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Starting Point :Tester Utilization Performance                                      (av.
                               week 210-230 as presented in AIMS 28-08-2002)


Tester             Installed Planning               Operation      Overall     Overall
System                 Base Utilization             Utilization Utilization Utilization
                     in PSK from ACS                from ACS from ACS in Output
                           #          %                       %           %           %
Fusion FT                   13           84.1%          77.6%       65.6%       49.7%
Fusion WT                   21           99.2%          66.7%       66.2%       49.0%
Catalyst FT                 14           74.2%          65.6%       48.7%       52.7%
Catalyst WT                  4 ?         74.2% ?        65.6% ?     48.7% ?     52.7%
VQ FT                       37           91.1%          68.0%       62.1%       63.5%
VQ WT                       17 ?         91.1% ?        68.0% ?     62.1% ?     63.5%
Turbo FT                    26           94.4%          88.0%       83.2%       75.0%
Turbo WT                    20           82.5%          85.5%       71.7%       64.2%

Total/Av.                  152           89.1%          74.1%       66.3%       61.1%

Target Operational Utilization:
- Immature Testers/Applications > 80%
- Mature Testers/Applications > 90%
Division, Content owner, Date(in numbers), ISO No                                                1
Current Tester Utilization Performance
                                                    (av. week 240-245)


Tester             Installed Planning Operation               Overall     Overall
System                 Base Utilization Utilization        Utilization Utilization
                     in PSK from ACS from ACS              from ACS in Output
                           #          %           %                  %           %
Fusion FT                    ?                 ?       ?            ?           ?
Fusion WT                    ?
                          28.5                 ?
                                            99.4       ?
                                                    78.6            ?
                                                                 78.2           ?
                                                                                0
Catalyst FT                  ?                 ?       ?            ?           ?
Catalyst WT                  ?                 ?       ?            ?           ?
VQ FT                        ?                 ?       ?            ?           ?
VQ WT                        ?                 ?       ?            ?           ?
Turbo FT                     ?                 ?       ?            ?           ?
Turbo WT                     ?                 ?       ?            ?           ?

Total/Av.                     ?                 ?     ?             ?           ?

Current Operational Utilization:
- Quite improved compared to first half 2002 by ongoing improvement-actions.
- Target Operational Utilization can be > 80% for immatutr testers/ applications.
Division, Content owner, Date(in numbers), ISO No                                    2
Fusion utilization
                                              Planning Utilization (a)                            Operation Utilization (b)                          Overall Tester Utilization (a)x(b)                               Overall Tester Utilization from Output




  100.0


   90.0


   80.0


   70.0


   60.0


   50.0

   40.0


   30.0
                                   Wk210~wk230                                                                                                                                        Wk231~wk245
   20.0
                                  Avg. Util. : 68.51%                                                                                                                                Avg. Util. : 77.39%
   10.0


    0.0
          WK210


                          WK212


                                          WK214
                                                  WK215
                                                          WK216
                                                                  WK217
                                                                          WK218
                                                                                  WK219
                                                                                          WK220
                                                                                                  WK221
                                                                                                          WK222
                                                                                                                  WK223
                                                                                                                          WK224


                                                                                                                                          WK226
                                                                                                                                                  WK227
                                                                                                                                                          WK228
                                                                                                                                                                  WK229


                                                                                                                                                                                  WK231
                                                                                                                                                                                          WK232
                                                                                                                                                                                                  WK233
                                                                                                                                                                                                          WK234
                                                                                                                                                                                                                  WK235
                                                                                                                                                                                                                          WK236


                                                                                                                                                                                                                                          WK238
                                                                                                                                                                                                                                                  WK239
                                                                                                                                                                                                                                                          WK240
                                                                                                                                                                                                                                                                  WK241


                                                                                                                                                                                                                                                                                  WK243
                                                                                                                                                                                                                                                                                          WK244
                                                                                                                                                                                                                                                                                                  WK245
                  WK211


                                  WK213




                                                                                                                                  WK225




                                                                                                                                                                          WK230




                                                                                                                                                                                                                                  WK237




                                                                                                                                                                                                                                                                          WK242
Division, Content owner, Date(in numbers), ISO No                                                                                                                                                                                                                                                         3
Fusion utilization 2002-10-07~2002-10-27
Utilization    Efficiency    Prod.(%)      Idle.(%)       System .(%) Type.(%)      Prober.(%)    Contact.(%) Sm all_D.(%) Unknow n_D.(%)
                                                                                                                                       Schedule_D.(%)
                                                                                                                                                   N-Prod.(%)

