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CMOS Digital Integrated Circuits
1
CMOS Digital Integrated Circuits
Lec 10
Combinational CMOS
Logic Circuits
CMOS Digital Integrated Circuits
2
Combinational vs. Sequential Logic
Combinational
The output is determined by
•Current inputs
•Previous inputs
Output = f(In) Output = f(In, Previous In)
Combinational
Logic
circuit
Out
In
Out
In
State
Combinational
Logic
circuit
Sequential
The output is determined only by
•Current inputs
CMOS Digital Integrated Circuits
3
Static CMOS Circuit
• At every point in time (except during the switching transients) each
gate output is connected to either VDD or VSS via a low-resistive
path
• The outputs of the gates assume at all times the value of the
Boolean function, implemented by the circuit (ignoring, once
again, the transient effects during switching periods).
• This is contrasted to the dynamic circuit class, which relies on
temporary storages of signal values on the capacitance of high
impedance circuit nodes.
CMOS Digital Integrated Circuits
4
Static CMOS
• The complementary operation of a CMOS gate
» The nMOS network (PDN) is on and the pMOS network
(PUN) is off
» The pMOS network is on and the nMOS network is off.
f(In1,In2,…InN)
In1
In2
InN
In1
In2
InN
Pull Up Network (PUN)
Pull Down Network (PDN)
PUN and PDN are dual logic networks
nMOS
Network
VDD
pMOS
Network
CMOS Digital Integrated Circuits
5
NMOS Transistors
Series/Parallel Connection
• Transistors can be thought as a switch controlled by its gate signal
• NMOS switch closes when switch control input is high
NMOS Transistors pass a “strong” 0 but a “weak” 1
Y = X if A and B=AB
Y = X if A OR B=A+B
X Y
A B
X
Y
A
B
CMOS Digital Integrated Circuits
6
PMOS Transistors
Series/Parallel Connection
• PMOS switch closes when switch control input is low
PMOS Transistors pass a “strong” 1 but a “weak” 0
X Y
A B
X
Y
A
B
Y = X if AAND B = A+B
Y = X if A OR B = AB
CMOS Digital Integrated Circuits
7
Threshold Drops
VDD
VDD  0
PDN
0  VDD
CL
CL
PUN
VDD
0  VDD - VTn
CL
VDD
VDD  |VTp|
CL
S
D S
D
VGS
S
S
D
D
VGS
VDD
CMOS Digital Integrated Circuits
8
CMOS Logic Style
• PUN is the DUAL of PDN
(can be shown using DeMorgan’s Theorem’s)
• The complementary gate is inverting
AND = NAND + INV
B
A
AB
B
A
B
A





CMOS Digital Integrated Circuits
9
Example Gate: NAND
CMOS Digital Integrated Circuits
10
CMOS NOR2
Two-Input NOR Gate
ID
IDB,n
IDA,n
IDB,p
IDA,p
CMOS Digital Integrated Circuits
11
CMOS NOR2
Threshold Calculation (1/3)
• Basic Assumptions
» Both input A and B switch simultaneously (VA = VB)
» The device sizes in each block are identical. (W/L)n,A = (W/L)n,B ,
and (W/L)p,A = (W/L)p,B
» The substrate-bias effect for the PMOS is neglected
Vth Calculation
• By definition, VA = VB = Vout = Vth. The two NMOS transistors are
saturated because VGS = VDS,
ID = IDA,n + IDB,n = kn(Vth-VT,n)2
• PMOS-B operates in the linear region, and PMOS-A is in
saturation for Vin = Vout,
k
I
V
V
n
D
n
T
th 

 ,
 
 
 
V
V
V
V
k
I
V
V
V
V
V
k
I
p
SDB
p
T
th
DD
p
p
DA
p
SDB
p
SDB
p
T
th
DD
p
p
DB
,
,
2
,
2
,
,
,
,
2
2
2








B
A
A B
F
VDD
IDA,n IDB,n
IDA,p
IDB,p
CMOS Digital Integrated Circuits
12
CMOS NOR2
Threshold Calculation (2/3)
Since IDA,p = IDB,p = ID, we have
• Combine the above equations, we obtain
which is different with the expression of Vth(INV)
k
I
V
V
V
p
D
p
T
th
DD 2
, 


 
k
k
V
V
k
k
V
NOR
V
n
p
p
T
DD
n
p
n
T
th
2
1
1
2
1
)
2
(
,
,




 
k
k
V
V
k
k
V
INV
V
n
p
p
T
DD
n
p
n
T
th




1
)
(
,
,
CMOS Digital Integrated Circuits
13
CMOS NOR2
Threshold Calculation (3/3)
• If kn = kp and VT,n = |VT,p| , Vth(INV) = VDD/2. However,
Equivalent-Inverter Approach (both inputs are identical)
» The parallel connected nMOS transistors can be represented
by a nMOS transistor with 2kn.
» The series connected pMOS transistors can be represented by
a pMOS transistor with kp/2.
3
)
2
( ,
V
V
NOR
V
n
T
DD
th


Vin
VDD
Vout
kp/2
2kn
CMOS Digital Integrated Circuits
14
CMOS NOR2
Equivalent-Inverter Approach
• Therefore
• To obtain a switching threshold voltage of VDD/2 for
simultaneous switching, we have to set VT,n = |VT,p| and kp=4kn
Parasitic Capacitances and Simplified Equivalent Circuit: See
Fig. 7.12 in Kang and Leblebici.
» The total lumped load capacitance is assumed to be equal to
the sum of all internal capacitances in the worst case.
 
k
k
V
V
k
k
V
NOR
V
n
p
p
T
DD
n
p
n
T
th
4
1
4
)
2
(
,
,




CMOS Digital Integrated Circuits
15
CMOS NAND2
Two-Input NAND Gate
CMOS Digital Integrated Circuits
16
CMOS NAND2
Threshold Calculation
• Assume the device sizes in each block are identical, (W/L)n,A =
(W/L)n,B , and (W/L)p,A = (W/L)p,B, and by the similar analysis to
the one developed for the NOR2 gate, we have
• To obtain a switching threshold voltage of VDD/2 for simultaneous
switching, we have to set VT,n = |VT,p| and kn=4kp
 
