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M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76
www.ijera.com DOI: 10.9790/9622-0703067176 71 | P a g e
High Performance and Low power VLSI CMOS Circuit Designs
using ONOFIC Approach
M.Sahithi Priyanka1
, G.Manikanta2
, K.Bhaskar3
, A.Ganesh4
, V.Swetha5
1.
Student of Lendi Institute of Engineering and Technology
2.
Student of Lendi Institute of Engineering and Technology
3.
Student of Lendi Institute of Engineering and Technology
4
.Student of Lendi Institute of Engineering and Technology
5.
Assistant Professor of Lendi institute of Engineering and Technology
ABSTRACT
Leakage power dissipation a major concern for scaling down portable devices. Improving high performance
with reduced power consumption and chip area are the main constraint for designing VLSI CMOS circuits. In
this paper, high performance and low power ONOFIC approach for VLSI CMOS circuits have been
implemented. Mostly the concentrated part in deep sub micron regime is the power dissipation. Many
techniques have been proposed for reducing leakage current in deep sub micron but with some limitations they
are not suitable for actual requirements. Here we discussed two techniques named LECTOR & ONOFIC. The
proposed On/Off Logic (ONOFIC) serves the needs for deep sub micron with its reduced power dissipation and
increased performance in VLSI circuits. Thus the proposed ONOFIC approach results have been compared with
the LECTOR technique and observed that the proposed technique improves the performance and reduce the
power dissipation.
Keywords: ONOFIC, Deep sub micron, LECTOR, Leakage current.
I. INTRODUCTION
The design of low power circuits mainly
focus on performance, power dissipation and chip
area. The concentrated part in VLSI CMOS circuits is
deep sub micron regime. The constraint in deep sub
micron is to reduce the device dimensions leads to
decrease in chip area. Supply voltage plays an
important role in electronic devices to control the
power consumption. By reducing supply voltage and
threshold voltage we can retains the performance.
Introducing new lower level technologies in
integrated circuits leads to increase in power
dissipation. As the technology scaling down the
leakage power dissipation goes up. Several
technologies have been implemented to reducing the
leakage power dissipation.
Kao and chandrakasan used power gating
with Multi-Threshold transistors. This is the most
efficient way to lowering the leakage power
dissipation of a VLSI circuits in the standby state is
to turn off its supply voltage. However this technique
cannot be used in sequential circuits and memory
cells, as it would result in loss of data stored. Self-
bias transistor (SBT) to minimize sub-threshold
leakage currents in static and dynamic circuits.
Which acts as smart switch by virtually power gating
either pull-up or pull-down logic, and causes a
considerable reduction in leakage currents in both
active and standby modes. S.Narendra et al.
discovered that by connecting off state transistors in
series can reduce the leakage power. In this paper we
are discussing Leakage control transistor (LCT)
technique to reduce the power consumption and
power dissipation. Moreover, for designing high
performance and low power CMOS circuits a new
method is implemented which is On/Off logic
(ONOFIC) approach. Section II briefly describes
Power dissipation in CMOS designs. Section III
describes LECTOR technique to reduce leakage
power. Section IV describes our proposed technique
which is ONOFIC to reduce the leakage power.
Section V describes results. Section VI is about
conclusion.
II. POWER DISSIPATION
Power dissipation is a major problem in
microelectronic circuit designing the, exclusively in
wireless mobile applications and gadgets computing
elements. This paper deals with the reduction and
optimization techniques for leakage power
dissipation in VLSI CMOS circuits. The causes of
power dissipation in CMOS circuits are described by
the given below equation (1).
P=1/2.C.VDD2. f. N + I leak .VDD + QSC
.VDD. f .N (1)
Where P signifies the total power dissipated, VDD
represents the supply voltage, and f represents the
operating frequency. The first term denotes the power
required for charging and discharging the circuit
RESEARCH ARTICLE OPEN ACCESS
M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76
www.ijera.com DOI: 10.9790/9622-0703067176 72 | P a g e
nodes. C is the node Capacitance. The factor N is the
switching action which gives the number of gate
transitions per clock cycle at the output. The second
term in Equation 1 signifies the static power
dissipation due to the leakage current I leak. The
third term in Equation 1 signifies power dissipation.
