Low power test pattern generation for bist applications

IJRET: International Journal of Research in Engineering and Technology eISSN: 2319-1163 | pISSN: 2321-7308
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Volume: 03 Issue: 03 | Mar-2014, Available @ http://www.ijret.org 698
LOW POWER TEST PATTERN GENERATION FOR BIST
APPLICATIONS
Karthikkumar.B1
, Anusha.T2
, Dhanagopal.R3
1
ME (Applied Electronics), ECE, Jayaram College of Engineering and Technology, Trichy, India
2
ME (Applied Electronics), ECE, Jayaram College of Engineering and Technology, Trichy, India
3
Assistant Professor, ECE, Jayaram College of Engineering and Technology, Trichy, India
Abstract
This paper proposes a novel test pattern generator (TPG) for built-in self-test. Our method generates multiple single input change
(MSIC) vectors in a pattern, i.e., each vector applied to a scan chain is an SIC vector. A reconfigurable Johnson counter and a
scalable SIC counter are developed to generate a class of minimum transition sequences. The proposed TPG is flexible to both the
test-per-clock and the test-per-scan schemes. A theory is also developed to represent and analyze the sequences and to extract a class
of MSIC sequences. Analysis results show that the produced MSIC sequences have the favorable features of uniform distribution and
low input transition density. Simulation results with ISCAS benchmarks demonstrate that MSIC can save test power and impose no
more than 7.5% overhead for a scan design. It also achieves the target fault coverage without increasing the test length.
Keywords—Built-in self-test (BIST), low power, single-input change (SIC), test pattern generator (TPG)
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1. INTRODUCTION
BUILT-IN SELF-TEST (BIST) techniques can effectively
reduce the difficulty and complexity of VLSI testing, by
Introducing on-chip test hardware into the circuit-under-test
(CUT). In conventional BIST architectures, the linear feedback
Shift register (LFSR) is commonly used in the test pattern
Generators (tpgs) and output response analyzers. A major
Drawback of these architectures is that the pseudorandom
Patterns generated by the LFSR lead to significantly high
switching activities in the CUT [1], which can cause excessive
Power dissipation. They can also damage the circuit and reduce
Product yield and lifetime [2], [3]. In addition, the LFSR
Usually needs to generate very long pseudorandom sequences
In order to achieve the target fault coverage in nanometer
technology.
1.1 Prior Work
Several advanced BIST techniques have been studied and
applied. The first class is the LFSR tuning. Girard et al.
analyzed the impact of an LFSR‟s polynomial and seed
selection on the CUT‟s switching activity, and proposed a
method to select the LFSR seed for energy reduction [4].
The second class is low-power TPGs. One approach is to design
low-transition TPGs. Wang and Gupta used two LFSRs of
different speeds to control those inputs that have elevated
transition densities [5]. Corno et al. provided a low power TPG
based on the cellular automata to reduce the test power in
combinational circuits [6]. Another approach focuses on
modifying LFSRs. The scheme in [7] reduces the power in the
CUT in general and clock tree in particular. In [8], a low power
BIST for data path architecture is proposed, which is circuit
dependent. However, this dependency implies that no detecting
subsequences must be determined for each circuit test sequence.
Bonhomme et al. [9] used a clock gating technique where two
no overlapping clocks control the odd and even scan cells of the
scan chain so that the shift power dissipation is reduced by a
factor of two. The ring generator [10] can generate a single-
input change (SIC) sequence which can effectively reduce test
power. The third approach aims to reduce the dynamic power
dissipation during scan shift through gating of the outputs of a
portion of the scan cells. Bhunia et al. [11] inserted blocking
logic into the stimulus path of the scan flip-flops to prevent the
propagation of the scan ripple effect to logic gates. The need for
transistors insertion, however, makes it difficult to use with
standard cell libraries that do not have power-gated cells. In
[12], the efficient selection of the most suitable subset of scan
cells for gating along with their gating values is studied.
The third class makes use of the prevention of pseudorandom
patterns that do not have new fault detecting abilities [13]–[15].
