This project report describes the development of a test jig for testing the MODE-S drawer of IFF equipment. Some key issues with current testing methods are the need to test using the full IFF system, which is time-consuming, and the lack of a standalone test solution for the MODE-S drawer. The proposed test jig includes a pulse generator circuit to generate trigger pulses, and interfaces to monitor signals and outputs from the MODE-S drawer unit. Use of the test jig is expected to reduce testing time and allow more efficient troubleshooting, resulting in estimated savings of over 300,000 rupees.