k
k
V
V
k
k
V
NAND
V
n
p
p
T
DD
n
p
n
T
th
2
1
2
)
2
(
,
,




CMOS Digital Integrated Circuits
17
Layout of Simple CMOS Logic Gates (1/2)
In
Out
VDD
GND
Out
In
VDD
M2
M1
Inverter
CMOS Digital Integrated Circuits
18
Layout of Simple CMOS Logic Gates (2/2)
A
Out
VDD
GND
B
2-input NAND gate
B
VDD
A
CMOS Digital Integrated Circuits
19
Stick Diagram (1/2)
• Does not contain any information of dimensions.
• Represent relative positions of transistors
Basic Elements
» Rectangle: Diffusion Area
» Solid Line: Metal Connection
» Circle: Contact
» Cross-Hatched Strip: Polysilicon
In
Out
VDD
GND
INV
A
Out
VDD
GND
B
NAND2
CMOS Digital Integrated Circuits
20
Stick Diagram (2/2)
In
Out
VDD
GND
INV
A
Out
VDD
GND
B
NAND2
CMOS Digital Integrated Circuits
21
Complex CMOS Gates
Functional Design (1/3)
• OR operations are performed by parallel-connected drivers.
• AND operations are performed by series-connected drivers.
• Inversion is provided by the nature of MOS circuit operation.
• The realization of pull-down network is based on the same basic
design principle examined earlier.
• The pMOS pull-up network must be the dual network of the
nMOS pull-down network.
• One method systematically derives the pull-up network directly
form the pull-down network. This method constructs the dual
graph of the network. The pull-down network graph has nodes for
circuit nodes and arcs for nFETs with the each arc labeled with the
literal on the input to the corresponding nFET.
CMOS Digital Integrated Circuits
22
Complex CMOS Gates
Functional Design (2/3)
• To construct a graph and pull-up network from a pull-down
network
» Insert a node in each of the enclosed areas within the pull-down
network graph.
» Place two nodes outside of the network separated by arcs from GND
and OUT.
» Connect pairs of new nodes by drawing an arc through each arc in the
pull-down circuit that lies between the corresponding pairs of areas.
» Draw the resulting pull-up network with a pFET for each of the new
arcs labeled with the same literal as on the nFET from which it came.
• The justification
» The complement of a Boolean expression can be obtained by taking
its dual, replacing ANDs with ORs and ORs with ANDs and
complementing the variables,
» The graphical dual corresponds directly to the algebraic dual.
» Complementation of the variables takes place automatically because
each nFETs is replaced with a pFET.
CMOS Digital Integrated Circuits
23
Complex CMOS Gates
Functional Design (3/3)
• This method is illustrated by the generation of the pull-up from the
pull-down shown.
• On the dual graph, which of the two side nodes is labeled VDD or
OUT is functionally arbitrary. The selection may, however, affect
the location of capacitances, and hence, the performance.
B
D
C
OUT
A
B
A
C
VDD
D
OUT
OUT
GND
A
D
B
C
VDD OUT
1
2
CMOS Digital Integrated Circuits
24
Complex CMOS Gates
Device Sizing in Complex Gates (1/4)
• Method used for sizing NAND and NOR gates also applies to
complex gates
• Most easily transferred by examining all possible paths from
OUT to GND (and from VDD to OUT)
• Suppose that we are dealing with CMOS and the sized inverter
devices use minimum channel lengths and widths Wn and Wp.
• For the pull-down network:
1. Find the length nmax of the longest paths between OUT and through
GND the network. Make the width of the nFETs on these paths
nmaxWn.
In this algorithm, a path is a series of FETs that does not contain any
complementary pair of literals such as X and X.
2. For next longest paths through the circuit between OUT and GND
consisting of nFETs not yet sized, repeat Step 1.
3. Repeat Step 2 until there are no full paths consisting of unsized
nFETS
CMOS Digital Integrated Circuits
25
Complex CMOS Gates
Device Sizing in Complex Gates (2/4)
4. For each longest partial path in the circuit consisting of unsized
nFETs, based on the longest path between OUT and GND on which
it lies, find the equivalent Weq required for the partial path.
5. Repeat Step 1 for each longest partial path from Step 4 with OUT
and GND replaced the endpoints of the partial path. Make the
widths of devices on the path equal to nmaxWeq where nmax is the
number of FETs on the partial path.
6. Repeat 4 and 5 for newly generated longest partial paths until all
devices are sized.
CMOS Digital Integrated Circuits
26
Complex CMOS Gates
Device Sizing in Complex Gates (3/4)
• This can be illustrated for the example above. Ln =0.5μ, Wn=5 μ,
in the inverter.
1. A longest path through the network from OUT to GND is A-
B-C-D with nmax=4. Thus, the widths WA, WB, WC, WD are
45=20 μ. This is the only longest path we can find from
B
A
C
OUT
D
GND
E
F
G
H
CMOS Digital Integrated Circuits
27
Complex CMOS Gates
Device Sizing in Complex Gates (4/4)
OUT to GND without passing through a sized device.
2. H and G are partial path. But it is important that they are
considered as part of a longest between OUT and GND for
evaluation. Thus, a “split” partial path consisting of H and G
must be considered. Based on the evaluation segments,
Weq =2Wn=10μ. Thus, WH and WG are 110=10 μ.
3. The longest remaining partial path in the circuit is E-F with nmax
= 2. Since this path is in series with A with width 4Wn=20 μ, it
needs to have an equivalent width of Weq determined from:
Weq = 20/3 μ and the widths WE and WF are 220/3 μ=40/3 μ.
Since all devices are sized, we are finished.
W
W
W
W eq
eq
n
n
1
20
1
5
1
1
4
1
1





