This document discusses key interconnect parameters for VLSI design including capacitance, resistance, and inductance. It notes that as device sizes shrink, wire lengths increase which leads to greater parasitic effects that must be considered. The document outlines how capacitance depends on shape and surroundings and can be modeled as parallel plates. Resistance is defined by resistivity, length and cross-sectional area, with aluminum a common interconnect material. Inductance also becomes important at higher frequencies. Models are simplified by ignoring less dominant effects.