Manufacturability & reliability challenges with qfn

Manufacturability &
Reliability
Challenges with QFN
Cheryl Tulkoff
©2011 ASQ & Presentation Cheryl Tulkoff
Presented live on Mar 10th, 2011

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Manufacturing and Reliability
Challenges With QFN (Quad Flat
No Leads)

Cheryl Tulkoff ASQ Reliability Society Webinar March 10, 2011

1

Instructor Biography
o Cheryl Tulkoff has over 17 years of experience in electronics manufacturing
with an emphasis on failure analysis and reliability. She has worked throughout
the electronics manufacturing life cycle beginning with semiconductor fabrication
processes, into printed circuit board fabrication and assembly, through
functional and reliability testing, and culminating in the analysis and evaluation
of field returns. She has also managed no clean and RoHS-compliant conversion
programs and has developed and managed comprehensive reliability
programs.

o Cheryl earned her Bachelor of Mechanical Engineering degree from Georgia
Tech. She is a published author, experienced public speaker and trainer and a
Senior member of both ASQ and IEEE. She holds leadership positions in the IEEE
Central Texas Chapter, IEEE WIE (Women In Engineering), and IEEE ASTR
(Accelerated Stress Testing and Reliability) sections. She chaired the annual IEEE
ASTR workshop for four years and is also an ASQ Certified Reliability
Engineer.

o She has a strong passion for pre-college STEM (Science, Technology,
Engineering, and Math) outreach and volunteers with several organizations that
specialize in encouraging pre-college students to pursue careers in these fields.

2

DfR Solutions works with companies and individuals throughout the life cycle
of a product, lending a guiding hand on quality, reliability and durability
(QRD) issues that allows your staff to focus on creativity and ideas.

Our expertise in the emerging science of Electrical and Electronics Reliability
Physics provides crucial insights and solutions early in product design,
development and test throughout manufacturing, and even into the field.

3

Who is DfR Solutions?

o We use Physics-of-Failure
(PoF) and Best Practices
expertise to provide knowledge-
based strategic quality and
reliability solutions to the
electronics industry
o Technology Insertion
o Design
o Manufacturing and Supplier Selection
o Product Validation and Accelerated Testing
o Root-Cause Failure Analysis & Forensics Engineering

o Unique combination of expert consultants and state-of-the-art laboratory
facilities

4

DfR Clients
Military / Avionics / Space Server / Telecom Industrial / Power
o Rockwell Collins o Lucent Technologies  Schlumberger
o DRS o Sun Microsystems  Copeland
o Honeywell o Cisco Systems  Tennant
o Applied Data Systems o Artesyn Communications  Rosemount
o Mercury Computers o Corvis Communications  Branson
o Digital Receiver Technology o Huawei (China)  Computer Process Controls
o Hamilton Sundstrand o Airgo Networks  ASCO Power
o Kato Engineering o Verigy  ASCO Valve
o Thales Communications o Antares ATT  Astec
o L-3 Communications o Enterasys  Liebert
o Innovative Concepts o True Position  Avansys
o Sandia National Labs o HiFN  Tyco Electronics
o Crane (Eldec) o Cedar Point  Rainbird
o ViaSat o Optics1  MicroMotion
o Eaton o Tropos Networks  Siemens
 Barco
Automotive / Commercial Vehicle Consumer / Appliance  Calex
o General Motors o Fujitsu (Japan)  Western Geco (Norway)
o Caterpillar o Dell Computers  General Electric
o Panasonic Automotive o Samsung (Korea)  Ingersoll Rand
o Hella Automotive o LG Electronics (Korea)  Fusion UV
o LG Electronics o Tubitak Mam (Turkey)  Numatics
o Tyco Electronics o Insinkerator  Durotech
o TRW o White Rodgers  Danaher Motion
o MicroHeat o Emerson Appliance Controls  TallyGencom
o Therm-O-Disc  Vision Research
Medical o NMB Technologies  Olympus NDT
o Biotronik o Shure
o Philips Medical o Handi-Quilt Components
o Abbott Laboratories o Xerox  Fairchild Semiconductor
o Tecan Systems  Maxtek
o Neuropace Portables  Samsung ElectroMechanics (Korea)
o Inter-Metro o RSA Security  Pulse
o Welch Allyn o Handheld  Teradyne
o Guidant / Boston Scientific o Kyocera  Amphenol
o Beckman Coulter o LG Electronics  AVX
o Applied Biosystems  Anadigics
o Cardinal Health Contract Manufacturers  Kemet
o Medtronic o Daeduck (Korea)  NIC
o Cardiac Science o Gold Circuit Electronics (Taiwan)  Graftech
o Engent  International Rectifier
o EIT

