This document discusses using a C chart to analyze count data for defects. It provides instructions on how to develop a C chart, including collecting count data, graphing the data, calculating the average number of defects, determining the upper and lower control limits, and analyzing the chart to identify non-random patterns indicating a potential issue with the process. An example using data from a shoe manufacturer is provided to demonstrate the steps. An exercise using data from a bolt manufacturer is also included to allow practicing the technique.