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Variation-Aware Design of Custom Integrated
Circuits: A Hands-on Field Guide

Trent McConaghy • Kristopher Breen
Jeffrey Dyck • Amit Gupta
Variation-Aware Design of
Custom Integrated Circuits:
A Hands-on Field Guide
With Foreword by James P. Hogan
123

Trent McConaghy
Solido Design Automation Inc.
Saskatoon, SK
Canada
Kristopher Breen
Saskatoon, SK
Canada
Jeffrey Dyck
Saskatoon, SK
Canada
Amit Gupta
Saskatoon, SK
Canada
ISBN 978-1-4614-2268-6 ISBN 978-1-4614-2269-3 (eBook)
DOI 10.1007/978-1-4614-2269-3
Springer New York Heidelberg Dordrecht London
Library of Congress Control Number: 2012943974
Springer Science+Business Media New York 2013
This work is subject to copyright. All rights are reserved by the Publisher, whether the whole or part of
the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations,
recitation, broadcasting, reproduction on microfilms or in any other physical way, and transmission or
information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar
methodology now known or hereafter developed. Exempted from this legal reservation are brief
excerpts in connection with reviews or scholarly analysis or material supplied specifically for the
purpose of being entered and executed on a computer system, for exclusive use by the purchaser of the
work. Duplication of this publication or parts thereof is permitted only under the provisions of
the Copyright Law of the Publisher’s location, in its current version, and permission for use must always
be obtained from Springer. Permissions for use may be obtained through RightsLink at the Copyright
Clearance Center. Violations are liable to prosecution under the respective Copyright Law.
The use of general descriptive names, registered names, trademarks, service marks, etc. in this
publication does not imply, even in the absence of a specific statement, that such names are exempt
from the relevant protective laws and regulations and therefore free for general use.
While the advice and information in this book are believed to be true and accurate at the date of
publication, neither the authors nor the editors nor the publisher can accept any legal responsibility for
any errors or omissions that may be made. The publisher makes no warranty, express or implied, with
respect to the material contained herein.
Printed on acid-free paper
Springer is part of Springer Science+Business Media (www.springer.com)

Set topology
Initial sizing
Sizing on Corners
Fast Verify
(PVT / Statistical / High- )
Layout
Extract Parasitics
Verify with Parasitics
on Corners
Extract Corners
(PVT / Statistical / High- )
Chapter 1:
Introduction
Chapter 2: PVT
Chapter 3, 4: Statistical
Chapter 5: High-
Chapter 6:
Design
Exploration
Chapter 7:
Conclusion

Foreword
After more than 35 years in the semiconductor business, I find that custom inte-
grated circuit (IC) design continues to present extremely interesting challenges. In
this book, Trent McConaghy, Kristopher Breen, Jeff Dyck, and Amit Gupta, all
with Solido Design Automation, address the increasingly difficult design issues
associated with variation in advanced nanoscale processes.
The authors have put together what I believe will become an invaluable ref-
erence for best practices in variation-aware custom IC design. They have taken
theory and combined it with methodology and examples, based on their experi-
ences in supplying leading-edge design tools to the likes of TSMC and NVIDIA.
This book’s content is useful for circuit designers, CAD managers and CAD
researchers. This book will also be very useful to graduate students as they begin
their careers in custom IC design.
I have always felt that the job of a designer is to optimize designs to what the
requirements dictate, within the process capabilities. Circuits must trade off the
marketing requirements of function, performance, cost, and power. This is espe-
cially true for custom IC design, where the results are on a continuum. There is
never a perfect answer—only the most right, or equivalently, the least wrong.
Moore’s Law—the practice of shrinking transistor sizes over time—has tradi-
tionally been a no-brainer, since smaller devices directly led to improved power,
performance, and area. Several decades into Moore’s Law, today’s IC manufac-
turing has literally reached the level of ‘‘nanotech’’, with minimum device sizes at
40, 28, 20 nm, and most recently 14 nm. Variation in devices during manufac-
turing has always been around, but it has not traditionally been a big issue. The
problem is that variation gets exponentially worse as the devices shrink, and it has
become a major problem at these nano nodes. Designers must choose between
over-margining so that the circuit yields (taking a performance hit), or to push
performance (taking a yield hit).
Variation has made it harder to differentiate ICs on power or performance,
while still yielding. The use of common commercial foundries, such as TSMC,
GLOBALFOUNDRIES, Samsung, and even now Intel, makes it even more dif-
ficult to differentiate competitively. Performance hits are unacceptable, because all
vii

semiconductor companies are using the same foundries trying to produce com-
petitive chips. In turn, yield hits are unacceptable for high volume applications
since costs quickly skyrocket.
Moore’s Law and opportunities for differentiation are the lifeblood of a healthy
semiconductor industry. Variation is threatening both.
I’ve known Trent for several years now, since when he was co-founder of
Analog Design Automation (acquired by Synopsys) in the early 2000s. He earned
his Ph.D. at KU Leuven University under the supervision of Georges Gielen, and is
now currently co-founder and CTO of Solido Design Automation.
I love Trent’s personal story as well. He grew up on a pig farm in Saskatch-
ewan. As of this writing, Saskatchewan is 251,700 square miles with a population
of just over 1 million souls. In contrast, California is 163,696 square miles with a
population of 37 million souls. And Saskatchewan gets cold.
Trent once told me a story about farm life. When the weather gets to about
-40 (it is the same in Celsius or Fahrenheit), it freezes the valves for the pigs’
outdoor watering bowls. To prevent damage to the plumbing, he had to pour hot
water over the valves to thaw the ice, then re-fasten some tiny bolts. This latter
step required taking his gloves off. He had about 15 s to fasten the bolts and get his
gloves back on before freezing his fingers (and risking frostbite). Trent is a
fountain of amazing farm stories from his boyhood. I grew up in California, and
the biggest obstacle I had to starting the day was deciding if I was going to wear a
long or short sleeve shirt that day. These experiences surely had a huge influence
in building Trent’s character.
As I have come to know Trent, I have also learned that he has a broad range of
interests, from neuroscience, to music, to art. He complements his wife, who is an
art curator with world-class training (Sorbonne, Paris) and work experience (The
Louvre, Paris). Trent is truly a unique and entertaining renaissance man in the Da
Vinci tradition.
On the technical side, Trent has a unique ability to invent algorithms that solve
real design challenges, but not stop there. He takes the algorithms past the stage of
prototype software that solves academic problems, shepherding them into com-
mercial software usable by real designers doing production circuit design. At
Solido, Trent has worked closely with Jeff Dyck, Kristopher Breen, and Solido’s
product development team, to deliver industrial-scale variation solutions.
This book helps custom IC designers to address variation issues, in an easy-to-
read and pragmatic fashion. I believe this book will become an invaluable resource
to the custom IC designer facing variation challenges in his/her memory, standard
cell, analog/RF, and custom digital designs.
Enjoy the read… and never miss a chance to talk or listen to Trent!
Los Gatos, CA, July 2012 Jim Hogan
viii Foreword

Acknowledgments
This book is the culmination of work by the authors and their colleagues,
stretching back nearly a decade, in building variation-aware tools for circuit
designers. It is a distillation of successful and not-so-successful ideas, of lessons
learned, all geared towards making better designs despite variation issues.
We would like to thank those who reviewed the book, and provided extensive
and valuable suggestions: Drew Plant, Mark Smith, Tom Eeckelaert, Jim Hogan,
and Gloria Nichols. Thanks to those who have helped to provide and prepare real-
world design examples: Ting Ku, Hassan Sharghi, Joel Amzallag, Drew Plant,
Jiandong Ge, Anthony Ho, and Roshan Thomas. Thanks to the rest of the team in
Solido Design Automation, who have helped us build and deliver high-quality
tools. Thanks to the Solido investors and Solido board, without whom this work
would not have been possible.
Thanks to our users and our partners, who have helped us shape our tools and
methodologies for real-world use.
Finally, thank you for picking up this book! We hope that you find it useful (and
valuable) in your own work.
Solido Design Automation Inc. Trent McConaghy
Canada, July 2012 Kristopher Breen
Jeff Dyck
Amit Gupta
ix

Contents
1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.2 Key Variation Concepts . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.2.1 Types of Variables. . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.2.2 Types of Variation . . . . . . . . . . . . . . . . . . . . . . . . . . 3
1.2.3 Key Variation-Related Terms . . . . . . . . . . . . . . . . . . 6
1.3 Status Quo Design Flows . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
1.4 A Fast, Accurate Variation-Aware Design Flow . . . . . . . . . . . 9
1.5 Conclusion/Book Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2 Fast PVT Verification and Design. . . . . . . . . . . . . . . . . . . . . . . . . 13
2.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.2 Review of Flows to Handle PVT Variation . . . . . . . . . . . . . . . 15
2.2.1 PVT Flow: Full Factorial . . . . . . . . . . . . . . . . . . . . . 16
2.2.2 PVT Flow: Guess Worst-Case . . . . . . . . . . . . . . . . . . 16
2.2.3 PVT Flow: Guess Worst-Case ? Full Verification. . . . 17
2.2.4 PVT Flow: Good Initial Corners ? Full
Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
2.2.5 PVT Flow: Fast PVT . . . . . . . . . . . . . . . . . . . . . . . . 19
2.2.6 Summary of PVT Flows . . . . . . . . . . . . . . . . . . . . . . 20
2.3 Approaches for Fast PVT Corner Extraction
and Verification. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.1 Full Factorial. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.2 Designer Best Guess. . . . . . . . . . . . . . . . . . . . . . . . . 21
2.3.3 Sensitivity Analysis (Orthogonal Sampling,
Linear Model) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
2.3.4 Quadratic Model (Traditional DOE) . . . . . . . . . . . . . . 22
2.3.5 Cast as Global Optimization Problem (Fast PVT) . . . . 22
xi