5

Selected Publications

o Epidemiological Study of SnAgCu Solder: Benchmarking Results from Accelerated Life Testing
o What I Don„t Know That I Don„t Know: Things to Worry About with the Pb-Free Transition
o Long-term Reliability of Pb-free Electronics
o Robustness of Ceramic Capacitors Assembled with Pb-Free Solder
o Failure Mechanisms in LED and Laser Diodes
o Microstructure and Damage Evolution in Pb-Free Solder Joints
o Improved Methodologies for Identifying Root-Cause of Printed Board Failures
o Reliability of Pressure Sensitive Adhesive Tapes for Heat Sink Attachment
o Failure Mechanisms in Electronic Products at High Altitudes
o Determining the Lifetime of Conductive Adhesive / Solder Plated Interconnections
o Issues in Long-Term Storage of Plastic Encapsulated Microcircuits
o Effect of PWB Plating on the Microstructure and Reliability of SnAgCu Solder Joints
o A Demonstration of Virtual Qualification for the Design of Electronic Hardware
o Solder Failure Mechanisms in Single-Sided Insertion-Mount Printed Wiring Boards
o Finite Element Modeling of Printed Circuit Boards for Structural Analysis

6

DfR Resources and Equipment
Electrical Material Analysis
o Oscilloscopes o X-ray
o Digital o Acoustic Microscopy
o Analog o Infrared Camera
o Curve Tracers o Metallographic Preparation
o Digital
o Stereoscope
o Analog
o Optical Microscope
o Partial Discharge Detector
o Scanning Electron Microscope
o Capacitance Meters
o Energy Dispersive Spectroscopy
o Low Resistance Meters
o Ion Chromatography
o High Resistance Meters
o FTIR (Solid / Film / Liquid)
o High Voltage Power Supplies (Hi-Pot)
o Thermomechanical Analyzer
o SQUID Microscopy
Testing
o Xray Diffraction
o HALT
o Focused Ion Beam Imaging
o Temperature Cycling
o XPS
o Thermal Shock
o Temperature/Humidity
Other
o Vibration
o Circuit Simulation
o Mechanical Shock / Drop Tower
o Finite Element Analysis (FEA)
o Mixed Flowing Gas
o Computational Fluid Dynamics
o Salt Spray
o Reliability Prediction (Physics of Failure)
o Capacitor Testing (Ripple Current)

7

Knowledge and Education (Website)

o Let your staff learn
all day / every day

E-LEARNING
o Scholarly articles
o Technical white papers
o Case studies
o Reliability calculators
o Online presentations

8
8

QFN as a ‘Next Generation’ Technology

o What is „Next Generation‟ Technology?
o Materials or designs currently
being used, but not widely adopted
(especially among hi-rel manufacturers)

o Carbon nanotubes are not
„Next Generation‟
o Not used in electronic applications

o Ball grid array is not
„Next Generation‟
o Widely adopted

9
9

Introduction (cont.)

o Why is knowing about „Next
Generation‟ Technologies important?
o These are the technologies that you
or your supply chain will use to
improve your product
o Cheaper, Faster, Stronger,
„Environmentally-Friendly‟, etc.

o And sooner then you think!