The term QSC shows the amount of charge carried
during each transition by the short circuit current in
the circuit.
III. LECTOR TECHNIQUE
LECTOR technique was proposed by the
authors N. Hachette and N. Ranganathan. In this
technique two leakage control transistors are used to
control leakage current. These LCT transistors are
connected in such a manner so that one of the LCT
transistors will be in off state for any input signal.
Further, the gate of p – channel and n – channel
MOSFET is connected to the drain terminal of n –
channel and p – channel MOSFET respectively. The
generalized structure for leakage control gates is
shown in figure. 1. This technique gives an advantage
of reducing the leakage current in a path from VDD
to ground. The connection between pull – up and pull
– down is connected with leakage control transistors.
By breaking the path between pull – up and pull
down networks reduces the leakage current. The
conventional NAND design and NAND design using
LECTOR technique also shown below respectively in
figure .2 and figure .3. Simultaneously the
conventional NOR design and NOR design using
LECTOR technique also shown below respectively in
figure .4 and figure .5.
Fig.1.Generalized structure for leakage
control gates
Fig.2.Coventional NAND design
Fig.3.NAND design using LECTOR
Fig.4. Conventional NOR design
Fig.5. NOR design using LETOR
M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76
www.ijera.com DOI: 10.9790/9622-0703067176 73 | P a g e
IV. PROPOSED ONOFIC
The proposed On/Off logic (ONOFIC)
approach reduces the leakage current and power
with single threshold voltage level approach. This
technique efficiently reduces the leakage current in
both active and standby mode of logic circuit. Same
as LECTOR technique the ONOFIC approach also
introduces an extra logic between pull-up and pull-
down networks for leakage reduction. This additional
introduced circuit is called On/Off logic (ONOFIC)
circuit. This proposed approach contains one PMOS
and one NMOS transistor. Due to maintaining either
on or off condition for any output logic level this
technique is known as ONOFIC. The connection of
ONOFIC is shown in figure.4. This technique
provides the maximum resistance to the ONOFIC
block when it is in off state and minimum resistance
when it is in on state. This logic directly affects the
power dissipation and propagation delay of the logic
circuit.
Fig.6.Schematic of ONOFIC logic
In ONOFIC block, the drain of PMOS
transistor is connected to the gate of NMOS transistor
and the output is connected to the gate of PMOS
transistor. The drain of the pull-down network is
connected to the source of NMOS transistor and
PMOS source terminal is connected to VDD of the
circuit. The NMOS transistor drain is connected to
the output of the circuit and the substrate of NMOS
transistor is connected to the ground while the
substrate of PMOS transistor is connected to the
VDD. The main concept of this technique is property
of On/Off. The both ONOFIC transistors are in linear
region when ONOFIC logic is in on condition while
ONOFIC logic is in off state both the transistors are
in cut-off mode. The good conducting path is
obtained by turning on the ONOFIC block and it acts
as a good resistance to control the leakage current
when it is in off state. The proposed ONOFIC NAND
design is shown in below figure .7. The proposed
ONOFIC NOR design is shown in below figure .8.