CMOS Digital Integrated Circuits
28
Complex CMOS Gates
Layout of Complex Gates (1/4)
• Goal: Given a complex CMOS logic gate, how to find a
minimum-area layout.
VDD
OUT
B
A
C
D
E
A
B C
D
E
A
A
B
B
C
C
D
D
E
E
pMOS network
nMOS network
CMOS Digital Integrated Circuits
29
Complex CMOS Gates
Layout of Complex Gates (2/4)
Arbitrary ordering of the polysilicon columns:
» The separation between the polysilicon columns must allow for one
diffusion-to-diffusion separation and two metal-to-diffusion contacts
in between
 Consume a considerable amount of extra silicon area
Out
VDD
GND
D
D D
S
A
D
D
D D D
D
D
S
S
S
S
S S
S S
S
pMOS
nMOS
E B D C
CMOS Digital Integrated Circuits
30
Complex CMOS Gates
Layout of Complex Gates (3/4)
Euler Path Approach
• Objective: To order the inputs such that the diffusion breaks
between input polysilicon strips is minimized, thereby reducing
the width of the layout.
• Definition: An Euler path is an uninterrupted path that traverses
each gate of the graph exactly once.
• Approach:
» Draw the graph for the NMOS and PMOS networks.
» Find a common Euler path through both of the graphs.
• Note that nodes with an odd number of attached edges must be
at the end points of the Euler path.
• Some circuits may not have Euler paths – Do Euler paths for
parts of the circuit in such cases. A circuit constructed using
the dual graph method is more likely to have an Euler path.
» Order the transistor pairs in the layout in the order of the path
from left to right or right to left.
CMOS Digital Integrated Circuits
31
Complex CMOS Gates
Layout of Complex Gates (4/4)
• Euler path successful: Order: E-D-A-B-C
• Do the symbolic layout (stick diagram)
» More compact, simple routing of signals, and consequently, less
parasitic capacitance
Out
VDD
GND
D
D D
S
A
D
D
D
D
D
S
S S S
S
S
S
pMOS
nMOS
E B
D C
D
D
S S
pMOS network
A
B C
D
E
A B
C
D E
nMOS network Common Euler path
E-D-A-B-C
CMOS Digital Integrated Circuits
32
Complex CMOS Gates
AOI Gates
• AOI (AND-OR-INVERT): Enable the sum-of-products
realization of a Boolean function in one logic gate.
» The pull-down network consists of parallel branches of
series-connected nMOS driver transistors.
» The corresponding pull-up network can be found using the
dual-graph concept.
Example: OUT = A1A2A3+B1B2+C1C2C3
A1
A2
A3
B1
B2
C1
C2
C3
VDD
Dual pMOS
Pull-up network
OUT
A1
A2
A3
B1
B2
C1
C2
C3
CMOS Digital Integrated Circuits
33
Complex CMOS Gates
OAI Gates
• OAI (OR-AND-INVERT): Enable the product-of-sums
realization of a Boolean function in one logic gate.
» The pull-down network consists of series branches of
parallel-connected nMOS driver transistors.
» The corresponding pull-up network can be found using the
dual-graph concept.
OUT = (A1+A2+A3)(B1+B2) C1
VDD
Dual pMOS
Pull-up network
OUT
C1
B1
A3
B2
A2 A3
A1
A2
A3
B1
B2
C1
CMOS Digital Integrated Circuits
34
Complex CMOS Gates
Pseudo-NMOS
• In Pseudo-NMOS, the PMOS network is replaced by a single pFET
with its gate attached to GND. This provides a fixed load such as on
NMOS circuits, hence called pseudo-NMOS.
• Advantage: Eliminate the PMOS network and hence reduce area.
• Disadvantages:
» Back to ratioed design and VOL problems as in NMOS since PFET is
always ON.
» “Non-zero” static power dissipation.
VDD
OUT
C1
B1
A3
B2
A2 A3
pMOS transistor
acting as load
CMOS Digital Integrated Circuits
35
Ratioed Logic (1/2)
Ratioless Logic: The logic levels are not dependent upon the relative
device sizes.
Ratioed Logic: The logic levels are determined by the relative
dimensions of composing transistors
VDD
VSS
PDN
In1
In2
In3
F
RL
Load
VDD
VSS
In1
In2
In3
F
VDD
VSS
PDN
In1
In2
In3
F
VSS
PDN
Resistive Depletion
Load
PMOS
Load
(a) resistive load (b) depletion load NMOS (c) pseudo-NMOS
VT < 0
Goal: To reduce the number of devices over complementary CMOS
CMOS Digital Integrated Circuits
36
Ratioed Logic (2/2)
VDD
VSS
PDN
In1
In2
In3
F
RL
Load
Resistive
N transistors + Load
• VOH = VDD
• VOL = RPN
RPN + RL
• Assymetrical response
• Static power consumption
•
• tpL = 0.69 RLCL
VDD
CMOS Digital Integrated Circuits
37
Active Loads
VDD
VSS
In1
In2
In3
F
VDD
VSS
PDN
In1
In2
In3
F
VSS
PDN
Depletion
Load
PMOS
Load
depletion load NMOS pseudo-NMOS
VT < 0
CMOS Digital Integrated Circuits
38
Pseudo-NMOS
VDD
A B C D
F
CL
VOH = VDD (similar to complementary CMOS)
Smaller area and load but Static power dissipation!!!
   
  )
Assuming
(
1
1
2
2
2
2
|
|V
V
V
k
k
V
V
V
V
V
k
V
V
V
V
k
Tp
Tn
T
n
p
T
DD
OL
Tp
DD
p
OL
OL
Tn
DD
n


