These architectures apply the minimum number of test vectors
required to attain the target fault coverage and therefore reduce
the power. However, these methods have high area overhead,
need to be customized for the CUT, and start with a specific
seed. Gerstendorfer et al. also proposed to filter out no detecting
patterns using gate-based blocking logics [16], which, however,
add significant delay in the signal propagation path from the
scan flip-flop to logic.

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Several low-power approaches have also been proposed for
Scan-based BIST. The architecture in [17] modifies scan-path
Structures, and lets the CUT inputs remain unchanged during a
shift operation. Using multiple scan chains with many scan
enable (SE) inputs to activate one scan chain at a time, the TPG
proposed in [18] can reduce average power consumption during
scan-based tests and the peak power in the CUT. In [19], a
pseudorandom BIST scheme was proposed to reduce switching
activities in scan chains. Other approaches include LT-LFSR
[20], a low-transition random TPG [21], and the weighted
LFSR [22]. The TPG in [20] can reduce the transitions in the
scan inputs by assigning the same value to most neighboring
bits in the scan chain. In [21], power reduction is achieved by
increasing the correlation between consecutive test patterns.
The weighted LFSR in [22] decreases energy consumption and
increases fault coverage by adding weights to tune the
pseudorandom vectors for various probabilities.
2. PROPOSED MSIC-TPG SCHEME
Fig 1 Symbolic Representation of an MSIC Pattern
This section develops a TPG scheme that can convert an SIC
vector to unique low transition vectors for multiple scan chains.
First, the SIC vector is decompressed to its multiple
codeword‟s. Meanwhile, the generated codeword‟s will bit-
XOR with a same seed vector in turn. Hence, a test pattern with
similar test vectors will be applied to all scan chains. The
Proposed MSIC-TPG consists of an SIC generator, a seed
generator, an XOR gate network, and a clock and control block.
2.1 Test Pattern Generation Method
Assume there are m primary inputs (PIs) and M scan chains in a
full scan design, and each scan chain has l scan cells. Fig. 1(a)
shows the symbolic simulation for one generated pattern. The
vector generated by an m-bit LFSR with the primitive
polynomial can be expressed as S(t) = S0(t)S1(t)S2(t), . . . ,
Sm−1(t) (hereinafter referred to as the seed), and the vector
generated by an l-bit Johnson counter can be expressed as J (t)
= J0(t)J1(t)J2(t), . . . , Jl−1(t). In the first clock cycle, J = J0 J1
J2, . . . , Jl−1 will bit-XOR with S = S0S1S2, . . . , SM−1, and
the results X1Xl+1X2l+1, . . . , X(M−1)l+1 will be shifted into
M scan chains, respectively. In the second clock cycle, J = J0 J1
J2, . . . , Jl−1 will be circularly shifted as J = Jl−1 J0 J1, . . . ,
Jl−2, which will also bit-XOR with the seed S = S0S1S2, . . . ,
SM−1. The resulting X2Xl+2X2l+2, . . . , X(M−1)l+2 will be
shifted into M scan chains, respectively. After l clocks, each
scan chain will be fully loaded with a unique Johnson
codeword, and seed S0S1S2, . . . , Sm−1 will be applied to m
PIs. Since the circular Johnson counter can generate l unique
Johnson code words through circular shifting a Johnson vector,
the circular Johnson counter and XOR gates in Fig. 1 actually
constitute a linear sequential decompressor
2.2 Reconfigurable Johnson Counter
According to the different scenarios of scan length, this paper
develops two kinds of SIC generators to generate Johnson
vectors and Johnson code words, i.e., the reconfigurable
Johnson counter and the scalable SIC counter.
For a short scan length, we develop a reconfigurable Johnson
counter to generate an SIC sequence in time domain.
As shown in Fig. 2(a), it can operate in three modes.
1) Initialization: When RJ_Mode is set to 1 and Init is set to
logic 0, the reconfigurable Johnson counter will be initialized to
all zero states by clocking CLK2 more than l times.
2) Circular shift register mode: When RJ_Mode and Init are set
to logic 1, each stage of the Johnson counter will output a
Johnson codeword by clocking CLK2 l times.