Fig.7.NAND design using ONOFIC
Fig.8. NOR design using ONOFIC
TABLE I The Transistor Operation Of An Onofic Cmos Inverter
Input level PMOS ONOFIC PMOS ONOFIC NMOS NMOS
Logic 0 On Off Off Off
Logic 1 Off On On On
From Fig.4 when compared to other
circuits of the NAND design the ONOFIC
technique uses the same threshold voltage
throughout the entire block which can improve the
performance of the logic circuits. From the Fig.3
shows the NAND design using LECTOR technique
also uses the same threshold voltage throughout the
circuit block. The slope of the CMOS inverter
circuit with any input combinations is given in
Equation (1),
Slope = ð V out/ðVin = ð (IoutRout)/ð Vin; (2)
Iout = k/2 (VT) 2 e (Vin-Vth)/VT (1- e-Vout/VT);
(3)
M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76
www.ijera.com DOI: 10.9790/9622-0703067176 74 | P a g e
Here k is device process parameter, VT is
voltage temperature. Where Vth is device
threshold voltage and which depends on doping
densities of the material with material’s quality
factor, the flat voltage and charge storing
capacitances. From the Equations (2) and (3)
observed that the large slope is occurred due to
large I out current which leads to large static power
dissipation and hence LECTOR technique has low
static power dissipation when compared to
conventional and ONOFIC approach. Equation (3)
gives the propagation delay,
Tp = (RoutΔVout)/Iout;
(4)
Where, Rout is the sum of loads of
resistive and capacitive of the CMOS circuit.
ONOFIC and conventional circuits have less
propagation delay when compared to LECTOR
technique due to large Iout as observed from
Equation (4). Due to less propagation delay the
output values obtained quicker when input
combination applied.
In ONOFIC block, the operation of
NMOS transistor is controlled by the PMOS
transistor. ONOFIC NMOS transistor mode is
depends upon the output logic. The concept of
stacking provides the ONOFIC circuit for
controlling leakage current with maximum
resistance when it is in OFF state and minimum
resistance when it is in ON state.
The minimum propagation delay is obtained due to
fast performance of turning-off and turning on of a
PMOS transistor when compared to other
techniques.
V. RESULTS
Power consumption and Propagation
delay of basic CMOS designs are tabulated
below as shown in TABLE II. Here, the basic
CMOS designs are simulated in tanner tools. In
the given table we gave the comparison among
conventional circuits of different logic gates,
logic gates using LECTOR technique and logic
gates using our proposed ONOFIC approach.
We also showed the graphs of power
consumption and delay for NAND designs in
the figure.9 and figure.10. Simultaneously
NOR designs in the figure.11. and figure.12.
TABLE II: The Power Consumption (W) And Propagation Delay (Ns)
CMOS DESIGN DELAY POWER
INVERTER -102.2930n 6.385162e-005w
LECTOR INVERTER -101.7726n 5.345801e-005w
ONOFIC INVERTER -102.3982n 3.982539e-006w
NAND 29.8060n 1.232135e-004w
LECTOR NAND 59.8060n 8.846303e-005w
ONOFIC NAND -10.4715n 3.424948e-005w
NOR 9.5988n 6.783585e-005w
LECTOR NOR 9.6126n 6.624054e-005w
ONOFIC NOR 9.5340n 1.476662e-005w
TABLE II shows the delay and power consumption of various CMOS circuit designs. Here the
comparison is among conventional CMOS circuits, circuits using LECTOR and circuits using ONOFIC.
It is found that the delay and power consumption of ONOFIC decreases when compared to
conventional circuit results. It is also seen that LECTOR based (LCT) circuits have less power
consumption but more delay as compared to conventional design as shown in below graphs. As
LECTOR technique consumes less power compared to conventional but has more delay so we went to
proposed ONOFIC approach. By observing the above table we get less delay and less power
consumption compared to conventional and LECTOR. So, our proposed ONOFIC technique gives high
performance compared to other techniques. It is more advantageous by using ONOFIC approach to
reduce power and delay. The power and delay graphs are shown below. By comparing ONOFIC circuit
designs with other conventional and LECTOR technique circuit designs ONOFIC consume less p ower
and delay.