CMOS Digital Integrated Circuits
39
CMOS Full-Adder Circuit
A B Cin S Cout Carry status
0 0 0 0 0 delete
0 0 1 1 0 delete
0 1 0 1 0 propagate
0 1 1 0 1 propagate
1 0 0 1 0 propagate
1 0 1 0 1 propagate
1 1 0 0 1 generate
1 1 1 1 1 generate
A B
Cout
Sum
Cin
Full
adder
CMOS Digital Integrated Circuits
40
CMOS Full-Adder Circuit
The Binary Adder
A B
Cout
Sum
Cin
Full
adder
Sum = ABCin
= ABCin + ABCin + ABCin + ABCin
= ABC + (A+B+C)Cout
Cout = AB + BCin + ACin
at least two of A, B, and C are zeros
CMOS Digital Integrated Circuits
41
CMOS Full-Adder Circuit
Express Sum and Carry as a Function of P, G, D
• Define three new variable which ONLY depend on A, B
Generate (G) = AB
Propagate (P) = AB
Delete (D)= A B
Cout(G,P) = G+PCin
Sum(G,P) = PCin
• Can also derive expressions for S and Cout based on D and P.
G = 1: Ensure that the carry bit will be generated
D = 1: Ensure that the carry bit will be deleted
P = 1: Guarantee that an incoming carry will be propagated to
Cout
• Note that G, P and D are only functions of A and B and are not
dependent on Cin
CMOS Digital Integrated Circuits
42
CMOS Full-Adder Circuit
The Ripple-Carry Adder
• The N-bit adder is constructed by cascading N full-adder circuits.
• The carry bit ripples from one stage to the other.
• The delay through the circuit depends upon the number of logic
stages which need to be traversed, and is a function of the applied
signals.
Worst case delay linear with the number of bits
p = O(N)
adder  (N-1)carry + sum
Goal: Make the fastest possible carry path circuit
FA FA FA FA
A0 B0
S0
A1 B1
S1
A2 B2
S2
A3 B3
S3
Ci,0 Co,0
( Ci,1)
Co,1 Co,2 Co,3
CMOS Digital Integrated Circuits
43
CMOS Full-Adder Circuit
Transistor-Level of One-Bit Full-Adder Circuit
A B
B
A
Ci
Ci A
X
VDD
VDD
A B
Ci B
A
B VDD
A
B
Ci
Ci
A
B
A Ci
B
Co
VDD
S
28 transistors
CMOS Digital Integrated Circuits
44
CMOS Full-Adder Circuit
Inversion Property
A B
S
Co
Ci FA
A B
S
Co
Ci FA
S(A,B,Ci) = S(A,B,Ci)
Co(A,B,Ci) = Co(A,B,Ci)
CMOS Digital Integrated Circuits
45
CMOS Full-Adder Circuit
Minimize Critical Path by Reducing Inverting Stages (1/2)
A3
FA FA
Even cell Odd cell
A0 B0
S0
A1 B1
S1
A2 B2
S2
B3
S3
Ci,0 Co,0 Co,1 Co,3
Co,2
FA FA
A3
FA FA
A0 B0
S0
A1 B1
S1
A2 B2
S2
B3
S3
Ci,0 Co,0 Co,1 Co,3
Co,2
FA FA
CMOS Digital Integrated Circuits
46
CMOS Full-Adder Circuit
Minimize Critical Path by Reducing Inverting Stages (2/2)
Exploit Inversion Property
A3
FA' FA'
Even cell Odd cell
A0 B0
S0
A1 B1
S1
A2 B2
S2
B3
S3
Ci,0 Co,0 Co,1 Co,3
Co,2
•The number of inverting stages in the carry path is reduced.
•The only disadvantage is that it need different cells for the even and old slices.
FA' FA'
*FA' is a full adder without the inverter in the carry path.
CMOS Digital Integrated Circuits
47
CMOS Full-Adder Circuit
A Better Structure: The Mirror Adder (1/3)
• Carry Generation Circuitry
» Carry-inverting gate is eliminated
» PDN and PUN networks are not dual
• D or G is high  C0 is set to VDD or GND
• P is high  the incoming carry is propagated to C0
VDD
Ci
A
B
B
A
B
A
A B
Kill
Generate
"1"-Propagate
"0"-Propagate
VDD
Ci
A B Ci
Ci
B
A
Ci
A
B
B
A
VDD
S
Co
24 transistors
Cout(G,P) = G+PCin
Sum(G,P) = PCin
CMOS Digital Integrated Circuits
48
CMOS Full-Adder Circuit
The Mirror Adder (2/3)
• Only need 24 transistors.
• NMOS and PMOS chains are completely symmetrical. This
guarantees identical rising and falling time if the NMOS and
PMOS devices are properly sized.
• A maximum of two series transistors can be observed in the
carry generation circuitry.
• The critical issue is to minimize the capacitance at node C0.
• Capacitance at node C0
» 4 diffusion capacitances
» 2 internal gate capacitances
» 6 gate capacitances in the connecting adder cell
 A total 12 gate capacitances (Assume Cdiffusion  Cgate)
• The transistors connected to Ci are placed closest to the output.
• Only the transistors in the carry stage have to be optimized for
speed. All transistors in the sum gate can be minimum-size.
CMOS Digital Integrated Circuits
49
CMOS Full-Adder Circuit
The Mirror Adder (3/3)
Stick Diagram
Ci
A B
VDD
GND
B
Co
A Ci Co
Ci A B
S
A
A
B
B
B
B
A
A
Ci
Ci
Co
Ci
CMOS Digital Integrated Circuits
50
Pass Transistors
• The pass transistor is an nFET used as a switch-like element to
connect logic and storage.
• Used in NMOS; sometimes used in CMOS to reduce cost.
• The voltage on the gate, VC, determines whether the pass
transistor is “open” or “closed” as a switch.
» If VC = H, it is “closed” and connects Vout to Vin.
» If VC = L, it is “open” and Vout is not connected to Vin.
• Consider Vin = L and Vin = H with VC = H. With Vin = L, the pass
transistor is much like a pull-down transistor in an inverter or
NAND gate. So Vout, likewise, becomes L. But, for Vin = H, the
output becomes the effective source of the FET. When VGS =
VDD-VOUT=VTn , the nFET cuts off. The H level is VOUT = VDD-
VTn.
Vin Vout
VC
VC = 1
VC = 0
CMOS Digital Integrated Circuits
51
Transmission Gates (Pass Gates) (1/2)
• With body effect, for VDD = 5V, the value on Vout can be around
3.0 to 3.5 V. This reduced level diminishes NMH and the current
drive for the gate or gates driven by the pass transistor.
• For both NMOS and CMOS, the lack of current drive slows
circuit operation and NMH can be particularly problematic. As a
consequence, in CMOS, a pFET is added to form a
transmission gate.
Transmission Gates
• Symbols:
A B
C
C
A B
C
C
Circuit Popular Usage
CMOS Digital Integrated Circuits
52
Transmission Gates (2/2)
• Operation
» C is logic high  Both transistors are turned on and provide
a low-resistance current path between nodes A and B.
» C is logic low  Both transistors will be off, and the path
between nodes A and B will be open circuit. This condition
is called the high-impedance state.
• With the parallel pFET added, it can transfer a full VDD from A
to B (or B to A). It can also charge driven capacitance faster.
• The substrates of NMOS and PMOS are connected to ground
and VDD, respectively. Therefore, the substrate-bias effect must
be taken into account.
CMOS Digital Integrated Circuits
53
Transmission Gates
DC Analysis (1/3)
• Vin = VDD, VC = VDD, and node B is connected to a capacitor, which
represents capacitive loading of the subsequent logic stages.
• The nMOS transistor, VDS,n=VDD–Vout, and VGS,n=VDD–Vout. Thus,
» Turn off: If Vout > VDD – VT,n
» Saturation: If Vout < VDD – VT,n
• The pMOS transistor, VDS,p=Vout–VDD, and VGS,p= –VDD. Thus,
» Saturation: If Vout < |VT,p |
» Linear: If Vout > |VT,p |
Vin=VDD Vout
0V
VDD
ISD,p
IDS,n
ID
CMOS Digital Integrated Circuits
54
Transmission Gates
DC Analysis (2/3)
• The current flowing through the transmission gate is equal to
ID = IDS,n + ISD,p
• The equivalent resistance for each transistor can be represented as
Req,n = (VDD-Vout)/IDS,n
Req,p = (VDD-Vout)/ IDS,p
and
Req = Req,n ║ Req,p
nMOS: saturation
pMOS: saturation
nMOS: saturation
pMOS: linear reg.
nMOS: cut-off
pMOS: linear reg.
Region 1 Region 2 Region 3
0V |VT,p| (VDD-VT,n ) VDD
Vout
CMOS Digital Integrated Circuits
55
Transmission Gates
DC Analysis (3/3)
The values of Req,n and Req,p
• Region 1
• Region 2
• Region 3
 
 
|
|
)
(
2
)
(
2
,
2
,
,
2
,
V
V
k
V
V
R
V
V
V
k
V
V
R
p
T
DD
p
out
DD
p
eq
n
T
out
DD
n
out
DD
n
eq







 
   