2.4 Fast PVT Method. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
2.4.1 Overview of Fast PVT Approach. . . . . . . . . . . . . . . . 23
2.5 Fast PVT Verification: Benchmark Results . . . . . . . . . . . . . . . 25
2.5.1 Experimental Setup . . . . . . . . . . . . . . . . . . . . . . . . . 25
2.5.2 Experimental Results . . . . . . . . . . . . . . . . . . . . . . . . 25
2.5.3 Post-Layout Flows . . . . . . . . . . . . . . . . . . . . . . . . . . 26
2.5.4 Fast PVT for Multiple Outputs and Multiple Cores . . . 27
2.5.5 Fast PVT Corner Extraction Limitations . . . . . . . . . . . 27
2.5.6 Fast PVT Verification Limitations . . . . . . . . . . . . . . . 27
2.5.7 Guidelines on Measurements . . . . . . . . . . . . . . . . . . . 28
2.6 Design Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
2.6.1 Corner-Based Design of a Folded-Cascode
Amplifier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
2.6.2 Low-Power Design. . . . . . . . . . . . . . . . . . . . . . . . . . 31
2.7 Fast PVT: Discussion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
2.8 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Appendix A: Details of Fast PVT Verification Algorithm. . . . . 33
Appendix B: Gaussian Process Models . . . . . . . . . . . . . . . . . . 36
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
3 A Pictorial Primer on Probabilities. . . . . . . . . . . . . . . . . . . . . . . . 41
3.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
3.2 One-Dimensional Probability Distributions . . . . . . . . . . . . . . . 41
3.3 Higher-Dimensional Distributions . . . . . . . . . . . . . . . . . . . . . 43
3.4 Process Variation Distributions . . . . . . . . . . . . . . . . . . . . . . . 45
3.5 From Process Variation to Performance Variation . . . . . . . . . . 46
3.6 Monte Carlo Sampling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
3.7 Interpreting Performance Distributions . . . . . . . . . . . . . . . . . . 48
3.8 Histograms and Density Estimation . . . . . . . . . . . . . . . . . . . . 52
3.9 Statistical Estimates of Mean, Standard Deviation,
and Yield . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
3.10 Normal Quantile Plots . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
3.11 Confidence Intervals. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
3.11.1 Confidence Interval for Mean (P1). . . . . . . . . . . . . . . 60
3.11.2 Confidence Interval for Standard Deviation (P2) . . . . . 60
3.11.3 Confidence Interval for Yield (P3). . . . . . . . . . . . . . . 61
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63
4 3-Sigma Verification and Design. . . . . . . . . . . . . . . . . . . . . . . . . . 65
4.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65
4.2 Review of Flows that Handle 3-Sigma Statistical Variation. . . . 66
4.2.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
4.2.2 Flow: PVT (with SPICE) . . . . . . . . . . . . . . . . . . . . . 67
4.2.3 Flow: PVT ± 3-Stddev Monte Carlo Verify . . . . . . . . 68
xii Contents

4.2.4 Flow: PVT + Binomial Monte Carlo Verify . . . . . . . . 70
4.2.5 Flow: PVT with Convex Models . . . . . . . . . . . . . . . . 71
4.2.6 Flow: Direct Monte Carlo . . . . . . . . . . . . . . . . . . . . . 73
4.2.7 Flow: Light + Heavy Direct Monte Carlo . . . . . . . . . . 73
4.2.8 Flow: Linear Worst-Case Distances . . . . . . . . . . . . . . 74
4.2.9 Flow: Quadratic Worst-Case Distances . . . . . . . . . . . . 75
4.2.10 Flow: Response Surface Modeling . . . . . . . . . . . . . . . 75
4.2.11 Flow: Sigma-Driven Corners . . . . . . . . . . . . . . . . . . . 77
4.2.12 Summary of Flows for Three-Sigma
Statistical Design . . . . . . . . . . . . . . . . . . . . . . . . . . . 80
4.3 Sigma-Driven Corner Extraction . . . . . . . . . . . . . . . . . . . . . . 80
4.3.1 Sigma-Driven Corner Extraction with 1 Output . . . . . . 81
4.3.2 Benchmark Results on Sigma-Driven Corner
Extraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83
4.3.3 Sigma-Driven Corner Extraction with [1 Output:
Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
4.4 Confidence-Driven 3r Statistical Verification . . . . . . . . . . . . . 87
4.5 Optimal Spread Sampling for Faster Statistical Estimates . . . . . 88
4.5.1 Pseudo-Random Sampling and Yield Estimation . . . . . 88
4.5.2 Issues with Pseudo-Random Sampling . . . . . . . . . . . . 90
4.5.3 The Promise of Well-Spread Samples. . . . . . . . . . . . . 90
4.5.4 The ‘‘Monte Carlo’’ Label. . . . . . . . . . . . . . . . . . . . . 91
4.5.5 Well-Spread Sequences. . . . . . . . . . . . . . . . . . . . . . . 92
4.5.6 Low-Discrepancy Sampling: Introduction . . . . . . . . . . 92
4.5.7 OSS Experiments: Speedup in Yield Estimation?. . . . . 93
4.5.8 OSS Experiments: Convergence of Statistical
Estimates . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
4.5.9 Assumptions and Limitations of Optimal Spread
Sampling. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
4.6 Design Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 98
4.6.1 How Many Monte Carlo Samples?. . . . . . . . . . . . . . . 98
4.6.2 Corner-Based Design of a Flip-Flop. . . . . . . . . . . . . . 100
4.6.3 3-Sigma Design of a Folded-Cascode Amplifier . . . . . 101
4.7 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Appendix A: Density-Based Yield Estimation on [1
Outputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
Appendix B: Details of Low-Discrepancy Sampling. . . . . . . . . 108
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112
5 High-Sigma Verification and Design . . . . . . . . . . . . . . . . . . . . . . . 115
5.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
5.1.1 Background. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 115
5.1.2 The Challenge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 116
Contents xiii

5.2 Building Intuition on the Problem . . . . . . . . . . . . . . . . . . . . . 116
5.3 Review of High-Sigma Approaches . . . . . . . . . . . . . . . . . . . . 118
5.3.1 Giant Monte Carlo . . . . . . . . . . . . . . . . . . . . . . . . . . 119
5.3.2 Medium MC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119
5.3.3 MC with Extrapolation . . . . . . . . . . . . . . . . . . . . . . . 119
5.3.4 Manual Model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
5.3.5 Quasi Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . . 120
5.3.6 Direct Model-Based . . . . . . . . . . . . . . . . . . . . . . . . . 120
5.3.7 Linear Worst-Case Distance . . . . . . . . . . . . . . . . . . . 121
5.3.8 Rejection Model-Based (Statistical Blockade) . . . . . . . 121
5.3.9 Control Variate Model-Based . . . . . . . . . . . . . . . . . . 122
5.3.10 Markov Chain Monte Carlo. . . . . . . . . . . . . . . . . . . . 122
5.3.11 Importance Sampling . . . . . . . . . . . . . . . . . . . . . . . . 123
5.3.12 Worst-Case Distance + Importance Sampling . . . . . . . 125
5.4 High-Sigma Monte Carlo Method . . . . . . . . . . . . . . . . . . . . . 126
5.4.1 An Idea to Break the Complexity Barrier . . . . . . . . . . 126
5.4.2 HSMC Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . 126
5.4.3 Detailed Description. . . . . . . . . . . . . . . . . . . . . . . . . 127
5.4.4 Output of HSMC Method . . . . . . . . . . . . . . . . . . . . . 128
5.4.5 Example HSMC Behavior, on Bitcell Read Current . . . 129
5.4.6 HSMC Usage Flows. . . . . . . . . . . . . . . . . . . . . . . . . 130
5.4.7 Other HSMC Attributes . . . . . . . . . . . . . . . . . . . . . . 134
5.5 HSMC: Illustrative Results . . . . . . . . . . . . . . . . . . . . . . . . . . 135
5.5.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 135
5.5.2 Experimental Setup . . . . . . . . . . . . . . . . . . . . . . . . . 135
5.5.3 Bitcell Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 135
5.5.4 Sense Amp Results . . . . . . . . . . . . . . . . . . . . . . . . . 136
5.5.5 Flip-Flop Results . . . . . . . . . . . . . . . . . . . . . . . . . . . 137
5.5.6 HSMC vs. Extrapolated MC . . . . . . . . . . . . . . . . . . . 138
5.6 Binary-Valued Outputs and Adaptive Initial Sampling . . . . . . . 143
5.6.1 Default HSMC and Typical Successful Behavior . . . . . 145
5.6.2 Default HSMC on Binary-Valued Outputs . . . . . . . . . 145
5.6.3 HSMC with Adaptive Initial Sampling
on Binary-Valued Outputs. . . . . . . . . . . . . . . . . . . . . 147
5.6.4 Details of Adaptive Initial Sampling Algorithm. . . . . . 148
5.7 System-Level Analysis and Full PDF Extraction . . . . . . . . . . . 149
5.7.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 149
5.7.2 The Challenge of Statistical System-Level Analysis . . . 150
5.7.3 Brief Review of System-Level Approaches,
Focusing on SRAM . . . . . . . . . . . . . . . . . . . . . . . . . 150
5.7.4 Statistical System Analysis Via Nested MC
on Extracted PDFs . . . . . . . . . . . . . . . . . . . . . . . . . . 152
5.7.5 Full PDF Extraction via High-Sigma Monte Carlo . . . . 153
5.7.6 Drawing Samples from Arbitrary PDFs . . . . . . . . . . . 154
xiv Contents