3) Normal mode: When RJ_Mode is set to logic 0, the
reconfigurable Johnson counter will generate 2l unique SIC
vectors by clocking CLK2 2l times.
Fig.2 Reconfigurable Johnson Counter

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2.3 Scalable SIC Counter
When the maximal scan chain length l is much larger than the
scan chain number M, we develop an SIC counter named the
“scalable SIC counter.” As shown in Fig. 2(b), it contains a k-
bit adder clocked by the rising SE signal, a k-bit subtractor
clocked by test clock CLK2, an M-bit shift register clocked by
test clock CLK2, and k multiplexers. The value of k is the
integer of log2(l − M). The waveforms of the scalable SIC
counter are shown in Fig. 2(c). The k-bit adder is clocked by the
falling SE signal, and generates a new count that is the number
of 1s (0s) to fill into the shift register. As shown in Fig. 2(b), it
can operate in three modes
Fig 3 Scalable SIC Counter
1) If SE = 0, the count from the adder is stored to the k-bit
subtractor. During SE = 1, the contents of the k-bit subtractor
will be decreased from the stored count to all zeros gradually.
2) If SE = 1 and the contents of the k-bit subtractor are not all
zeros, M-Johnson will be kept at logic 1 (0).
3) Otherwise, it will be kept at logic 0 (1). Thus, the needed 1s
(0s) will be shifted into the M-bit shift register by clocking
CLK2 l times, and unique Johnson codeword‟s will be applied
into different scan chains.
For example, after full-scan design, ISCAS‟89 s13207 has 10
scan chains whose maximum scan length is 64. To implement a
scalable SIC counter as shown in Fig. 2(b), it only needs 6 D-
type flip-flops (DFFs) for the adder, 6 DFFs for the subtractor,
10 DFFs for a 10-bit shift register for 10 scan chains, 6
multiplexers, and additional 19 combinational logic gates. The
equivalent gates are 204 in total. For a 64-bit Johnson counter,
it needs 64 DFFs, which are about 428 equivalent gates. The
overhead of a MSIC-TPG can thus be effectively decreased by
using the scalable SIC counter..
2.4 MSIC-TPGs for Test-per-Clock Schemes
The MSIC-TPG for test-per-clock schemes is illustrated in Fig.
3(a). The CUT‟s PIs X1 − Xmn are arranged as an n ×m
SRAM-like grid structure. Each grid has a two-input XOR gate
whose inputs are tapped from a seed output and an output of the
Johnson counter. The outputs of the XOR gates are applied to
the CUT‟s PIs. A seed generator is an m-stage Conventional
LFSR, and operates at low frequency CLK1. The test procedure
is as follows.
1) The seed generator generates a new seed by clocking CLK1
one time.
2) The Johnson counter generates a new vector by clocking
CLK2 one time.
3) Repeat 2 until 2l Johnson vectors are generated.
4) Repeat 1–3 until the expected fault coverage or test length is
achieved.
Fig 4 MSIC-TPGs test-per-clock
2.4 MSIC-TPGs for Test-per-Scan Schemes
The MSIC-TPG for test-per-scan schemes is illustrated in Fig.
3(b). The stage of the SIC generator is the same as the
maximum scan length, and the width of a seed generator is not
smaller than the scan chain number. The inputs of the XOR
gates come from the seed generator and the SIC counter, and
their outputs are applied to M scan chains, respectively. The
outputs of the seed generator and XOR gates are applied to the
CUT‟s PIs, respectively. The test procedure is as follows.
1) The seed circuit generates a new seed by clocking CLK1 one
time.
2) RJ_Mode is set to “0”. The reconfigurable Johnson counter
will operate in the Johnson counter mode and generate a
Johnson vector by clocking CLK2 one time.
3) After a new Johnson vector is generated, RJ_Mode and Init
are set to 1. The reconfigurable Johnson counter operates as a
circular shift register, and generates l codewords by clocking
CLK2 l times. Then, a capture operation is inserted.
4) Repeat 2–3 until 2l Johnson vectors are generated.
5) Repeat 1–4 until the expected fault coverage or test length is
achieved.