 
V
V
V
V
k
R
V
V
V
k
V
V
R
out
DD
p
T
DD
p
p
eq
n
T
out
DD
n
out
DD
n
eq








|
|
2
2
)
(
2
,
,
,
2
,
   
 
V
V
V
V
k
R
out
DD
p
T
DD
p
p
eq




|
|
2
2
,
,
CMOS Digital Integrated Circuits
56
Resistance of Transmission Gate
• The parallel combination of the pFET and the nFET result in an
equivalent resistance that is roughly constant. This constant value,
Req, can be used in series with an ideal switch controlled by C and
C to model the transmission gate. See p. 311 of the text book.
• The implementation of CMOS transmission gates in logic circuit
design usually results in compact circuit structures which may even
require a smaller number of transistors.
Req,n
Req,p
VDD-VT,n VDD
Vout
R
Req,n║ Req,p
0
CMOS Digital Integrated Circuits
57
Applications of Transmission Gate
Example: XOR
A
B
F
B
A
B
B
M1
M2
M3/M4
Only need 6 transistors
AB
AB
CMOS Digital Integrated Circuits
58
Applications of Transmission Gate
Example: Multiplexer
A
B
S
S
S F = AS+BS
BS
AS
CMOS Digital Integrated Circuits
59
Applications of Transmission Gate
Examples: Transmission Gate Full Adder
B
P
Ci
A
A A
A
P
A
B
S
P
P
P
P
P
Sum Generation
Carry Generation
Setup
Ci
VDD
A
Ci
Ci
Ci
VDD
VDD
Co
VDD
Similar delays for sum and carry
Generate (G) = AB
Propagate (P) =
AB
Cout(G,P) =
G+PCin
Sum(G,P) =
PCin

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CMOS Combinational_Logic_Circuits.pdf

