists is provided to help assess the testability of each completed design — again, stage by stage. As you will see, design-for-test is not difficult. The various requirements are easy to understand and to implement. If implemented, the various design-for-test features will significantly reduce the cost of testing the finished board design. So why not give it a try?
  • 12. PREFACE vii Acknowledgements Many people have contributed to this book. Particular acknowledgement should be given to the following: O my employer, BT, for providing the time to develop the internal design-for-test 'manual' that was the basis of this book and for giving permission for its publication; • Ben Bennetts, of Bennetts Associates, who introduced me to test engineering and with whom I have lectured on test generation and design-for-test over many years; 3 the students on courses presented in Amsterdam and elsewhere, who unwittingly acted as the test-bed for the material in this book and, in some cases, contributed items that have been included in it; O Ken Totton and other colleagues at BT Laboratories, who provided comments on early drafts; and, lastly, H my wife and children, who were starved of attention at evenings and weekends as the draft was converted into this book. Finally, Chapter 3 contains material from two previously-published papers: O Maunder CM. and Tulloss R.E. (1991). An introduction to the boundary-scan standard: ANSI/IEEE Std 1149.1. Journal of Electronics Test, Theory, and Applications, 2(1), 27-42. • . Maunder CM. (1991). The impact of testability standards on design and EDA. In Proc. Concurrent Engineering and Electronic Design Automation Conference. Bournemouth, UK, March. Acknowledgement is made to Kluwer Academic Publishers and Bournemouth Polytechnic, respectively, for permission to reuse this material. ; Colin Maunder BT Laboratories Martlesham Heath Ipswich, IP5 7RE, UK November 11, 1991
  • 14. Contents Preface v Glossary xiii Part 1 l 1 Introduction to testing and testability 3 1.1 • Introduction 3 1.2 Basics 4 1.3 Test generation 8 1.4 Test application 14 1.5 Fault diagnosis 18 1.6 Design-for-test 21 References 23 2 Design-for-test techniques 24 2.1 Introduction 24 2.2 Do nothing 26 2.3 Design-for-test guidelines 27 2.4 Scan design 30 2.5 Self-test 42 References 51 IX
  • 15. x CONTENTS 3 Boundary-scan 52 3.1 Introduction 52 3.2 A chip-level view 53 3.3 The test logic architecture 54 3.4 The TAP 56 3.5 The TAP controller 57 3.6 The instruction register 59 3.7 The test data registers 60 3.8 The BYPASS instruction 62 3.9 The IDCODE and USERCODE instructions 63 3.10 Boundary-scan register instructions 65 3.11 Machine-readable descriptions of ANSI/IEEE Std 1149.1-compatible ICS 75 3.12 Using boundary-scan 76 3.13 Conclusion 81 References 82 4 Planning for design-for-test 83 4.1 Introduction 83 4.2 Planning for a testable design 83 4.3 Testability checklists and design reviews 86 4.4 The test strategy 90 4.5 Choosing a design-for-test strategy 91 4.6 Setting a design-for-test budget 94 References 95 Part 2 97 Test access techniques 5.1 Introduction 5.2 Connector 'U' links 5.3 3-state devices 5.4 Multiplexors and shift-registers 5.5 Use of simple logic gates 5.6 Test support chips 5.7 Bed-of-nails Designing self-testing products 6.1 Introduction 6.2 Start small 6.3 Triggering self-test 6.4 Pass/fail indications 6.5 Control of external interfaces during self-test 6.6 Component-specific self-test requirements 6.7 Some useful techniques 99 99 100 102 102 104 104 105 106 106 107 109 109 110 110 112
  • 16. CONTENTS 7 Component selection and design 113 7.1 Introduction 113 7.2 Component selection 114 7.3 Programmable device design 115 7.4 ASIC design 117 8 Circuit design 122 8.1 Introduction 122 8.2 Initialization 123 8.3 Architectural issues 128 8.4 Function-oriented requirements 132 8.5 Connection-oriented requirements 138 8.6 Controllability and observability improvement 143 9 Supplying power to the product 144 9.1 Introduction 144 9.2 Safety during testing 144 9.3 Power inputs 145 9.4 Decoupling 146 9.5 Conversion and validation 146 9.6 Power-on resets 146 10 Connector selection and layout 147 10.1 Introduction 147 10.2 Connector selection 148 10.3 Signal-to-pin mapping 148 11 Printed circuit layout 151 151 152 155 155 157 157 159 162 166 168 171 172 12 Documentation 173 12.1 Introduction 173 12.2 Documentation required for test 173 11.1 11.2 11.3 11.4 11.5 11.6 11.7 11.8 11.9 11.10 11.11 Introduction Using this chapter Terminology Overall layout Interconnect, vias, etc. Packaging of logic elements Component placement Test access provision Test access point design Labelling Construction References
  • 17. xii CONTENTS Appendix Testability checklists 175 A. 1 Introduction 175 Self-testing products 176 Component selection 177 Programmable device design 178 ASIC design 179 Circuit design 180 Power supply and distribution 183 Connectors 185 Printed circuit layout 186 Documentation 188 Index 189