      65.49%        83.26%        78.65%          0.21%         1.25%       4.40%         0.39%         0.50%       0.01%       2.03%        0.55%      12.00%




                                                 Fusion Utilization 2002-10-07 ~ 2002-10-27
                                  Unknown-down
                                                                                        Non-Production
                                                                                                                                Prod.(%)
                                  2.03%
                                                                                        12.00%
                            Type down
                            4.40%                                                                                               Idle.(%)
                                                                                                                                System.(%)
                                                                                                                                Type.(%)
                                                                                                                                Prober.(%)
                                                                                                                                Contact.(%)
                        System down
                        1.25%                                                                                                   Small_D.(%)
                                                                                                                                Unknown_D.(%)
                                                                                                                                Schedule_D.(%)
                                Production
                                78.65%                                                                                          N-Prod.(%)


Division, Content owner, Date(in numbers), ISO No                                                                                                               4
WT Utilization Pilots in PSK
                                           (Top 5 key issues to be tackled)
                                         Fusion WT                 Catalyst WT             VQ WT

  Operational Utilization                av. wk 210-230   66.7%    av. wk 210-230 ..%      av. wk 210-230 ..%


                                         av. wk 240-245   78.6%

  Key Issues:                            1.Docking        .4.1% 1.Contact        ....% 1.Prober         ....%
                                                                   problems                accuracy
          Info. From
              FTF                        2.Prober         ..3%    2.Type down    ....%
                                           accuracy

                                         3.System hang    .0.3%

         Finished.                       4.Prober-Wafer ....%     3.Prober-Wafer ....% 2.Prober-Wafer ....%
                                           contacting                contacting            contacting

                                          5. Abrasive paper 2%



  Operational Utilization                Target           86.0%    Target         80.0%    Target         80.0%
Division, Content owner, Date(in numbers), ISO No                                                                  5
Fusion New Design Pogo Ring


        Contact Problem is a key issue               Under Survey.
             in Fusion of WTF.




                                                    New design of
                  Contact is better than            Pogo Ring by
                  Before, testing is more            Engineering
                         Stable ?                      Group.
Division, Content owner, Date(in numbers), ISO No                    6
Fusion New Design Pogo Ring
           Use new pogo ring
                                                    New pogo ring
                                                      is better.
                                                                       Use old pogo ring




                                                             Trace the same type
                                                             in the same days,but
                                                           the results are different

Division, Content owner, Date(in numbers), ISO No                                          7
Fusion New Design Pogo Ring

                              Fusion#06 Utilization 2002-1007~2002-1107
                                                           The re-test rate of
     120.00%                                           new pogo ring is lower
                                          Fusion#34 Utilization 2002-1007~2002-1107
     100.00%                                                  Than old one.
           120.00%
      80.00%                                                                                 Yield
             100.00%
        60.00%                                                                               Utilization
              80.00%                                                                         RetestRateYield
        40.00%
              60.00%                                                                                  Utilization
        20.00%
              40.00%                                                                                  RetestRate
         0.00%
              20.00%
                                                                                185
                                                              116
                                                                    139
                                                                          162


                                                                                      208
                               24
                                        47
                                                    70
                                                         93
                      1




                     0.00%
                                                                           103
                                                                                 120
                                                                                       137
                                                                                             154
                                                    35


                                                               69
                                                                     86
                                           18


                                                          52
                                  1




Division, Content owner, Date(in numbers), ISO No                                                                   8
Fusion New Design Pogo Ring


  Machine Number                      Installation date                         Description                          Remark
                                                                 Use from 10/17 till 11/14 then new pogo ring
Fusion#34                                           2002/10/17   with prober move to Fusion#03 in 11/15
Fusion#02                                            2002/11/1   in use                                         **
Fusion#07                                            2002/11/1   in use                                         **
Fusion#05                                            2002/11/5   in use                                         **
Fusion#09                                           2002/11/14   in use                                         **
Fusion#03                                           2002/11/15   in use                                         **

Total use                          5 sets in site                                                2002/11/18




Division, Content owner, Date(in numbers), ISO No                                                                             9
Fusion New Machine stop & Inspection
                                          Design Pogo Ring
                                                       ⇒ Utilization lost
                                                    ⇒ Prober accuracy problem

                               New docking.                         Old docking.




