Device Modeling Report



COMPONENTS: Power MOSFET (Professional)
PART NUMBER: IRFB9N60A
MANUFACTURER: International Rectifier
REMARK: Body Diode (Standard)




                Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
POWER MOSFET MODEL
Pspice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




         All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Body Diode Model
 Pspice model
                                       Model description
  parameter
       IS       Saturation Current
       N        Emission Coefficient
      RS        Series Resistance
      IKF       High-injection Knee Current
     CJO        Zero-bias Junction Capacitance
       M        Junction Grading Coefficient
       VJ       Junction Potential
     ISR        Recombination Current Saturation Value
      BV        Reverse Breakdown Voltage(a positive value)
     IBV        Reverse Breakdown Current(a positive value)
       TT       Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Transconductance Characteristic

Circuit Simulation Result




Comparison table

                                       gfs (S)
     ID(A)                                                                Error (%)
                     Measurement                  Simulation
             0.5                      2.5                     2.565              2.60
               1                     3.63                     3.591              1.07
               2                        5                     5.005              0.10
              5                      7.69                      7.69                   0




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Vgs-Id Characteristic

Circuit Simulation result

                 40A




                 10A




                1.0A




               100mA
                       4V           5V   6V    7V     8V       9V      10V
                            I(V2)
                                              V_V1



Evaluation circuit




                                                              V2


                                                             0V dc

                                                              V3
                                 V1
                       10 Vd c                               50 Vd c




                                               0




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                     VGS(V)
     ID(A)                                                              Error (%)
                    Measurement                 Simulation
       1.000                     4.875                      4.898             0.478
       2.000                     5.125                      5.131             0.111
       5.000                     5.625                      5.602            -0.411
      10.000                     6.125                      6.149             0.393




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Id-Rds(on) Characteristic

Circuit Simulation result



             5.0A




               0A
                    0V                               5V                       10V
                         I(V2)
                                                    V_V3


Evaluation circuit



                                                                  V2


                                                                  0Vdc

                                                                  V3
                                    V1

                                                                  50Vdc
                          10.0Vdc




                                                     0

Simulation Result

    ID=5.5, VGS=10V              Measurement               Simulation          Error (%)
        R DS (on)                        0.75                  0.75                  0




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Gate Charge Characteristic
Circuit Simulation result
                  20V




                  16V




                  12V




                   8V




                   4V




                   0V
                        0              10n          20n       30n          40n            50n
                             V(W1:3)
                                                      Time*10ms

Evaluation circuit

                                                                    V2


                                                                         0Vdc

                                                                                Dbreak


         PER = 1000u                                                             D1
         PW = 600u                                                                         I2
         TF = 10n                      W1
         TR = 10n                        +                                                 9.2Adc
         TD = 0
         I2 = 10m
                                         -
                        I1             W
         I1 = 0                        IOFF = 1mA                                          V1
                                       ION = 0uA                                           300Vdc




                                                          0


Simulation Result

     VDD=300V,ID=9.2A                  Measurement            Simulation                 Error (%)

              Qgs                             8.750 nC             8.736 nC                     -0.160
              Qgd                            12.000 nC            12.033 nC                      0.275
              Qg                             32.250 nC            32.253 nC                      0.009


                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Capacitance Characteristic



                                                               Measurement
                                                                Simulation




Simulation Result

                                      Cbd(pF)
         VDS(V)                                                      Error(%)
                        Measurement            Simulation
             10.000              300.000              294.000                -2.000
             20.000              197.500              196.900                -0.304
             50.000              115.000               114.400               -0.522
           100.000                78.000                76.000               -2.564
           200.000                50.000                50.500                1.000




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Switching Time Characteristic

Circuit Simulation result
                12V
                                    VDS =300 (V)



                                                                                VGS = 10V
                  8V




                  4V




                  0V
                  5.00us                5.05us                    5.10us                  5.15us
                       V(2)        V(3)/30
                                                     Time


Evaluation circuit

                                                                           L1         RL

                                                                  3
                                                                      V3   0.0 5uH    31 .8
                                                          0V dc



                                                                                                 VDD
                                                                                          30 0
                                  L2           RG
                                                     2
                                  0.0 3uH
              V1 = 0
                             V1                9.1
              V2 = 10                                                                            0
              TD = 5u
              TR = 6n
              TF = 7n
              PW = 5 u
              PE R = 10 0u

                             0                                        0


Simulation Result

     ID=9.2A, VDD=300V
                                       Measurement                    Simulation                 Error(%)
         VGS=0/10V
           td (on)                          13.000   ns           13.006             ns                0.046




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Output Characteristic

Circuit Simulation result

             20A
                            10.0V                    7.0V




             10A


                                                                       6.0V




                                                                  5.5V


                                                            VGS=5.0V
              0A
                   0V                       25V                          50V
                        I(V2)
                                           V_V3




Evaluation circuit




                                                                V2


                                                               0V dc

                                                                V3
                                    V1

                                                               50 Vd c
                        10 .0Vd c




                                              0




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Forward Current Characteristic of Reverse Diode
Circuit Simulation Result

               50A




               10A




              1.0A




             100mA
                 0.2V            0.5V                       1.0V     1.2V
                     I(V2)
                                             V_V3

Evaluation Circuit


                                        R1

                                        0.0 1m
                         V2


                        0V dc

                         V3


                        0V dc




                                                     0




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                          Vfwd(V)                   Vfwd(V)
        Ifwd(A)                                                             %Error
                        Measurement                Simulation
             0.200                0.523                     0.525               0.325
             0.500                0.567                     0.565              -0.423
             1.000                0.600                     0.600               0.012
             2.000                0.646                     0.645              -0.146
             5.000                0.734                     0.737               0.354
            10.000                0.859                     0.858              -0.105




