The paper presents a novel method for recognizing the stem-calyx of apples using shape descriptors, addressing the challenge of existing grading techniques that misidentify stem-calyx as defects. The proposed approach combines multi-threshold segmentation with shape feature extraction using multifractal, Fourier, and Radon descriptors, ultimately employing an SVM classifier for accurate differentiation between stem-calyx and actual defects. Experimentation on an apple image dataset demonstrates improved recognition accuracy over prior methods.