                 Ideal
                                                                 New docking:0.783
              Utilization
                                                                  Expectation:0.95
             distribution.
                                                                     Target:17%
                                                                 Discuss with prober
                      New Docking will increase                 Vendor - Undergoing!
                        Utilization effectively

Division, Content owner, Date(in numbers), ISO No                                      10
Fusion New Design Pogo Ring

     Fusion07 New Pogo Ring Installation days :11/01
     Trace type: PCF8811BW1_b
     Utilization Improvement: 0.685 -> 0.827 = > improve 14.2%
     From Operation Utilization: 0.786 -> 0.827
     = > improve 4.1%                               Improvement Estimation:
                                                           >= 4.1%




Division, Content owner, Date(in numbers), ISO No                             11
Prober accuracy problem: Current spec. survey
         •Prober accuracy                                       +/- 4 um
         •Probe card alignment                                  +/- 6 um (epoxy)
                 (New probe card alignment)                      +/- 5 um (epoxy)
         •Bump placement accuracy                               +/- 4 um
         •Human variation                                        +/- 2 um




                                                     ?
                      How to ensure probe                 How to measure
         Accumulated shift at worst case: 4+6+4+2 = 16 um !
          for 32 um bump width ensure accuracy?
                                 prober
                      How to accuracy?
                           card
                      Bump placement
            PCF8813 bump width: 40 um
                                                    accuracy?

Division, Content owner, Date(in numbers), ISO No                                   Pitch   12
Prober accuracy verification : Alignment Error
  Condition:
    Wafer : Standard wafer
    Temp : 30 degree C
    Probing mode : Horizontal (From wafer top)

      Reference Die : Wafer center die
      Die size : 82x82 mil

  Rotation Error = 0.0015413 Degrees no:4090u-73
                                  Prober
                 X range Y range Cpk(X) Cpk(Y)
  Measure Data 8.330       9.460   0.896   0.744
  After Rotation 5.387     6.210   1.437   0.947




Division, Content owner, Date(in numbers), ISO No       13
Prober accuracy verification – Wafer to wafer accuracy error
          Condition:
          • Prober :4090u-13
          • Wafer type: 40913
          • Die size : X 139.643 mil , Y 122.831 mil
          • Temperature : 30 degree C
          • Load wafer to chuck  profile  alignment
          • Train reference target on die of wafer center for
            measurement
          • Probed and measured the reference target
            position
          • Repeat measured wafer to wafer for 25 times.
            Unload wafer  reload  profile  alignment 
            probing & measurement
                                                                Repeat measured 25 times load & unload
                                                     Wafer to wafer average X shift                0.43
                                                     Wafer to wafer average Y shift                0.41
                                                     Wafer to wafer Max X shift                    1.96
                                                     Wafer to wafer Max Y shift                    1.72
                                                     25 wafers X shift range               -4.16 ~ 8.30 = 12.46
                                                     25 wafers Y shift range               -3.41 ~ 7.61 = 11.02
                                                     25 wafers average X range                     6.49
                                                     25 wafers average Y range                     6.17
                                                     Max X shift range                             8.08
                                                     Min X shift range                             5.71
                                                     Max Y shift range                             8.81
                                                     Min Y shift range                             5.24
                                                     Average Cp(X)                                 1.15
                                                     Average Cp(Y)                                 1.10
 Division, Content owner, Date(in numbers), ISO No                                                                14
Prober accuracy verification – (Die size V.S accuracy)
   Condition:                           X,Y within
                                        ± 4 um
   •Prober:
                                        X out of
    4090u-57                            spec
   •Wafer:                              Y out of
                                        spec
     Glass Mask                                                82Size : 82 x 82
                                                               Die
                                                                   X 82                             471.5 :X 82
                                                                                                      Die Size 471.5 x 82
                                                                                                                                              82 X 471.5
                                                                                                                                                Die Size : 82 x 471.5


                                        X & Y out                   6                                        6                                         6



   •Temp:                               of spec                     4                                        4                                         4


                                                                    2                                        2                                         2


     30 degree C                                     -6   -4   -2
                                                                    0
                                                                         0   2    4   6   -6   -4      -2
                                                                                                             0
                                                                                                                 0   2      4   6   -6   -4      -2
                                                                                                                                                       0
                                                                                                                                                            0   2       4   6




   •Probing mode:
                                                                    -2                                      -2                                         -2



                                                                    -4                                      -4                                         -4




     From wafer top                                                 -6                                      -6                                         -6