5.7.7 Example Analysis of SRAM Array . . . . . . . . . . . . . . 155
5.8 HSMC Convergence/Limitations . . . . . . . . . . . . . . . . . . . . . . 156
5.9 HSMC: Discussion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158
5.10 Design Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 159
5.10.1 Flip-Flop Setup Time . . . . . . . . . . . . . . . . . . . . . . . . 159
5.10.2 High-Sigma DRAM Design. . . . . . . . . . . . . . . . . . . . 161
5.10.3 SRAM Sense Amplifier . . . . . . . . . . . . . . . . . . . . . . 163
5.11 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 165
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 166
6 Variation-Aware Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 169
6.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 169
6.2 Manual Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 171
6.2.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 171
6.2.2 SPICE-Based Analysis Techniques. . . . . . . . . . . . . . . 172
6.2.3 SPICE-Based Design Tuning. . . . . . . . . . . . . . . . . . . 174
6.2.4 Advantages and Disadvantages . . . . . . . . . . . . . . . . . 174
6.3 Automated Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175
6.3.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175
6.3.2 Automated Topology Design . . . . . . . . . . . . . . . . . . . 175
6.3.3 Automated Sizing: Problem Types . . . . . . . . . . . . . . . 176
6.3.4 Automated Sizing: Optimizer Criteria. . . . . . . . . . . . . 177
6.3.5 Automated Sizing: Example on Digital
Standard Cells . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 178
6.3.6 Advantages and Disadvantages . . . . . . . . . . . . . . . . . 179
6.4 Integrating Manual and Automated Approaches. . . . . . . . . . . . 180
6.4.1 Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 180
6.4.2 Design Exploration User Interface . . . . . . . . . . . . . . . 181
6.5 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 184
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 185
7 Conclusion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 187
Contents xv

Chapter 1
Introduction
Variation Effects, Variation-Aware Flows
Abstract This chapter introduces the problems of variation with respect to cus-
tom integrated circuit design. It then describes several design flows, and how well
they handle or fail to handle variation. The chapter concludes with an outline for
the rest of the book, which covers methodologies and tools for handling variation
in industrial design settings.
1.1 Introduction
Variation is an expensive problem. Failing to effectively design for variation can
cause product delays, respins, and yield loss. These are serious issues that directly
impact the revenues, profits, and ultimately, valuations of semiconductor com-
panies and foundries alike. The costs of variation problems trickle down the whole
supply chain in the form of product delays, inability to meet market demands,
finished product quality issues, and loss of customer confidence. This adds up to a
massive annual loss. Calculating this loss would be extremely difficult, as there are
many factors that contribute to the true cost of variation. However, we are aware of
cases where variation problems have led to single product losses in excess of $100
million, so given the large number of semiconductor products available, it is
intuitive that the annual losses due to variation are easily in the billions of dollars.
To make matters more challenging, physics and economics continue to co-
conspire to drive us toward smaller process geometries. As transistors get smaller,
performance targets increase, and supply voltages decrease, all making variation
effects more pronounced. The variation problem continues to get worse, and the
need to combat it with effective variation-aware design continues to become more
essential.
Designing for variation is also expensive. Collecting data using test chips and
building accurate models of variation is an intensive and complex procedure for
T. McConaghy et al., Variation-Aware Design of Custom Integrated Circuits:
A Hands-on Field Guide, DOI: 10.1007/978-1-4614-2269-3_1,
Springer Science+Business Media New York 2013
1

foundries and design companies alike. Putting variation models to even basic use
requires CAD tool investment, compute cluster investment, and CAD and IT
support staff.1
To effectively design for variation requires considerable designer
expertise, additional time for careful analysis and design iterations, and time to
perform thorough verification across the range of variation effects. Reducing
variation effects at the design stage is a critical component to solving the overall
variation problem, and this is best done with thoughtful design methodologies that
are both rigorous and that can be completed within production timelines.
This book is for designers. It is a field guide to variation-aware design, outlining
fast and accurate methods for eliminating risks and costs associated with variation.
It is for people who design RF, analog, I/O, custom digital, digital standard cell,
memory, automotive, or medical blocks or systems. That is, it is for people who
work with schematics and SPICE simulators, rather than just RTL and related
system code.2
No revolution is necessary; this book describes minimal but spe-
cifically targeted extensions to existing corner-based, SPICE-based design meth-
odologies. Furthermore, this book does not ask the reader to learn or re-learn deep
statistical concepts or advanced algorithmic techniques; though for the interested
reader, it does make those available in appendices.
In short, this book is about developing custom circuit designs that work, despite
the effects of variation, and doing so within production timelines.
1.2 Key Variation Concepts
We begin by presenting an overview of key variation-aware design concepts: types
of variables, types of variation, and terminology.
1.2.1 Types of Variables
Two types of variables affect a circuit’s behavior:
• Design variables (controllable variables): These can be set by the designer, and
together their choice constitutes the final design. These include the choices of
topology, device sizes, placement, routing, and packaging.
• Variation variables (uncontrollable variables): These cannot be set by the
designer in the final design; they happen due to various mechanisms that the
designer cannot control. However, their values can be set during design, to
1
CAD = computer-aided design, IT = information technology.
2
RF = radio frequency, I/O = input/output, SPICE = Simulation Program with Integrated
Circuit Emphasis (Nagel and Pederson 1973), and RTL = Resistor-Transistor Logic.
2 1 Introduction

predict their effect on the design’s performance. This ability to predict is the key
enabler of variation-aware design.
1.2.2 Types of Variation
In integrated circuits, the variation variables may take many forms, which we now
review.
Environmental variation: These variables include temperature, power supply
voltage, and loads. In general, environmental variables affect the performance of
the design once the circuit is operating in the end user environment. The design
must meet target performance values across all pre-set environmental conditions;
said another way, the worst-case performances across environmental corners must
meet specifications. These pre-set conditions may be different for different circuits;
for example, military-spec circuits typically must handle more extreme
temperatures.
Modelset-based global process variation: These are die-to-die or wafer-to-
wafer variations introduced during manufacturing, by random dopant fluctuations
(RDFs) and more. Global process variation assumes that the variations affect each
device in a given circuit (die) in an identical fashion. These variations affect device
performance, for instance vth, gm, delay, or power, which in turn affect circuit
performance and yield.
Traditionally, modelsets are used to account for global process variation. In
modelsets, each NMOS model and each PMOS3
model has a fast (F), typical (T),
and slow (S) version, supplied by the foundry in netlist form as part of the Process
Design Kit (PDK). The foundry typically determines the models by Monte Carlo
(MC) sampling the device, measuring the mean and standard deviation of delay,
then picking the sample with delay value closest to mean -3 * stddev (for
F modelset), closest to mean (for T modelset), and closest to mean +3 * stddev (for
S modelset).
The modelset approach to global process variation has traditionally been quite
effective for digital design: F and S conservatively bounded the high and low
limits of circuit speed; and since speed is inversely proportional to power, F and
S indirectly bracketed power. The device-level performance measures of speed
and power directly translated to the key digital circuit-level measures of speed and
power. However, the modelset approach has not been adequate for analog and
other custom circuits since modelsets do not bracket other performances such as
slew rate, power supply rejection ratio, etc. When possible, designers have
3
NMOS = N-channel MOSFET, PMOS = P-channel MOSFET, MOSFET = metal-oxide-
semiconductor field-effect transistor.
1.2 Key Variation Concepts 3

compensated using differential topology designs; and when not possible, they used
the modelsets anyway and hoped for the best.
Statistical global and local process variation: Whereas in the past, the modelset
approach to handling global process variation was adequate for most cases, the
situation is now changing. This is because gate lengths continue to shrink over
time, as Fig 1.1 shows. This phenomenon—Moore’s Law—is still happening:
devices will continue shrinking in the foreseeable future. While transistors keep
shrinking, atoms do not. For earlier technology generations, a few atoms out of
place due to random dopant fluctuations or other variations did not have a major
impact on device performance. Now, the same small fluctuations matter. For
example, typically the oxide layer of a gate is just a few atoms thick, so even a
single atom out of place can change device performance considerably. Statistical
models can capture these variations. Local variation occurs within a single die,
while global variation occurs across dies or wafers.
On modern process nodes, such as TSMC 28 nm or GF 28 nm, statistical
models of variation are supplied by the foundry as part of the PDK. Larger
semiconductor companies typically verify and tune these models with in-house
model teams. A statistical model typically specifies the global random variables,
the local random variables, and the distribution of those random variables. Another
approach is to use modelsets for global process variation, and a statistical model
for local variation only.
There are many approaches to modeling statistical variation. Probably the best-
known approach is the Pelgrom mismatch model (Pelgrom and Duinmaijer 1989).
In this model, matched devices are identified beforehand, such as devices in a
current mirror, and the variance in threshold voltage Vt between matched devices
is estimated. The theory is based on simple hand-based equations for transistors in
the saturation region, which makes them poorly suited for calibration from tester-
gathered MOS data, or for other transistor operating regions.
Since Pelgrom’s famous work, many improved models have emerged. An
example is the Back-Propagation-of-Variance (BPV) statistical model (Drennan
12
14
16
18
20
22
24
26
28
30
2009 2010 2011 2012 2013 2014 2015 2016 2017 2018
Gate
length
(nm)
Year of production
Fig. 1.1 Transistor gate length is shrinking (ITRS 2011)
4 1 Introduction

