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Processes Involved in IC
Manufacturing on the Wafer:
Diffusion/ion implantation
Photolithography
Deposition
Oxidation
Etching
    Diffusion and Ion
      Implantation
            Lecture 4
Impurity Doping
• Two methods for introducing impurities into Si
  to control the majority-carrier type and
  resistivity of layers
  – Diffusion: dopant atoms move from the surface
    into Si by thermal means via substitutional or
    interstitial diffusion mechanisms.
  – Ion implantation: dopant atoms are forcefully
    added into Si in the form of energetic ion beam
    injection.

                 IC Technology
                                                      2
                             Ms. Neha Singh
Need of doping
– Formation of pn junction and fabrication of
  devices during wafer fabrication.
– alter the type and level of conductivity of
  semiconductor materials.
– form bases, emitters, and resistors in bipolar
  devices, as well as drains and sources in MOS
  devices.
– dope polysilicon layers.


                IC Technology
                                                   3
                            Ms. Neha Singh
Comparison




IC Technology
                             4
            Ms. Neha Singh
Doping Profiles




  IC Technology
                               5
              Ms. Neha Singh
Diffusion
• Diffusion: movement of a chemical species from an
  area of high concentration to an area of lower
  concentration.
• The diffusion process begins with the deposition of a
  shallow high concentration of the desired impurity in
  the Si surface through windows etched in the
  protective barrier layer.




                   IC Technology
                                                      6
                               Ms. Neha Singh
Diffusion mechanism (7 methods)
    1. Interstitial diffusion (Na, Li)
  - fast process.
  - diffuses in interstitials.
  - does not depend upon             vacancy concentration.




2. Substitutional diffusion
- Diffuse in vacancy.
- Slow diffusion.
- Thus controlled.

                             IC Technology
                                                              7
                                         Ms. Neha Singh
Diffusion mechanism (contd.)
3. Interstitial-substitutional Diffusion


                                          3.a) Diffusion by
                                          dissociative
                                          mechanism
                                          (Cu, Ni)



                                          3.b) Diffusion by
                                          kick-out mechanism
                                          (Gold and Platinum)
             IC Technology
                                                          8
                         Ms. Neha Singh
Diffusion mechanism (contd.)
4. Interstitialcy Diffusion (B and P)




5. Interchange Diffusion
6. Grain Boundary Diffusion
7. Combination effects
                    IC Technology
                                                 9
                                Ms. Neha Singh
Fick’s First Law of Diffusion
• Based on analogy between material transfer in a
  solution and heat transfer by conduction.


  J=rate of transfer of solute per unit area or diffusion flux
  C=concentration of solute (function of x and t only)
  x=coordinate axis in the direction of solute flow
  t=diffusion time
  D=diffusivity (Diffusion constant)
Statement: The local rate of transfer of solute per unit area per
   unit time is proportional to the concentration gradient of the
   solute and defines the proportionality constant as diffusivity
   of the solute. The negative sign shows the flow towards lower
   concentration of solute.
                      IC Technology
                                                                 10
                                  Ms. Neha Singh
Here, d is the distance between tetrahedral sites. Let n 1
and n2 be the no. of atoms in layers1 and 2 respectively
and their respective concentration C1 and C2 so that,

                 3n1                       3n2
            C1 =            and       C2 =
                 Ad                        Ad




                      IC Technology
                                                             11
                                  Ms. Neha Singh
We assume atoms jump at a frequency of v such that,half
of them jump right and the other half jump left. So, the
net flow of atoms across plane R in direction of x is
                    n1 − n2
              ∆n       2      v Ad
                  =         =        (C1 − C2 )
               ∆t      1      2 3
                       v
            But     ∆C   C1 −C2
                       =
                    ∆x   d/ 3
             So,
                   ∆n vAd 2 ∆C
                      =
                   ∆t   6 ∆x
                   IC Technology
                                                      12
                               Ms. Neha Singh
Let J= rate of change of no. of impurities per unit
  area, then,
          ∆n      vd ∆ C       2
       J=      =−                                  D, diffusivity
          A∆ t     6 ∆x
              ∂C
       J = −D
              ∂x
              ∂ C ( x, t )
       J = −D                            Fick’s First Law
                 ∂x


                   IC Technology
                                                                    13
                               Ms. Neha Singh
Limitation of first law
• Though it describes diffusion process
  accurately.
• But, has no convenient measure of current
  density of the impurity.
• Thus, second law developed to describe the
  concept with more readily measurable
  quantities.