M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76
www.ijera.com DOI: 10.9790/9622-0703067176 75 | P a g e
Fig.9. Power Consumption for NAND design
Fig.10. Delay for NAND design
Fig.11. Power consumption for NOR design
Fig.12. Delay for NOR design
VI. CONCLUSION
The problem of power dissipation is
reduced for different VLSI CMOS circuits by
using TANNER EDA tool. This work addresses
the challenge of obtaining low power losses
and efficiently uses IC’s and electronic
devices. Our proposed ONOFIC approach gives
high performance when compared to
conventional circuits, LECTOR. So, it is
helpful in saving power in CMOS circuits.
Hence, our proposed ONOFIC approach gives
best results for saving power and gives high
performance.
REFERENCES
[1]. Preeti Verma,’’Estimation of leakage power
and delay inCMOS circuits using parametric
variation’’ELSEVIER-2016.
[2]. Umesh jeevalu chavan, Siddarama R
Patil’’High Performance and Low Power
ONOFIC Approach for VLSI CMOS
Circuits Design’’IEEE-2016.
[3]. Siddesh Gaonkar” Design of CMOS inverter
using LECTOR technique to reduce the
leakage power. Issue 31(September, 2015).
[4]. Anjana R And Ajay Kumar Somkwar
’’Analysis Of Sub Threshold Leagake
Techniques In Deep Sub Micron Regime
For CMOS VLSI Circuits” IEEE-2013 978-
1-4673-5301-4/13.
[5]. Fallah, F., Pedram, M., 2005. ’’Standby and
active leakage current control and
minimization in CMOS VLSI
circuits.’’IEICE Trans. Electron. 88 (4),
509—519.
[6]. Gopalakrishnan, H., Shiue, W.T., 2004.
‘’Leakage power reduction using self bias
transistor in VLSI circuits.’’ In: Micro. and
Electron Devices IEEE Workshop, pp. 71—
74.
M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com
ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76
www.ijera.com DOI: 10.9790/9622-0703067176 76 | P a g e
[7]. Gu, R.X., Elmasry, M.I., 1999. ‘’Power
dissipation analysis and opti-mization for
deep submicron CMOS digital circuits.’’
IEEE J. Solid-State Circuits, 707—713.
[8]. Hanchate, N., Ranganathan, N., 2004.
LECTOR: a technique for leakage reduction
in CMOS circuits. IEEE Trans. VLSI Syst.
12 (2).
[9]. Verma, P., Mishra, R.A., 2012.’’ HTLCT-A
new technique for Leakage reduction in
CMOS circuits.’’ In: IEEE Conf., No. 2, pp.
131—134.
[10]. Ye, Y., Borkar, S., De, V., 1998. A new
technique for standby leakagereduction in
high performance circuits. In: IEEE
Symposium on VLSI Circuits Digest of
Technical Papers, pp. 40—41.

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High Performance and Low power VLSI CMOS Circuit Designs using ONOFIC Approach

  • 1. M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76 www.ijera.com DOI: 10.9790/9622-0703067176 71 | P a g e High Performance and Low power VLSI CMOS Circuit Designs using ONOFIC Approach M.Sahithi Priyanka1 , G.Manikanta2 , K.Bhaskar3 , A.Ganesh4 , V.Swetha5 1. Student of Lendi Institute of Engineering and Technology 2. Student of Lendi Institute of Engineering and Technology 3. Student of Lendi Institute of Engineering and Technology 4 .Student of Lendi Institute of Engineering and Technology 5. Assistant Professor of Lendi institute of Engineering and Technology ABSTRACT Leakage power dissipation a major concern for scaling down portable devices. Improving high performance with reduced power consumption and chip area are the main constraint for designing VLSI CMOS circuits. In this paper, high performance and low power ONOFIC approach for VLSI CMOS circuits have been implemented. Mostly the concentrated part in deep sub micron regime is the power dissipation. Many techniques have been proposed for reducing leakage current in deep sub micron but with some limitations they are not suitable for actual requirements. Here we discussed two techniques named LECTOR & ONOFIC. The proposed On/Off Logic (ONOFIC) serves the needs for deep sub micron with its reduced power dissipation and increased performance in VLSI circuits. Thus the proposed ONOFIC approach results have been compared with the LECTOR technique and observed that the proposed technique improves the performance and reduce the power dissipation. Keywords: ONOFIC, Deep sub micron, LECTOR, Leakage current. I. INTRODUCTION