  • 1. CMOS Digital Integrated Circuits 1 CMOS Digital Integrated Circuits Lec 10 Combinational CMOS Logic Circuits
  • 2. CMOS Digital Integrated Circuits 2 Combinational vs. Sequential Logic Combinational The output is determined by •Current inputs •Previous inputs Output = f(In) Output = f(In, Previous In) Combinational Logic circuit Out In Out In State Combinational Logic circuit Sequential The output is determined only by •Current inputs
  • 3. CMOS Digital Integrated Circuits 3 Static CMOS Circuit • At every point in time (except during the switching transients) each gate output is connected to either VDD or VSS via a low-resistive path • The outputs of the gates assume at all times the value of the Boolean function, implemented by the circuit (ignoring, once again, the transient effects during switching periods). • This is contrasted to the dynamic circuit class, which relies on temporary storages of signal values on the capacitance of high impedance circuit nodes.
  • 4. CMOS Digital Integrated Circuits 4 Static CMOS • The complementary operation of a CMOS gate » The nMOS network (PDN) is on and the pMOS network (PUN) is off » The pMOS network is on and the nMOS network is off. f(In1,In2,…InN) In1 In2 InN In1 In2 InN Pull Up Network (PUN) Pull Down Network (PDN) PUN and PDN are dual logic networks nMOS Network VDD pMOS Network
  • 5. CMOS Digital Integrated Circuits 5 NMOS Transistors Series/Parallel Connection • Transistors can be thought as a switch controlled by its gate signal • NMOS switch closes when switch control input is high NMOS Transistors pass a “strong” 0 but a “weak” 1 Y = X if A and B=AB Y = X if A OR B=A+B X Y A B X Y A B
  • 6. CMOS Digital Integrated Circuits 6 PMOS Transistors Series/Parallel Connection • PMOS switch closes when switch control input is low PMOS Transistors pass a “strong” 1 but a “weak” 0 X Y A B X Y A B Y = X if AAND B = A+B Y = X if A OR B = AB
  • 7. CMOS Digital Integrated Circuits 7 Threshold Drops VDD VDD  0 PDN 0  VDD CL CL PUN VDD 0  VDD - VTn CL VDD VDD  |VTp| CL S D S D VGS S S D D VGS VDD
  • 8. CMOS Digital Integrated Circuits 8 CMOS Logic Style • PUN is the DUAL of PDN (can be shown using DeMorgan’s Theorem’s) • The complementary gate is inverting AND = NAND + INV B A AB B A B A     
  • 9. CMOS Digital Integrated Circuits 9 Example Gate: NAND
  • 10. CMOS Digital Integrated Circuits 10 CMOS NOR2 Two-Input NOR Gate ID IDB,n IDA,n IDB,p IDA,p
  • 11. CMOS Digital Integrated Circuits 11 CMOS NOR2 Threshold Calculation (1/3) • Basic Assumptions » Both input A and B switch simultaneously (VA = VB) » The device sizes in each block are identical. (W/L)n,A = (W/L)n,B , and (W/L)p,A = (W/L)p,B » The substrate-bias effect for the PMOS is neglected Vth Calculation • By definition, VA = VB = Vout = Vth. The two NMOS transistors are saturated because VGS = VDS, ID = IDA,n + IDB,n = kn(Vth-VT,n)2 • PMOS-B operates in the linear region, and PMOS-A is in saturation for Vin = Vout, k I V V n D n T th    ,       V V V V k I V V V V V k I p SDB p T th DD p p DA p SDB p SDB p T th DD p p DB , , 2 , 2 , , , , 2 2 2         B A A B F VDD IDA,n IDB,n IDA,p IDB,p
  • 12. CMOS Digital Integrated Circuits 12 CMOS NOR2 Threshold Calculation (2/3) Since IDA,p = IDB,p = ID, we have • Combine the above equations, we obtain which is different with the expression of Vth(INV) k I V V V p D p T th DD 2 ,      k k V V k k V NOR V n p p T DD n p n T th 2 1 1 2 1 ) 2 ( , ,       k k V V k k V INV V n p p T DD n p n T th     1 ) ( , ,
  • 13. CMOS Digital Integrated Circuits 13 CMOS NOR2 Threshold Calculation (3/3) • If kn = kp and VT,n = |VT,p| , Vth(INV) = VDD/2. However, Equivalent-Inverter Approach (both inputs are identical) » The parallel connected nMOS transistors can be represented by a nMOS transistor with 2kn. » The series connected pMOS transistors can be represented by a pMOS transistor with kp/2. 3 ) 2 ( , V V NOR V n T DD th   Vin VDD Vout kp/2 2kn
  • 14. CMOS Digital Integrated Circuits 14 CMOS NOR2 Equivalent-Inverter Approach • Therefore • To obtain a switching threshold voltage of VDD/2 for simultaneous switching, we have to set VT,n = |VT,p| and kp=4kn Parasitic Capacitances and Simplified Equivalent Circuit: See Fig. 7.12 in Kang and Leblebici. » The total lumped load capacitance is assumed to be equal to the sum of all internal capacitances in the worst case.   k k V V k k V NOR V n p p T DD n p n T th 4 1 4 ) 2 ( , ,    
  • 15. CMOS Digital Integrated Circuits 15 CMOS NAND2 Two-Input NAND Gate
  • 16. CMOS Digital Integrated Circuits 16 CMOS NAND2 Threshold Calculation • Assume the device sizes in each block are identical, (W/L)n,A = (W/L)n,B , and (W/L)p,A = (W/L)p,B, and by the similar analysis to the one developed for the NOR2 gate, we have • To obtain a switching threshold voltage of VDD/2 for simultaneous switching, we have to set VT,n = |VT,p| and kn=4kp   k k V V k k V NAND V n p p T DD n p n T th 2 1 2 ) 2 ( , ,    
  • 17. CMOS Digital Integrated Circuits 17 Layout of Simple CMOS Logic Gates (1/2) In Out VDD GND Out In VDD M2 M1 Inverter
  • 18. CMOS Digital Integrated Circuits 18 Layout of Simple CMOS Logic Gates (2/2) A Out VDD GND B 2-input NAND gate B VDD A
  • 19. CMOS Digital Integrated Circuits 19 Stick Diagram (1/2) • Does not contain any information of dimensions. • Represent relative positions of transistors Basic Elements » Rectangle: Diffusion Area » Solid Line: Metal Connection » Circle: Contact » Cross-Hatched Strip: Polysilicon In Out VDD GND INV A Out VDD GND B NAND2
  • 20. CMOS Digital Integrated Circuits 20 Stick Diagram (2/2) In Out VDD GND INV A Out VDD GND B NAND2
  • 21. CMOS Digital Integrated Circuits 21 Complex CMOS Gates Functional Design (1/3) • OR operations are performed by parallel-connected drivers. • AND operations are performed by series-connected drivers. • Inversion is provided by the nature of MOS circuit operation. • The realization of pull-down network is based on the same basic design principle examined earlier. • The pMOS pull-up network must be the dual network of the nMOS pull-down network. • One method systematically derives the pull-up network directly form the pull-down network. This method constructs the dual graph of the network. The pull-down network graph has nodes for circuit nodes and arcs for nFETs with the each arc labeled with the literal on the input to the corresponding nFET.
  • 22. CMOS Digital Integrated Circuits 22 Complex CMOS Gates Functional Design (2/3) • To construct a graph and pull-up network from a pull-down network » Insert a node in each of the enclosed areas within the pull-down network graph. » Place two nodes outside of the network separated by arcs from GND and OUT. » Connect pairs of new nodes by drawing an arc through each arc in the pull-down circuit that lies between the corresponding pairs of areas. » Draw the resulting pull-up network with a pFET for each of the new arcs labeled with the same literal as on the nFET from which it came. • The justification » The complement of a Boolean expression can be obtained by taking its dual, replacing ANDs with ORs and ORs with ANDs and complementing the variables, » The graphical dual corresponds directly to the algebraic dual. » Complementation of the variables takes place automatically because each nFETs is replaced with a pFET.
  • 23. CMOS Digital Integrated Circuits 23 Complex CMOS Gates Functional Design (3/3) • This method is illustrated by the generation of the pull-up from the pull-down shown. • On the dual graph, which of the two side nodes is labeled VDD or OUT is functionally arbitrary. The selection may, however, affect the location of capacitances, and hence, the performance. B D C OUT A B A C VDD D OUT OUT GND A D B C VDD OUT 1 2