  • 18. Glossary AC ACL ALU AOT ASIC ATE ATPG BILBO BIST BOM BSDL CCITT CMOS DC DIL DIP DTL DUT ECL EDA EMC FBT Alternating current Approved component list Arithmetic logic unit Adjust on test Application-specific IC Automatic test equipment Automatic test program generation Built-in logic block observer Built-in self-test Bill of materials Boundary-scan description language International Telephone and Telegraph Consultative Committee Complementary metal oxide semiconductor Direct current Dual-in-line Dual-in-line package Diode transistor logic Device-under-test Emitter-coupled logic Electronic design automation Electromagnetic compatibility Functional board tester: a type of ATE Xltl
  • 19. FDDI IC ICT ISDN JEDEC JTAG LED LFSR LSSD MISR MOS Overdrive PBX PCB PLD PTH PWB RAM ROM RTL S-a-0 S-a-1 SIP SMT SOT Stuck-at fault TAP Test fixture Test Land TTL VHDL VHSIC Via VLSI UUT ZIF Fibre distributed data interface Integrated circuit In-circuit tester: a type of ATE Integrated services digital network Joint Electron Device Engineering Council Joint Test Action Group Light-emitting diode Linear-feedback shift register Level-sensitive scan design Multiple-input signature register Metal oxide semiconductor Force the logic state of a connection by supplying more current than the circuit that would normally drive it Private branch exchange: a telephone and/or data exchange installed on a company's premises, etc. Printed circuit board Programmable logic device Plated through hole Printed wiring board Random-access memory Read-only memory Resistor transistor logic Stuck-at-0: a fault in which a connection becomes permanently fixed at logic 0 Stuck-at-1: a fault in which a connection becomes permanently fixed at logic 1 Single-in-line package Surface-mount technology Select on test A fault that causes a signal to take on a fixed logic value regardless of the output of preceeding logic The ANSI/IEEE Std 1149.1 test access port Hardware used to connect the printed circuit board being tested to the ATE. Contact area on a printed circuit board used by bed-of-nails test probes Transistor transistor logic VHSIC hardware description language Very high speed integrated circuit A plated-through hole on a printed circuit board used solely to convey a connection from one layer to another Very large scale integration Unit under test Zero insertion force
  • 20. This part provides an introduction to testing and design-for-testability. It provides an overview of the principal design-for-test techniques, for both chips and loaded boards, and discusses the formulation of plans to ensure that products are designed to be testable. Part 1
  • 22. CHAPTER 1. Introduction to Testing and Testability 1.1 Introduction 1.4 Test application 1.2 Basics 1-5 Fault diagnosis 1.3 Test generation 1.6 Design-for-test References 1.1. Introduction A combination of two factors — greater competition and the wider use of 'information technology' — is bringing about a rapid growth in the variety of electronic products available to the consumer. Also evident is the increasing complexity of these products, made possible through the combination of low-cost state of the art integrated circuit technology and advanced manufacturing techniques. To compete successfully in such an environment, companies need to bring new products from the drawing board to the marketplace as quickly (and as cheaply) as possible, and to encourage their suppliers to do the same. The costly and time-consuming 'production engineering' phases that have traditionally followed initial design must now be avoided, with the consequence that the responsibility for production engineering tasks is increasingly placed on the designer. The areas of design covered by these 3
  • 23. 4 INTRODUCTION TO TESTING AND TESTABILITY tasks do, however, contribute significantly to the product's commercial viability and it is therefore important that they continue to be considered carefully. One such design area is 'design-for-testability' which stems from the need to make the process of testing the product, both following production and during repair, as cost-effective as possible. The purpose of this chapter is to explain why design-for-testability (and hence this book) is needed through a discussion of test technology and the problems of test generation, test application and fault diagnosis. 