and McAndrew 2003). It does not require specification of mismatch pairs. It is
more accurate because it directly models the underlying physical variables as
independent random variables (e.g. oxide thickness, substrate doping concentra-
tion) which can be readily calibrated by silicon measures. It can also account for
both global and local variation. Beyond BPV, research on more accurate models
continues, and foundries will continue to incorporate them into PDKs.
Figure 1.2 compares FF/SS variation versus statistical variation on a GF 28 nm
process for a performance output of a typical analog circuit. We see that the FF/SS
modelset does not adequately capture the performance bounds of the circuit,
reconfirming our claim that FF/SS corners are not adequate on modern geometries
for many types of custom circuits.
Layout parasitics: These resistances and capacitances (RCs) are not part of the
up-front design, but rather emerge in the silicon implementation. They form within
devices, between devices and interconnect, between devices and substrate,
between interconnects, and between interconnect and substrate. Their effects are
most concerning in circuits operating at higher frequencies (e.g. RF), or lower
power supply voltages which have less margin. The challenge with layout
parasitics is that one needs the layout to measure them, yet they affect electrical
performance, which needs to be handled during front-end design, the step before
layout. At advanced process nodes (e.g. 20 nm) where double patterning lithog-
raphy (DPL) is used, the parasitics between layers can significantly impact
performance.
Other types of variation: There are even more types of variation. Transistor
aging/reliability includes hot carrier injection (HCI) and negative bias temperature
instability (NBTI), which have been noted for some time, but are now becoming
more significant. New aging issues include positive bias temperature instability
(PBTI) and soft breakdown (SBD). There is electromigration (EM), which is aging
on wires. There are layout-dependent effects (LDEs), which include well prox-
imity effects (WPEs) and stress/strain effects. Thermal effects are becoming an
FF
SS
52 51 50 49
Avg. duty cycle
FF/SS do not capture
the bounds of the distribution!
Fig. 1.2 FF/SS Corners
versus Distribution, for the
average duty cycle output of a
phase-locked loop (PLL)
voltage-controlled oscillator
(VCO), on GF 28 nm.
Adapted from (Yao et al.
2012)

issue with through-silicon-via (TSV)-enabled 3D ICs, which have less opportunity
for air-based cooling. There are noise issues, crosstalk issues, and more.
Sometimes the various variation effects interact. For example, parasitics
themselves can have process variation, and aging and process variation have
nonlinear interactions.
Many recent books discuss the physical underpinnings of variation effects in
great detail, for example (Chiang and Kawa 2007; Kundu and Sreedhar 2010;
Orshansky et al. 2010; Srivastava et al. 2010). This book is complementary. It aims
to equip designers with intuition and straightforward-to-apply methodologies for
industrial-scale variation-aware design. In fact, the techniques in this book have
now been in use at some major semiconductor vendors and foundries for several
years.
Despite this long list of variation effects, we have found that many of these
effects can be handled with simple steps, such as with post-layout simulation, or
including aging in simulation (Maricau and Gielen 2010). Other types of variation
may be hidden from the designer, for instance, using design rules, or with tools
such as optical proximity correction.
In our experience, global process variation, local process variation, and envi-
ronmental variation must be managed more directly by the designer, because (1)
the effect on performance and yield is too large to be ignored, (2) they cannot be
simply revealed by a single simulation, and (3) as we will see, simplistic sets of
simulations such as comprehensive PVT corner analysis or thorough Monte Carlo
analysis are too simulation-intensive.
This book focuses on global and local process variation, and environmental
variation, with knowledge that many of the other effects are being adequately
addressed orthogonally via appropriate tools and problem setup.
1.2.3 Key Variation-Related Terms
PVT variation is a combination of modelset-based global process variation (P) and
environmental variation, including power supply voltage (V), temperature (T),
load conditions, and power settings (e.g. standby, active).
Corners: A corner is a point in variation space. For example, a traditional PVT
corner had a modelset value, a voltage value, and a temperature value, such as
{modelset = FF, vdd = 1.3 V, T = 15 C}. The concept generalizes to include
other types of variation. For example, a corner may have a value for each local
process variable, such as {modelset = FF, vdd = 1.3 V, T = 15 C,
M1_Nsub = 0.23, M1_tox = 0.12, M2_Nsub = 0.21,…}. Due to DPL, RC
parasitics are often modeled as corners too. As we will see, this generalized
concept of corners is crucial to pragmatic variation-aware design.
Yield is the percentage of manufactured circuits that meet specs across all
environmental conditions, expressed as a percentage, such as 95 %. Yield may
also be expressed in alternate units of probability of failure, sigma1, and sigma2.
6 1 Introduction

Probability of failure (pfail) is another unit for yield, defined as pfail = 1-
yield(%)/100. For example, pfail is 0.05 when yield is 95 %.
Sigma is a unit of yield, and can use either a single-tailed or two-tailed
assumption, referred to as sigma1 and sigma2, respectively. Sigma1 yield is the
area under a Gaussian curve from -? to +sigma. Sigma2 yield is the area under
the curve between -sigma and +sigma. Figure 1.3 illustrates the difference
between sigma1 and sigma2.
Figure 1.4 shows typical conversions among sigma1, sigma2, yield, and
probability of failure.
High-sigma circuits: For an overall chip to have a reasonable yield (2–3
sigma), replicated blocks like standard cells and memory bitcells need to have
much higher yields (4–6 sigma). The need to analyze and design such ‘‘high-
sigma’’ circuits introduces qualitatively new challenges compared to 3-sigma
design.
1.3 Status Quo Design Flows
We now review typical status-quo flows for designing custom circuit blocks.
Figure (1.5a) shows the simplest possible flow.
• In the first step, the designer selects a topology.
• In the next step, he does initial sizing by computing the widths, lengths, and
biases, typically from first principles equations against target power budget and
performance constraints.
• In the third step, he makes modifications to the circuit sizing to improve per-
formance. This step typically involves sensitivity analysis, sweeps, and other
design exploration techniques, getting feedback from SPICE simulations.
• Starting from the sized schematic or netlist, the designer then does layout:
device generation, placement, and routing.
At the end of this flow, the block is ready for integration into larger systems.
The flow also works for system-level designs and higher by applying behavioral
models or FastMOS/Analog FastSPICE simulators.
(a) Single-Tailed Sigma (b) Two-Tailed Sigma
-infinity to sigma value
0 1 2 3
-1
-2
-3
84.1%
+/- sigma value
0 1 2 3
-1
-2
-3
68.3%
Fig. 1.3 Converting between yield and sigma. a Single-tailed sigma. b Two-tailed sigma

Of course, the flow of Fig. (1.5a) does not account for variations at all, leaving
the final design highly exposed.
Figure (1.5b) shows an example status quo flow that begins to address variation.
Starting with the simple flow of Fig. (1.5a), it adds user-chosen PVT corners, ad-
hoc statistical Monte Carlo sampling, and post-layout parasitic extraction with
SPICE-based verification.
While this is a big improvement in handling variation compared to the simple
flow, it falls short in many regards:
• First, the user might not have chosen the PVT corners that bound worst-case
performance, which means the design is optimistic and could fail in the field. Or,
to be on the safe side, he used all the PVT corners. This resulting large number
of corners means painfully long sizing iterations.
Fig. 1.4 Typical conversions
among sigma1, sigma2, yield,
and probability of failure
Set topology
Initial sizing
Sizing (for performance)
Layout
Set topology
Initial sizing
Sizing on corners
Verify
(ad-hoc statistical)
Layout
Extract parasitics
Verify with parasitics
Choose corners
(ad-hoc PVT)
(a) (b)
Fig. 1.5 Status quo design
flows. a A simple flow.
b Beginning to address
variation with user-chosen
PVT corners, ad-hoc
statistical (Monte Carlo)
sampling, and parasitic
extraction
8 1 Introduction

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Mr. Pena. Yes; that's Oswald.
Mr. Liebeler. Do you recognize him as the same man who was in
the bar?
Mr. Pena. Yes.
Mr. Liebeler [handing picture to witness]. I show you a picture
that has been marked Pizzo Exhibit No. 453-C, and ask you if you
can identify that man.
Mr. Pena. Yes; that's Oswald.
Mr. Liebeler. That's the same man who was in your bar?
Mr. Pena. Yes.
Mr. Liebeler. Do you have any doubt in your mind that it was
Oswald who was in your bar?
Mr. Pena. He was there.
Mr. Liebeler. He was there?
Mr. Pena. Yes.
Mr. Liebeler. Am I correct in my understanding of your previous
testimony that after you saw the picture of Oswald on television
after the assassination, you, yourself, recognized that as the man
that had been in the bar, even before Rodriguez mentioned it to
you?
Mr. Pena. Well, I seen it and I came down. I was talking about it,
and I recognized him right away.
Mr. Liebeler. Even before Rodriguez spoke to you about it, or was
it after Rodriguez spoke to you about it?
Mr. Pena. I was talking about it, and the man was in my place,
you know. Then Rodriguez came over and said, You remember that
man who was drinking that lemonade? Then my mind got clear. He
just run from his house to my house to tell me about it.