The design of low power circuits mainly focus on performance, power dissipation and chip area. The concentrated part in VLSI CMOS circuits is deep sub micron regime. The constraint in deep sub micron is to reduce the device dimensions leads to decrease in chip area. Supply voltage plays an important role in electronic devices to control the power consumption. By reducing supply voltage and threshold voltage we can retains the performance. Introducing new lower level technologies in integrated circuits leads to increase in power dissipation. As the technology scaling down the leakage power dissipation goes up. Several technologies have been implemented to reducing the leakage power dissipation. Kao and chandrakasan used power gating with Multi-Threshold transistors. This is the most efficient way to lowering the leakage power dissipation of a VLSI circuits in the standby state is to turn off its supply voltage. However this technique cannot be used in sequential circuits and memory cells, as it would result in loss of data stored. Self- bias transistor (SBT) to minimize sub-threshold leakage currents in static and dynamic circuits. Which acts as smart switch by virtually power gating either pull-up or pull-down logic, and causes a considerable reduction in leakage currents in both active and standby modes. S.Narendra et al. discovered that by connecting off state transistors in series can reduce the leakage power. In this paper we are discussing Leakage control transistor (LCT) technique to reduce the power consumption and power dissipation. Moreover, for designing high performance and low power CMOS circuits a new method is implemented which is On/Off logic (ONOFIC) approach. Section II briefly describes Power dissipation in CMOS designs. Section III describes LECTOR technique to reduce leakage power. Section IV describes our proposed technique which is ONOFIC to reduce the leakage power. Section V describes results. Section VI is about conclusion. II. POWER DISSIPATION Power dissipation is a major problem in microelectronic circuit designing the, exclusively in wireless mobile applications and gadgets computing elements. This paper deals with the reduction and optimization techniques for leakage power dissipation in VLSI CMOS circuits. The causes of power dissipation in CMOS circuits are described by the given below equation (1). P=1/2.C.VDD2. f. N + I leak .VDD + QSC .VDD. f .N (1) Where P signifies the total power dissipated, VDD represents the supply voltage, and f represents the operating frequency. The first term denotes the power required for charging and discharging the circuit RESEARCH ARTICLE OPEN ACCESS
  • 2. M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76 www.ijera.com DOI: 10.9790/9622-0703067176 72 | P a g e nodes. C is the node Capacitance. The factor N is the switching action which gives the number of gate transitions per clock cycle at the output. The second term in Equation 1 signifies the static power dissipation due to the leakage current I leak. The third term in Equation 1 signifies power dissipation. The term QSC shows the amount of charge carried during each transition by the short circuit current in the circuit. III. LECTOR TECHNIQUE LECTOR technique was proposed by the authors N. Hachette and N. Ranganathan. In this technique two leakage control transistors are used to control leakage current. These LCT transistors are connected in such a manner so that one of the LCT transistors will be in off state for any input signal. Further, the gate of p – channel and n – channel MOSFET is connected to the drain terminal of n – channel and p – channel MOSFET respectively. The generalized structure for leakage control gates is shown in figure. 1. This technique gives an advantage of reducing the leakage current in a path from VDD to ground. The connection between pull – up and pull – down is connected with leakage control transistors. By breaking the path between pull – up and pull down networks reduces the leakage current. The conventional NAND design and NAND design using LECTOR technique also shown below respectively in figure .2 and figure .3. Simultaneously the conventional NOR design and NOR design using LECTOR technique also shown below respectively in figure .4 and figure .5. Fig.1.Generalized structure for leakage control gates Fig.2.Coventional NAND design Fig.3.NAND design using LECTOR Fig.4. Conventional NOR design Fig.5. NOR design using LETOR