1.2. Basics 1.2.1. Types of testing Testing is performed at a number of stages in the development of a product and for a variety of purposes. Perhaps the most important of these types of testing are: (1) Design Verification Testing. Carried out to ensure that the design adequately performs the function which is expected of it. This stage of testing is most often performed using bench-top instrumentation (oscilloscopes, logic analysers, etc.), although in the case of more complex designs programmable test systems may be used. (2) Production Testing. Performed to locate any defects which might exist in each copy of a design once it has been manufactured. Typically, this stage of testing will be done using a programmable automated test equipment (ATE), which for assembled printed circuit boards may cost $1,000,000 or more. The principal types of ATE are described in Section 1.4.1. (3) Repair Testing. Performed when a product fails during use. The aim is to isolate the cause of failure sufficiently to allow it to be repaired. Once again, this may be accomplished using ATE. (4) Self-testing. An example of self-test is the routining of telephone exchanges, computers, or military equipment during idle periods, performed to locate faults before they cause failure in use. Self-test procedures are also provided for other reasons, for example to reduce the costs of performing on-site repair. They are particularly suitable for use in equipment that is to be installed in a customer's premises (for example, office equipment or telephone switches) since they allow the customer to check which piece of equipment is at fault before asking for repair.
  • 24. BASICS 5 This book is directed at all stages of testing a product during its life and at ways in which products can be designed to make test tasks easier. 1.2.2. Test activities There are three stages of activity involved in the testing of a product. (1) Test Development. Firstly, a test for the product must be developed, and demonstrated to be sufficiently good at detecting and locating faults. We will look at one typical method for achieving this in Section 1.3. (2) Test Application. Secondly, once the test has been developed, it will be applied to units as they leave the production line, or as they arrive for repair, using the available ATE. After this stage units will have been marked faulty or fault-free. Types of ATE, and other aspects of test application, are considered in Section 1.4. (3) Diagnosis. Finally, if a unit is found faulty, the ATE will be used to produce a diagnosis of the cause of failure, for example a failed component. In this way, a repair can be effected, the success of which will be determined by re-testing the unit. Ways in which automated diagnosis is accomplished are discussed in Section 1.5. 1.2.3. What is testability? Since cost is an important factor in any commercial environment, it should not be surprising that the overall cost of performing testing activities discussed in Section 1.2.2 is one measure of the product's testability. The higher the cost of each activity, the lower the product's testability. Cost is, however, not the only factor which determines testability, and for the purpose of this discussion two other factors will be considered. Firstly, the time taken to perform the various test tasks is important, and cannot always be measured through the costs of labour, etc. In some cases, for example when deadlines have to be met, time may actually be more important than cost. In these cases, the most significant impact of reduced testability may be lengthened test development timescales. Figure 1.1 (Reinerstein, 1983) shows the importance of time-to-market in high- growth markets where product life cycles are relatively short. It can be seen that a loss of up to 33% of profits may occur if a product is six months late on to the market. Secondly, there is the adverse effect that reduced testability can have on the quality of the product. Ideally, a test program should be able to detect lOOfo of the faults that might occur in the product; if this were the case, then the quality of the product could be guaranteed. Inevitably, the test will be less than perfect (as will be discussed later) and so some faults will escape
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  • 26. Wyatt Eaton as a Student
  • 27. Photo by Kurtz, N. Y. To the woman who loves becoming toilets and the vivacity and movement of life in literary and social centres, and who, moreover, possesses the useful hands and right instincts both in artistic and domestic relationships, the long sojourns in desolate places, the doing with makeshifts and the like that these entail, are a real deprivation, and a persistent irritation that calls for the counteraction of an exceptional degree of poise and self-mastery. Nothing, in short, emphasizes this sense of her isolation, to my mind, so strongly as Stevenson himself in describing her quarters on board the schooner Equator, as a "beetle-haunted most unwomanly bower," and this simultaneously with the reminder that it will be long before her eyes behold again the familiar scenes of rural beauty dear to her memory. The pen sketch of Stevenson forming the frontispiece was drawn by Mr. Eaton in a few minutes from memory. I regret to say that it is reproduced from a reproduction, the original (owned by Mr. S. S. McClure) could not be found, when wanted, Mr. McClure