10
10

Reliability and Next Generation Technologies

o One of the most common drivers for failure is
inappropriate adoption of new technologies
o The path from consumer (high volume, short lifetime) to high rel is
not always clear

o Obtaining relevant information
can be difficult
o Information is often segmented
o Focus on opportunity, not risks

o Can be especially true for
component packaging
o BGA (Ball Grid Array), flip chip, QFN (Quad Flat No Lead)

11
11

Component Packaging

o Most of us have little influence over component packaging
o Most devices offer only one or two packaging styles

o Why should you care?
o Poor understanding of component qualification procedures
o Who tests what and why?

12
12

Component Testing

o Reliability testing performed by component manufacturers
is driven by JEDEC
o JESD22 series (A & B)

o Focus is almost entirely on die, packaging, and 1st level
interconnections (wire bond, solder bump, etc.)

o Only focus on 2nd level interconnects (solder joints) is
JESD22-B113 Cyclic Bend Test
o Driven by cell phone industry
o They have little interest in thermal cycling or vibration!

13
13

2nd Level Interconnect Reliability

o IPC has attempted to rectify this through
IPC-9701
o Two problems
o Adopted by OEMs; not by component manufacturers
o Application specific; you have to tell them the application
(your responsibility, not theirs)

o The result
o An increasing incidence of solder wearout in next generation
component packaging

14
14

Solder Wearout in Next Generation Packaging

Performance Needs
o Higher frequencies and data transfer rates
o Lower resistance-capacitance (RC) constants
o Higher densities
o More inside less plastic
o Lower voltage, but higher current
o Joule heating is I2R

o Has resulted in less robust package designs

15
15

Solder Wearout (cont.)
o Elimination of leaded devices
o Provides lower resistance-capacitance (RC) and higher package
densities
o Reduces compliance

Cycles to failure QFP: >10,000 BGA: 3,000 to 8,000
-40 to 125C

CSP / Flip Chip: <1,000 QFN: 1,000 to 3,000

16
16


o Design change: More silicon, less plastic
o Increases mismatch in coefficient of thermal expansion
(CTE)

BOARD LEVEL ASSEMBLY AND RELIABILITY
CONSIDERATIONS FOR QFN TYPE PACKAGES,
Ahmer Syed and WonJoon Kang, Amkor Technology.

17
17


o Hotter devices
o Increases change in temperature (DT)
10000

Characteristic Life (Cycles to Failure)
9000

tf = DTn 8000

7000

6000
n = 2 (SnPb) 5000

n = 2.3 (SnNiCu) 4000

n = 2.7 (SnAgCu) 3000

2000

1000

0
0 50 100 150 200
o
Change in Temperature ( C)

18
18

Industry Response to SJ Wearout?

o JEDEC
o Specification body for component manufacturers
o JEDEC JESD47
o Guidelines for new component qualification
o Requires 2300 cycles of 0 to 100C
o Testing is often done on thin boards

o IPC
o Specification body for electronic OEMs
o IPC 9701
o Recommends 6000 cycles of 0 to 100C
o Test boards should be similar thickness as
actual design

19
19

BIG PROBLEM

o JEDEC requirements are 60% less than IPC
o Testing on a thin board can extend lifetimes by 2X to 4X

o What does this mean?
o The components you buy may only survive
500 cycles of 0 to 100C

o What must you do?
o Components at risk must be subjected to PoF-based (Physics of
Failure) reliability analysis

20
20

Quad Flat Pack No Leads or
Quad Flat No Leads
(QFN)

21
21

QFN: What is it?

o Quad Flat Pack No Lead or Quad Flat Non-Leaded
o „The poor man‟s ball grid array‟
o Also known as
o Leadframe Chip Scale Package (LF-CSP)
o MicroLeadFrame (MLF)
o Others (MLP, LPCC, QLP, HVQFN, etc.)

o Overmolded leadframe with bond pads exposed on the bottom and
arranged along
the periphery of the package
o Developed in the early to
mid-1990‟s by Motorola,
Toshiba, Amkor, etc.
o Standardized by JEDEC/EIAJ in
late-1990‟s
o Fastest growing package type

22
22

QFN Advantages: Size and Cost

o Smaller, lighter and thinner than comparable leaded
packages
o Allows for greater functionality per volume

o Reduces cost
o Component manufacturers: More ICs per frame
o OEMs: Reduced board size

o Attempts to limit the footprint of lower I/O devices have
previously been stymied for cost reasons
o BGA materials and process too expensive