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Reverse Recovery Characteristic

Circuit Simulation Result
               400mA




                     0A




              -400mA
                   8us     10us            14us 16us 18us          22us 24us   28us
                          I(R1)
                                                       Time


Evaluation Circuit

                                                  R1

                                                  50




                             V1 = {-9.4}    V1
                             V2 = {10.7}
                             TD = 1.275u
                             TR = 10n
                             TF = 10n
                             PW = 15u
                             PER = 100u



                                            0



                                                               0


Compare Measurement vs. Simulation
             Measurement                          Simulation                   Error(%)
 Trj +Trb            1.720                 us          1.721            us       0.058




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Reverse Recovery Characteristic                                             Reference




                                                    Measurement




trj = 1.08(us)
trb = 0.64(us)
Conditions: Ifwd=Irev=0.2(A), Rl=50




                                               Example




                            Relation between trj and trb


             All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

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SPICE MODEL of IRFB9N60A (Professional+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Professional) PART NUMBER: IRFB9N60A MANUFACTURER: International Rectifier REMARK: Body Diode (Standard) Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 2. POWER MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 3. Body Diode Model Pspice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 4. Transconductance Characteristic Circuit Simulation Result Comparison table gfs (S) ID(A) Error (%) Measurement Simulation 0.5 2.5 2.565 2.60 1 3.63 3.591 1.07 2 5 5.005 0.10 5 7.69 7.69 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 5. Vgs-Id Characteristic Circuit Simulation result 40A 10A 1.0A 100mA 4V 5V 6V 7V 8V 9V 10V I(V2) V_V1 Evaluation circuit V2 0V dc V3 V1 10 Vd c 50 Vd c 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 6. Comparison Graph Circuit Simulation Result Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation 1.000 4.875 4.898 0.478 2.000 5.125 5.131 0.111 5.000 5.625 5.602 -0.411 10.000 6.125 6.149 0.393 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 7. Id-Rds(on) Characteristic Circuit Simulation result 5.0A 0A 0V 5V 10V I(V2) V_V3 Evaluation circuit V2 0Vdc V3 V1 50Vdc 10.0Vdc 0 Simulation Result ID=5.5, VGS=10V Measurement Simulation Error (%) R DS (on) 0.75  0.75  0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 8. Gate Charge Characteristic Circuit Simulation result 20V 16V 12V 8V 4V 0V 0 10n 20n 30n 40n 50n V(W1:3) Time*10ms Evaluation circuit V2 0Vdc Dbreak PER = 1000u D1 PW = 600u I2 TF = 10n W1 TR = 10n + 9.2Adc TD = 0 I2 = 10m - I1 W I1 = 0 IOFF = 1mA V1 ION = 0uA 300Vdc 0 Simulation Result VDD=300V,ID=9.2A Measurement Simulation Error (%) Qgs 8.750 nC 8.736 nC -0.160 Qgd 12.000 nC 12.033 nC 0.275 Qg 32.250 nC 32.253 nC 0.009 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 9. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 10.000 300.000 294.000 -2.000 20.000 197.500 196.900 -0.304 50.000 115.000 114.400 -0.522 100.000 78.000 76.000 -2.564 200.000 50.000 50.500 1.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 10. Switching Time Characteristic Circuit Simulation result 12V VDS =300 (V) VGS = 10V 8V 4V 0V 5.00us 5.05us 5.10us 5.15us V(2) V(3)/30 Time Evaluation circuit L1 RL 3 V3 0.0 5uH 31 .8 0V dc VDD 30 0 L2 RG 2 0.0 3uH V1 = 0 V1 9.1 V2 = 10 0 TD = 5u TR = 6n TF = 7n PW = 5 u PE R = 10 0u 0 0 Simulation Result ID=9.2A, VDD=300V Measurement Simulation Error(%) VGS=0/10V td (on) 13.000 ns 13.006 ns 0.046 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 11. Output Characteristic Circuit Simulation result 20A 10.0V 7.0V 10A 6.0V 5.5V VGS=5.0V 0A 0V 25V 50V I(V2) V_V3 Evaluation circuit V2 0V dc V3 V1 50 Vd c 10 .0Vd c 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 12. Forward Current Characteristic of Reverse Diode Circuit Simulation Result 50A 10A 1.0A 100mA 0.2V 0.5V 1.0V 1.2V I(V2) V_V3 Evaluation Circuit R1 0.0 1m V2 0V dc V3 0V dc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 13. Comparison Graph Circuit Simulation Result Simulation Result Vfwd(V) Vfwd(V) Ifwd(A) %Error Measurement Simulation 0.200 0.523 0.525 0.325 0.500 0.567 0.565 -0.423 1.000 0.600 0.600 0.012 2.000 0.646 0.645 -0.146 5.000 0.734 0.737 0.354 10.000 0.859 0.858 -0.105 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 14. Reverse Recovery Characteristic Circuit Simulation Result 400mA 0A -400mA 8us 10us 14us 16us 18us 22us 24us 28us I(R1) Time Evaluation Circuit R1 50 V1 = {-9.4} V1 V2 = {10.7} TD = 1.275u TR = 10n TF = 10n PW = 15u PER = 100u 0 0 Compare Measurement vs. Simulation Measurement Simulation Error(%) Trj +Trb 1.720 us 1.721 us 0.058 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 15. Reverse Recovery Characteristic Reference Measurement trj = 1.08(us) trb = 0.64(us) Conditions: Ifwd=Irev=0.2(A), Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2005