                                      Die size (mil)                         82 X 82                        471.5 X 82                         82 X 471.5
     (Horizontal)                     X min shift                              -4.62                          -3.15                              -3.34
                                      X max shift                              3.35                            4.33                               3.46
   •Reference Die:
                                      X mean                                 -0.9064                         0.5133                             -0.5233
     Wafer center die                 Y min shift                              -3.41                          -4.32                              -4.53
                                      Y max shift                              4.86                            3.36                               3.28
                                      Y mean                                  0.4553                         -1.0811                            -0.8071
                                      X range                                  7.97                            7.48                               6.80
                                      Y range                                  8.27                            7.68                               7.81
Division, Content owner, Date(in numbers), ISO No                                                                                                                               15
Prober accuracy problem - action

  Use CMS tool to classify prober to 4 levels:
  If (1)Cp > 1.33, class: A                         --   Prober Quantity: 21
       (2) 1.0 < Cp <= 1.33, class: B
       (3) Cp <= 1.0, class: C
       (4) Prober accuracy more than 8 um, class: D


             Contact and discuss with Vendor,                 Machine stop & Inspection
             Survey & Action are undergoing !                    Time reduce, then
                                                                Utilization will go up
                                                                     Deservedly!!


Division, Content owner, Date(in numbers), ISO No                                         16
Action – (4) New Material Abrasive Paper
                                                                                                             Probe Tip
                                                                            Abrasive Side


                      Result: Clean effect                                                  Cleaning Layer

                         is better than                                                     Cushion Layer

                             before
                                                                                            Liner Paper

                    Cleaning
                     method        CL type cleaning film    B2L type cleaning film
            Yield                  (particle size: 3.0μm)   (particle size: 1.0μm)

 Tester

 FUS-10                                      78%                    73%
                                                                                     Before : 18 mil 1 um
 FUS-34                                      79%                    76%
                                                                                     Now : 18 mil 3 um
 FUS-35                                      78%                    70%


Division, Content owner, Date(in numbers), ISO No                                                                  17
Division, Content owner, Date(in numbers), ISO No   18