  • 24. CMOS Digital Integrated Circuits 24 Complex CMOS Gates Device Sizing in Complex Gates (1/4) • Method used for sizing NAND and NOR gates also applies to complex gates • Most easily transferred by examining all possible paths from OUT to GND (and from VDD to OUT) • Suppose that we are dealing with CMOS and the sized inverter devices use minimum channel lengths and widths Wn and Wp. • For the pull-down network: 1. Find the length nmax of the longest paths between OUT and through GND the network. Make the width of the nFETs on these paths nmaxWn. In this algorithm, a path is a series of FETs that does not contain any complementary pair of literals such as X and X. 2. For next longest paths through the circuit between OUT and GND consisting of nFETs not yet sized, repeat Step 1. 3. Repeat Step 2 until there are no full paths consisting of unsized nFETS
  • 25. CMOS Digital Integrated Circuits 25 Complex CMOS Gates Device Sizing in Complex Gates (2/4) 4. For each longest partial path in the circuit consisting of unsized nFETs, based on the longest path between OUT and GND on which it lies, find the equivalent Weq required for the partial path. 5. Repeat Step 1 for each longest partial path from Step 4 with OUT and GND replaced the endpoints of the partial path. Make the widths of devices on the path equal to nmaxWeq where nmax is the number of FETs on the partial path. 6. Repeat 4 and 5 for newly generated longest partial paths until all devices are sized.
  • 26. CMOS Digital Integrated Circuits 26 Complex CMOS Gates Device Sizing in Complex Gates (3/4) • This can be illustrated for the example above. Ln =0.5μ, Wn=5 μ, in the inverter. 1. A longest path through the network from OUT to GND is A- B-C-D with nmax=4. Thus, the widths WA, WB, WC, WD are 45=20 μ. This is the only longest path we can find from B A C OUT D GND E F G H
  • 27. CMOS Digital Integrated Circuits 27 Complex CMOS Gates Device Sizing in Complex Gates (4/4) OUT to GND without passing through a sized device. 2. H and G are partial path. But it is important that they are considered as part of a longest between OUT and GND for evaluation. Thus, a “split” partial path consisting of H and G must be considered. Based on the evaluation segments, Weq =2Wn=10μ. Thus, WH and WG are 110=10 μ. 3. The longest remaining partial path in the circuit is E-F with nmax = 2. Since this path is in series with A with width 4Wn=20 μ, it needs to have an equivalent width of Weq determined from: Weq = 20/3 μ and the widths WE and WF are 220/3 μ=40/3 μ. Since all devices are sized, we are finished. W W W W eq eq n n 1 20 1 5 1 1 4 1 1     
  • 28. CMOS Digital Integrated Circuits 28 Complex CMOS Gates Layout of Complex Gates (1/4) • Goal: Given a complex CMOS logic gate, how to find a minimum-area layout. VDD OUT B A C D E A B C D E A A B B C C D D E E pMOS network nMOS network
  • 29. CMOS Digital Integrated Circuits 29 Complex CMOS Gates Layout of Complex Gates (2/4) Arbitrary ordering of the polysilicon columns: » The separation between the polysilicon columns must allow for one diffusion-to-diffusion separation and two metal-to-diffusion contacts in between  Consume a considerable amount of extra silicon area Out VDD GND D D D S A D D D D D D D S S S S S S S S S pMOS nMOS E B D C
  • 30. CMOS Digital Integrated Circuits 30 Complex CMOS Gates Layout of Complex Gates (3/4) Euler Path Approach • Objective: To order the inputs such that the diffusion breaks between input polysilicon strips is minimized, thereby reducing the width of the layout. • Definition: An Euler path is an uninterrupted path that traverses each gate of the graph exactly once. • Approach: » Draw the graph for the NMOS and PMOS networks. » Find a common Euler path through both of the graphs. • Note that nodes with an odd number of attached edges must be at the end points of the Euler path. • Some circuits may not have Euler paths – Do Euler paths for parts of the circuit in such cases. A circuit constructed using the dual graph method is more likely to have an Euler path. » Order the transistor pairs in the layout in the order of the path from left to right or right to left.
  • 31. CMOS Digital Integrated Circuits 31 Complex CMOS Gates Layout of Complex Gates (4/4) • Euler path successful: Order: E-D-A-B-C • Do the symbolic layout (stick diagram) » More compact, simple routing of signals, and consequently, less parasitic capacitance Out VDD GND D D D S A D D D D D S S S S S S S pMOS nMOS E B D C D D S S pMOS network A B C D E A B C D E nMOS network Common Euler path E-D-A-B-C
  • 32. CMOS Digital Integrated Circuits 32 Complex CMOS Gates AOI Gates • AOI (AND-OR-INVERT): Enable the sum-of-products realization of a Boolean function in one logic gate. » The pull-down network consists of parallel branches of series-connected nMOS driver transistors. » The corresponding pull-up network can be found using the dual-graph concept. Example: OUT = A1A2A3+B1B2+C1C2C3 A1 A2 A3 B1 B2 C1 C2 C3 VDD Dual pMOS Pull-up network OUT A1 A2 A3 B1 B2 C1 C2 C3
  • 33. CMOS Digital Integrated Circuits 33 Complex CMOS Gates OAI Gates • OAI (OR-AND-INVERT): Enable the product-of-sums realization of a Boolean function in one logic gate. » The pull-down network consists of series branches of parallel-connected nMOS driver transistors. » The corresponding pull-up network can be found using the dual-graph concept. OUT = (A1+A2+A3)(B1+B2) C1 VDD Dual pMOS Pull-up network OUT C1 B1 A3 B2 A2 A3 A1 A2 A3 B1 B2 C1
  • 34. CMOS Digital Integrated Circuits 34 Complex CMOS Gates Pseudo-NMOS • In Pseudo-NMOS, the PMOS network is replaced by a single pFET with its gate attached to GND. This provides a fixed load such as on NMOS circuits, hence called pseudo-NMOS. • Advantage: Eliminate the PMOS network and hence reduce area. • Disadvantages: » Back to ratioed design and VOL problems as in NMOS since PFET is always ON. » “Non-zero” static power dissipation. VDD OUT C1 B1 A3 B2 A2 A3 pMOS transistor acting as load
  • 35. CMOS Digital Integrated Circuits 35 Ratioed Logic (1/2) Ratioless Logic: The logic levels are not dependent upon the relative device sizes. Ratioed Logic: The logic levels are determined by the relative dimensions of composing transistors VDD VSS PDN In1 In2 In3 F RL Load VDD VSS In1 In2 In3 F VDD VSS PDN In1 In2 In3 F VSS PDN Resistive Depletion Load PMOS Load (a) resistive load (b) depletion load NMOS (c) pseudo-NMOS VT < 0 Goal: To reduce the number of devices over complementary CMOS
  • 36. CMOS Digital Integrated Circuits 36 Ratioed Logic (2/2) VDD VSS PDN In1 In2 In3 F RL Load Resistive N transistors + Load • VOH = VDD • VOL = RPN RPN + RL • Assymetrical response • Static power consumption • • tpL = 0.69 RLCL VDD
  • 37. CMOS Digital Integrated Circuits 37 Active Loads VDD VSS In1 In2 In3 F VDD VSS PDN In1 In2 In3 F VSS PDN Depletion Load PMOS Load depletion load NMOS pseudo-NMOS VT < 0
  • 38. CMOS Digital Integrated Circuits 38 Pseudo-NMOS VDD A B C D F CL VOH = VDD (similar to complementary CMOS) Smaller area and load but Static power dissipation!!!       ) Assuming ( 1 1 2 2 2 2 | |V V V k k V V V V V k V V V V k Tp Tn T n p T DD OL Tp DD p OL OL Tn DD n                          
  • 39. CMOS Digital Integrated Circuits 39 CMOS Full-Adder Circuit A B Cin S Cout Carry status 0 0 0 0 0 delete 0 0 1 1 0 delete 0 1 0 1 0 propagate 0 1 1 0 1 propagate 1 0 0 1 0 propagate 1 0 1 0 1 propagate 1 1 0 0 1 generate 1 1 1 1 1 generate A B Cout Sum Cin Full adder
  • 40. CMOS Digital Integrated Circuits 40 CMOS Full-Adder Circuit The Binary Adder A B Cout Sum Cin Full adder Sum = ABCin = ABCin + ABCin + ABCin + ABCin = ABC + (A+B+C)Cout Cout = AB + BCin + ACin at least two of A, B, and C are zeros