23
23

Advantages: Manufacturability

o Small package without placement and solder printing
constraints of fine pitch leaded devices
o No special handling/trays to avoid bent or non planar pins
o Easier to place correctly on PCB pads than fine pitch QFPs,
TSOPs, etc.
o Larger pad geometry makes for simpler solder paste printing
o Less prone to bridging defects when proper pad design and
stencil apertures are used.

o Reduced popcorning moisture sensitivity issues – smaller
package

24
24

Advantages: Thermal Performance

o More direct thermal path with larger area
o Die  Die Attach  Thermal Pad 
Solder  Board Bond Pad

o qJa for the QFN is about half of a
leaded counterpart (as per JESD-51)
o Allows for 2X increase in power dissipation

25
25

Advantages: Inductance

o At higher operating frequencies, inductance of the gold
wire and long lead-frame traces will affect performance

o Inductance of QFN is half its leaded counterpart because
it eliminates gullwing leads and shortens wire lengths

Popular for
RF Designs

http://ap.pennnet.com/display_article/153955/36/ARTCL/none/none/1/The-back-end-process:-Step-9-QFN-Singulation/

26
26

QFN: Why Not?

o QFN is a „next generation‟ technology for non-consumer
electronic OEMs due to concerns with
o Manufacturability
o Compatibility with other OEM processes
o Reliability

o Acceptance of this package, especially in long-life, severe
environment, high-rel applications, is currently limited as a
result

27
27

QFN Manufacturability: Bond Pads

o Non Solder Mask Defined Pads Preferred (NSMD)
o Copper etch process has tighter process control than solder mask process
o Makes for more consistent, strong solder joints since solder bonds to both tops and sides of pads

o Use solder mask defined pads (SMD) with care
o Can be used to avoid bridging between pads, especially between thermal and signal pads.
o Pads can grow in size quite a bit based on PCB mfg capabilities

o Can lose solder volume and standoff height through vias in thermal pads
o May need to tent, plug, or cap vias to keep sufficient paste volume
o Reduced standoff weight reduces cleanability and pathways for flux outgassing
o Increased potential for contamination related failures
o Tenting and plugging vias is often not well controlled and can lead to placement and chemical
entrapment issues
o Exercise care with devices placed on opposing side of QFN
o Can create placement issues if solder “bumps” are created in vias
o Can create solder short conditions on the opposing device
o Capping is a more robust, more expensive process that eliminates these concerns

28
28

Increase component standoff through PCB design
o One option: Soldermask Lift

29

Bond Pads (cont.)

o Extend bond pad 0.2 – 0.3 mm beyond
package footprint
o May or may not solder to cut edge
o Allows for better visual inspection

o Really need X-ray for best results
o Allows for verification of bridging,
adequate solder coverage and
void percentage
o Note: Lacking in good criteria
for acceptable voiding

30
30

Manufacturability: Stencil Design

o Stencil thickness and aperture design can be crucial for
manufacturability
o Excessive amount of paste can induce
float, lifting the QFN off the board
o Excessive voiding can also be induced
through inappropriate stencil design

o Follow manufacturer‟s guidelines
o Goal is 2-3 mils of solder thickness

o Rules of thumb (thermal pad)
o Ratio of aperture/pad ~0.5:1
o Consider multiple, smaller apertures
(avoid large bricks of solder paste)
o Reduces propensity for solder balling

31
31

Manufacturability: Stencil Design
Datasheet says solder paste coverage should be 40-80%

Drawing supplied in same datasheet is for 26% coverage

32
32

Manufacturability: Reflow & Moisture
o QFN solder joints are more susceptible to dimensional changes

o Case Study: Military supplier experienced solder separation under QFN

o QFN supplier admitted that the package was more susceptible to moisture
absorption that initially expected
o Resulted in transient swelling during reflow soldering
o Induced vertical lift, causing solder separation

o Was not popcorning
o No evidence of cracking or delamination in component package