being in France at the time, but we were glad to obtain one of these copies, now becoming rare. I have never seen a portrait of Stevenson that equalled his appearance that day. The bas-relief by Saint Gaudens approximates it somewhat in ethereal thinness, but the verve, the glow, the vital spark, are lacking even in that. It has always been a satisfaction to me that our meeting was on an occasion when his illness was least apparent. My memory of his face has nothing of that pain-worn expression so often seen in photographs. The afternoon of the day we received his message, I caught a glimpse of him at a distance from my window. He was coming up from the Inlet, where, no doubt, he had gone to take a plunge. There was a briskness about his movements that seemed like the unconscious enjoyment of sound health, and in appearance he
  • 28. certainly was as romantic a figure as any of his own characters. Whenever I read "In the Highlands," I see him as he appeared at that moment, treading through a maze of bright sabatia and sweet clover, the mental picture, as it were, becoming a part of that beautiful and touching poem: In the highlands, in the country places, Where the old plain men have rosy faces, And the young fair maidens quiet eyes; Where essential silence cheers and blesses, And for ever in the hill-recesses Her more lovely music broods and dies. O to mount again where erst I haunted; Where the old red hills are bird-enchanted, And the low green meadows bright with sward; And when even dies, the million-tinted, And the night has come, and planets glinted, Lo! the valley hollow, lamp-bestarred. O to dream, O to awake and wander There, and with delight to take and render, Through the trance of silence, quiet breath; Lo! for there, among the flowers and grasses, Only the mightier movement sounds and passes; Only winds and rivers, life and death. I felt the poetry of the day more poignantly as the hour for parting approached, and when the sun began to wane, I went out on the lawn to see the place under the spell of the lengthened shadows and the mellow sun-rays that turn the tree-trunks to burnished gold. This has always been my favorite hour, this charmed hour before sunset, when we can almost feel the earth's movement under our feet—an hour that transcends in poetry anything that can be imagined by the finite mind.
  • 29. I walked up and down under the cedars bordering the river, to quiet my emotion. It was there, too, under the cedars, that a remark of Mr. Eaton's, in describing to me his first meeting with Stevenson, flashed across my memory: "He combined the face of a boy with the distinguished bearing of a man of the world." And I thought, as I saw him then, merrily recalling the scenes and escapades of student life, "How well the distinguished man of the world had succeeded in keeping the heart of a boy!" A passage in Mr. Low's book, "A Chronicle of Friendships," that recalls that day most vividly, is this: "Stevenson never once excused himself from our company on the plea of having work to do." For so it was with us; he seemed to have no cares or preoccupations, but to be content to be there, enjoying the conversation and the pleasantness of the passing hour. I had a cosy quarter of an hour with his mother after my walk, and off by ourselves, in a corner, away from interruption, she spoke of her son's childhood. In her eyes, he was still the "bonnie wee laddie" who scouted about in his make-believe worlds among the chairs and tables in the drawing-room while she entertained her friends, and we repeated bits from "A Child's Garden of Verses." I think that if there is any clue to the character of a great man we must look to his mother. Mrs. Stevenson embodied the idea of her son's peculiar charm; there was the same triumphal youthfulness, and her cheeks were round and rosy like a ripe apple. I think of the mother now, after so many years, as the crowning influence of the day, quiet and reticent, but always felt, and honored by all as became the mother of our welcome guest. In her letters, written in the Marquesas to her sister in Scotland, she carries out this impression of habitual freshness of spirit, and her humor is subtle and optimistic: "Nothing gives me more pleasure or a better appetite than an obstacle overcome." She shows herself the life of "The Silver Ship," as the people of Fakarava dubbed the Casco, and never a word of criticism or complaint is penned at any