  • 3. M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76 www.ijera.com DOI: 10.9790/9622-0703067176 73 | P a g e IV. PROPOSED ONOFIC The proposed On/Off logic (ONOFIC) approach reduces the leakage current and power with single threshold voltage level approach. This technique efficiently reduces the leakage current in both active and standby mode of logic circuit. Same as LECTOR technique the ONOFIC approach also introduces an extra logic between pull-up and pull- down networks for leakage reduction. This additional introduced circuit is called On/Off logic (ONOFIC) circuit. This proposed approach contains one PMOS and one NMOS transistor. Due to maintaining either on or off condition for any output logic level this technique is known as ONOFIC. The connection of ONOFIC is shown in figure.4. This technique provides the maximum resistance to the ONOFIC block when it is in off state and minimum resistance when it is in on state. This logic directly affects the power dissipation and propagation delay of the logic circuit. Fig.6.Schematic of ONOFIC logic In ONOFIC block, the drain of PMOS transistor is connected to the gate of NMOS transistor and the output is connected to the gate of PMOS transistor. The drain of the pull-down network is connected to the source of NMOS transistor and PMOS source terminal is connected to VDD of the circuit. The NMOS transistor drain is connected to the output of the circuit and the substrate of NMOS transistor is connected to the ground while the substrate of PMOS transistor is connected to the VDD. The main concept of this technique is property of On/Off. The both ONOFIC transistors are in linear region when ONOFIC logic is in on condition while ONOFIC logic is in off state both the transistors are in cut-off mode. The good conducting path is obtained by turning on the ONOFIC block and it acts as a good resistance to control the leakage current when it is in off state. The proposed ONOFIC NAND design is shown in below figure .7. The proposed ONOFIC NOR design is shown in below figure .8. Fig.7.NAND design using ONOFIC Fig.8. NOR design using ONOFIC TABLE I The Transistor Operation Of An Onofic Cmos Inverter Input level PMOS ONOFIC PMOS ONOFIC NMOS NMOS Logic 0 On Off Off Off Logic 1 Off On On On From Fig.4 when compared to other circuits of the NAND design the ONOFIC technique uses the same threshold voltage throughout the entire block which can improve the performance of the logic circuits. From the Fig.3 shows the NAND design using LECTOR technique also uses the same threshold voltage throughout the circuit block. The slope of the CMOS inverter circuit with any input combinations is given in Equation (1), Slope = ð V out/ðVin = ð (IoutRout)/ð Vin; (2) Iout = k/2 (VT) 2 e (Vin-Vth)/VT (1- e-Vout/VT); (3)
  • 4. M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76 www.ijera.com DOI: 10.9790/9622-0703067176 74 | P a g e Here k is device process parameter, VT is voltage temperature. Where Vth is device threshold voltage and which depends on doping densities of the material with material’s quality factor, the flat voltage and charge storing capacitances. From the Equations (2) and (3) observed that the large slope is occurred due to large I out current which leads to large static power dissipation and hence LECTOR technique has low static power dissipation when compared to conventional and ONOFIC approach. Equation (3) gives the propagation delay, Tp = (RoutΔVout)/Iout; (4) Where, Rout is the sum of loads of resistive and capacitive of the CMOS circuit. ONOFIC and conventional circuits have less propagation delay when compared to LECTOR technique due to large Iout as observed from Equation (4). Due to less propagation delay the output values obtained quicker when input combination applied. In ONOFIC block, the operation of NMOS transistor is controlled