Electron microscope

z Sub: MSE Guided By : Prof. Pesode Sir
Prajwal Deshmukh 45
ELECTRON
MICROSCOPE

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• An electron microscope is a
microscope that uses a beam of
accelerated electrons as a source
of illumination.
• The wavelength of an electron can
be up to 100,000 times shorter
than that of visible light photons.
• Electron microscopes have a
higher resolving power than light
microscopes and can reveal the
structure of smaller objects
INTRODUCTION

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Types of Electron Microscope
 • There are basic 4 types of Electron Microscope:
 1. Analytical Electron Microscopy (AEM)
 2. Scanning Transmission Electron Microscope (STEM)
 3. Scanning Electron Microscope (SEM)
 4. Transmission Electron Microscope (TEM)

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Transmission
Electron
microscope
• Is a microscopy technique in which a beam of
electrons is transmitted through an ultra-thin
specimen, interacting with the specimen as it passes
through it.
• A transmission electron microscope can achieve
better than 50 pm resolution and magnifications of up
to about 10,000,000x

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Types of TEM:
 • Bright Field (BF) – BFTEM
 • Dark field (DF) – DFTEM
 • High Resolution TEM – HRTEM
 • Energy Filtered TEM – EFTEM
 • Electron Diffraction – ED

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Applications Of TEM
 • It can be used for the study of:
 – To examine a small column of atoms.
 – Cancer research
 – Virology
 – Pollution Nanotechnology
 – Semiconductor research
 – Chemical Identity
 – Crystal orientation
 – Electronic structure

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Limitations of TEM:
 • It is difficult to produce thin sample. • Relatively time
consuming process with a low throughput of samples.
 • The structure of the sample may be change during the
preparation process.
 • Small field of view may not give conclusion result of the whole
sample

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Scanning Electron
Microscope (SEM)
• A scanning electron microscope (SEM) is a type of
electron microscope that produces images of a
sample by scanning it with a focused beam of
electrons.
• The electrons interact with atoms in the sample,
producing various signals that contain information
about the sample's surface topography and
composition.

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Comparison Between SEM and TEM

Electron microscope

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