The document provides an overview of Structural Equation Modeling (SEM) and its applications, highlighting the differences between first-generation statistical techniques and second-generation SEM methods, including Partial Least Squares (PLS) and Covariance-Based SEM (CB-SEM). It emphasizes the importance of understanding measurement errors, reflective versus formative constructs, and the necessity of evaluating construct reliability and validity in research. Furthermore, it discusses the growing popularity of PLS-SEM in complex models and small sample sizes, along with the relevant statistical methods for measurement and assessment.