  • 30. inconvenience or annoyance endured by the way. Indeed, one marvels at her tranquillity in the midst of so many complications— just as one wondered at the simplicity of Queen Victoria in her diary. One of the chief delights in the perusal of these letters is the questions they project into the mind of the reader. Is it a style, a native virtue, a mannerism, a fad, or what? For example, she never suspects that the French man-o'-war in one of the bays may account for some of the good behavior of the natives, or that their bounty in cocoanuts and bread-fruit may be tendered with an eye to the novelties to be had in exchange, but accepts all in good faith, as part of their native generosity. And what a joy it is to see her taking holy communion with these people, so lately reclaimed from cannabalism, and taking the ceremony "au grand serieux"! Thus, a missionary within, a warship without, the amenities of religion and society are enjoyed to the full. One lays down these letters and laughs, many a time, where no laughter was intended. Certainly, she was a good mixer as well as the born mother of a genius. Stevenson's death is an anomaly no less pathetic than his life, for in eluding extinction by consumption, he probably achieved a still earlier end by apoplexy. I had the account from Mrs. Low, who received it directly from "Fanny" by letter. Mrs. Stevenson was mixing a salad of native ingredients of which Stevenson was very fond, when he joined her in the kitchen, complaining that he was not very well, and sitting down, laid his head on her shoulder, where in about twenty minutes he expired. I said at the beginning that I was not disappointed in the personality of Stevenson, but it would be nearer the mark to say that my anticipations fell far short of the reality. It is often the case in meeting literary celebrities that one has the feeling that they are first authors, and after that men. Rodin, the French sculptor, focuses this idea by saying that "many are artists at the expense of some qualities of manhood." With Stevenson one
  • 31. was clearly in the presence of a man, and after that the scholar and the gentleman. Was it not this fine distinction that, in spite of woolen shirt and a third-class transportation, awoke the suspicions of his companions of the steerage, that prompted the already quoted remark, "You are not one of us?" And on that memorable journey across the plains, seeking the woman of his choice, resolved, though penniless and unknown, to make her his wife in spite of every obstacle, the truth that the frailty of the body is no criterion for the strength of the spirit is well brought out. It was, in fact, this quality of initiative that constituted his chief charm—the quality that, above all others, made us so spontaneous in his presence and so proud of his achievement. We knew that we were seeing him at his best, surrounded by his old friends, and with the light of the memory of his youthful ambitions on his face. We knew, too, that the parting would be a life-long one, and that we would never look upon his like again. This regret each knew to be uppermost in the mind of the others, but when the good-byes began, we made no sign that it was to be more than the absence of a day. Nevertheless, the tensity of the last moments of parting was keenly felt. Stevenson had planned to spend his last night at Wainwright's, and Lloyd Osbourne was to row him across the river. Mr. Eaton and I went down to the river-bank to see them off and to wave our last adieux. The rumble of carriage-wheels in the distance, and the reverberations of footsteps and voices on the old wooden bridge grew fainter and died away, before the little boat was pushed off; and then, these two friends, Robert Louis Stevenson and Wyatt Eaton, both at the zenith of their life and powers, and both hovering so closely on the brink of eternity, sent their last messages to each other, across the distance, until the little boat had glided away, on the ebb-tide, a mere speck in the gray transparency of the twilight.
  • 33. FATE OF THE CASCO There are ships that, like certain people, seem created for an unusual and distinguishing destiny, and are unable long to survive the destruction of those peculiar conditions that have given them their dominating qualities, animation and color. Mr. Francis Dickie of Vancouver, B. C., has described with a vivid pen the later adventures and slow foundering of the Casco. This gentleman has kindly given me permission to reprint it here. Our sympathy goes out to the beautiful yacht in her lonely buffetings and chill decay, but though stricken and vanished, we know that she will live long in romance and in song as "The Silver Ship." FATE OF THE CASCO by Francis Dickie Forty miles from Nome, Alaska, breaking under the Arctic winter on the shores of bleak King Island, lies the skeleton of a wrecked top- mast schooner. Early in June, 1919, a small crew of adventurous spirits had turned her nose out through the Behring Sea, headed for the Lena River and Anadyn—and gold. She was small and old, this yacht, but what are thirty-three years when a craft has the proper tradition for daring, hazardous adventure? September storms swept upon the Casco, pounding her teak sides with unfamiliar Northern blasts. Fog, cold, night—and she lay shuddering on the rocks, snow-beaten, ice-broken, abandoned by her crew.