33
33

Corrective Actions: Manufacturing

 Verify good MSL handling/procedures
 Spec and confirm - Reflow
o
 Room temperature to preheat (max 2-3 C/sec)

 Preheat to at least 150oC

 Preheat to maximum temperature (max 4-5oC/sec)
o
 Cooling (max 2-3 C/sec)

 In conflict with profile from J-STD-020C (6oC/sec)

 Make sure assembly is less than 60oC before cleaning

34
34

Manufacturability: QFN Joint Inspection

35
35


36
36


Convex or absence of fillet highly likely

•Etching of leadframe can prevent
pad from reaching edge of package
•Edge of bond pad is not plated for
solderability

37
37


o A large convex fillet is often an indication of issues
o Poor wetting under the QFN
o Tilting due to excessive solder paste under the thermal pad
o Elevated solder surface tension, from insufficient solder paste
under the thermal pad, pulling the package down

38
38

Manufacturability: Rework

o Can be difficult to replace a package and get adequate
soldering of thermal / internal pads.
o Mini-stencils, preforms, or rebump techniques can be used to get
sufficient solder volume

o Not directly accessible with soldering iron and wire
o Portable preheaters used in conjunction with soldering iron can
simplify small scale repair processes

o Close proximity with capacitors often requires adjacent
components to be resoldered / replaced as well

39
39

Manufacturability: Board Flexure

o Area array devices are known to have board flexure
limitations
o For SAC attachment, maximum microstrain can be as low as
500 ue

o QFN has an even lower level of compliance
o Limited quantifiable knowledge in this area
o Must be conservative during board build
o IPC is working on a specification similar to BGAs

40
40

Pad Cratering
 Cracking initiating within the laminate during a dynamic mechanical event
 In circuit testing (ICT), board depanelization, connector insertion, shock and
vibration, etc.

G. Shade, Intel (2006)

41 41
41

Pad Cratering
Intel (2006)

o Drivers
o Finer pitch components
o More brittle laminates
o Stiffer solders (SAC vs. SnPb)
o Presence of a large heat sink

o Difficult to detect using
standard procedures
o X-ray, dye-n-pry, ball shear, and
ball pull

42 42
42

Solutions to Pad Cratering
o Board Redesign
o Solder mask defined vs. non-solder mask defined

o Limitations on board flexure
o 750 to 500 microstrain, Component dependent

o More compliant solder
o SAC305 is relatively rigid, SAC105 and SNC are possible
alternatives

o New acceptance criteria for laminate materials
o Intel-led industry effort
o Attempting to characterize laminate material using high-speed
ball pull and shear testing, Results inconclusive to-date

o Alternative approach
o Require reporting of fracture toughness and elastic modulus

43 43
43

Reliability: Thermal Cycling

o Order of magnitude reduction in time to
failure from QFP
o 3X reduction from BGA QFP: >10,000

o Driven by die / package ratio
o 40% die; tf = 8K cycles (-40 / 125C)
o 75% die; tf = 800 cycles (-40 / 125C)

o Driven by size and I/O#
BGA: 3,000 to 8,000
o 44 I/O; tf = 1500 cycles (-40 / 125C)
o 56 I/O; tf = 1000 cycles (-40 / 125C)

o Very dependent upon solder bond with
thermal pad

QFN: 1,000 to 3,000

44
44

Thermal Cycling: Conformal Coating

o Care must be taken when using conformal coating over QFN
o Coating can infiltrate under the QFN
o Small standoff height allows coating to cause lift
o Hamilton Sundstrand found a significant reduction in time to failure (-
55 / 125C)
o Uncoated: 2000 to 2500 cycles
o Coated: 300 to 700 cycles
o Also driven by solder joint
sensitivity to tensile stresses
o Damage evolution is far
higher than for shear stresses

Wrightson, SMTA Pan Pac 2007

45
45

Reliability: Bend Cycling

o Low degree of compliance
and large footprint can
also result in issues during
cyclic flexure events

o Example: IR tested a
5 x 6mm QFN to
JEDEC JESD22-B113
o Very low beta (~1)
o Suggests brittle fracture, possible along the interface