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Fusion utilization update 7

  • 1. Starting Point :Tester Utilization Performance (av. week 210-230 as presented in AIMS 28-08-2002) Tester Installed Planning Operation Overall Overall System Base Utilization Utilization Utilization Utilization in PSK from ACS from ACS from ACS in Output # % % % % Fusion FT 13 84.1% 77.6% 65.6% 49.7% Fusion WT 21 99.2% 66.7% 66.2% 49.0% Catalyst FT 14 74.2% 65.6% 48.7% 52.7% Catalyst WT 4 ? 74.2% ? 65.6% ? 48.7% ? 52.7% VQ FT 37 91.1% 68.0% 62.1% 63.5% VQ WT 17 ? 91.1% ? 68.0% ? 62.1% ? 63.5% Turbo FT 26 94.4% 88.0% 83.2% 75.0% Turbo WT 20 82.5% 85.5% 71.7% 64.2% Total/Av. 152 89.1% 74.1% 66.3% 61.1% Target Operational Utilization: - Immature Testers/Applications > 80% - Mature Testers/Applications > 90% Division, Content owner, Date(in numbers), ISO No 1
  • 2. Current Tester Utilization Performance (av. week 240-245) Tester Installed Planning Operation Overall Overall System Base Utilization Utilization Utilization Utilization in PSK from ACS from ACS from ACS in Output # % % % % Fusion FT ? ? ? ? ? Fusion WT ? 28.5 ? 99.4 ? 78.6 ? 78.2 ? 0 Catalyst FT ? ? ? ? ? Catalyst WT ? ? ? ? ? VQ FT ? ? ? ? ? VQ WT ? ? ? ? ? Turbo FT ? ? ? ? ? Turbo WT ? ? ? ? ? Total/Av. ? ? ? ? ? Current Operational Utilization: - Quite improved compared to first half 2002 by ongoing improvement-actions. - Target Operational Utilization can be > 80% for immatutr testers/ applications. Division, Content owner, Date(in numbers), ISO No 2
  • 3. Fusion utilization Planning Utilization (a) Operation Utilization (b) Overall Tester Utilization (a)x(b) Overall Tester Utilization from Output 100.0 90.0 80.0 70.0 60.0 50.0 40.0 30.0 Wk210~wk230 Wk231~wk245 20.0 Avg. Util. : 68.51% Avg. Util. : 77.39% 10.0 0.0 WK210 WK212 WK214 WK215 WK216 WK217 WK218 WK219 WK220 WK221 WK222 WK223 WK224 WK226 WK227 WK228 WK229 WK231 WK232 WK233 WK234 WK235 WK236 WK238 WK239 WK240 WK241 WK243 WK244 WK245 WK211 WK213 WK225 WK230 WK237 WK242 Division, Content owner, Date(in numbers), ISO No 3
  • 4. Fusion utilization 2002-10-07~2002-10-27 Utilization Efficiency Prod.(%) Idle.(%) System .(%) Type.(%) Prober.(%) Contact.(%) Sm all_D.(%) Unknow n_D.(%) Schedule_D.(%) N-Prod.(%) 65.49% 83.26% 78.65% 0.21% 1.25% 4.40% 0.39% 0.50% 0.01% 2.03% 0.55% 12.00% Fusion Utilization 2002-10-07 ~ 2002-10-27 Unknown-down Non-Production Prod.(%) 2.03% 12.00% Type down 4.40% Idle.(%) System.(%) Type.(%) Prober.(%) Contact.(%) System down 1.25% Small_D.(%) Unknown_D.(%) Schedule_D.(%) Production 78.65% N-Prod.(%) Division, Content owner, Date(in numbers), ISO No 4
  • 5. WT Utilization Pilots in PSK (Top 5 key issues to be tackled) Fusion WT Catalyst WT VQ WT Operational Utilization av. wk 210-230 66.7% av. wk 210-230 ..% av. wk 210-230 ..% av. wk 240-245 78.6% Key Issues: 1.Docking .4.1% 1.Contact ....% 1.Prober ....% problems accuracy Info. From FTF 2.Prober ..3% 2.Type down ....% accuracy 3.System hang .0.3% Finished. 4.Prober-Wafer ....% 3.Prober-Wafer ....% 2.Prober-Wafer ....% contacting contacting contacting 5. Abrasive paper 2% Operational Utilization Target 86.0% Target 80.0% Target 80.0% Division, Content owner, Date(in numbers), ISO No 5
  • 6. Fusion New Design Pogo Ring Contact Problem is a key issue Under Survey. in Fusion of WTF. New design of Contact is better than Pogo Ring by Before, testing is more Engineering Stable ? Group. Division, Content owner, Date(in numbers), ISO No 6
  • 7. Fusion New Design Pogo Ring Use new pogo ring New pogo ring is better. Use old pogo ring Trace the same type in the same days,but the results are different Division, Content owner, Date(in numbers), ISO No 7
  • 8. Fusion New Design Pogo Ring Fusion#06 Utilization 2002-1007~2002-1107 The re-test rate of 120.00% new pogo ring is lower Fusion#34 Utilization 2002-1007~2002-1107 100.00% Than old one. 120.00% 80.00% Yield 100.00% 60.00% Utilization 80.00% RetestRateYield 40.00% 60.00% Utilization 20.00% 40.00% RetestRate 0.00% 20.00% 185 116 139 162 208 24 47 70 93 1 0.00% 103 120 137 154 35 69 86 18 52 1 Division, Content owner, Date(in numbers), ISO No 8
  • 9. Fusion New Design Pogo Ring Machine Number Installation date Description Remark Use from 10/17 till 11/14 then new pogo ring Fusion#34 2002/10/17 with prober move to Fusion#03 in 11/15 Fusion#02 2002/11/1 in use ** Fusion#07 2002/11/1 in use ** Fusion#05 2002/11/5 in use ** Fusion#09 2002/11/14 in use ** Fusion#03 2002/11/15 in use ** Total use 5 sets in site 2002/11/18 Division, Content owner, Date(in numbers), ISO No 9