Mr. Liebeler. You had seen Oswald on television before Rodriguez
told you about it and you thought you recognized him as having
been in the place?
Mr. Pena. Yes.
Mr. Liebeler. Then Rodriguez reminded you of the lemonade and
then it became clear in your mind that Oswald was the man who had
ordered the lemonade and had been in your place?
Mr. Pena. Yes.
Mr. Liebeler. Rodriguez told the FBI that shortly after Oswald had
been in the bar, after the lemonade incident, that he went to a
doctor's office with you and this was just before you went to Puerto
Rico and the Dominican Republic. Do you have any recollection of
that?
Mr. Pena. We went to a doctor's office?
Mr. Liebeler. Yes. To be more specific, Rodriguez said that while
he was riding back in the car with you, he saw Bringuier in the street
with some policemen. Do you know anything about that?
Mr. Pena. Oh, yes. They got some kind of trouble. I went out.
Yes. And they got some group, or two or three people was giving
propaganda away, and Bringuier and one or two more guys went
and started an argument with the guy who was giving the
propaganda away in Canal Street. Then the police came down and
they arrested him. Bringuier, and one or two more Cubans, and one
more guy. I don't know the guy. I have seen him, but I don't know
the guy. And they put them in jail in the first district, and they was
calling Bringuier's brother-in-law. His name is—it is——
Mr. Liebeler. Hernandez? Is that Celso Hernandez?
Mr. Pena. No. They called me up there. I say, Well— so I went
over there and put a bond, $20, so they can come out.
Mr. Liebeler. You actually went to the police station and put up
bond for Bringuier?

Mr. Pena. Yes, sir.
Mr. Liebeler. That was so that Bringuier could get out?
Mr. Pena. Yes. One or two more guys.
Mr. Liebeler. Do you remember seeing the incident in the street
as you drove by?
Mr. Pena. No.
Mr. Liebeler. Did Rodriguez tell you about it later on? He told you
that he had seen it?
Mr. Pena. Yes.
Mr. Liebeler. Did he tell you that when he was with you at that
time? Did he mention it after the doctor's appointment where you
had been together?
Mr. Pena. What you mean?
Mr. Liebeler. Did Rodriguez tell you that he had seen Bringuier in
the street on the way back from the doctor's appointment when he
was with you?
Mr. Pena. I don't remember that.
Mr. Liebeler. In any event, you, yourself, did not see Bringuier in
the street with the policemen at that time, and later on, after
Bringuier had been arrested, you went over to the police station and
put the bond up for Bringuier?
Mr. Pena. His brother-in-law in the store told me about it. He say,
I can't leave the store by myself. I said, How much would the
bond be? Then I said, Okay, I put the bond. Then you give it back
to me.
Mr. Liebeler. Now that was shortly before you went to Puerto
Rico; is that correct?
Mr. Pena. I don't know exactly.

Mr. Liebeler. Do you remember whether the incident with regard
to the bond was about the time that Oswald was in the bar and
ordered the lemonade, or was it not about at that time? Do you
remember?
Mr. Pena. I don't remember.
Mr. Liebeler. Do you remember one time about in May or so of
1962 that you got into a fight in your bar with some man who was
standing there listening to you talk to some of your friends?
Mr. Pena. I got so many fights in my place I don't know which
one it is.
Mr. Liebeler. Do you know a man by the name of Garcia?
Mr. Pena. I don't know.
Mr. Liebeler. Hector José Garcia?
Mr. Pena. Hector José Garcia?
Mr. Liebeler. We have a report that there was a man in your bar
who heard you talking to two merchant seamen, and you are
reported to have said: Castro should have been notified about that
as soon as possible. Do you remember saying anything about that?
Mr. Pena. That Castro should be notified about it?
Mr. Liebeler. That Castro should have been notified about that as
soon as possible.
Mr. Pena. No.
Mr. Liebeler. Have you ever had anything to do with Castro?
Mr. Pena. No; not ever.
Mr. Liebeler. You say that Rodriguez had worked as a merchant
seaman prior to the time he went to work as a bartender, is that
correct?
Mr. Pena. Yes.

Mr. Liebeler. About what time did he start working as a
bartender?
Mr. Pena. When he came. His ship sunk and—somewhere in
Costa Rica—and they was transferred to New Orleans, and the
company—agency that he worked for bring him to New Orleans,
bring a whole bunch to New Orleans. They know I got room up in
the house on the third floor. They ask me if I got rooms, so I rent
rooms to those guys, so—Evaristo, too—so in that time, I put
Evaristo to work for me.
Mr. Liebeler. About how long ago was that?
Mr. Pena. I don't know exactly. I know it's over a year.
Mr. Liebeler. Over a year?
Mr. Pena. Yes.
Mr. Liebeler. You do have a lot of fights and difficulties in your
bar, is that correct?
Mr. Pena. Yes. Arguments. You know, a barroom.
Mr. Liebeler. Was the anti-Castro organization that you worked
with called the Cuban Revolutionary Council?
Mr. Pena. Yes.
Mr. Liebeler. That was the name of it?
Mr. Pena. And the delegate here was Serrgio Arcacha. He was the
boss of the organization.
Mr. Liebeler. Do you remember having your picture in the paper
at one time——
Mr. Pena. Yes.
Mr. Liebeler. In connection with this, on the front page?
Mr. Pena. Yes.
Mr. Liebeler. That would have been some time in late December
of 1960 approximately?

Mr. Pena. I don't know exactly.
Mr. Liebeler. Do you remember that when you talked to the FBI
just last month, they asked you when you went to Puerto Rico and
the Dominican Republic in August of 1963, and they asked you the
days?
Mr. Pena. Yes.
Mr. Liebeler. And did you subsequently discuss that with your
attorney, Mr. Tamberella?
Mr. Pena. Yes. Well, see, why, the reason I took Tamberella with
me was because from my point of view, the FBI of New Orleans ask
me about the same things so many times that somehow I was mad,
so I said—about 10, 15 times they ask me the same thing over and
over and over, and Tamberella is my lawyer, so I went to Tamberella
and said, Look! They look silly to me. They say the same thing so
much, so I want to see if I can't stop this. If they come around
asking me something else, that's okay, but for the same thing, I
can't tell no more about that. He said, Okay, I go with you.
Mr. Liebeler. Now my reports indicate that Mr. Tamberella called
the FBI office back after your interview and told the FBI that you
had left for Puerto Rico on August 8, 1963.
Mr. Pena. August 8?
Mr. Liebeler. Yes. That you were not able to tell them the exact
date at the time of the interview, but later, Mr. Tamberella told them
that. That does not appear to be correct, does it?
Mr. Pena. I don't know exactly. It wasn't in the passport, the
date?
Mr. Liebeler. Well, the date was August 22 in the passport.
Mr. Pena. The date in the passport was the date I came out of
the Dominican Republic, the 22d. I came back on my way back to
New Orleans the 22d of August.
Mr. Liebeler. Let me ask you this——

Mr. Pena. Yes; might be the day I came out of the Dominican
Republic. I don't know exactly. Might be the 8th because I spent 1
week—if that date, August 22, is the date I left the Dominican
Republic, might be the 8th because I spent 2 weeks between the
two places. Delta Airlines can give you the date of the flight to
Puerto Rico exactly.
Mr. Liebeler. The only way that you and Mr. Tamberella were able
to fix the date was by looking at the stamp on the passport; is that
correct?
Mr. Pena. Yes.
Mr. Liebeler. If the visa stamp is the date that you left the
Dominican Republic——
Mr. Pena. It would be 14 days before that. I went 1 week in
Puerto Rico and 1 week in the Dominican Republic.
Mr. Liebeler. If the date on the stamp was the day you went into
the Dominican Republic——
Mr. Pena. It would be 7 days before.
Mr. Liebeler. You are absolutely clear in your mind, however, that
you were here in New Orleans on the day that Bringuier was
arrested in connection with the propaganda demonstration on the
street because you put up the bond to get him out. If I told you that
that happened on August 9, 1963, that would indicate that you were
here in New Orleans at that time and that you must have left some
time subsequent to August 9, 1963?
Mr. Pena. I don't know. It might be another time, but the time I
placed the bond for him, I was here because I was the one went up
to the first precinct to give the money.
Mr. Liebeler. That was the time Bringuier had gotten into a fight
with this man over distributing propaganda leaflets?
Mr. Pena. I didn't see the fight.
Mr. Liebeler. But he told you about it?

Mr. Pena. Yes.
Mr. Liebeler. Did he tell you how this fight came about?
Mr. Pena. Some other Cuban, a friend of Bringuier's, one of the
Cubans I placed the bond for, came to Bringuier's store—that's what
they told me about it, what I hear—and told Bringuier, Look,
Bringuier, there is a man there giving propaganda against the Cuban
Society in favor of Castro. So Bringuier came out, but the two men
got away, and how they—I don't know what happened, what was
the argument, but they got arrested by the policemen.
Mr. Liebeler. That was the time when you put up the bond to get
him out?
Mr. Pena. Yes; if that's the same time. I don't know if he got in
some other trouble like that a different time. I don't know. I put
bond for him one time. I don't know if it was—I don't remember
exactly.
Mr. Liebeler. Well, the description of the incident that you have
given us about the propaganda sounds very much like the one that
occurred on August 9, and the man who was handing out the
literature was Oswald, and Bringuier was arrested along with two
other men along with Oswald. That would seem to place you here in
the United States at that time. We can always check what the
procedure is on that visa stamp so we can figure out when you left
the United States.
Mr. Pena. You don't need a visa to go to Puerto Rico when you
are an American citizen, but the Delta Airlines, if they keep records,
can give you the exact date and the hour I left New Orleans to go to
San Juan, P.R., last summer. I know it was in August because in
August is my birthday.
Mr. Liebeler. You went to Puerto Rico on your birthday?
Mr. Pena. Well, I stay there on my birthday.
Mr. Liebeler. When is your birthday?

