1. The document discusses Fourier transforms and their application in X-ray crystallography. It introduces Fourier series and how they can be used to decompose periodic functions.
2. Structure factors are described as the Fourier transform of the electron density in a unit cell. The structure factors yield the intensity of X-ray reflections but not the phase.
3. Methods for determining the phase such as isomorphous replacement and anomalous dispersion are discussed. The Wilson plot for placing intensity measurements on an absolute scale is also summarized.