                IC Technology
                                               14
                            Ms. Neha Singh
Fick’s second law
• Consider a long bar of material with uniform cross-
  sectional area A. For a small volume of length dx,




• J1 is the flux entering into the volume and J2 is the flux
                                    J 2 − J1 ∂J
  leaving the volume. Then,                 =
                                                   dx   ∂x
• The continuity equation gives,
                      ∂C                           ∂J
                Adx      = − A( J 2 − J1 ) = − Adx
                      ∂t                           ∂x
                      IC Technology
                                                             15
                                  Ms. Neha Singh
Fick’s second Law of Diffusion
• Law of conservation of matter: change in solute
  concentration per unit time= local decrease in
  diffusion flux in the absence of source or sink.


• Combining with Fick’s first law,
             ∂C ( x, t )   ∂  ∂C ( x, t ) 
                         =    D
               ∂t          ∂x   ∂x       
• At low concentration of solute, diffusivity at a
  particular temperature can be considered a constant
                ∂C ( x, t )    ∂ 2C ( x, t )
                            =D
                  ∂t              ∂x 2
                     IC Technology
                                                     16
                                 Ms. Neha Singh
End of Lecture 5
In the next lecture we shall
- solve the Fick’s second law for various conditions.
- See the effect of electric field on diffusion.
- See diffusion in SiO2




                    IC Technology
                                                        17
                                Ms. Neha Singh