  • 34. So ships pass and become smooth driftwood on scattered beaches. But sometimes the magic of long adventure will gather around an abandoned hull, and form a rich memory to tempt the eternal wanderlust of man. What is an old ship but a floating castle built upon the memories of the men who have helmed her? Sometimes she plies the same dull course throughout her existence. Sometimes she changes trade with surprising chances. So it was with the Casco —now a glittering pleasure yacht, whim of an old millionaire, now stripped of gaudy trappings and bent to the grim will of seal hunter and opium trader. In the opening of Robert Louis Stevenson's novel, "The Wrecker," with red ensign waving, sailing into the port of Tai-o-hae in the Marquesas, the Casco takes her place in fiction. But she is far more romantic as she has sailed in fact. "Winged by her own impetus and the dying breeze, the Casco skimmed under cliffs, opened out a cove, showed us a beach and some green trees, and flitted by again, bowing to the swell ... from close aboard arose the bleating of young lambs; a bird sang on the hillside; the scent of the land and of a hundred fruits or flowers flowed forth to meet us; and presently"— Presently they sailed among the Isles of Varien, sunny and welcoming in the South Seas. Stevenson wrote this in the cabin of the Casco, in the summer of '88. His always delicate health had broken completely under the San Francisco climate. Friends had urged a cruise to the South Seas, he had gladly acquiesced, and looked around for a ship. There was a subtle romantic call for the author of "Treasure Island" in a voyage on a ship of his own choosing and direction under the soft skies of the tropics. The Casco had been built by an eccentric California millionaire, Dr. Merritt, for cruising along the coast, and no money had been spared in her fittings. She was a seventy-ton fore-and-aft schooner, ninety- five feet long, with graceful lines, high masts, white sails and decks,
  • 35. shiny brasswork, and a gaudy silk-hung saloon. She was not perhaps too staunch a cruiser. "Her cockpit was none too safe, her one pump was inadequate in size and almost worthless; the sail plan forward was meant for racing and not for cruising; and even if the masts were still in good condition, they were quite unfitted for hurricane weather." Nevertheless, negotiations were opened with Dr. Merritt. That gentleman had read of Stevenson. He had conceived him as an erratic, irresponsible soul who wrote poetry and let everything else go to the devil. He'd be blamed, he said, if he'd let any scatter- brained writer use his precious yacht. Finally, a meeting between the two was effected; and, speedily charmed by Stevenson's manner, he decided to let him have the Casco. Therefore, with Capt. Otis as skipper, four deck hands, "three Swedes and the inevitable Finn," and a Chinese cook, the Stevensons sailed June 28, 1888, for the Marquesas. Stevenson's health rapidly improved in the first weeks of the voyage. He was charmed by the Southern islands and began making notes and gathering data from the natives for later books. He wrote parts of "The Master of Ballantrae" and of "The Wrong Box," and spent much of his time studying the intricate personality of his skipper, whose portrait afterward appeared in the pages of "The Wrecker." After months of idle cruising, it was discovered that the Casco's masts were dangerously rotten. Repairs were immediately necessary. Meantime Stevenson became less and less well. When the ship was again in commission and took them to Hawaii, he realized the impossibility of his returning to America, and, sending the Casco back to San Francisco, started upon the exile that was to terminate in his death. Thereafter, the Casco changed hands frequently, exploring the mysteries of seal-hunting, opium-smuggling, coast-trading and gold- adventure, among other things. In the early nineties, she was known, because of her swiftness, quickness and ease of handling at the wheel, to be the best of a hundred and twenty ships engaged in
  • 36. the extinction of the pelagic seal. But when, in 1898, the sealers found themselves impoverished by their own ruthlessness, the Casco, her decks disfigured with blood and her hold rotten from the drip of countless salty pelts, was discarded and left to rot on the mud flats of Victoria. Too much of the spirit of adventure, however, lurked in the tall masts of the Casco to let her waste away to such an ugly ending. When the smuggling of Chinese and opium was at its height, up and down the coast there were whisperings of the daring work of the smuggler Casco. The revenue officers knew positively that she was laden with illicit Oriental cargo, and with Chinese immigrants; but she escaped them again and again, her old speed and lightness returning. Once, however, the wind failed her, and the revenue launch hauled alongside. Search for contraband was instituted; but not a Chinaman appeared, not a trace of opium. Fooled!—and they climbed down sheepishly into their launch. Later it developed that while the revenue men were still far astern, the crew had weighted the sixty Chinamen and dumped them overboard along with the opium!