Mr. Pena. August 15.
Mr. Liebeler. August 16?
Mr. Pena. Fifteen.
Mr. Liebeler. I show you a photographic copy of a passport
application dated June 24, 1963, and ask you if that is a copy of the
passport application that you filled out on or about that day
[handing document to witness].
Mr. Pena. Yes.
Mr. Liebeler. That is a copy of your passport application, is it?
Mr. Pena. I believe so.
Mr. Liebeler. I would like to mark that as Orest Pena Exhibit No.
1, and I will just write it on here if I may.
(Whereupon, the document offered by counsel was duly marked
for identification as Orest Pena Exhibit No. 1.)
Mr. Liebeler. I have marked this Orest Pena Exhibit No. 1, New
Orleans, July 21, 1964, and I have placed my initials on it. Would
you initial it below my initials just so we know we are talking about
the same document.
Mr. Pena. Over here [indicating]?
Mr. Liebeler. Yes; just put your initials on it.
(Witness complying.)
Mr. Liebeler. Now this application also has a part 2, which is
required to be filled out by naturalized citizens. That is also a part of
your application; is it not? [Handing document to witness.] Is that a
part of your application, too, Mr. Pena?
Mr. Pena. I don't know. Might be. Something wrong here. How—
went to Mexico? I don't know exactly.
Mr. Liebeler. What's the problem?

Mr. Pena. I don't know. Says here I was in Mexico. I don't know
when I went to Mexico. When I got my passport, I don't remember
exactly. I believe I got my passport—when I went to Mexico? How
come it says here I went to Mexico?
Mr. Liebeler. You told us you went to Mexico in May of 1963, if I
am not mistaken. Is that right?
Mr. Pena. I know I went to Mexico last year.
Mr. Liebeler. Well, this passport application, the one that we have
already marked, is dated June 24, and the part, the supplement to
it, or what purports to be a supplement to it indicates that you went
to Mexico for 8 days in May of 1963. Now this part that we are
looking at is not signed by you at any point.
Mr. Pena. You mean that's when I applied for my passport?
Mr. Liebeler. No; you applied for your passport on June 24, 1963.
That was after you came back from Mexico. You didn't need your
passport to go to Mexico. I don't think you did, anyway.
Mr. Pena. Yes; I believe so. I got my citizen papers; yes.
Mr. Liebeler. But the information that is set forth on this second
part of the application, to the extent that it indicates that you went
to Cuba in 1959 in May and April, is correct, is it not?
Mr. Pena. Well, I don't know the exact date, but it was around
there, somewhere around there.
Mr. Liebeler. The information that you came to the United States
in October of 1946 is correct, is it not? That's correct approximately?
Mr. Pena. Yes; around.
Mr. Liebeler. And you lived at 223 West 105th Street in New York
City, did you not, for a time?
Mr. Pena. Yes; I lived in that place.
Mr. Liebeler. Now on the application, the original application that
we have marked as Exhibit No. 1, which you signed, it indicates,

does it not, that you were going to go to Spain and that you planned
to go to Spain for a vacation trip of approximately 2 weeks.
Mr. Pena. Yes.
Mr. Liebeler. Now in fact, you didn't go to Spain at that time; is
that right?
Mr. Pena. Yes.
Mr. Liebeler. You went to Puerto Rico and the Dominican
Republic?
Mr. Pena. Yes.
Mr. Liebeler. What made you change your mind about that?
Mr. Pena. I don't know; I just changed my mind. I postponed the
trip to Europe for this year.
Mr. Liebeler. Do you recall that you did plan to go to Spain on
vacation?
Mr. Pena. What?
Mr. Liebeler. Do you recall that you did plan to go to Spain on
vacation?
Mr. Pena. Yes, sir. That's where I did take my passport. You also
use a passport.
Mr. Liebeler. Where did you fill this application out?
Mr. Pena. Right here in New Orleans at 701 Loyola Street, if I am
not wrong, the new Federal building.
Mr. Liebeler. At 701 Loyola Street, the new Federal building?
Mr. Pena. Yes, sir.
Mr. Liebeler. Did you see Lee Harvey Oswald at the passport
office on the day you applied for this passport?
Mr. Pena. I don't believe he was there.
Mr. Liebeler. He applied for a passport on the same day.

Mr. Pena. He applied for the passport on the same day?
Mr. Liebeler. Yes.
Mr. Pena. I don't remember seeing him there. I remember the
day I applied for my passport there were a lot of people from—I
don't know from where, India or Africa. You know, colored people.
There were some people there. They were seamen or something,
and one American girl got all of those colored people. She was
helping all of them that day. A bunch of people there, colored
people.
Mr. Liebeler. You have no recollection of seeing Oswald there at
that time?
Mr. Pena. No.
Mr. Liebeler. As far as you know, you never saw Oswald at any
time other than that time you saw him in your bar?
Mr. Pena. No.
Mr. Liebeler. He never had any conversation with you; is that
correct?
Mr. Pena. Not that I recall.
Mr. Liebeler. Have any other Federal agencies besides the FBI
interviewed you?
Mr. Pena. You see, before, they used to go there and say, We
are from the Federal Bureau, and would just talk to them. I didn't
know what agency. I never took no one's name or anything until
later my lawyer told me, Every time you talk to one of these men,
get their name, where they come from. That was very, very much
later. Before, they would just come around and tell me that they are
asking me many things about people that was for Castro. When you
got a barroom, especially in Spanish like I got—most of my
customers are Spanish seamen, foreign seamen—you hear the way
they talk, and before, as I was against Batista—most of the people
here for Castro, really for Castro—they was going to my place. So

when I joined the organization against Castro in New Orleans, one
of the agents of the FBI, De Brueys, started going to my place very,
very often asking me about many different people, Spanish people,
what I knew, what I thought. I told him what I knew; that some
people was for Castro and some people was against. I told him what
I saw. I never did ask him what he found out about those people.
Mr. Liebeler. Sometimes you would call the FBI and give them
information, too; is that correct?
Mr. Pena. Yes.
Mr. Liebeler. Information that you picked up from conversations
that took place at your bar and listening to those seamen?
Mr. Pena. Yes.
Mr. Liebeler. Now I have been provided with what are supposed
to be all of the FBI reports about their conversations relating to the
Oswald case, and as far as I can tell, the only time the FBI has
spoken to you about that was back in December 1963, shortly after
the assassination, and then again in June 1964 just a short time
ago; when they came to question you again at my request after I
had——
Mr. Pena. Just those two times?
Mr. Liebeler. Yes; just twice.
Mr. Pena. I believe it's very many more times than that.
Mr. Liebeler. You think it is more times than that?
Mr. Pena. Oh, yes.
Mr. Liebeler. You are sure these were FBI men?
Mr. Pena. I don't know because, as I told you before, I didn't
used to get the names until my lawyer told me, Look! Every time
you talk to one of those people, you better get the name and write it
down so you know who you are talking about.

Mr. Liebeler. You wanted to tell me something about the FBI in
New Orleans. Why don't you do that now.
Mr. Pena. You see, I started—like I told you, when that
organization moved in New Orleans——
Mr. Liebeler. This is the anti-Castro organization?
Mr. Pena. Yes. So I went down there and joined the organization.
In 1959 when I went to Cuba, my mother told me how everything
was going; so she says, He is even worse than Batista. So when I
came back, I joined the organization a little bit after that, the
organization here in New Orleans. So I went and joined them and
started working for the organization collecting money at my place of
business and giving my own money for many things to the
organization, you know, a dollar, two dollars. Then De Brueys came
to the organization. Maybe—I don't know if sent by the Government
or how, but he went to the organization.
Mr. Liebeler. He joined it?
Mr. Pena. No; he didn't join it, but he was sticking with the
organization very, very close.
Mr. Liebeler. They knew he was an FBI agent?
Mr. Pena. Yes; we knew he was an FBI agent. So from time to
time he called me at my place. He went to my place and was asking
me about this guy and that guy, different people here in New
Orleans. So I told him what I thought about the men. I tell you that
and then you find out if I am right or if I am wrong. I never did ask
if I was right or wrong. I told him about people that I am for sure
they are for Castro here in New Orleans. So one way or the other, he
was interfering with me somehow, Mr. De Brueys, so——
Mr. Liebeler. De Brueys was interfering with you?
Mr. Pena. Yes. Somehow. So one day I went to the FBI. They
called me to the FBI. I don't remember exactly for what they called
me. So I told De Brueys'—I told De Brueys' or somebody else that I
talked to—De Brueys' boss—I didn't ask them who it was. They was

FBI. They was in the FBI office—I told the agency there I don't talk
to De Brueys. I don't trust him as an American.
Mr. Liebeler. Did you tell them any reasons why you didn't?
Mr. Pena. Because he was interfering very close with the
organization against Castro. So since that day—we got in a little bit
of argument there. We was talking about somebody. The FBI asked
me about a man that had been in the group before, about somebody
—if I knew somebody—if I knew his way for signing. So I asked De
Brueys, Did I told you about this man? He said, No. I got mad. I
said, If you said I didn't told you about that man, I don't trust you
as an American, to be for an American. So 2 days later he went to
my place of business. He said to me at the table, I want to talk to
you. I said, Okay, let's go. He said not to talk about him any more
because what he could do is get me in big trouble. He said, I am an
FBI man. I can get you in big trouble. But he made a mistake. I had
a girl that was with me that was here when he was discussing me.
Mr. Liebeler. Somebody else was there and heard it?
Mr. Pena. Yes. He was discussing me not to talk about it. He was
an FBI man and he could get me in big trouble. So I talked to my
girl friend and said, Look, I better pull out of this thing. What the
FBI wants me is to pull away from that organization and just keep
away from those things, politics, so I pull away, and I never did
heard from the FBI any more until Mr. Kennedy got assassinated.
They left me alone completely. They never asked me after I pulled
out of the organization. After that, I never listened to anybody
talking about politics in the place. I tried to keep out of it the most I
could. They never did call me any more until Oswald got—and then
they started coming here talking to me because we was talking
about the incident.
Mr. Liebeler. So your complaints about the FBI here in New
Orleans relate basically to the anti-Castro proposition and not to the
investigation of the assassination; is that correct?
Mr. Pena. No, no. That was way before.

