Device Modeling Report



COMPONENTS: Silicon Carbide Schottky Diode
PART NUMBER: CSD10060G
MANUFACTURER: Cree, Inc.
REMARK: Professional Model




                Bee Technologies Inc.



  All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
PSpice model
                                      Model description
 parameter
     IS         Saturation Current
     N          Emission Coefficient
     RS         Series Resistance
    IKF         High-injection Knee Current
    CJO         Zero-bias Junction Capacitance
     M          Junction Grading Coefficient
     VJ         Junction Potential
    ISR         Recombination Current Saturation Value
     BV         Reverse Breakdown Voltage(a positive value)
    IBV         Reverse Breakdown Current(a positive value)
     TT         Transit Time
    EG          Energy-band Gap




               All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Forward Current Characteristic

Circuit Simulation Result

                 20A


                 18A


                 16A


                 14A


                 12A


                 10A

                     8A


                     6A


                     4A


                     2A


                     0A
                          0V                    1.0V                 2.0V                3.0V
                               I(R1)
                                                           V_V1




Evaluation Circuit


                                                   R1
                                                                  PIN2
                                                                                  CASE
                                                   0.01m          PIN1


                                       V1                                U1 SD10060G
                           0Vdc




                                            0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                              VF(V)
              IF(A)                                                         Error(%)
                             Measurement               Simulation
                      0.1            0.895                      0.894              -0.112
                      0.2            0.915                      0.916               0.109
                      0.5            0.960                      0.957              -0.313
                        1            1.000                      0.989              -1.112
                        2            1.070                      1.065              -0.469
                        5            1.250                      1.245              -0.402
                       10            1.500                      1.510               0.662
                       20            2.050                      2.040              -0.490




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Junction Capacitance Characteristic

Circuit Simulation Result

                 400p




                 300p




                 200p




                 100p




                        0
                        3.0V            10V                                        100V   200V
                               I(V2)/(600V/1us)
                                               V(N00016)




Evaluation Circuit


                                              V2


                                                       0Vdc   PIN1
                         V2 = 600     V1                                      CASE
                         V1 = 0                               PIN2
                         TD = 0
                         TR = 1us                                    U1 SD10060G
                         TF = 10ns
                         PW = 50us
                         PER = 10us




                                                   0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                          Cj (pF)
            VR(V)                                                              Error(%)
                               Measurement               Simulation
                       5              304.000                 305.500               0.491
                      10              238.000                 237.500              -0.211
                      20              180.000                 179.900              -0.056
                      50              121.000                 121.500               0.412
                     100               90.000                   90.000              0.000
                     200               66.000                   66.200              0.302




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Reverse Characteristic

Circuit Simulation Result

                 100uA




                     80uA




                     60uA




                     40uA




                     20uA




                        0A
                             0V     100V    200V     300V   400V      500V   600V
                                  I(R1)
                                                        V_V1




Evaluation Circuit



                                             R1


                                             0.01m             PIN1
                                                                             CSAE
                                                               PIN2
                                   V1
                         0Vdc                        U1
                                                     CSD10060G




                                        0




                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                          VR(V)
             IR(uA)                                                          Error(%)
                               Measurement              Simulation
                        1            378.000                 376.700               -0.345
                        2            418.000                 417.200               -0.192
                        5            473.000                 471.000               -0.425
                       10            511.000                 511.500                0.098
                       20            553.000                 552.000               -0.181
                       50            607.000                 606.000               -0.165
                      100            648.000                 647.000               -0.155




                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2005

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SPICE MODEL of CSD10060G(Cree)

  • 1. Device Modeling Report COMPONENTS: Silicon Carbide Schottky Diode PART NUMBER: CSD10060G MANUFACTURER: Cree, Inc. REMARK: Professional Model Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 2. PSpice model Model description parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 3. Forward Current Characteristic Circuit Simulation Result 20A 18A 16A 14A 12A 10A 8A 6A 4A 2A 0A 0V 1.0V 2.0V 3.0V I(R1) V_V1 Evaluation Circuit R1 PIN2 CASE 0.01m PIN1 V1 U1 SD10060G 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 4. Comparison Graph Circuit Simulation Result Simulation Result VF(V) IF(A) Error(%) Measurement Simulation 0.1 0.895 0.894 -0.112 0.2 0.915 0.916 0.109 0.5 0.960 0.957 -0.313 1 1.000 0.989 -1.112 2 1.070 1.065 -0.469 5 1.250 1.245 -0.402 10 1.500 1.510 0.662 20 2.050 2.040 -0.490 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 5. Junction Capacitance Characteristic Circuit Simulation Result 400p 300p 200p 100p 0 3.0V 10V 100V 200V I(V2)/(600V/1us) V(N00016) Evaluation Circuit V2 0Vdc PIN1 V2 = 600 V1 CASE V1 = 0 PIN2 TD = 0 TR = 1us U1 SD10060G TF = 10ns PW = 50us PER = 10us 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 6. Comparison Graph Circuit Simulation Result Simulation Result Cj (pF) VR(V) Error(%) Measurement Simulation 5 304.000 305.500 0.491 10 238.000 237.500 -0.211 20 180.000 179.900 -0.056 50 121.000 121.500 0.412 100 90.000 90.000 0.000 200 66.000 66.200 0.302 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 7. Reverse Characteristic Circuit Simulation Result 100uA 80uA 60uA 40uA 20uA 0A 0V 100V 200V 300V 400V 500V 600V I(R1) V_V1 Evaluation Circuit R1 0.01m PIN1 CSAE PIN2 V1 0Vdc U1 CSD10060G 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005
  • 8. Comparison Graph Circuit Simulation Result Simulation Result VR(V) IR(uA) Error(%) Measurement Simulation 1 378.000 376.700 -0.345 2 418.000 417.200 -0.192 5 473.000 471.000 -0.425 10 511.000 511.500 0.098 20 553.000 552.000 -0.181 50 607.000 606.000 -0.165 100 648.000 647.000 -0.155 All Rights Reserved Copyright (C) Bee Technologies Inc. 2005