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Lect5 Diffusion

  • 1. Processes Involved in IC Manufacturing on the Wafer: Diffusion/ion implantation Photolithography Deposition Oxidation Etching Diffusion and Ion Implantation Lecture 4
  • 2. Impurity Doping • Two methods for introducing impurities into Si to control the majority-carrier type and resistivity of layers – Diffusion: dopant atoms move from the surface into Si by thermal means via substitutional or interstitial diffusion mechanisms. – Ion implantation: dopant atoms are forcefully added into Si in the form of energetic ion beam injection. IC Technology 2 Ms. Neha Singh
  • 3. Need of doping – Formation of pn junction and fabrication of devices during wafer fabrication. – alter the type and level of conductivity of semiconductor materials. – form bases, emitters, and resistors in bipolar devices, as well as drains and sources in MOS devices. – dope polysilicon layers. IC Technology 3 Ms. Neha Singh
  • 4. Comparison IC Technology 4 Ms. Neha Singh
  • 5. Doping Profiles IC Technology 5 Ms. Neha Singh
  • 6. Diffusion • Diffusion: movement of a chemical species from an area of high concentration to an area of lower concentration. • The diffusion process begins with the deposition of a shallow high concentration of the desired impurity in the Si surface through windows etched in the protective barrier layer. IC Technology 6 Ms. Neha Singh
  • 7. Diffusion mechanism (7 methods) 1. Interstitial diffusion (Na, Li) - fast process. - diffuses in interstitials. - does not depend upon vacancy concentration. 2. Substitutional diffusion - Diffuse in vacancy. - Slow diffusion. - Thus controlled. IC Technology 7 Ms. Neha Singh
  • 8. Diffusion mechanism (contd.) 3. Interstitial-substitutional Diffusion 3.a) Diffusion by dissociative mechanism (Cu, Ni) 3.b) Diffusion by kick-out mechanism (Gold and Platinum) IC Technology 8 Ms. Neha Singh
  • 9. Diffusion mechanism (contd.) 4. Interstitialcy Diffusion (B and P) 5. Interchange Diffusion 6. Grain Boundary Diffusion 7. Combination effects IC Technology 9 Ms. Neha Singh
  • 10. Fick’s First Law of Diffusion • Based on analogy between material transfer in a solution and heat transfer by conduction. J=rate of transfer of solute per unit area or diffusion flux C=concentration of solute (function of x and t only) x=coordinate axis in the direction of solute flow t=diffusion time D=diffusivity (Diffusion constant) Statement: The local rate of transfer of solute per unit area per unit time is proportional to the concentration gradient of the solute and defines the proportionality constant as diffusivity of the solute. The negative sign shows the flow towards lower concentration of solute. IC Technology 10 Ms. Neha Singh
  • 11. Here, d is the distance between tetrahedral sites. Let n 1 and n2 be the no. of atoms in layers1 and 2 respectively and their respective concentration C1 and C2 so that, 3n1 3n2 C1 = and C2 = Ad Ad IC Technology 11 Ms. Neha Singh
  • 12. We assume atoms jump at a frequency of v such that,half of them jump right and the other half jump left. So, the net flow of atoms across plane R in direction of x is n1 − n2 ∆n 2 v Ad = = (C1 − C2 ) ∆t 1 2 3 v But ∆C C1 −C2 = ∆x d/ 3 So, ∆n vAd 2 ∆C = ∆t 6 ∆x IC Technology 12 Ms. Neha Singh
  • 13. Let J= rate of change of no. of impurities per unit area, then, ∆n vd ∆ C 2 J= =− D, diffusivity A∆ t 6 ∆x ∂C J = −D ∂x ∂ C ( x, t ) J = −D Fick’s First Law ∂x IC Technology 13 Ms. Neha Singh
  • 14. Limitation of first law • Though it describes diffusion process accurately. • But, has no convenient measure of current density of the impurity. • Thus, second law developed to describe the concept with more readily measurable quantities. IC Technology 14 Ms. Neha Singh
  • 15. Fick’s second law • Consider a long bar of material with uniform cross- sectional area A. For a small volume of length dx, • J1 is the flux entering into the volume and J2 is the flux J 2 − J1 ∂J leaving the volume. Then, = dx ∂x • The continuity equation gives, ∂C ∂J Adx = − A( J 2 − J1 ) = − Adx ∂t ∂x IC Technology 15 Ms. Neha Singh
  • 16. Fick’s second Law of Diffusion • Law of conservation of matter: change in solute concentration per unit time= local decrease in diffusion flux in the absence of source or sink. • Combining with Fick’s first law, ∂C ( x, t ) ∂  ∂C ( x, t )  = D ∂t ∂x  ∂x   • At low concentration of solute, diffusivity at a particular temperature can be considered a constant ∂C ( x, t ) ∂ 2C ( x, t ) =D ∂t ∂x 2 IC Technology 16 Ms. Neha Singh
  • 17. End of Lecture 5 In the next lecture we shall - solve the Fick’s second law for various conditions. - See the effect of electric field on diffusion. - See diffusion in SiO2 IC Technology 17 Ms. Neha Singh