Mr. Liebeler. You don't have any criticism of the FBI as far as the
investigation of the Kennedy assassination was concerned except
that you just don't like to talk to the FBI any more; is that right?
Mr. Pena. You mean after the assassination?
Mr. Liebeler. Yes.
Mr. Pena. After the assassination, they came and asked me so
many times about the same thing, lemonade, it just looked silly to
me. They came over so many times, I said, I better do something
about it. I called my lawyer and said, Look! I don't know anything
else about this. I want you to go with me there and put it clear that
that's what I know about it and I don't want no more part of that.
The thing—I got in an argument with one of the men there, the
same thing I told you about the printing and the propaganda. I told
him how I feel about that. I don't know whether I was right or
wrong. He told me that the United States is a big country and it was
hard to find. I told him, I don't agree with you. I told him that.
Mr. Liebeler. Who?
Mr. Pena. I talked to the agency about if that propaganda, where
they was printing that propaganda, and I said, Why can't you find
that place? He said, Because the United States is a big country. I
said, It doesn't matter. Each printing has their own type or letter
that can be found somehow.
Mr. Liebeler. So you told this FBI agent that they should find
where the propaganda literature had been printed?
Mr. Pena. The propaganda that Oswald was giving away. They
put that on television about 4 or 5 days after the assassination—
Oswald giving that propaganda. They knew that Oswald was giving
that propaganda away before Mr. Kennedy was killed. They got all of
that propaganda and all of that film taken of Oswald.
Mr. Liebeler. You think they should find where those leaflets were
printed? This is what you told them?

Mr. Pena. The little bit I know about the investigation, they even
—let me see how to say it. Let me see—they even keep Oswald from
killing Mr. Kennedy. From my point of view as an investigator, if they
went all the way from that propaganda, from where it was printed,
maybe they can put Oswald in jail. Maybe the President not be
killed. That was before Mr. Kennedy was killed.
Mr. Liebeler. Let me ask you this: Do you have any evidence or
do you know of any evidence that would link Oswald to anybody else
in a conspiracy to assassinate the President?
Mr. Pena. No.
Mr. Liebeler. Do you have any information or knowledge that
Oswald was involved with pro-Castro people in connection with the
assassination?
Mr. Pena. No; I can't tell you that.
Mr. Liebeler. Do you have any information that this was a pro-
Castro or a Castro plot to assassinate President Kennedy?
Mr. Pena. No; I can't say that.
Mr. Liebeler. Do you know whether anybody else in New Orleans
has any information like that?
Mr. Pena. No; I can't say that.
Mr. Liebeler. What about Bringuier?
Mr. Pena. What I think about Bringuier? He is just trying to get
big name, collecting big name to make himself big when he come
back to Cuba. Be one of the bosses. That's my point of view. I told
you he don't like the United States and what I told you about; you
can bring him here and tell him that Orest Pena told you that. I will
stand a lie-detector test and invite him to take one, and I invite De
Brueys, too, to ask De Brueys if that's true or not true he went to my
place and tried to intimidate me. If he say no, I take a lie-detector
test and he take a lie-detector test and maybe you will find one
Communist in the FBI.

Mr. Liebeler. You think that Bringuier is using his association with
Oswald to give himself a big name in connection with that?
Mr. Pena. That's what it is.
Mr. Liebeler. As far as you know, Bringuier doesn't have any
evidence that there was a pro-Castro plot to assassinate the
President.
Mr. Pena. No; I don't know. See, Bringuier know Oswald very
well. He told me one time—I don't know if that is true or not—he
said that Oswald brought him some kind of manual or a book. I
believe he still have the book. And Bringuier has his own
organization here. They call it——
Mr. Liebeler. DRE?
Mr. Pena. Cuban something.
Mr. Liebeler. Is that the DRE?
Mr. Pena. Yes; something.
Mr. Liebeler. Cuban Students Directory?
Mr. Pena. He said Oswald came to infiltrate in his organization.
Mr. Liebeler. And that Oswald came to his store?
Mr. Pena. Yes. That's what he told me. Before, I used to talk to
him, go there or he came to my place.
Mr. Liebeler. You and Mr. Bringuier are not too good friends any
more; is that right?
Mr. Pena. We was quite close until—when they started the
blockade in Cuba, the way he spoke about President Kennedy. And I
pulled a little bit out. I even used to give him sometimes more than
$2. I don't know. He collected to send to Miami, if he don't send it
somewhere else. That's what he said.
Mr. Liebeler. Do you have anything else that you want to tell us
at this time, Mr. Pena, that I haven't asked you about that you think
we should know about?

Mr. Pena. No.
Mr. Liebeler. You can't think of anything?
Mr. Pena. I tell you, Bringuier don't do many things that he will
tell you. He don't like America. Time will tell. He is one of the guys
that—do you remember when they were saying, Yankee, go home,
in Cuba? He was in Cuba at that time. He was calling, Yankee, go
home.
Mr. Liebeler. Has he ever favored Castro that you know of?
Mr. Pena. Oh, of course.
Mr. Liebeler. Who, Bringuier?
Mr. Pena. Yes. He said not?
Mr. Liebeler. I am asking you did he ever favor Castro.
Mr. Pena. I was in Cuba. I left Cuba very long time ago. I never
was involved in any kind of politics. I didn't like Batista, but I wasn't
in any organization.
Mr. Liebeler. You didn't know of any.
Mr. Pena. What I know about people, what I hear in my place, or
what I hear other people talking, and what I hear about Bringuier
was, when Castro started with his revolution of Cuba, he was one of
the Cubans in the revolution calling, Yankee, go home.
Mr. Liebeler. You don't think that Bringuier is in favor of Castro at
this time?
Mr. Pena. He? No, no. He hate Castro and he hate Russia, but he
hates America as much, too. He just want to go back to Cuba and be
one of the bosses.
Mr. Liebeler. Be a big man?
Mr. Pena. Yes.
Mr. Liebeler. All right, Mr. Pena. I want to thank you very much
for coming in.

Mr. Pena. I want you to know something: I love the United States
more than many people that are born in this country and I got a
place of business and I hear—they don't talk much now. They are
very scared, but before, when Castro was started, I learn many
people, how much they was against this country, people that was
born in this country. I love this country, believe me. Maybe you don't
believe me or have a bad report about me, but nobody make me a
Communist. Believe that. Believe it or not.
Mr. Liebeler. All right. Thank you very much.

TESTIMONY OF RUPERTO PENA
The testimony of Ruperto Pena was taken on July 21, 1964, at
the Old Civil Courts Building, Royal and Conti Streets, New Orleans,
La., by Mr. Wesley J. Liebeler, assistant counsel of the President's
Commission.
Ruperto Pena, having been first duly sworn, was examined and
testified, through the interpreter, as follows:
Mr. Liebeler. First, let the record show that this testimony is being
taken through an interpreter in the person of Special Agent Richard
E. Logan of the Federal Bureau of Investigation.
Mr. Pena, I am an attorney on the staff of the President's
Commission investigating the assassination of President John F.
Kennedy. I have been authorized to take your testimony pursuant to
certain regulations and orders that President Johnson has issued,
including Executive Order No. 11130, dated November 29, 1963, and
joint resolution of Congress No. 137.
You are entitled to have an attorney. You do not have to answer
the questions if you have any objections to them, and you are
entitled to 3 days' notice of the hearing.
Mr. Logan. I have already explained to him that you are an
attorney and about the Commission and authorization. Now I will
just tell him about these rights that he has.
(Discussion between witness and interpreter).
Mr. Logan. He says as long as he can answer them, that he will.