  • 38. The Casco, Just Before It was Wrecked on King Island Kind permission of Mr. L. W. Pedrose From the swift romance of opium running the Casco turned drudge. She carried junk between Victoria and Vancouver; she was a training ship for the Boy Sea Scouts of Vancouver; she was a coasting trader in 1917 when the shipping boom gave value to even her little hulk; and in between times she lay on mud flats. In the spring of 1919 came the stories of gold in Northern Siberia. With high hopes of fortunes to be made, the Northern Mining and Trading Company sprang into existence, and the Casco was chartered to dare the far Northern seas and icy gaps. So she died at sea, as all good ships should, with the storm at her back and the mists over her, with snow as a shroud, and brooding icebergs to mourn. She lies cold and stately, with her memories of tropical splendor, high adventure, and light romance—this little ship whose cabin knew Stevenson.
  • 39. PORTRAITS FROM STEVENSON by George Steele Seymour TREASURE ISLAND Jim Hawkins, Jim Hawkins, the treasure ship's a-sailing, The lure of life is calling us beyond the shining sea, The distant land of mystery her beauty is unveiling, And shall we then be lagging when there's work for you and me? The pirate ship is on the main, Jim Hawkins, Jim Hawkins, She flies the Jolly Roger and there's battle in her prow, Then shall we play the craven-heart and lurk ashore, Jim Hawkins, When fortune with a lavish turn is waiting for us now? Jim Hawkins, Jim Hawkins, the pirate crew has landed, With guns and knives between their teeth they're stealing on the prey, Then let's afoot and follow them and catch them bloody-handed— When life and joy are calling us, shall we bide long away? Jim Hawkins, Jim Hawkins! ALAN BRECK
  • 40. Is't you, Alan? You of the ready sword And nimble feet, and keen, courageous eye, Quick to affront, and yet more quick to spy Aught that might touch your own dear absent lord! Hero and clown! How it sets every chord Athrill to see your feathered hat draw nigh, And all your brave, fantastic finery! Romance no stranger picture doth afford. For I have met you in the House of Fear, Have watched you cross the torrent of Glencoe And climbed with you the rugged mountain-side. We are old comrades, and I hold most dear This loyal friend and yet more loyal foe Who bore a kingly name with kingly pride. ELLIS DUCKWORTH
  • 41. Was there a rustle of the leafy bed? Heard you no footstep in the matted grass? Down the deep glade where fearsome shadows pass What is it lurks so still? What secret dread Troubles the tangled branches overhead? An ye be foe to this good man, alas! No art shall save you though ye walk in brass. Swift to your heart shall the Black Death be sped. The woods are still—for that was years ago— And now no baleful presence haunts the glade, No train-band rules the highway as of yore. Romance is dead. Adventure, too, lies low. Long in the grave is Duckworth's kingdom laid, And the black arrow speeds its way no more. SAINT IVES
  • 42. Viscomte, your health. Confusion to the foe. The noble lord your uncle—bless his name! And may your wicked captors die in shame. I kiss your hand; I kiss your forehead—so! The castle cliff is steep, but down below Both fortune and the lady Flora wait. Oh, you will meet them, I anticipate, Your hand upon your heart, and bowing low. The stage-coach lumbers heavily tonight. Its wheels sound loudly on the stony flag. What's that! A chest of florins in the drag Gone! And the rascally postboy taken flight! Ah, well, God send him a dark night, and we ... Your health, Saint Ives, in sparkling Burgundy. PRINCE FLORIZEL
  • 43. Try these perfectos, gentlemen. The flavour I recommend. A smoke-royal. With white wines You'll find them fragrantest. That spicy savour Comes only in stock from the Isle of Pines. Here are cigarettes, Turkish and Egyptian, Such as no other merchant has to sell, And Trichinopoly of the same description I smoked when I was called Prince Florizel. That was before I stooped to trade plebeian, Left my exalted home and wandered far, Emptied my plate at danger's feast Protean, Beside the well of wisdom broke my jar. Till Louis looked from out the empyrean And in the dust of Mayfair found a star. THE EBB TIDE Green palm-tops bending low by silent seas Like heads in prayer— Life's turmoil nor its multiplicities Are there. But only calms and potencies hold sway That will not be denied, Come with the surge of dawn and drift away With the ebb tide.
  • 44. FOOTNOTES: [A] Lescaris was a Greek shepherd who discovered the secret of transmuting the baser metals to fine gold. [B] Paua—Native name for the Tridacna Gigus, a huge clam. When it closes on any one, his only escape is by losing the limb. TRANSCRIBER'S NOTE: Inconsistencies in spelling, punctuation, and hyphenation have been standardized.
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