Editor's Notes

  • #2: The wafer obtained after undergoing the processes discussed in the last lectures goes though another set of processes to manufacture IC finally on it. These steps include: Diffusion and ion implantation: This is the step of introducing deliberately the dopants or impurities into either precise regions and/or complete wafer. Ion Implantation offers more precisely controlled dopant introduction. Photolithography: This step is done to select the region for processes like diffusion, implantation, oxidation and etching. It uses a material called photoresist to select the processing regions. Deposition: it is a step of depositing certain materials on the wafer. Eg. Deposition of metal for lead connection. Oxidation: This process allows Si wafer to be oxidized in a controlled manner in a specially designed chamber to form SiO 2 . this oxide behaves as an insulator on the wafer layer. Etching: Etching is the process of chemically cleaning and removal of selected regions on the wafer. In a few lectures from today we shall focus on the two mechanisms of introducing impurities or dopants into the wafer: DIFFUSION and ION-IMPLANTATION.
  • #3: Si wafers are doped with impurities to control the majority carrier type and their resistivities. Diffusion is a process in which material atom moves in crystal lattice from regions of higher concentration into the regions of lower concentration to achieve equilibrium. The dopant atoms move from the surface into Si by thermal means via substitutional or interstitial diffusion mechanisms. Diffusion depends upon the concentration of vacancies available in the wafer. Ion implantation is another method to introduce dopant atoms into Si wafer. The dopants are forcefully added into Si in the form of energetic ion beam injection. Though the process is more controlled as compared to diffusion but the striking of energetic atoms on the surface results into unwanted mechanical defects in the wafer for which the wafers need to be treated.
  • #5: If the two processes of doping are compared the highlights are as follows: Diffusion requires high temperature but ion implantation can be done at low temperatures. At high temperatures, the crystal structure is disturbed and the dopants diffuse into Si by taking up the lattice sites which are made vacancies by Si atoms which tend to move by taking up energy due to high temperature. 2. Diffusion requires hard mask like SiO 2 but ion implantation can be done with a soft mask of photoresist. 3. The dopant profile is isotropic for diffusion and anisotropic for ion implantation. The dopants diffuse equally in all directions. So, as shown in this figure the dopants diffuse well under the SiO 2 layer. The dopant profile of diffusion is also shown in next slide. Where as for ion implantation high energy ions strike the surface through the opening in the mask and thus do not move sideways under the mask. 4. The dopant concentration and the junction depth cannot be controlled independently for diffusion mechanism. By controlling the energy of the ions, the depth to which they move can be greatly controlled so it is for ion implantation method that the dopant concentration and junction depth is controlled.
  • #6: Diffusion is isotropic process i.e. it allows dopants to move in all the directions uniformly. And thus, dopants well diffuse under SiO 2 as shown in figure (a) above. Ion implantation is anisotropic in nature so, the dopants move vertically to the depth of the wafer.
  • #7: Diffusion is the movement of a chemical species from an area of high concentration to an area of lower concentration. The controlled diffusion of dopants into silicon is the foundation of forming a pn junction and fabrication of devices during IC fabrication. Diffusion is used primarily to alter the type and level of conductivity of semiconductor materials. It is used to form bases, emitters, and resistors in bipolar devices, as well as drains and sources in MOS devices. It is also used to dope polysilicon layers.
  • #8: Crystal is isotropic and the diffusion constant is a function of doping concentration and depth level. Each atom is at rest at 0 degree Celcius. As the temperature is increased, atoms oscillate from equilibrium position. Now if impurity atom is introduced it diffuses either directly or through vacancy. Interstitial diffusion , in which impurity atoms do not replace atoms in the crystal lattice. Considerable space exists between atoms in the Si lattice, and certain impurity atoms diffuse through the crystal by jumping from one interstitial site to another. Since this mechanism does not require the presence of vacancies, interstitial diffusion proceeds much more rapidly than substitutional diffusion. The rapid diffusion rate makes interstitial diffusion difficult to control. Sodium and Lithium move in Si by this method. Substitutional diffusion , in which the impurity moves among vacancies in the lattice. Vacancies must be present in the Si lattice. Impurity atoms needs to occupy substitutional sites in the lattice in order to provide electrons or holes for conduction. Substitutional diffusion proceeds at a relatively low rate, because the supply of vacancies is limited. This slow diffusion rate is actually an advantage, because it permits good control of the diffusion process.
  • #9: Interstitial- substitutional diffusion: In this type of diffusion mechanism, the impurity atoms occupy interstitial as well as substitutional lattice sites. However, they move at significant rate when present in interstitial sites (by interstitial diffusion). This can be done in either of the following ways: By dissociative mechanism: The dissociative mechanism by which a substitutional impurity becomes an interstitial impurity by creating vacancy is the controlling factor of the process. So, for Interstitial- substitutional diffusion, the effective diffusivity is a function of dissociative rate, impurity concentration and crystal quality. Cu and Ni diffuse through this mechanism. By kick-out mechanism: here a rapidly moving interstitial diffuser displaces an atom in the substitutional site. The kicked out atom forms a self-interstitial. Gold and Platinum diffuse through this mechanism.
  • #10: Intertialcy diffusion: It is the modified version of substitutional diffusion. The self interstitial knocks out the substitutional impurity atom to move to interstitial site. These impurities now diffuse to adjacent substitutional sites and create new self interstitials. Thus the interstitial position of the impurity atom is a transition state purely. All substitutional diffusers move, in part, by this mechanism. Boron and Phosphorous diffuse by this mechanism. Interchange Diffusion: when an impurity and the host atom interchange their position. The probability of occurance of interchange diffusion is very low. Grain boundary diffusion: this is diffusion along the dislocations and grain boundaries. Fast diffusion along dislocations. Combination effect: combination of these mechanisms result in diffusion.
  • #11: For complete derivation, refer class notes.