Mr. Liebeler. I assume that he will be willing to proceed without
an attorney?
Mr. Logan. No; he doesn't care.
Mr. Liebeler. Where were you born, Mr. Pena?
Mr. Pena. Mantanza—that's the province—Colón—that's the city—
Cuba.
Mr. Liebeler. When?
Mr. Pena. March 5, 1927.
Mr. Liebeler. You are still a citizen of Cuba?
Mr. Pena. Yes.
Mr. Liebeler. Where do you work?
Mr. Pena. With my brother at the—I help my brother run the bar,
the Habana Bar, 117 Decatur Street. The Habana Bar it is called.
Mr. Liebeler. Do you know Carlos Bringuier?
Mr. Pena (answering directly). Yes.
Mr. Liebeler. And you are the brother of Orest Pena; is that
correct?
Mr. Pena. Yes.
Mr. Liebeler. Do you know Evaristo Rodriguez?
Mr. Pena (answering directly). Yes.
Mr. Liebeler. Have you discussed with your brother an incident in
the bar where a man ordered a lemonade?
Mr. Pena. I didn't talk with my brother about it. I have discussed
it with the bartender.
Mr. Liebeler. Rodriguez?
Mr. Logan. Because his brother, apparently—he wasn't there
when the incident happened either. He didn't discuss it with his

brother and the bartender. Apparently, he just heard it through talk
in the bar about the thing.
Mr. Liebeler. You were not there at the time this happened?
Mr. Pena. No; I wasn't there.
Mr. Liebeler (handing picture to witness). I show you a picture
which has been marked Garner Exhibit No. 1, and ask you if you
recognize that man.
Mr. Pena. I know him from the newspapers, but I have never
seen him in person.
(Discussion between witness and interpreter.)
Mr. Logan. He knows. Just can't get it out right now. He doesn't
remember his name. He knows his face because he has seen it in a
lot of photographs and pictures in the newspaper. Never saw him in
person, but he knows the photograph of the man from pictures on
TV and newspapers.
Mr. Liebeler. And you know him as the man who assassinated
President Kennedy?
Mr. Pena. Yes; I do. I don't right at this second remember his
name.
Mr. Liebeler. Oswald?
Mr. Pena. Oswald is the man.
Mr. Liebeler (handing picture to witness). I show you a picture
that has been marked Bringuier Exhibit No. 1, and ask you if you
have ever seen any of the men in this picture, specifically that man
who is handing out leaflets slightly to Oswald's right, the man I point
to with my pencil, and, for the purposes of the record, it is the man
who stands behind Oswald to his right, and he is the second man
from Oswald. He wears a short-sleeved shirt with a tie.
Mr. Pena. I don't know anybody in there. I don't recognize
anybody in there.

Mr. Liebeler. Did you ever tell Carlos Bringuier that you had seen
Oswald anywhere?
Mr. Pena. No.
Mr. Liebeler. Were you in the bar, the Habana Bar, at the time
when your brother got into an argument with two Mexicans or
Cubans about the bongo drums?
Mr. Pena. It was me that had the argument with them. I had an
argument with a couple of them over there over the problem of
Cuba, but I was not there when the incident that your question
specifically asked about took place.
Mr. Liebeler. Now, you did have an argument with two Mexicans
about Cuba; is that right?
Mr. Pena. The problems of Cuba.
Mr. Liebeler. And did you call the FBI?
Mr. Pena. Bringuier did.
Mr. Liebeler. Bringuier called the FBI?
Mr. Pena. Yes.
Mr. Liebeler. How many times did you see these men?
Mr. Pena. The first time I saw them was in the bar, the two of
them. It was in the evening we were having this discussion over the
problems of Cuba. The second time was 2 or 3 days later—I am not
positive about that—when I saw them pass the bar in a little car.
Mr. Liebeler. Did you ask Bringuier to call the FBI?
Mr. Pena. Yes. What I did was, when I saw them passing in the
car—these two men that I mentioned, passing in a car—I went out
and took the license number and I gave this to Bringuier, Carlos
Bringuier, and I asked Bringuier to call the FBI because I wasn't able
to speak English well enough, and that's it.
Mr. Liebeler. Had you, yourself, ever called the FBI or any other
Government agency about these two men before you told Bringuier

to call them?
Mr. Pena. I didn't call anybody before I told Bringuier to call
them, the FBI.
Mr. Liebeler. Are you sure?
Mr. Pena. I am sure. I gave Bringuier the number and told him to
call the FBI because I couldn't speak English well enough.
Mr. Liebeler. Well, do you remember discussing this question with
Mr. Logan back in May, and Mr. Logan asked you this question at that
time, and don't you remember that you told Mr. Logan that you had
called the FBI or the Immigration and Naturalization Service?
Mr. Pena. No; I didn't, but at that time, I just have said that I
called one because it mentions there about the telephone. I just
can't remember it now.
Mr. Liebeler. Why did you ask Bringuier to call the FBI, when you
saw these men in the car?
Mr. Pena. The night that I had the discussion with these two
men, I got the impression that they were pro-Castro and probably
Communists, so that's why, when I saw them go by in the car a
couple of days later, I asked Bringuier to call the FBI to denounce
them, to turn them in or denounce them, or to let them know that
they were about.
Mr. Liebeler. Why didn't you call the FBI when you talked to them
the first time?
Mr. Pena. The first reason I did not call the FBI the first time was
because this discussion took place at night and that, as soon as the
discussion was terminated, these two men left, and so it just sort of
ended right there. Then, when I saw them again, I got Bringuier to
try to call them.
Mr. Liebeler. Did Bringuier tell you that he did call the FBI?
Mr. Pena. He called the FBI right in front of me.

Mr. Liebeler. Were you there when Bringuier called the FBI?
Mr. Pena. Yes. I was right there when he was supposed to have
called them.
Mr. Liebeler. Where did Bringuier call them from?
Mr. Pena. Called them from Bringuier's store. That's the Casa
Rocca. That's right down the street from me. It's 107 Decatur. It's
the Casa Rocca. It's a store. That's where the call was made from.
Mr. Liebeler. Did Bringuier tell you who he talked to at the FBI?
Mr. Pena. No.
Mr. Liebeler. Did these two men have anything to do with
Oswald, as far as you know?
Mr. Pena. As far as I know, no.
Mr. Liebeler. Have you ever seen them again after you saw them
in the car?
Mr. Pena. No; never saw them since.
Mr. Liebeler. Have you ever been in favor of Fidel Castro in the
early times?
Mr. Pena. I have never been friendly toward Castro. I am more or
less pro-Batista.
Mr. Liebeler. Do you have any information as to where these two
men could be found now?
Mr. Pena. No; I don't have any information. I am under the
impression that one was a Cuban and one was a Mexican because of
their method of speaking Spanish, which varies from each Spanish
country, like a Cuban speaking can recognize a Mexican by his
language rather than his appearance.
Mr. Liebeler. What is the answer to the question?
Mr. Pena. The answer to the question is that I do not have any
information as to where these two men can be found now.

Mr. Liebeler. Did you give Bringuier the license number of the
automobile?
Mr. Pena. Yes; I gave it to Bringuier.
Mr. Liebeler. Did Bringuier give it to the FBI?
Mr. Pena. Bringuier gave it to them, the FBI, over the telephone.
Mr. Liebeler. You are sure that you were present when Bringuier
talked to the FBI?
Mr. Pena. The thing is, I was there when Bringuier made a call
supposedly to the FBI, but I can't say and won't say that I know
Bringuier was talking to the FBI. Actually, as a matter of fact, he
could have been talking to just anybody. That's what he just said.
Mr. Liebeler. You had that problem because of your difficulty
understanding the English language?
Mr. Pena. The idea is that I was there when the call was made,
but I don't know. As far as I am concerned, Bringuier was talking to
the FBI.
Mr. Liebeler. It says here in this report that you weren't even
there.
(Discussion between witness and interpreter.)
Mr. Logan. He is telling me now about all the people that are
exiles that are in Cuba. They hollered, Yankee, no. But that's not
pertinent. You want me to ask him again about his being present
and see if we can make him remember?
Mr. Liebeler. Why does he mention this thing about Cuba? He is
not one of them?
Mr. Logan. I dare say it is part of his nature. He is telling me that
we have to be careful of all of these people, which we already know.
Mr. Liebeler. Now, Mr. Pena, did you tell Mr. Logan and Agent De
Brueys that you were not present when Carlos called the FBI?

Mr. Pena. I don't know that I remember telling you that, but I say
now that I was present when that call was made.
Mr. Liebeler. Now Mr. Bringuier said that you told him that one of
the two Mexicans had been in the bar with Oswald. Is that correct?
Mr. Pena. I never told Bringuier that.
Mr. Liebeler. And you couldn't have told Bringuier that because
you weren't even in the bar when Oswald was there and you never
saw the man who was with Oswald?
Mr. Pena. That's right. I wasn't in the bar when——
Mr. Liebeler. Do you have any knowledge that Oswald was
connected in any way with any conspiracy to assassinate the
President?
Mr. Pena. I have no information that Oswald was ever connected
with any organization or conspiracy to assassinate the President.
Mr. Liebeler. Is there anything else that you would like to tell us
about this whole affair?
Mr. Pena. I have no further information outside of what I have
already said regarding the two Mexicans.
Mr. Liebeler. All right. Thank you very much.

TESTIMONY OF SYLVIA ODIO
The testimony of Sylvia Odio was taken at 9 a.m., on July 22,
1964, in the office of the U.S. attorney, 301 Post Office Building,
Bryan and Ervay Streets, Dallas, Tex., by Mr. Wesley J. Liebeler,
assistant counsel of the President's Commission.
Mr. Liebeler. Would you please rise and take the oath? Do you
solemnly swear that the testimony you are about to give will be the
truth, the whole truth, and nothing but the truth, so help you God?
Mrs. Odio. Yes; I do.
Mr. Liebeler. Please sit down. My name is Wesley J. Liebeler. I am
an attorney on the staff of the President's Commission investigating
the assassination of President Kennedy. I have been authorized to
take your testimony by the Commission, pursuant to authority
granted to the Commission by Executive Order 11130 dated
November 29, 1963, and joint resolution of Congress No. 137.
Under the rules of the Commission, you are entitled to have an
attorney present, if you wish one. You are also entitled to 3 days'
notice of the hearing, and you are not required to answer any
question that you think might incriminate you or might violate some
other privilege you may have. I think the Secret Service did call you,
or Martha Joe Stroud, here in the U.S. attorney's office, called you
and gave you notice.
Mrs. Odio. Yes.
Mr. Liebeler. Do you wish to have an attorney present?

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