  • 41. CMOS Digital Integrated Circuits 41 CMOS Full-Adder Circuit Express Sum and Carry as a Function of P, G, D • Define three new variable which ONLY depend on A, B Generate (G) = AB Propagate (P) = AB Delete (D)= A B Cout(G,P) = G+PCin Sum(G,P) = PCin • Can also derive expressions for S and Cout based on D and P. G = 1: Ensure that the carry bit will be generated D = 1: Ensure that the carry bit will be deleted P = 1: Guarantee that an incoming carry will be propagated to Cout • Note that G, P and D are only functions of A and B and are not dependent on Cin
  • 42. CMOS Digital Integrated Circuits 42 CMOS Full-Adder Circuit The Ripple-Carry Adder • The N-bit adder is constructed by cascading N full-adder circuits. • The carry bit ripples from one stage to the other. • The delay through the circuit depends upon the number of logic stages which need to be traversed, and is a function of the applied signals. Worst case delay linear with the number of bits p = O(N) adder  (N-1)carry + sum Goal: Make the fastest possible carry path circuit FA FA FA FA A0 B0 S0 A1 B1 S1 A2 B2 S2 A3 B3 S3 Ci,0 Co,0 ( Ci,1) Co,1 Co,2 Co,3
  • 43. CMOS Digital Integrated Circuits 43 CMOS Full-Adder Circuit Transistor-Level of One-Bit Full-Adder Circuit A B B A Ci Ci A X VDD VDD A B Ci B A B VDD A B Ci Ci A B A Ci B Co VDD S 28 transistors
  • 44. CMOS Digital Integrated Circuits 44 CMOS Full-Adder Circuit Inversion Property A B S Co Ci FA A B S Co Ci FA S(A,B,Ci) = S(A,B,Ci) Co(A,B,Ci) = Co(A,B,Ci)
  • 45. CMOS Digital Integrated Circuits 45 CMOS Full-Adder Circuit Minimize Critical Path by Reducing Inverting Stages (1/2) A3 FA FA Even cell Odd cell A0 B0 S0 A1 B1 S1 A2 B2 S2 B3 S3 Ci,0 Co,0 Co,1 Co,3 Co,2 FA FA A3 FA FA A0 B0 S0 A1 B1 S1 A2 B2 S2 B3 S3 Ci,0 Co,0 Co,1 Co,3 Co,2 FA FA
  • 46. CMOS Digital Integrated Circuits 46 CMOS Full-Adder Circuit Minimize Critical Path by Reducing Inverting Stages (2/2) Exploit Inversion Property A3 FA' FA' Even cell Odd cell A0 B0 S0 A1 B1 S1 A2 B2 S2 B3 S3 Ci,0 Co,0 Co,1 Co,3 Co,2 •The number of inverting stages in the carry path is reduced. •The only disadvantage is that it need different cells for the even and old slices. FA' FA' *FA' is a full adder without the inverter in the carry path.
  • 47. CMOS Digital Integrated Circuits 47 CMOS Full-Adder Circuit A Better Structure: The Mirror Adder (1/3) • Carry Generation Circuitry » Carry-inverting gate is eliminated » PDN and PUN networks are not dual • D or G is high  C0 is set to VDD or GND • P is high  the incoming carry is propagated to C0 VDD Ci A B B A B A A B Kill Generate "1"-Propagate "0"-Propagate VDD Ci A B Ci Ci B A Ci A B B A VDD S Co 24 transistors Cout(G,P) = G+PCin Sum(G,P) = PCin
  • 48. CMOS Digital Integrated Circuits 48 CMOS Full-Adder Circuit The Mirror Adder (2/3) • Only need 24 transistors. • NMOS and PMOS chains are completely symmetrical. This guarantees identical rising and falling time if the NMOS and PMOS devices are properly sized. • A maximum of two series transistors can be observed in the carry generation circuitry. • The critical issue is to minimize the capacitance at node C0. • Capacitance at node C0 » 4 diffusion capacitances » 2 internal gate capacitances » 6 gate capacitances in the connecting adder cell  A total 12 gate capacitances (Assume Cdiffusion  Cgate) • The transistors connected to Ci are placed closest to the output. • Only the transistors in the carry stage have to be optimized for speed. All transistors in the sum gate can be minimum-size.
  • 49. CMOS Digital Integrated Circuits 49 CMOS Full-Adder Circuit The Mirror Adder (3/3) Stick Diagram Ci A B VDD GND B Co A Ci Co Ci A B S A A B B B B A A Ci Ci Co Ci
  • 50. CMOS Digital Integrated Circuits 50 Pass Transistors • The pass transistor is an nFET used as a switch-like element to connect logic and storage. • Used in NMOS; sometimes used in CMOS to reduce cost. • The voltage on the gate, VC, determines whether the pass transistor is “open” or “closed” as a switch. » If VC = H, it is “closed” and connects Vout to Vin. » If VC = L, it is “open” and Vout is not connected to Vin. • Consider Vin = L and Vin = H with VC = H. With Vin = L, the pass transistor is much like a pull-down transistor in an inverter or NAND gate. So Vout, likewise, becomes L. But, for Vin = H, the output becomes the effective source of the FET. When VGS = VDD-VOUT=VTn , the nFET cuts off. The H level is VOUT = VDD- VTn. Vin Vout VC VC = 1 VC = 0
  • 51. CMOS Digital Integrated Circuits 51 Transmission Gates (Pass Gates) (1/2) • With body effect, for VDD = 5V, the value on Vout can be around 3.0 to 3.5 V. This reduced level diminishes NMH and the current drive for the gate or gates driven by the pass transistor. • For both NMOS and CMOS, the lack of current drive slows circuit operation and NMH can be particularly problematic. As a consequence, in CMOS, a pFET is added to form a transmission gate. Transmission Gates • Symbols: A B C C A B C C Circuit Popular Usage
  • 52. CMOS Digital Integrated Circuits 52 Transmission Gates (2/2) • Operation » C is logic high  Both transistors are turned on and provide a low-resistance current path between nodes A and B. » C is logic low  Both transistors will be off, and the path between nodes A and B will be open circuit. This condition is called the high-impedance state. • With the parallel pFET added, it can transfer a full VDD from A to B (or B to A). It can also charge driven capacitance faster. • The substrates of NMOS and PMOS are connected to ground and VDD, respectively. Therefore, the substrate-bias effect must be taken into account.
  • 53. CMOS Digital Integrated Circuits 53 Transmission Gates DC Analysis (1/3) • Vin = VDD, VC = VDD, and node B is connected to a capacitor, which represents capacitive loading of the subsequent logic stages. • The nMOS transistor, VDS,n=VDD–Vout, and VGS,n=VDD–Vout. Thus, » Turn off: If Vout > VDD – VT,n » Saturation: If Vout < VDD – VT,n • The pMOS transistor, VDS,p=Vout–VDD, and VGS,p= –VDD. Thus, » Saturation: If Vout < |VT,p | » Linear: If Vout > |VT,p | Vin=VDD Vout 0V VDD ISD,p IDS,n ID
  • 54. CMOS Digital Integrated Circuits 54 Transmission Gates DC Analysis (2/3) • The current flowing through the transmission gate is equal to ID = IDS,n + ISD,p • The equivalent resistance for each transistor can be represented as Req,n = (VDD-Vout)/IDS,n Req,p = (VDD-Vout)/ IDS,p and Req = Req,n ║ Req,p nMOS: saturation pMOS: saturation nMOS: saturation pMOS: linear reg. nMOS: cut-off pMOS: linear reg. Region 1 Region 2 Region 3 0V |VT,p| (VDD-VT,n ) VDD Vout
  • 55. CMOS Digital Integrated Circuits 55 Transmission Gates DC Analysis (3/3) The values of Req,n and Req,p • Region 1 • Region 2 • Region 3     | | ) ( 2 ) ( 2 , 2 , , 2 , V V k V V R V V V k V V R p T DD p out DD p eq n T out DD n out DD n eq                V V V V k R V V V k V V R out DD p T DD p p eq n T out DD n out DD n eq         | | 2 2 ) ( 2 , , , 2 ,       V V V V k R out DD p T DD p p eq     | | 2 2 , ,
  • 56. CMOS Digital Integrated Circuits 56 Resistance of Transmission Gate • The parallel combination of the pFET and the nFET result in an equivalent resistance that is roughly constant. This constant value, Req, can be used in series with an ideal switch controlled by C and C to model the transmission gate. See p. 311 of the text book. • The implementation of CMOS transmission gates in logic circuit design usually results in compact circuit structures which may even require a smaller number of transistors. Req,n Req,p VDD-VT,n VDD Vout R Req,n║ Req,p 0
  • 57. CMOS Digital Integrated Circuits 57 Applications of Transmission Gate Example: XOR A B F B A B B M1 M2 M3/M4 Only need 6 transistors AB AB
  • 58. CMOS Digital Integrated Circuits 58 Applications of Transmission Gate Example: Multiplexer A B S S S F = AS+BS BS AS
  • 59. CMOS Digital Integrated Circuits 59 Applications of Transmission Gate Examples: Transmission Gate Full Adder B P Ci A A A A P A B S P P P P P Sum Generation Carry Generation Setup Ci VDD A Ci Ci Ci VDD VDD Co VDD Similar delays for sum and carry Generate (G) = AB Propagate (P) = AB Cout(G,P) = G+PCin Sum(G,P) = PCin