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Fig 5 MSIC-TPGs Test-Per-Scan schemes
3. PRINCIPLE OF MSIC SEQUENCES
The main objective of the proposed algorithm is to reduce the
switching activity. In order to reduce the hardware overhead,
the linear relations are selected with consecutive vectors or
within a pattern, which can generate a sequence with a
sequential decompressed, facilitating hardware implementation.
Another requirement is that the MSIC sequence should not
contain any repeated test patterns, because repeated patterns
could prolong the test time and reduce test efficiency [5].
Finally, uniformly distributed patterns are desired to reduce the
test length (number of patterns required to achieve a target fault
coverage) [21]. This section aims to extract a class of test
sequences that meets these requirements.
3.1 Example
Suppose there are four scan chains whose lengths are 8 in a full-
scan design. The 8-bit Johnson codeword‟s and 4-bit (or more
bits) seeds can be used to generate an MSIC sequence.
A MSIC sequence with seed 01101 is
For (25 − 1) unique seeds, there are 31 such blocks. Therefore,
there are 16 × 31 = 496 unique patterns in this MSIC sequence.
Also, the transition between patterns X(t) and X(t+1) is one for
every scan chain, and transitions for scan chain 2 to scan in
“1001111” are two per clock. Seed “01101” is kept unchanged
for patterns X(1) to X(16).
4. PERFORMANCE ANALYSIS
To analyze the performance of the proposed MSIC-TPG,
Experiments on ISCAS‟85 benchmarks and standard full-scan
Designs of ISCAS‟89 benchmarks are conducted. The
performance Simulations are carried out with the Synopsys
Design Analyzer and Prime Power. Fault simulations are
carried Out with Synopsys Tetramax. Syntheses are carried out
with Nangate library based on 45-nm typical technology. The
testFrequency is 100 mhz, and the power supply voltage is 1.1
V. The test application method is test-per-clock for ISCAS‟85
Benchmarks and test-per-scan for ISCAS‟89 benchmarks. The
Number of scan chains is 10 for s13207 and s15850, and 20 For
s38417, s35932 and s38584.
4.1 Fault Coverage Comparison
The fault coverage‟s for ISCAS benchmarks with the MSIC-
TPG, the conventional LFSR, and the methods in [7] and [21].
In this table, the columns labeled SFC, TFC, and TL refer to the
stuck-at fault coverage, transition fault coverage, and test
length, respectively. The TFC values of this table correspond to
launch-on-shift test patterns. In order to achieve fair
comparisons, for ISCAS‟89 benchmarks, our TLs are chosen to
be the same as those in [7]. For the first three ISCAS‟85
benchmarks, our TLs are chosen according to [21]. The last two
ISCAS‟85 benchmarks are selected to have similar fault
coverage‟s as [7].
Compared with the conventional LFSR, the MSIC-TPG
achieves similar stuck-at fault coverage for ISCAS‟85
benchmarks and higher stuck-at fault coverage for ISCAS‟89
benchmarks except for s38417. It also achieves higher
transition fault coverage for both ISCAS‟85 and ISCAS‟89
benchmarks except for s35392. Compared to the LT-LFSR
method in [21], it can be seen from the ISCAS‟85 benchmarks
that, with the same TL, the MSIC-TPG achieves similar test
efficiency.
Compared to the TPG in [7], the results with ISCAS‟89
benchmarks show that, with the same TL, the MSIC-TPG has
higher efficiency, except for s38417. Note that, for ISCAS‟89
benchmarks, the results of our method and those of [21] in the
table should not be compared directly because of the different
TLs.
4.2 Average and Peak Power Reduction
The total and peak power reductions of CUTs with the MSIC-
TPG and with the LFSR-TPG, where columns labeled “Ptot”
and “Ppeak” refer to the CUT‟s total power and peak power
with the MSIC-TPG, respectively. Columns labeled “_Ptot” and
“_Ppeak” refer to the percentages of different methods‟ total
power reduction and peak power reduction with respect to the
LFSR method, respectively. The results of [25] are also
included for comparison. For ISCAS‟85 benchmarks, the
MSIC-TPG saves 25%–50.0% total power and 15.6%–32.6%
peak power against the conventional LFSR. All total power
reductions and peak power reductions are higher than those
with variable-length ring counter in [25].