by the PMOS transistor. ONOFIC NMOS transistor mode is depends upon the output logic. The concept of stacking provides the ONOFIC circuit for controlling leakage current with maximum resistance when it is in OFF state and minimum resistance when it is in ON state. The minimum propagation delay is obtained due to fast performance of turning-off and turning on of a PMOS transistor when compared to other techniques. V. RESULTS Power consumption and Propagation delay of basic CMOS designs are tabulated below as shown in TABLE II. Here, the basic CMOS designs are simulated in tanner tools. In the given table we gave the comparison among conventional circuits of different logic gates, logic gates using LECTOR technique and logic gates using our proposed ONOFIC approach. We also showed the graphs of power consumption and delay for NAND designs in the figure.9 and figure.10. Simultaneously NOR designs in the figure.11. and figure.12. TABLE II: The Power Consumption (W) And Propagation Delay (Ns) CMOS DESIGN DELAY POWER INVERTER -102.2930n 6.385162e-005w LECTOR INVERTER -101.7726n 5.345801e-005w ONOFIC INVERTER -102.3982n 3.982539e-006w NAND 29.8060n 1.232135e-004w LECTOR NAND 59.8060n 8.846303e-005w ONOFIC NAND -10.4715n 3.424948e-005w NOR 9.5988n 6.783585e-005w LECTOR NOR 9.6126n 6.624054e-005w ONOFIC NOR 9.5340n 1.476662e-005w TABLE II shows the delay and power consumption of various CMOS circuit designs. Here the comparison is among conventional CMOS circuits, circuits using LECTOR and circuits using ONOFIC. It is found that the delay and power consumption of ONOFIC decreases when compared to conventional circuit results. It is also seen that LECTOR based (LCT) circuits have less power consumption but more delay as compared to conventional design as shown in below graphs. As LECTOR technique consumes less power compared to conventional but has more delay so we went to proposed ONOFIC approach. By observing the above table we get less delay and less power consumption compared to conventional and LECTOR. So, our proposed ONOFIC technique gives high performance compared to other techniques. It is more advantageous by using ONOFIC approach to reduce power and delay. The power and delay graphs are shown below. By comparing ONOFIC circuit designs with other conventional and LECTOR technique circuit designs ONOFIC consume less p ower and delay.
  • 5. M.Sahithi Priyanka et al. Int. Journal of Engineering Research and Application www.ijera.com ISSN : 2248-9622, Vol. 7, Issue 3, ( Part -6) March 2017, pp.71-76 www.ijera.com DOI: 10.9790/9622-0703067176 75 | P a g e Fig.9. Power Consumption for NAND design Fig.10. Delay for NAND design Fig.11. Power consumption for NOR design Fig.12. Delay for NOR design VI. CONCLUSION The problem of power dissipation is reduced for different VLSI CMOS circuits by using TANNER EDA tool. This work addresses the challenge of obtaining low power losses and efficiently uses IC’s and electronic devices. Our proposed ONOFIC approach gives high performance when compared to conventional circuits, LECTOR. So, it is helpful in saving power in CMOS circuits. Hence, our proposed ONOFIC approach gives best results for saving power and gives high performance. REFERENCES [1]. Preeti Verma,’’Estimation of leakage power and delay inCMOS circuits using parametric variation’’ELSEVIER-2016. [2]. Umesh jeevalu chavan, Siddarama R Patil’’High Performance and Low Power ONOFIC Approach for VLSI CMOS Circuits Design’’IEEE-2016. [3]. Siddesh Gaonkar” Design of CMOS inverter using LECTOR technique to reduce the leakage power. Issue 31(September, 2015). [4]. Anjana R And Ajay Kumar Somkwar ’’Analysis Of Sub Threshold Leagake Techniques In Deep Sub Micron Regime For CMOS VLSI Circuits” IEEE-2013 978- 1-4673-5301-4/13. [5]. Fallah, F., Pedram, M., 2005. ’’Standby and active leakage current control and minimization in CMOS VLSI circuits.’’IEICE Trans. Electron. 88 (4), 509—519. [6]. Gopalakrishnan, H., Shiue, W.T., 2004. ‘’Leakage power reduction using self bias transistor in VLSI circuits.’’ In: Micro. and Electron Devices IEEE Workshop, pp. 71— 74.
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