46
46

Reliability: Dendritic Growth / Electrochemical Migration

o Large area, multi-I/O and low standoff can trap flux
under the QFN
o Processes using no-clean flux should be requalified
o Particular configuration could result in weak organic acid
concentrations above maximum (150 – 200 ug/in2)
o Those processes not using no-clean flux will likely
experience dendritic growth without modification of
cleaning process
o Changes in water temperature
o Changes in saponifier
o Changes to impingement jets

47
47

Dendritic Growth (cont.)

o The electric field strength between adjacent conductors is a strong
driver for dendritic growth
o Voltage / distance

o Digital technology typically has a maximum field strength of
0.5 V/mil
o TSSOP80 with 3.3VDC power and 16 mil pitch

o Previous generation analog / power technology had a maximum field
strength of 1.6 V/mil
o SOT23 with 50VDC power and 50 mil pitch

o Introduction of QFN has resulted in electric fields as high as
3.5 V/mil
o 24VDC and 16 mil pitch

48
48

Dendritic Growth (cont.)
o Component manufacturers are increasingly aware of this
issue and separate power and ground
o Linear Technologies (left) has strong separation power and
ground
o Intersil (right) has power and ground on adjacent pins

49
49

Electro-Chemical Migration: Details
elapsed time
o Insidious failure mechanism 12 sec.
o Self-healing: leads to large number
of no-trouble-found (NTF)
o Can occur at nominal voltages (5 V)
and room conditions (25C, 60%RH)

o Due to the presence of contaminants
on the surface of the board
o Strongest drivers are halides (chlorides and bromides)
o Weak organic acids (WOAs) and polyglycols can also lead to drops in the
surface insulation resistance

o Primarily controlled through controls on cleanliness
o Minimal differentiation between existing Pb-free solders, SAC and SnCu,
and SnPb
o Other Pb-free alloys may be more susceptible (e.g., SnZn)

50 50
50

Cleanliness Recommendations

Ion Control Maximum

Fluoride N/A 1 mg/in2

Chloride 2 mg/in2 4.5 mg/in2

Bromide 10 mg/in2 15 mg/in2

Nitrates, Sulfates 2 – 4 mg/in2 6 – 12 mg/in2

WOAs 150 mg/in2 250 mg/in2

51
51

QFN: Risk Mitigation

o Assess manufacturability
o DOE on stencil design
o Degree of reflow profiling
o Control of board flexure
o Dual row QFN is especially difficult
o Cleanliness is critical

o Assess reliability
o Ownership of 2nd level interconnect
is often lacking
o Extrapolate to needed field reliability
o Some companies have reballed QFN
to deal with concerns

52
52

Thank you!
Any Questions?
Contact me:
ctulkoff@dfrsolutions.com
www.dfrsolutions.com
53

Disclaimer & Confidentiality
o ANALYSIS INFORMATION
This report may include results obtained through analysis performed by DfR Solutions‟
Sherlock software. This comprehensive tool is capable of identifying design flaws and
predicting product performance. For more information, please contact
DfRSales@dfrsolutions.com.

o DISCLAIMER
DfR represents that a reasonable effort has been made to ensure the accuracy and
reliability of the information within this report. However, DfR Solutions makes no
warranty, both express and implied, concerning the content of this report, including, but
not limited to the existence of any latent or patent defects, merchantability, and/or
fitness for a particular use. DfR will not be liable for loss of use, revenue, profit, or any
special, incidental, or consequential damages arising out of, connected with, or
resulting from, the information presented within this report.

o CONFIDENTIALITY
The information contained in this document is considered to be proprietary to DfR
Solutions and the appropriate recipient. Dissemination of this information, in whole or
in part, without the prior written authorization of DfR Solutions, is strictly prohibited.

From all of us at DfR Solutions, we would like to thank you for choosing us as your
partner in quality and reliability assurance. We encourage you to visit our website for
information on a wide variety of topics.
Best Regards,
Dr. Craig Hillman, CEO

54

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