  • 10. Fusion New Machine stop & Inspection Design Pogo Ring ⇒ Utilization lost ⇒ Prober accuracy problem New docking. Old docking. Ideal New docking:0.783 Utilization Expectation:0.95 distribution. Target:17% Discuss with prober New Docking will increase Vendor - Undergoing! Utilization effectively Division, Content owner, Date(in numbers), ISO No 10
  • 11. Fusion New Design Pogo Ring Fusion07 New Pogo Ring Installation days :11/01 Trace type: PCF8811BW1_b Utilization Improvement: 0.685 -> 0.827 = > improve 14.2% From Operation Utilization: 0.786 -> 0.827 = > improve 4.1% Improvement Estimation: >= 4.1% Division, Content owner, Date(in numbers), ISO No 11
  • 12. Prober accuracy problem: Current spec. survey •Prober accuracy +/- 4 um •Probe card alignment +/- 6 um (epoxy) (New probe card alignment) +/- 5 um (epoxy) •Bump placement accuracy +/- 4 um •Human variation +/- 2 um ? How to ensure probe How to measure Accumulated shift at worst case: 4+6+4+2 = 16 um ! for 32 um bump width ensure accuracy? prober How to accuracy? card Bump placement PCF8813 bump width: 40 um accuracy? Division, Content owner, Date(in numbers), ISO No Pitch 12
  • 13. Prober accuracy verification : Alignment Error Condition: Wafer : Standard wafer Temp : 30 degree C Probing mode : Horizontal (From wafer top) Reference Die : Wafer center die Die size : 82x82 mil Rotation Error = 0.0015413 Degrees no:4090u-73 Prober X range Y range Cpk(X) Cpk(Y) Measure Data 8.330 9.460 0.896 0.744 After Rotation 5.387 6.210 1.437 0.947 Division, Content owner, Date(in numbers), ISO No 13
  • 14. Prober accuracy verification – Wafer to wafer accuracy error Condition: • Prober :4090u-13 • Wafer type: 40913 • Die size : X 139.643 mil , Y 122.831 mil • Temperature : 30 degree C • Load wafer to chuck  profile  alignment • Train reference target on die of wafer center for measurement • Probed and measured the reference target position • Repeat measured wafer to wafer for 25 times. Unload wafer  reload  profile  alignment  probing & measurement Repeat measured 25 times load & unload Wafer to wafer average X shift 0.43 Wafer to wafer average Y shift 0.41 Wafer to wafer Max X shift 1.96 Wafer to wafer Max Y shift 1.72 25 wafers X shift range -4.16 ~ 8.30 = 12.46 25 wafers Y shift range -3.41 ~ 7.61 = 11.02 25 wafers average X range 6.49 25 wafers average Y range 6.17 Max X shift range 8.08 Min X shift range 5.71 Max Y shift range 8.81 Min Y shift range 5.24 Average Cp(X) 1.15 Average Cp(Y) 1.10 Division, Content owner, Date(in numbers), ISO No 14
  • 15. Prober accuracy verification – (Die size V.S accuracy) Condition: X,Y within ± 4 um •Prober: X out of 4090u-57 spec •Wafer: Y out of spec Glass Mask 82Size : 82 x 82 Die X 82 471.5 :X 82 Die Size 471.5 x 82 82 X 471.5 Die Size : 82 x 471.5 X & Y out 6 6 6 •Temp: of spec 4 4 4 2 2 2 30 degree C -6 -4 -2 0 0 2 4 6 -6 -4 -2 0 0 2 4 6 -6 -4 -2 0 0 2 4 6 •Probing mode: -2 -2 -2 -4 -4 -4 From wafer top -6 -6 -6 Die size (mil) 82 X 82 471.5 X 82 82 X 471.5 (Horizontal) X min shift -4.62 -3.15 -3.34 X max shift 3.35 4.33 3.46 •Reference Die: X mean -0.9064 0.5133 -0.5233 Wafer center die Y min shift -3.41 -4.32 -4.53 Y max shift 4.86 3.36 3.28 Y mean 0.4553 -1.0811 -0.8071 X range 7.97 7.48 6.80 Y range 8.27 7.68 7.81 Division, Content owner, Date(in numbers), ISO No 15
  • 16. Prober accuracy problem - action Use CMS tool to classify prober to 4 levels: If (1)Cp > 1.33, class: A -- Prober Quantity: 21 (2) 1.0 < Cp <= 1.33, class: B (3) Cp <= 1.0, class: C (4) Prober accuracy more than 8 um, class: D Contact and discuss with Vendor, Machine stop & Inspection Survey & Action are undergoing ! Time reduce, then Utilization will go up Deservedly!! Division, Content owner, Date(in numbers), ISO No 16
  • 17. Action – (4) New Material Abrasive Paper Probe Tip Abrasive Side Result: Clean effect Cleaning Layer is better than Cushion Layer before Liner Paper Cleaning method CL type cleaning film B2L type cleaning film Yield (particle size: 3.0μm) (particle size: 1.0μm) Tester FUS-10 78% 73% Before : 18 mil 1 um FUS-34 79% 76% Now : 18 mil 3 um FUS-35 78% 70% Division, Content owner, Date(in numbers), ISO No 17
  • 18. Division, Content owner, Date(in numbers), ISO No 18