Reliability growth models for quality management
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The document discusses the role of reliability growth models in software quality management, highlighting their utility in assessing and improving product quality during development. It outlines five key activities involved in a Quality Improvement Process (QIP), including blitz testing and customer evaluations, which delayed the product shipment by one month but ultimately led to the identification and removal of over 250 field defects. Consequently, the overall field quality of the product showed significant improvement over the years.
Reliability growth models for quality management
- 1. Software Quality Management Unit U – IV Roy Antony Arnold G y y Asst. Prof. / CSE
- 2. • Alth h reliability growth models are meant Although li bilit th d l t for reliability assessment, they are also useful for quality management at the back end of the development process. • Models developed from a previous product or a previous release of the same product can be used to track the testing defects of the current product. d • To have significant improvement, the defect arrival rate ( f il i l t (or failure d i ) of the density) f h current project must fall below the model curve. curve
- 6. • The QIP involved five extra activities: 1. Blitz testing — "artistic" testing in stressful environments. 2. Customer evaluation — customers conducting testing in the development laboratory. 3. 3 Code inspections — additional inspections of error-prone modules, especially routines that are difficult to test such as the error recovery/exception h dli routines. / ti handling ti 4. Design reviews — re-review of designs of suspect components and modules. p 5. Extension of system test — improvement of test suites and extension of testing schedules to allow thorough final test execution.
- 9. • Because of the special QIP activities, the p product ship date was delayed one p y month. • As a result more than 250 field defects result, were found and removed. • The field quality of the product, evidenced by field defect arrivals reported in later y p years, improved significantly.