For ISCAS‟89 benchmarks, the MSIC-TPG can save 21.38%–
34.52% total power and 3%–32.4% peak power against the
conventional LFSR. The total power reductions and peak power

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reductions are not higher than those with the variable-length
ring counter in [25]. One reason for this is that the power
simulation results for the MSIC-TPG are with 45-nm
technology, whereas results in [25] are with 0.25-μm
technology. Experimental results show that leak power
contributes about 10% to total power with 45-nm technology,
but contributes little to total power with 0.18- or 0.25-μm
technology.
5. RESULTS
In this paper BIST will be used for generate the TEST
PATTERN GENERATION. To evaluate the proposed model,
the LFSR is used to measure power and area in this model we
are used Johnson counter, scalable SIC counter.
5.1 Simulation Procedure
5.1.1 Simulate Seed Generator
Step 1: Open the ModelSim SE 6.3f software and use the
browse button in the project location box to specify the location
of the directory that you created for the project. ModelSim uses
a working library to contain the information on the design in
progress; in the Default Library Name field we used the name
work. Click OK.
Step 2: Go to the Library window, select the pattern and right
click the pattern to simulate the program.
Step 3: Again go to the Library window, select the pattern and
right click that to add the wave. If enable the clock 2 we will
get test pattern output.
Step 4: Generate the seed generator value, enable the seed
generator value 01101 and then get output of seed generator. It
will be change until 8 bit and single input changes.
Fig 6 Output for pattern method
5.1.2 Find Fault Occurrence
Step 1: Go to the Library, select the Test Main. right click the
test main, to write the program and simulate.
Step 2: Opened simulated window add to wave. if fault value is
„0‟means fault is not enabled. If fault value „1‟ means fault
enabled and will be get different output
Fig 7 Output for testing method
5.1.3 Simulate Power and Area
Step 1: open the Xilinx ISE 13.2 software.
Step 2: open the new file, to write the program for power and
area and simulate
Design summary
Step 3: Finally get the output of total equivalent gate count
design is 7.216

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Fig 8 Output of power and area
6. CONCLUSIONS
This paper has proposed a low-power test pattern generation
method that could be easily implemented by hardware. It also
developed a theory to express a sequence generated by linear
Sequential architectures, and extracted a class of SIC sequences
named MSIC. Analysis results showed that an MSIC sequence
had the favorable features of uniform distribution, low input
Transition density, and low dependency relationship between
the test length and the TPG‟s initial states. Combined with the
proposed reconfigurable Johnson counter or scalable SIC
counter, the MSIC-TPG can be easily implemented, and is
flexible to test-per-clock schemes and test-per-scan schemes.
For a test-per-clock scheme, the MSIC-TPG applies SIC
sequences to the cut with the SRAM like grid. For a test-per
scan scheme, the MSIC-TPG converts and sic vector to low
Transition vectors for all scan chains. Experimental results and
analysis results demonstrate that the MSIC-TPG is scalable to
scan length, and has negligible impact on the test overhead.
REFERENCES
[1]. Feng Liang, Luwen Zhang, Shaochong Lei, Guohe Zhang,
Kaile Gao, and Bin Liang” Test Patterns of Multiple SIC
Vectors: Theory and Application in BIST Schemes” IEEE
transactions on very large scale integration (vlsi) systems, vol.
21, no. 4, april 2013
[2]. A. Abu-Issa and S. Quigley, “Bit-swapping LFSR and
scan-chain ordering: A novel technique for peak- and average-
power reduction in scan-based BIST,” IEEE Trans. Comput.-
Aided Design Integr. Circuits Syst., vol. 28, no. 5, pp. 755–759,
May 2009.
[3]. Y. Bonhomme, P. Girard, L. Guiller, C. Landrault, and S.
Pravossoudovitch, “A gated clock scheme for low power scan
testing of logic ICs or embedded cores,” in Proc. 10th Asian
Test Symp., Nov. 2001, pp. 253–258.

Low power test pattern generation for bist applications

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